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2005 IEEE International Workshop on Memory Technology, Design and Testing : MTDT 2005 : 3-5 August, 2005, Taipei, Taiwan
2005 IEEE International Workshop on Memory Technology, Design and Testing : MTDT 2005 : 3-5 August, 2005, Taipei, Taiwan
Pubbl/distr/stampa [Place of publication not identified], : IEEE Computer Society, 2005
Disciplina 621.39/732
Soggetto topico Semiconductor storage devices - Testing
Random access memory
Electrical & Computer Engineering
Engineering & Applied Sciences
Electrical Engineering
ISBN 1-5386-0323-3
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNISA-996206157703316
[Place of publication not identified], : IEEE Computer Society, 2005
Materiale a stampa
Lo trovi qui: Univ. di Salerno
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2005 IEEE International Workshop on Memory Technology, Design and Testing : MTDT 2005 : 3-5 August, 2005, Taipei, Taiwan
2005 IEEE International Workshop on Memory Technology, Design and Testing : MTDT 2005 : 3-5 August, 2005, Taipei, Taiwan
Pubbl/distr/stampa [Place of publication not identified], : IEEE Computer Society, 2005
Disciplina 621.39/732
Soggetto topico Semiconductor storage devices - Testing
Random access memory
Electrical & Computer Engineering
Engineering & Applied Sciences
Electrical Engineering
ISBN 1-5386-0323-3
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNINA-9910142332303321
[Place of publication not identified], : IEEE Computer Society, 2005
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
2006 IEEE International Workshop on Memory Technology, Design, and Testing : 2-4 August 2006, Taipei, Taiwan : proceedings
2006 IEEE International Workshop on Memory Technology, Design, and Testing : 2-4 August 2006, Taipei, Taiwan : proceedings
Pubbl/distr/stampa [Place of publication not identified], : IEEE Computer Society, 2006
Disciplina 621.39/732
Soggetto topico Semiconductor storage devices - Testing
Random access memory
Electrical & Computer Engineering
Engineering & Applied Sciences
Electrical Engineering
ISBN 1-5090-9829-1
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNISA-996197570903316
[Place of publication not identified], : IEEE Computer Society, 2006
Materiale a stampa
Lo trovi qui: Univ. di Salerno
Opac: Controlla la disponibilità qui
2006 IEEE International Workshop on Memory Technology, Design, and Testing : 2-4 August 2006, Taipei, Taiwan : proceedings
2006 IEEE International Workshop on Memory Technology, Design, and Testing : 2-4 August 2006, Taipei, Taiwan : proceedings
Pubbl/distr/stampa [Place of publication not identified], : IEEE Computer Society, 2006
Disciplina 621.39/732
Soggetto topico Semiconductor storage devices - Testing
Random access memory
Electrical & Computer Engineering
Engineering & Applied Sciences
Electrical Engineering
ISBN 1-5090-9829-1
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNINA-9910145618003321
[Place of publication not identified], : IEEE Computer Society, 2006
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
2013 13th Non-Volatile Memory Technology Symposium (NVMTS 2013) : Minneapolis, Minnesota, USA, 12-14 August 2013
2013 13th Non-Volatile Memory Technology Symposium (NVMTS 2013) : Minneapolis, Minnesota, USA, 12-14 August 2013
Pubbl/distr/stampa IEEE
Disciplina 621.39/732
Soggetto topico Computer storage devices
Computer engineering
Flash memories (Computers)
Optical storage devices
ISBN 1-4799-4110-7
1-4799-4109-3
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Altri titoli varianti 2013 13th Non-Volatile Memory Technology Symposium
Non-Volatile Memory Technology Symposium
Record Nr. UNISA-996279821603316
IEEE
Materiale a stampa
Lo trovi qui: Univ. di Salerno
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2013 13th Non-Volatile Memory Technology Symposium (NVMTS 2013) : Minneapolis, Minnesota, USA, 12-14 August 2013
2013 13th Non-Volatile Memory Technology Symposium (NVMTS 2013) : Minneapolis, Minnesota, USA, 12-14 August 2013
Pubbl/distr/stampa IEEE
Disciplina 621.39/732
Soggetto topico Computer storage devices
Computer engineering
Flash memories (Computers)
Optical storage devices
ISBN 1-4799-4110-7
1-4799-4109-3
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Altri titoli varianti 2013 13th Non-Volatile Memory Technology Symposium
Non-Volatile Memory Technology Symposium
Record Nr. UNINA-9910135181503321
IEEE
Materiale a stampa
Lo trovi qui: Univ. Federico II
