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12th IEEE International Conference on Advanced Thermal Processing of Semiconductors : RTP 2004 : September 28-30, 2004, Hilton Portland & Executive Tower, Portland, OR
| 12th IEEE International Conference on Advanced Thermal Processing of Semiconductors : RTP 2004 : September 28-30, 2004, Hilton Portland & Executive Tower, Portland, OR |
| Pubbl/distr/stampa | [Place of publication not identified], : IEEE, 2004 |
| Disciplina | 621.3815/2 |
| Soggetto topico |
Semiconductors - Heat treatment
Rapid thermal processing - Defects Semiconductor doping Semiconductors Electrical Engineering Electrical & Computer Engineering Engineering & Applied Sciences |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996202108703316 |
| [Place of publication not identified], : IEEE, 2004 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
12th IEEE International Conference on Advanced Thermal Processing of Semiconductors : RTP 2004 : September 28-30, 2004, Hilton Portland & Executive Tower, Portland, OR
| 12th IEEE International Conference on Advanced Thermal Processing of Semiconductors : RTP 2004 : September 28-30, 2004, Hilton Portland & Executive Tower, Portland, OR |
| Pubbl/distr/stampa | [Place of publication not identified], : IEEE, 2004 |
| Disciplina | 621.3815/2 |
| Soggetto topico |
Semiconductors - Heat treatment
Rapid thermal processing - Defects Semiconductor doping Semiconductors Electrical Engineering Electrical & Computer Engineering Engineering & Applied Sciences |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910872550103321 |
| [Place of publication not identified], : IEEE, 2004 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
15th IEEE International Conference on Advanced Thermal Processing of Semiconductors--RTP 2007 : October 2-5, 2007, Grand Hotel Baia Verde, Catania, Italy / / IEEE Electron Devices Society
| 15th IEEE International Conference on Advanced Thermal Processing of Semiconductors--RTP 2007 : October 2-5, 2007, Grand Hotel Baia Verde, Catania, Italy / / IEEE Electron Devices Society |
| Pubbl/distr/stampa | IEEE |
| Disciplina | 621.3815/2 |
| Soggetto topico |
Semiconductors - Heat treatment
Rapid thermal processing Semiconductor doping Semiconductors - Defects |
| ISBN | 1-5090-8215-8 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti |
2007 15th International Conference on Advanced Thermal Processing of Semiconductors
Computer and Automation Engineering |
| Record Nr. | UNISA-996279733003316 |
| IEEE | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
15th IEEE International Conference on Advanced Thermal Processing of Semiconductors--RTP 2007 : October 2-5, 2007, Grand Hotel Baia Verde, Catania, Italy / / IEEE Electron Devices Society
| 15th IEEE International Conference on Advanced Thermal Processing of Semiconductors--RTP 2007 : October 2-5, 2007, Grand Hotel Baia Verde, Catania, Italy / / IEEE Electron Devices Society |
| Pubbl/distr/stampa | IEEE |
| Disciplina | 621.3815/2 |
| Soggetto topico |
Semiconductors - Heat treatment
Rapid thermal processing Semiconductor doping Semiconductors - Defects |
| ISBN |
9781509082155
1509082158 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti |
2007 15th International Conference on Advanced Thermal Processing of Semiconductors
Computer and Automation Engineering |
| Record Nr. | UNINA-9910143021203321 |
| IEEE | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
1994 International Integrated Reliability Workshop final report : Stanford Sierra Camp, Lake Tahoe, California, October 16-19, 1994
| 1994 International Integrated Reliability Workshop final report : Stanford Sierra Camp, Lake Tahoe, California, October 16-19, 1994 |
| Pubbl/distr/stampa | [Place of publication not identified], : IEEE Electron Devices Society, 1994 |
| Disciplina | 621.3815/2 |
| Soggetto topico |
Integrated circuits - Reliability - Congresses
Integrated circuits - Reliability - Congresses - Wafer scale integration Electrical & Computer Engineering Engineering & Applied Sciences Electrical Engineering |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996214351703316 |
