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1036-2020 - IEEE guide for the application of shunt power capacitors / / IEEE
| 1036-2020 - IEEE guide for the application of shunt power capacitors / / IEEE |
| Pubbl/distr/stampa | [Place of publication not identified] : , : IEEE, , 2021 |
| Descrizione fisica | 1 online resource |
| Disciplina | 621.315 |
| Soggetto topico |
Capacitors
Electrical engineering |
| ISBN | 1-5044-6566-0 |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996574638003316 |
| [Place of publication not identified] : , : IEEE, , 2021 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
1036-2020 - IEEE guide for the application of shunt power capacitors / / IEEE
| 1036-2020 - IEEE guide for the application of shunt power capacitors / / IEEE |
| Pubbl/distr/stampa | [Place of publication not identified] : , : IEEE, , 2021 |
| Descrizione fisica | 1 online resource |
| Disciplina | 621.315 |
| Soggetto topico |
Capacitors
Electrical engineering |
| ISBN | 1-5044-6566-0 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910444459303321 |
| [Place of publication not identified] : , : IEEE, , 2021 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Advanced electrical and electronics materials : processes and applications / / K. M. Gupta and Nishu Gupta ; cover design by Russell Richardson
| Advanced electrical and electronics materials : processes and applications / / K. M. Gupta and Nishu Gupta ; cover design by Russell Richardson |
| Autore | Gupta K. M. |
| Pubbl/distr/stampa | Hoboken, New Jersey : , : Scrivener Publishing, , 2015 |
| Descrizione fisica | 1 online resource (1140 p.) |
| Disciplina | 621.315 |
| Collana | Advanced Material Series |
| Soggetto topico |
Capacitors
Electric resistors Electronics - Materials |
| ISBN |
1-118-99857-X
1-118-99856-1 1-118-99858-8 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
Cover; Half Title page; Title page; Copyright page; Dedication; Preface; Acknowledgement; About the Authors; Abbreviations; Chapter 1: General Introduction to Electrical and Electronic Materials; 1.1 Importance of Materials; 1.2 Importance of Electrical and Electronic Materials; 1.3 Classification of Electrical and Electronic Materials; 1.4 Scope of Electrical and Electronic Materials; 1.5 Requirements of Engineering Materials; 1.6 Operational Requirements of Electrical and Electronic Materials; 1.7 Classification of Solids on the Basis of Energy Gap
1.8 Glimpse of Some Electronic Products, Their Working Principles and Choicest Materials1.9 Different Types of Engineering Materials; 1.10 Different Levels of Materials Structure; 1.11 Spintronics (The Electronics of Tomorrow) and Spintronic Materials; 1.12 Ferromagnetic Semiconductor; 1.13 Left-Handed (LH) Materials; 1.14 Solved Examples; Chapter 2: Atomic Models, Bonding in Solids, Crystal Geometry, and Miller Indices; 2.1 Atomic Models; 2.2 Bohr's Quantum Atomic Model; 2.3 Modern Concept of Atomic Model; 2.4 Electron Configuration; 2.5 Meaning of Chemical (or Atomic) Bonding 2.6 Classification of Chemical Bonds2.7 Ionic Bond; 2.8 Covalent Bonds; 2.9 Monocrystalline and Polycrystalline Crystal Structures; 2.10 Space Lattice; 2.11 Basis; 2.12 Unit Cell and Crystal; 2.13 Bravais Crystal System; 2.14 Primitive and Non-Primitive Unit Cells; 2.15 Coordination Number; 2.16 Atomic Packing Fraction; 2.17 Calculation of Density (or Bulk Density); 2.18 Miller Indices; 2.19 Interplaner Spacing; 2.20 Linear Density; 2.21 Planer Density; Chapter 3: Solid Structures, Characterization of Materials, Crystal Imperfections, and Mechanical Properties of Materials 3.1 Crystallography3.2 Crystalline and Non-Crystalline Structures; 3.3 Hexagonally Closed Packed Structure (HCP); 3.4 VOIDS; 3.5 Covalent Solids; 3.6 Bragg's Law of X-Rays Diffraction; 3.7 Structure Determination; 3.8 Microscopy; 3.9 Different Types of Metallurgical Microscopes and Their Features; 3.10 Working Principle of Electron Microscope; 3.11 Ideal and Real Crystals, and Imperfections; 3.12 Classification of Imperfections; 3.13 Point Imperfections; 3.14 Effects of Point Imperfections; 3.15 Line Imperfections; 3.16 Features of Edge Dislocation; 3.17 Screw Dislocation 3.18 Characteristics of Dislocations3.19 Sources of Dislocations, Their Effects and Remedies; 3.20 Grain Boundary; 3.21 Twin or Twinning; 3.22 Mechanical Properties of Metals; Chapter 4: Conductive Materials: Electron Theories, Properties and Behaviour; 4.1 Electrons and Their Role in Conductivity; 4.2 Electron Theories of Solids; 4.3 Free Electron Theory; 4.4 Energy Band Theory; 4.5 Brillouin Zone Theory; 4.6 Conductors; 4.7 Factors Affecting Conductivity (and Resistivity) of Metals; 4.8 Thermal Conductivity; 4.9 Heating Effect of Current; 4.10 Thermoelectric Effect (or Thermoelectricity) 4.11 Seebeck Effect |
| Record Nr. | UNISA-996202316803316 |
Gupta K. M.
