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Acoustic microscopy / / G.A.D. Briggs, O.V. Kolosov
| Acoustic microscopy / / G.A.D. Briggs, O.V. Kolosov |
| Autore | Briggs Andrew |
| Edizione | [2nd ed.] |
| Pubbl/distr/stampa | Oxford ; ; New York, : Oxford University Press, 2010 |
| Descrizione fisica | 1 online resource (383 p.) |
| Disciplina |
620.1/1299
620.11294 |
| Altri autori (Persone) | KolosovO. V (Oleg V.) |
| Collana | Monographs on the physics and chemistry of materials |
| Soggetto topico |
Materials - Microscopy
Acoustic microscopy |
| ISBN |
0-19-157969-6
1-282-34929-5 9786612349294 1-61583-130-4 0-19-155263-1 |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
Contents; List of symbols; 1 Son et lumière; 1.1 Composites; 1.2 Rocks; 1.3 Biological matrix; 1.4 What else?; 2 Focusing and scanning; 2.1 Focused acoustic beams; 2.2 Scanning in transmission; 2.3 Reflection acoustic microscopy; 3 Resolution; 3.1 Diffraction and noise; 3.2 The coupling fluid; 3.3 Cryogenic microscopy; 3.4 Non-linear enhancement of resolution; 3.5 Aliasing; 3.6 Does defocusing degrade the resolution?; 4 Lens design and selection; 4.1 Interior imaging; 4.2 Surface imaging; 4.3 Wanted and unwanted signals; 5 Electronic circuits for quantitative microscopy
5.1 Time and frequency domains5.2 Quasi-monochromatic systems; 5.3 Very short pulse techniques; 6 A little elementary acoustics; 6.1 Scalar theory; 6.2 Tensor derivation of acoustic waves in solids; 6.3 Rayleigh waves; 6.4 Reflection; 6.5 Materials constants; 7 Contrast theory; 7.1 Wave theory of V(z); 7.2 Ray model of V(z); 7.3 Tweedledum or Tweedledee?; 8 Experimental elastic microanalysis; 8.1 Measurement of the reflectance function; 8.2 Ray methods; 8.3 Time-resolved techniques; 8.4 Phew!; 9 Biological tissue; 9.1 A soft option; 9.2 Cell cultures; 9.3 Histological sections 9.4 Stiff tissue9.5 Bone; 10 Layered structures; 10.1 Subsurface imaging; 10.2 Waves in layers; 10.3 Near surface imaging; 10.4 Layers edge on; 11 Anisotropy; 11.1 Bulk anisotropy; 11.2 Waves in anisotropic surfaces; 11.3 Anisotropic reflectance functions; 11.4 Cylindrical lens anisotropic V(z); 11.5 Spherical lens anisotropic V(z); 11.6 Plastic deformation; 11.7 Grain boundaries; 12 Surface cracks and boundaries; 12.1 Initial observations; 12.2 Contrast theory of surface cracks; 12.3 Extension to three dimensions; 12.4 How fine a crack can you see?; 12.5 Contrast at boundaries 12.6 Time-resolved measurements and crack tip diffraction13 Acoustically excited probe microscopy; 13.1 Mechanical diode detection; 13.2 Experimental UFM implementation; 13.3 UFM contrast theory; 13.4 Quantitative measurements of contact stiffness; 13.5 UFM picture gallery; 13.6 Image interpretation - effects of adhesion and topography; 13.7 Superlubricity; 13.8 Defects below the surface; 13.9 Time-resolved nanoscale phenomena; 14 So what happens when you defocus?; References; Index; A; B; C; D; E; F; G; H; I; J; K; L; M; N; O; P; Q; R; S; T; U; V; W; Y; Z |
| Record Nr. | UNINA-9911006662303321 |
Briggs Andrew
|
||
| Oxford ; ; New York, : Oxford University Press, 2010 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Computer Simulation of Materials at Atomic Level
| Computer Simulation of Materials at Atomic Level |
| Pubbl/distr/stampa | [Place of publication not identified], : Wiley VCH Imprint, 2000 |
| Descrizione fisica | 1 online resource (715 pages) |
| Disciplina | 620.1/1299 |
| Soggetto topico |
Materials - Computer simulation
Atomic structure - Computer simulation Materials Science Chemical & Materials Engineering Engineering & Applied Sciences |
| Soggetto genere / forma | Electronic books. |
| ISBN |
1-280-55955-1
9786610559558 3-527-60310-7 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910146234503321 |
| [Place of publication not identified], : Wiley VCH Imprint, 2000 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Computer Simulation of Materials at Atomic Level
