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Semiconductor material and device characterization [[electronic resource] /] / Dieter K. Schroder
| Semiconductor material and device characterization [[electronic resource] /] / Dieter K. Schroder |
| Autore | Schroder Dieter K |
| Edizione | [3rd ed.] |
| Pubbl/distr/stampa | [Piscataway, NJ], : IEEE Press |
| Descrizione fisica | 1 online resource (799 p.) |
| Disciplina | 621.3815/2 |
| Soggetto topico |
Semiconductors
Semiconductors - Testing |
| ISBN |
1-280-65470-8
9786610654703 0-470-36250-2 0-471-74909-5 0-471-74908-7 |
| Classificazione |
549.8
621.3815/2 |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | Resistivity -- Carrier and doping density -- Contact resistance and Schottky barriers -- Series resistance, channel length and width, and threshold voltage -- Defects -- Oxide and interface trapped charges, oxide thickness -- Carrier lifetimes -- Mobility -- Charge-based and probe characterization -- Optical characterization -- Chemical and physical characterization -- Reliability and failure analysis. |
| Record Nr. | UNISA-996202345903316 |
Schroder Dieter K
|
||
| [Piscataway, NJ], : IEEE Press | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
Semiconductor material and device characterization [[electronic resource] /] / Dieter K. Schroder
| Semiconductor material and device characterization [[electronic resource] /] / Dieter K. Schroder |
| Autore | Schroder Dieter K |
| Edizione | [3rd ed.] |
| Pubbl/distr/stampa | [Piscataway, NJ], : IEEE Press |
| Descrizione fisica | 1 online resource (799 p.) |
| Disciplina | 621.3815/2 |
| Soggetto topico |
Semiconductors
Semiconductors - Testing |
| ISBN |
1-280-65470-8
9786610654703 0-470-36250-2 0-471-74909-5 0-471-74908-7 |
| Classificazione |
549.8
621.3815/2 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | Resistivity -- Carrier and doping density -- Contact resistance and Schottky barriers -- Series resistance, channel length and width, and threshold voltage -- Defects -- Oxide and interface trapped charges, oxide thickness -- Carrier lifetimes -- Mobility -- Charge-based and probe characterization -- Optical characterization -- Chemical and physical characterization -- Reliability and failure analysis. |
| Record Nr. | UNINA-9910830976103321 |
|
Schroder Dieter K
|
||
| [Piscataway, NJ], : IEEE Press | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Semiconductor material and device characterization / / Dieter K. Schroder
| Semiconductor material and device characterization / / Dieter K. Schroder |
| Autore | Schroder Dieter K |
| Edizione | [3rd ed.] |
| Pubbl/distr/stampa | [Piscataway, NJ], : IEEE Press |
| Descrizione fisica | 1 online resource (799 p.) |
| Disciplina | 621.3815/2 |
| Soggetto topico |
Semiconductors
Semiconductors - Testing |
| ISBN |
1-280-65470-8
9786610654703 0-470-36250-2 0-471-74909-5 0-471-74908-7 |
| Classificazione |
549.8
621.3815/2 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | Resistivity -- Carrier and doping density -- Contact resistance and Schottky barriers -- Series resistance, channel length and width, and threshold voltage -- Defects -- Oxide and interface trapped charges, oxide thickness -- Carrier lifetimes -- Mobility -- Charge-based and probe characterization -- Optical characterization -- Chemical and physical characterization -- Reliability and failure analysis. |
| Record Nr. | UNINA-9910877632003321 |
|
Schroder Dieter K
|
||
| [Piscataway, NJ], : IEEE Press | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||