|
||
| Hoboken, New Jersey : , : Scrivener Publishing, , 2015 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
Advanced electrical and electronics materials : processes and applications / / K. M. Gupta and Nishu Gupta ; cover design by Russell Richardson
| Advanced electrical and electronics materials : processes and applications / / K. M. Gupta and Nishu Gupta ; cover design by Russell Richardson |
| Autore | Gupta K. M. |
| Pubbl/distr/stampa | Hoboken, New Jersey : , : Scrivener Publishing, , 2015 |
| Descrizione fisica | 1 online resource (1140 p.) |
| Disciplina | 621.315 |
| Collana | Advanced Material Series |
| Soggetto topico |
Capacitors
Electric resistors Electronics - Materials |
| ISBN |
1-118-99857-X
1-118-99856-1 1-118-99858-8 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
Cover; Half Title page; Title page; Copyright page; Dedication; Preface; Acknowledgement; About the Authors; Abbreviations; Chapter 1: General Introduction to Electrical and Electronic Materials; 1.1 Importance of Materials; 1.2 Importance of Electrical and Electronic Materials; 1.3 Classification of Electrical and Electronic Materials; 1.4 Scope of Electrical and Electronic Materials; 1.5 Requirements of Engineering Materials; 1.6 Operational Requirements of Electrical and Electronic Materials; 1.7 Classification of Solids on the Basis of Energy Gap
1.8 Glimpse of Some Electronic Products, Their Working Principles and Choicest Materials1.9 Different Types of Engineering Materials; 1.10 Different Levels of Materials Structure; 1.11 Spintronics (The Electronics of Tomorrow) and Spintronic Materials; 1.12 Ferromagnetic Semiconductor; 1.13 Left-Handed (LH) Materials; 1.14 Solved Examples; Chapter 2: Atomic Models, Bonding in Solids, Crystal Geometry, and Miller Indices; 2.1 Atomic Models; 2.2 Bohr's Quantum Atomic Model; 2.3 Modern Concept of Atomic Model; 2.4 Electron Configuration; 2.5 Meaning of Chemical (or Atomic) Bonding 2.6 Classification of Chemical Bonds2.7 Ionic Bond; 2.8 Covalent Bonds; 2.9 Monocrystalline and Polycrystalline Crystal Structures; 2.10 Space Lattice; 2.11 Basis; 2.12 Unit Cell and Crystal; 2.13 Bravais Crystal System; 2.14 Primitive and Non-Primitive Unit Cells; 2.15 Coordination Number; 2.16 Atomic Packing Fraction; 2.17 Calculation of Density (or Bulk Density); 2.18 Miller Indices; 2.19 Interplaner Spacing; 2.20 Linear Density; 2.21 Planer Density; Chapter 3: Solid Structures, Characterization of Materials, Crystal Imperfections, and Mechanical Properties of Materials 3.1 Crystallography3.2 Crystalline and Non-Crystalline Structures; 3.3 Hexagonally Closed Packed Structure (HCP); 3.4 VOIDS; 3.5 Covalent Solids; 3.6 Bragg's Law of X-Rays Diffraction; 3.7 Structure Determination; 3.8 Microscopy; 3.9 Different Types of Metallurgical Microscopes and Their Features; 3.10 Working Principle of Electron Microscope; 3.11 Ideal and Real Crystals, and Imperfections; 3.12 Classification of Imperfections; 3.13 Point Imperfections; 3.14 Effects of Point Imperfections; 3.15 Line Imperfections; 3.16 Features of Edge Dislocation; 3.17 Screw Dislocation 3.18 Characteristics of Dislocations3.19 Sources of Dislocations, Their Effects and Remedies; 3.20 Grain Boundary; 3.21 Twin or Twinning; 3.22 Mechanical Properties of Metals; Chapter 4: Conductive Materials: Electron Theories, Properties and Behaviour; 4.1 Electrons and Their Role in Conductivity; 4.2 Electron Theories of Solids; 4.3 Free Electron Theory; 4.4 Energy Band Theory; 4.5 Brillouin Zone Theory; 4.6 Conductors; 4.7 Factors Affecting Conductivity (and Resistivity) of Metals; 4.8 Thermal Conductivity; 4.9 Heating Effect of Current; 4.10 Thermoelectric Effect (or Thermoelectricity) 4.11 Seebeck Effect |
| Record Nr. | UNINA-9910132441103321 |
|
Gupta K. M.
