Info
- Utilizzare la checkbox di selezione a fianco di ciascun documento per attivare le funzionalità di stampa, invio email, download nei formati disponibili del (i) record.
X-ray characterization of materials [[electronic resource] /] / Eric Lifshin (ed.)
| X-ray characterization of materials [[electronic resource] /] / Eric Lifshin (ed.) |
| Pubbl/distr/stampa | Weinheim ; ; New York, : Wiley-VCH, 1999 |
| Descrizione fisica | 1 online resource (280 p.) |
| Disciplina |
620.11272
778.33 |
| Altri autori (Persone) | LifshinEric |
| Soggetto topico |
X-ray spectroscopy
Materials - Analysis Surfaces (Technology) - Analysis X-rays - Industrial applications |
| Soggetto genere / forma | Electronic books. |
| ISBN |
1-281-76425-6
9786611764258 3-527-61374-9 3-527-61375-7 |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | X-ray Characterization of Materials; Contents; List of Symbols and Abbreviations.; 1 X-Ray Diffraction; 2 Application of Synchrotron X-Radiation to Problems in Materials Science; 3 X-Ray Fluorescence Analysis; 4 Small-Angle Scattering of X-Rays and Neutrons; Index |
| Record Nr. | UNINA-9910144722403321 |
| Weinheim ; ; New York, : Wiley-VCH, 1999 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
X-ray characterization of materials [[electronic resource] /] / Eric Lifshin (ed.)
| X-ray characterization of materials [[electronic resource] /] / Eric Lifshin (ed.) |
| Pubbl/distr/stampa | Weinheim ; ; New York, : Wiley-VCH, 1999 |
| Descrizione fisica | 1 online resource (280 p.) |
| Disciplina |
620.11272
778.33 |
| Altri autori (Persone) | LifshinEric |
| Soggetto topico |
X-ray spectroscopy
Materials - Analysis Surfaces (Technology) - Analysis X-rays - Industrial applications |
| ISBN |
1-281-76425-6
9786611764258 3-527-61374-9 3-527-61375-7 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | X-ray Characterization of Materials; Contents; List of Symbols and Abbreviations.; 1 X-Ray Diffraction; 2 Application of Synchrotron X-Radiation to Problems in Materials Science; 3 X-Ray Fluorescence Analysis; 4 Small-Angle Scattering of X-Rays and Neutrons; Index |
| Record Nr. | UNINA-9910831178403321 |
| Weinheim ; ; New York, : Wiley-VCH, 1999 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
X-ray characterization of materials [[electronic resource] /] / Eric Lifshin (ed.)
| X-ray characterization of materials [[electronic resource] /] / Eric Lifshin (ed.) |
| Pubbl/distr/stampa | Weinheim ; ; New York, : Wiley-VCH, 1999 |
| Descrizione fisica | 1 online resource (280 p.) |
| Disciplina |
620.11272
778.33 |
| Altri autori (Persone) | LifshinEric |
| Soggetto topico |
X-ray spectroscopy
Materials - Analysis Surfaces (Technology) - Analysis X-rays - Industrial applications |
| ISBN |
1-281-76425-6
9786611764258 3-527-61374-9 3-527-61375-7 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | X-ray Characterization of Materials; Contents; List of Symbols and Abbreviations.; 1 X-Ray Diffraction; 2 Application of Synchrotron X-Radiation to Problems in Materials Science; 3 X-Ray Fluorescence Analysis; 4 Small-Angle Scattering of X-Rays and Neutrons; Index |
| Record Nr. | UNINA-9910840599703321 |
| Weinheim ; ; New York, : Wiley-VCH, 1999 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||