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1998 IEEE International Workshop on IDDQ Testing : proceedings : November 12-13, 1998, San Jose, California
| 1998 IEEE International Workshop on IDDQ Testing : proceedings : November 12-13, 1998, San Jose, California |
| Pubbl/distr/stampa | [Place of publication not identified], : IEEE Computer Society Press, 1998 |
| Disciplina | 621.39/5/0287 |
| Soggetto topico |
Iddq testing - Congresses
Metal oxide semiconductors, Complementary - Testing Electrical & Computer Engineering Electrical Engineering Engineering & Applied Sciences |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996211376603316 |
| [Place of publication not identified], : IEEE Computer Society Press, 1998 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
1998 IEEE International Workshop on IDDQ Testing : proceedings : November 12-13, 1998, San Jose, California
| 1998 IEEE International Workshop on IDDQ Testing : proceedings : November 12-13, 1998, San Jose, California |
| Pubbl/distr/stampa | [Place of publication not identified], : IEEE Computer Society Press, 1998 |
| Disciplina | 621.39/5/0287 |
| Soggetto topico |
Iddq testing - Congresses
Metal oxide semiconductors, Complementary - Testing Electrical & Computer Engineering Electrical Engineering Engineering & Applied Sciences |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910872838803321 |
| [Place of publication not identified], : IEEE Computer Society Press, 1998 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Energy-efficient fault-tolerant systems / / Jimson Mathew, Rishad A. Shafik, Dhiraj K. Pradhan, editors
| Energy-efficient fault-tolerant systems / / Jimson Mathew, Rishad A. Shafik, Dhiraj K. Pradhan, editors |
| Autore | Mathew Jimson |
| Edizione | [1st ed. 2014.] |
| Pubbl/distr/stampa | New York : , : Springer, , 2014 |
| Descrizione fisica | 1 online resource (xiv, 335 pages) : illustrations (some color) |
| Disciplina |
006.22
621.39/5/0287 |
| Collana | Embedded Systems |
| Soggetto topico | Integrated circuits - Fault tolerance |
| ISBN | 1-4614-4193-5 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | Evolution of Fault Tolerant Design -- Fault and Reliability Models -- Energy Efficient Design Techniques -- Error Correction Coding -- System-level Reliable Design -- Fault Tolerant -- Finite Field Arithmetic Circuit Design and Testing Techniques -- Reliable Network-on-Chip Architectures -- Energy Efficient Reconfigurable Systems -- Bio-Inspired Online Fault Detection in NoC Interconnect -- Fault-tolerant dynamically reconfigurable NoC-based SoC. |
| Record Nr. | UNINA-9910299744903321 |
Mathew Jimson
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| New York : , : Springer, , 2014 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
IEEE International Workshop on IDDQ Testing : digest of papers, November 5-6, 1997, Washington, D.C
| IEEE International Workshop on IDDQ Testing : digest of papers, November 5-6, 1997, Washington, D.C |
| Pubbl/distr/stampa | [Place of publication not identified], : IEEE Computer Society Press, 1997 |
| Disciplina | 621.39/5/0287 |
| Soggetto topico |
Iddq testing - Congresses
Metal oxide semiconductors, Complementary - Testing - Congresses Electrical & Computer Engineering Engineering & Applied Sciences Electrical Engineering |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996204511703316 |
| [Place of publication not identified], : IEEE Computer Society Press, 1997 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
IEEE International Workshop on IDDQ Testing : digest of papers, November 5-6, 1997, Washington, D.C
| IEEE International Workshop on IDDQ Testing : digest of papers, November 5-6, 1997, Washington, D.C |
| Pubbl/distr/stampa | [Place of publication not identified], : IEEE Computer Society Press, 1997 |
| Disciplina | 621.39/5/0287 |
| Soggetto topico |
Iddq testing - Congresses
Metal oxide semiconductors, Complementary - Testing - Congresses Electrical & Computer Engineering Engineering & Applied Sciences Electrical Engineering |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910872626003321 |
| [Place of publication not identified], : IEEE Computer Society Press, 1997 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||