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Standard test interface language (STIL) for digital test vector data
| Standard test interface language (STIL) for digital test vector data |
| Pubbl/distr/stampa | New York : , : IEEE, , 2007 |
| Descrizione fisica | 1 online resource (148 pages) |
| Disciplina | 621.38150287 |
| Soggetto topico | Integrated circuits - Testing - Standards |
| ISBN | 0-7381-5721-X |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996279341703316 |
| New York : , : IEEE, , 2007 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
Standard test interface language (STIL) for digital test vector data
| Standard test interface language (STIL) for digital test vector data |
| Pubbl/distr/stampa | New York : , : IEEE, , 2007 |
| Descrizione fisica | 1 online resource (148 pages) |
| Disciplina | 621.38150287 |
| Soggetto topico | Integrated circuits - Testing - Standards |
| ISBN | 0-7381-5721-X |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910141756403321 |
| New York : , : IEEE, , 2007 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Test and diagnosis of analogue, mixed-signal and RF integrated circuits : the system on chip approach / / edited by Yichuang Sun
| Test and diagnosis of analogue, mixed-signal and RF integrated circuits : the system on chip approach / / edited by Yichuang Sun |
| Pubbl/distr/stampa | London, : Institution of Engineering and Technology, 2008 |
| Descrizione fisica | 1 online resource (411 p.) |
| Disciplina | 621.38150287 |
| Altri autori (Persone) | SunYichuang |
| Collana | Circuits, devices and systems series |
| Soggetto topico |
Linear integrated circuits - Testing
Mixed signal circuits - Testing Radio frequency integrated circuits - Testing |
| ISBN |
1-281-97130-8
9786611971304 1-61583-315-3 0-86341-999-2 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
Contents; Preface; List of contributors; 1 Fault diagnosis of linear and non-linear analogue circuits; 2 Symbolic function approaches for analogue fault diagnosis 37Stefano Manetti and Maria Cristina Piccirilli; 3 Neural-network-based approaches for analogue circuit faultdiagnosis; 4 Hierarchical/decomposition techniques for large-scale analoguediagnosis; 5 DFT and BIST techniques for analogue and mixed-signal test; 6 Design-for-testability of analogue filters; 7 Test of A/D converters: From converter characteristics to built-inself-test proposals; 8 Test of Sigma Delta converters
9 Phase-locked loop test methodologies: Current characterization and production test practices10 On-chip testing techniques for RF wireless transceiver systemsand components; 11 Tuning and calibration of analogue, mixed-signal and RF circuits; Index |
| Record Nr. | UNINA-9911006603503321 |
| London, : Institution of Engineering and Technology, 2008 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||