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22nd IEEE Non-Volatile Semiconductor Memory Workshop : proceedings : August 26th-30th, 2007, Monterey, California / / IEEE, Electron Devices Society
22nd IEEE Non-Volatile Semiconductor Memory Workshop : proceedings : August 26th-30th, 2007, Monterey, California / / IEEE, Electron Devices Society
Pubbl/distr/stampa IEEE
Disciplina 621.39/732
Soggetto topico Semiconductor storage devices
Flash memories (Computers)
ISBN 1-5090-8337-5
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Altri titoli varianti 2007 22nd IEEE Non-Volatile Semiconductor Memory Workshop
Data Mining
Record Nr. UNISA-996280935103316
IEEE
Materiale a stampa
Lo trovi qui: Univ. di Salerno
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22nd IEEE Non-Volatile Semiconductor Memory Workshop : proceedings : August 26th-30th, 2007, Monterey, California / / IEEE, Electron Devices Society
22nd IEEE Non-Volatile Semiconductor Memory Workshop : proceedings : August 26th-30th, 2007, Monterey, California / / IEEE, Electron Devices Society
Pubbl/distr/stampa IEEE
Disciplina 621.39/732
Soggetto topico Semiconductor storage devices
Flash memories (Computers)
ISBN 1-5090-8337-5
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Altri titoli varianti 2007 22nd IEEE Non-Volatile Semiconductor Memory Workshop
Data Mining
Record Nr. UNINA-9910143017203321
IEEE
Materiale a stampa
Lo trovi qui: Univ. Federico II
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CMOS : circuit design, layout, and simulation / / R. Jacob Baker
CMOS : circuit design, layout, and simulation / / R. Jacob Baker
Autore Baker R. Jacob <1964->
Edizione [Third edition]
Pubbl/distr/stampa Hoboken, NJ, : John Wiley & Sons, Inc., [2010]
Descrizione fisica 1 online resource (1214 pages)
Disciplina 621.3815
621.39/732
Collana IEEE Press series on microelectronic systems
Soggetto topico Metal oxide semiconductors, Complementary - Design and construction
Integrated circuits - Design and construction
Metal oxide semiconductor field-effect transistors
Metall-òxid-semiconductors complementaris - Disseny i construcció
Circuits integrats
Transistors MOSFET
ISBN 9780470891179
1-118-03823-1
1-283-37262-2
9786613372628
0-470-89117-3
0-470-89116-5
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto CMOS Circuit Design, Layout, and Simulation; Contents; Preface; Chapter 1 Introduction to CMOS Design; Chapter 2 The Well; Chapter 3 The Metal Layers; Chapter 4 The Active and Poly Layers; Chapter 5 Resistors, Capacitors, MOSFETs; Chapter 6 MOSFET Operation; Chapter 7 CMOS Fabrication; Chapter 8 Electrical Noise: An Overview; Chapter 9 Models for Analog Design; Chapter 10 Models for Digital Design; Chapter 11 The Inverter; Chapter 12 Static Logic Gates; Chapter 13 Clocked Circuits; Chapter 14 Dynamic Logic Gates; Chapter 15 VLSI Layout Examples; Chapter 16 Memory Circuits
Chapter 17 Sensing Using ?S ModulationChapter 18 Special Purpose CMOS Circuits; Chapter 19 Digital Phase-Locked Loops; Chapter 20 Current Mirrors; Chapter 21 Amplifiers; Chapter 22 Differential Amplifiers; Chapter 23 Voltage References; Chapter 24 Operational Amplifiers I; Chapter 25 Dynamic Analog Circuits; Chapter 26 Operational Amplifiers II; Chapter 27 Nonlinear Analog Circuits; Chapter 28 Data Converter Fundamentals; Chapter 29 Data Converter Architectures; Chapter 30 Implementing Data Converters; Chapter 31 Feedback Amplifiers; Index; About the Author
Record Nr. UNINA-9910140906703321
Baker R. Jacob <1964->  
Hoboken, NJ, : John Wiley & Sons, Inc., [2010]
Materiale a stampa
Lo trovi qui: Univ. Federico II
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CMOS circuit design for RF sensors
CMOS circuit design for RF sensors
Autore Gudnason Gunnar
Pubbl/distr/stampa Boston, MA : , : Springer US, , 2002
Descrizione fisica 1 online resource (VII, 176 p.)
Disciplina 621.39/732
Collana The Kluwer international series in engineering and computer science CMOS circuit design for RF sensors
Soggetto topico Detectors - Design and construction
Electronic circuit design - Power supply
Metal oxide semiconductors, Complementary - Design and construction
Very high speed integrated circuits
Electrical & Computer Engineering
Engineering & Applied Sciences
Electrical Engineering
ISBN 1-280-20015-4
9786610200153
0-306-47528-6
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto Link Design -- Receivers -- Power Supply Management -- Reference Circuits -- Case Studies.
Record Nr. UNINA-9910450618803321
Gudnason Gunnar  
Boston, MA : , : Springer US, , 2002
Materiale a stampa
Lo trovi qui: Univ. Federico II
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