| [Place of publication not identified], : IEEE Electron Devices Society, 1994 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
1994 International Integrated Reliability Workshop final report : Stanford Sierra Camp, Lake Tahoe, California, October 16-19, 1994
| 1994 International Integrated Reliability Workshop final report : Stanford Sierra Camp, Lake Tahoe, California, October 16-19, 1994 |
| Pubbl/distr/stampa | [Place of publication not identified], : IEEE Electron Devices Society, 1994 |
| Disciplina | 621.3815/2 |
| Soggetto topico |
Integrated circuits - Reliability - Congresses
Integrated circuits - Reliability - Congresses - Wafer scale integration Electrical & Computer Engineering Engineering & Applied Sciences Electrical Engineering |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910872753003321 |
| [Place of publication not identified], : IEEE Electron Devices Society, 1994 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
1996 1st International Symposium on Plasma Process-Induced Damage : 13-14 May 1996, Santa Clara, California, USA
| 1996 1st International Symposium on Plasma Process-Induced Damage : 13-14 May 1996, Santa Clara, California, USA |
| Pubbl/distr/stampa | [Place of publication not identified], : Northern California Chapter of the American Vacuum Society, 1996 |
| Disciplina | 621.3815/2 |
| Soggetto topico |
Semiconductor wafers - Congresses
Semiconductors - Congresses - Effect of radiation on Plasma radiation - Congresses Electrical & Computer Engineering Electrical Engineering Engineering & Applied Sciences |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996206561303316 |
| [Place of publication not identified], : Northern California Chapter of the American Vacuum Society, 1996 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
1996 1st International Symposium on Plasma Process-Induced Damage : 13-14 May 1996, Santa Clara, California, USA
| 1996 1st International Symposium on Plasma Process-Induced Damage : 13-14 May 1996, Santa Clara, California, USA |
| Pubbl/distr/stampa | [Place of publication not identified], : Northern California Chapter of the American Vacuum Society, 1996 |
| Disciplina | 621.3815/2 |
| Soggetto topico |
Semiconductor wafers
Semiconductors - Effect of radiation on Plasma radiation - Congresses Electrical & Computer Engineering Electrical Engineering Engineering & Applied Sciences |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910872918203321 |
| [Place of publication not identified], : Northern California Chapter of the American Vacuum Society, 1996 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
1996 IEEE Hong Kong Electron Devices Meeting : proceedings, 29 June 1996, the Hong Kong Polytechnic University
| 1996 IEEE Hong Kong Electron Devices Meeting : proceedings, 29 June 1996, the Hong Kong Polytechnic University |
| Pubbl/distr/stampa | [Place of publication not identified], : Institute of Electrical and Electronics Engineers, 1996 |
| Disciplina | 621.3815/2 |
| Soggetto topico |
Semiconductors - Congresses
Silicon-on-insulator technology - Congresses Transistors - Congresses Detectors - Congresses Electrical & Computer Engineering Electrical Engineering Engineering & Applied Sciences |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996203723903316 |
| [Place of publication not identified], : Institute of Electrical and Electronics Engineers, 1996 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
1996 IEEE Hong Kong Electron Devices Meeting : proceedings, 29 June 1996, the Hong Kong Polytechnic University
| 1996 IEEE Hong Kong Electron Devices Meeting : proceedings, 29 June 1996, the Hong Kong Polytechnic University |
| Pubbl/distr/stampa | [Place of publication not identified], : Institute of Electrical and Electronics Engineers, 1996 |
| Disciplina | 621.3815/2 |
| Soggetto topico |
Semiconductors
Silicon-on-insulator technology Transistors - Congresses Detectors Electrical & Computer Engineering Electrical Engineering Engineering & Applied Sciences |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910872778603321 |
| [Place of publication not identified], : Institute of Electrical and Electronics Engineers, 1996 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