| Computer Simulation of Materials at Atomic Level |
| Pubbl/distr/stampa | [Place of publication not identified], : Wiley VCH Imprint, 2000 |
| Descrizione fisica | 1 online resource (715 pages) |
| Disciplina | 620.1/1299 |
| Soggetto topico |
Materials - Computer simulation
Atomic structure - Computer simulation Materials Science Chemical & Materials Engineering Engineering & Applied Sciences |
| ISBN |
1-280-55955-1
9786610559558 3-527-60310-7 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910830860103321 |
| [Place of publication not identified], : Wiley VCH Imprint, 2000 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Computer Simulation of Materials at Atomic Level
| Computer Simulation of Materials at Atomic Level |
| Pubbl/distr/stampa | [Place of publication not identified], : Wiley VCH Imprint, 2000 |
| Descrizione fisica | 1 online resource (715 pages) |
| Disciplina | 620.1/1299 |
| Soggetto topico |
Materials - Computer simulation
Atomic structure - Computer simulation Materials Science Chemical & Materials Engineering Engineering & Applied Sciences |
| ISBN |
1-280-55955-1
9786610559558 3-527-60310-7 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9911020103803321 |
| [Place of publication not identified], : Wiley VCH Imprint, 2000 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Microstructural Characterization of Materials [[electronic resource]]
| Microstructural Characterization of Materials [[electronic resource]] |
| Autore | Brandon David |
| Edizione | [2nd ed.] |
| Pubbl/distr/stampa | Hoboken, : Wiley, 2008 |
| Descrizione fisica | 1 online resource (554 p.) |
| Disciplina | 620.1/1299 |
| Altri autori (Persone) |
KaplanWayne D
BrandonD. G |
| Collana | Quantitative software engineering series Microstructural characterization of materials |
| Soggetto topico |
Electronic books. -- local
Materials -- Microscopy Microstructure Materials - Microscopy Materials Science Chemical & Materials Engineering Engineering & Applied Sciences |
| Soggetto genere / forma | Electronic books. |
| ISBN |
1-282-34294-0
9786612342943 0-470-72712-8 0-470-72713-6 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
Microstructural Characterization of Materials; Contents; Preface to the Second Edition; Preface to the First Edition; 1 The Concept of Microstructure; 1.1 Microstructural Features; 1.1.1 Structure-Property Relationships; 1.1.2 Microstructural Scale; 1.1.3 Microstructural Parameters; 1.2 Crystallography and Crystal Structure; 1.2.1 Interatomic Bonding in Solids; 1.2.2 Crystalline and Amorphous Phases; 1.2.3 The Crystal Lattice; Summary; Bibliography; Worked Examples; Problems; 2 Diffraction Analysis of Crystal Structure; 2.1 Scattering of Radiation by Crystals
2.1.1 The Laue Equations and Bragg's Law2.1.2 Allowed and Forbidden Reflections; 2.2 Reciprocal Space; 2.2.1 The Limiting Sphere Construction; 2.2.2 Vector Representation of Bragg's Law; 2.2.3 The Reciprocal Lattice; 2.3 X-Ray Diffraction Methods; 2.3.1 The X-Ray Diffractometer; 2.3.2 Powder Diffraction-Particles and Polycrystals; 2.3.3 Single Crystal Laue Diffraction; 2.3.4 Rotating Single Crystal Methods; 2.4 Diffraction Analysis; 2.4.1 Atomic Scattering Factors; 2.4.2 Scattering by the Unit Cell; 2.4.3 The Structure Factor in the Complex Plane 2.4.4 Interpretation of Diffracted Intensities2.4.5 Errors and Assumptions; 2.5 Electron Diffraction; 2.5.1 Wave Properties of Electrons; 2.5.2 Ring Patterns, Spot Patterns and Laue Zones; 2.5.3 Kikuchi Patterns and Their Interpretation; Summary; Bibliography; Worked Examples; Problems; 3 Optical Microscopy; 3.1 Geometrical Optics; 3.1.1 Optical Image Formation; 3.1.2 Resolution in the Optical Microscope; 3.1.3 Depth of Field and Depth of Focus; 3.2 Construction of the Microscope; 3.2.1 Light Sources and Condenser Systems; 3.2.2 The Specimen Stage; 3.2.3 Selection of Objective Lenses 3.2.4 Image Observation and Recording3.3 Specimen