|
||
| Hoboken, New Jersey : , : Scrivener Publishing, , 2015 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Advanced electrical and electronics materials : processes and applications / / K. M. Gupta and Nishu Gupta ; cover design by Russell Richardson
| Advanced electrical and electronics materials : processes and applications / / K. M. Gupta and Nishu Gupta ; cover design by Russell Richardson |
| Autore | Gupta K. M. |
| Pubbl/distr/stampa | Hoboken, New Jersey : , : Scrivener Publishing, , 2015 |
| Descrizione fisica | 1 online resource (1140 p.) |
| Disciplina | 621.315 |
| Collana | Advanced Material Series |
| Soggetto topico |
Capacitors
Electric resistors Electronics - Materials |
| ISBN |
1-118-99857-X
1-118-99856-1 1-118-99858-8 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
Cover; Half Title page; Title page; Copyright page; Dedication; Preface; Acknowledgement; About the Authors; Abbreviations; Chapter 1: General Introduction to Electrical and Electronic Materials; 1.1 Importance of Materials; 1.2 Importance of Electrical and Electronic Materials; 1.3 Classification of Electrical and Electronic Materials; 1.4 Scope of Electrical and Electronic Materials; 1.5 Requirements of Engineering Materials; 1.6 Operational Requirements of Electrical and Electronic Materials; 1.7 Classification of Solids on the Basis of Energy Gap
1.8 Glimpse of Some Electronic Products, Their Working Principles and Choicest Materials1.9 Different Types of Engineering Materials; 1.10 Different Levels of Materials Structure; 1.11 Spintronics (The Electronics of Tomorrow) and Spintronic Materials; 1.12 Ferromagnetic Semiconductor; 1.13 Left-Handed (LH) Materials; 1.14 Solved Examples; Chapter 2: Atomic Models, Bonding in Solids, Crystal Geometry, and Miller Indices; 2.1 Atomic Models; 2.2 Bohr's Quantum Atomic Model; 2.3 Modern Concept of Atomic Model; 2.4 Electron Configuration; 2.5 Meaning of Chemical (or Atomic) Bonding 2.6 Classification of Chemical Bonds2.7 Ionic Bond; 2.8 Covalent Bonds; 2.9 Monocrystalline and Polycrystalline Crystal Structures; 2.10 Space Lattice; 2.11 Basis; 2.12 Unit Cell and Crystal; 2.13 Bravais Crystal System; 2.14 Primitive and Non-Primitive Unit Cells; 2.15 Coordination Number; 2.16 Atomic Packing Fraction; 2.17 Calculation of Density (or Bulk Density); 2.18 Miller Indices; 2.19 Interplaner Spacing; 2.20 Linear Density; 2.21 Planer Density; Chapter 3: Solid Structures, Characterization of Materials, Crystal Imperfections, and Mechanical Properties of Materials 3.1 Crystallography3.2 Crystalline and Non-Crystalline Structures; 3.3 Hexagonally Closed Packed Structure (HCP); 3.4 VOIDS; 3.5 Covalent Solids; 3.6 Bragg's Law of X-Rays Diffraction; 3.7 Structure Determination; 3.8 Microscopy; 3.9 Different Types of Metallurgical Microscopes and Their Features; 3.10 Working Principle of Electron Microscope; 3.11 Ideal and Real Crystals, and Imperfections; 3.12 Classification of Imperfections; 3.13 Point Imperfections; 3.14 Effects of Point Imperfections; 3.15 Line Imperfections; 3.16 Features of Edge Dislocation; 3.17 Screw Dislocation 3.18 Characteristics of Dislocations3.19 Sources of Dislocations, Their Effects and Remedies; 3.20 Grain Boundary; 3.21 Twin or Twinning; 3.22 Mechanical Properties of Metals; Chapter 4: Conductive Materials: Electron Theories, Properties and Behaviour; 4.1 Electrons and Their Role in Conductivity; 4.2 Electron Theories of Solids; 4.3 Free Electron Theory; 4.4 Energy Band Theory; 4.5 Brillouin Zone Theory; 4.6 Conductors; 4.7 Factors Affecting Conductivity (and Resistivity) of Metals; 4.8 Thermal Conductivity; 4.9 Heating Effect of Current; 4.10 Thermoelectric Effect (or Thermoelectricity) 4.11 Seebeck Effect |
| Record Nr. | UNINA-9910828839503321 |
|
Gupta K. M.
