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Test Generation of Crosstalk Delay Faults in VLSI Circuits / / by S. Jayanthy, M.C. Bhuvaneswari
| Test Generation of Crosstalk Delay Faults in VLSI Circuits / / by S. Jayanthy, M.C. Bhuvaneswari |
| Autore | Jayanthy S |
| Edizione | [1st ed. 2019.] |
| Pubbl/distr/stampa | Singapore : , : Springer Singapore : , : Imprint : Springer, , 2019 |
| Descrizione fisica | 1 online resource (161 pages) |
| Disciplina | 621.3950287 |
| Soggetto topico |
Electronic circuits
Microprogramming Computer software—Reusability Logic design Circuits and Systems Control Structures and Microprogramming Performance and Reliability Logic Design |
| ISBN | 981-13-2493-X |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | Chapter 1. Background and Review of Crosstalk Delay Fault Models and the Crosstalk Effects -- Chapter 2. Review of Test Generation Techniques for Crosstalk Delay Faults -- Chapter 3. An Automatic Test Pattern Generation Method for Crosstalk Delay Faults Using Modified PODEM and FAN Algorithm -- Chapter 4. An Automatic Test Pattern Generation Method for Crosstalk Delay Faults using Single-Objective Genetic Algorithm -- Chapter 5. An Automatic Test Pattern Generation Method for Crosstalk Delay Faults Using Single-Objective Particle Swarm Optimization -- Chapter 6. Simulation of Asynchronous Sequential Circuits using Fuzzy Delay Model -- Chapter 7. Simulation Based Test Generation for Crosstalk Delay Faults in Asynchronous Sequential Circuits. |
| Record Nr. | UNINA-9910350312403321 |
Jayanthy S
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| Singapore : , : Springer Singapore : , : Imprint : Springer, , 2019 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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VLSI Test Symposium (VTS 2000): 18th IEEE
| VLSI Test Symposium (VTS 2000): 18th IEEE |
| Pubbl/distr/stampa | [Place of publication not identified], : IEEE Computer Society Press, 2000 |
| Descrizione fisica | 1 online resource (478 pages) : illustrations |
| Disciplina | 621.3950287 |
| Soggetto topico | Integrated circuits - Very large scale integration - Testing |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | Foreword -- Organizing Committee -- Steering Committe -- Program Committee -- Reviewers -- VTS '99 Best Paper Award -- VTS '99 Best Panel Award -- Test Technology Technical Council -- Test Technology Education Program: Overview Tutorials -- Plenary Session -- Welcome Message -- Adit Singh -- Keynote Address: "Optical Internet: Industry Challenge" -- Brian McFadden -- Program Introduction -- Joan Figueras -- Invited Presentation: "Wall Street Perspective on System-on-Chip and Test Technology" -- Erach D. Desai. |
| Record Nr. | UNISA-996218755803316 |
| [Place of publication not identified], : IEEE Computer Society Press, 2000 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
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VLSI Test Symposium (VTS 2000): 18th IEEE
| VLSI Test Symposium (VTS 2000): 18th IEEE |
| Pubbl/distr/stampa | [Place of publication not identified], : IEEE Computer Society Press, 2000 |
| Descrizione fisica | 1 online resource (478 pages) : illustrations |
| Disciplina | 621.3950287 |
| Soggetto topico | Integrated circuits - Very large scale integration - Testing |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | Foreword -- Organizing Committee -- Steering Committe -- Program Committee -- Reviewers -- VTS '99 Best Paper Award -- VTS '99 Best Panel Award -- Test Technology Technical Council -- Test Technology Education Program: Overview Tutorials -- Plenary Session -- Welcome Message -- Adit Singh -- Keynote Address: "Optical Internet: Industry Challenge" -- Brian McFadden -- Program Introduction -- Joan Figueras -- Invited Presentation: "Wall Street Perspective on System-on-Chip and Test Technology" -- Erach D. Desai. |
| Record Nr. | UNINA-9910872661203321 |
| [Place of publication not identified], : IEEE Computer Society Press, 2000 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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