|
||
| Hoboken, New Jersey : , : Scrivener Publishing, , 2015 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
AIEE No 18-1934 (ASA C55 1934) : AIEE Standards for Capacitors / / Institute of Electrical and Electronics Engineers
| AIEE No 18-1934 (ASA C55 1934) : AIEE Standards for Capacitors / / Institute of Electrical and Electronics Engineers |
| Pubbl/distr/stampa | Piscataway, New Jersey : , : IEEE, , 1933 |
| Descrizione fisica | 1 online resource (203 pages) |
| Disciplina | 621.315 |
| Soggetto topico | Capacitors |
| ISBN | 1-5044-0183-2 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti | AIEE No 18-1934 |
| Record Nr. | UNISA-996280831503316 |
| Piscataway, New Jersey : , : IEEE, , 1933 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
AIEE No 18-1934 (ASA C55 1934) : AIEE Standards for Capacitors / / Institute of Electrical and Electronics Engineers
| AIEE No 18-1934 (ASA C55 1934) : AIEE Standards for Capacitors / / Institute of Electrical and Electronics Engineers |
| Pubbl/distr/stampa | Piscataway, New Jersey : , : IEEE, , 1933 |
| Descrizione fisica | 1 online resource (203 pages) |
| Disciplina | 621.315 |
| Soggetto topico | Capacitors |
| ISBN | 1-5044-0183-2 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti | AIEE No 18-1934 |
| Record Nr. | UNINA-9910137389703321 |
| Piscataway, New Jersey : , : IEEE, , 1933 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
ANSI C93.1-1999 / / Institute of Electrical and Electronics Engineers
| ANSI C93.1-1999 / / Institute of Electrical and Electronics Engineers |
| Pubbl/distr/stampa | New York, New York : , : IEEE, , 1999 |
| Descrizione fisica | 1 online resource (42 pages) |
| Disciplina | 621.315 |
| Soggetto topico | Capacitors - Standards |
| ISBN | 0-7381-4036-8 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti |
C93.1-1999 - American National Standard Requirements for Power-Line Carrier Coupling Capacitors and Coupling Capacitor Voltage Transformers
ANSI C93.1-1999: American National Standard Requirements for Power-Line Carrier Coupling Capacitors and Coupling Capacitor Voltage Transformers (CCVT |
| Record Nr. | UNISA-996279858303316 |
| New York, New York : , : IEEE, , 1999 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
ANSI C93.1-1999 / / Institute of Electrical and Electronics Engineers
| ANSI C93.1-1999 / / Institute of Electrical and Electronics Engineers |
| Pubbl/distr/stampa | New York, New York : , : IEEE, , 1999 |
| Descrizione fisica | 1 online resource (42 pages) |
| Disciplina | 621.315 |
| Soggetto topico | Capacitors - Standards |
| ISBN | 0-7381-4036-8 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti |
C93.1-1999 - American National Standard Requirements for Power-Line Carrier Coupling Capacitors and Coupling Capacitor Voltage Transformers
ANSI C93.1-1999: American National Standard Requirements for Power-Line Carrier Coupling Capacitors and Coupling Capacitor Voltage Transformers (CCVT |
| Record Nr. | UNINA-9910135783403321 |
| New York, New York : , : IEEE, , 1999 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
ANSI/IEEE Std 18-1980 / / Institute of Electrical and Electronics Engineers
| ANSI/IEEE Std 18-1980 / / Institute of Electrical and Electronics Engineers |
| Pubbl/distr/stampa | [Place of publication not identified] : , : IEEE, , 1980 |
| Descrizione fisica | 1 online resource (32 pages) |
| Disciplina | 621.315 |
| Soggetto topico | Capacitors |
| ISBN | 0-7381-4177-1 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti | ANSI/IEEE Std 18-1980: IEEE Standard for Shunt Power Capacitors |
| Record Nr. | UNISA-996279874003316 |
| [Place of publication not identified] : , : IEEE, , 1980 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