Preparation; 3.3.1 Sampling and Sectioning; 3.3.2 Mounting and Grinding; 3.3.3 Polishing and Etching Methods; 3.4 Image Contrast; 3.4.1 Reflection and Absorption of Light; 3.4.2 Bright-Field and Dark-Field Image Contrast; 3.4.3 Confocal Microscopy; 3.4.4 Interference Contrast and Interference Microscopy; 3.4.5 Optical Anisotropy and Polarized Light; 3.4.6 Phase Contrast Microscopy; 3.5 Working with Digital Images; 3.5.1 Data Collection and The Optical System; 3.5.2 Data Processing and Analysis; 3.5.3 Data Storage and Presentation 3.5.4 Dynamic Range and Digital Storage3.6 Resolution, Contrast and Image Interpretation; Summary; Bibliography; Worked Examples; Problems; 4 Transmission Electron Microscopy; 4.1 Basic Principles; 4.1.1 Wave Properties of Electrons; 4.1.2 Resolution Limitations and Lens Aberrations; 4.1.3 Comparative Performance of Transmission and Scanning Electron Microscopy; 4.2 Specimen Preparation; 4.2.1 Mechanical Thinning; 4.2.2 Electrochemical Thinning; 4.2.3 Ion Milling; 4.2.4 Sputter Coating and Carbon Coating; 4.2.5 Replica Methods; 4.3 The Origin of Contrast; 4.3.1 Mass-Thickness Contrast 4.3.2 Diffraction Contrast and Crystal Lattice Defects |
| Record Nr. | UNINA-9910146741103321 |
|
Brandon David
|
||
| Hoboken, : Wiley, 2008 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Microstructural Characterization of Materials [[electronic resource]]
| Microstructural Characterization of Materials [[electronic resource]] |
| Autore | Brandon David |
| Edizione | [2nd ed.] |
| Pubbl/distr/stampa | Hoboken, : Wiley, 2008 |
| Descrizione fisica | 1 online resource (554 p.) |
| Disciplina | 620.1/1299 |
| Altri autori (Persone) |
KaplanWayne D
BrandonD. G |
| Collana | Quantitative software engineering series Microstructural characterization of materials |
| Soggetto topico |
Electronic books. -- local
Materials -- Microscopy Microstructure Materials - Microscopy Materials Science Chemical & Materials Engineering Engineering & Applied Sciences |
| ISBN |
1-282-34294-0
9786612342943 0-470-72712-8 0-470-72713-6 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
Microstructural Characterization of Materials; Contents; Preface to the Second Edition; Preface to the First Edition; 1 The Concept of Microstructure; 1.1 Microstructural Features; 1.1.1 Structure-Property Relationships; 1.1.2 Microstructural Scale; 1.1.3 Microstructural Parameters; 1.2 Crystallography and Crystal Structure; 1.2.1 Interatomic Bonding in Solids; 1.2.2 Crystalline and Amorphous Phases; 1.2.3 The Crystal Lattice; Summary; Bibliography; Worked Examples; Problems; 2 Diffraction Analysis of Crystal Structure; 2.1 Scattering of Radiation by Crystals
2.1.1 The Laue Equations and Bragg's Law2.1.2 Allowed and Forbidden Reflections; 2.2 Reciprocal Space; 2.2.1 The Limiting Sphere Construction; 2.2.2 Vector Representation of Bragg's Law; 2.2.3 The Reciprocal Lattice; 2.3 X-Ray Diffraction Methods; 2.3.1 The X-Ray Diffractometer; 2.3.2 Powder Diffraction-Particles and Polycrystals; 2.3.3 Single Crystal Laue Diffraction; 2.3.4 Rotating Single Crystal Methods; 2.4 Diffraction Analysis; 2.4.1 Atomic Scattering Factors; 2.4.2 Scattering by the Unit Cell; 2.4.3 The Structure Factor in the Complex Plane 2.4.4 Interpretation of Diffracted Intensities2.4.5 Errors and Assumptions; 2.5 Electron Diffraction; 2.5.1 Wave Properties of Electrons; 2.5.2 Ring Patterns, Spot Patterns and Laue Zones; 2.5.3 Kikuchi Patterns and Their Interpretation; Summary; Bibliography; Worked Examples; Problems; 3 Optical Microscopy; 3.1 Geometrical Optics; 3.1.1 Optical Image Formation; 3.1.2 Resolution in the Optical Microscope; 3.1.3 Depth of Field and Depth of Focus; 3.2 Construction of the Microscope; 3.2.1 Light Sources and Condenser Systems; 3.2.2 The Specimen Stage; 3.2.3 Selection of Objective Lenses 3.2.4 Image Observation and Recording3.3 Specimen Preparation; 3.3.1 Sampling and Sectioning; 3.3.2 Mounting and Grinding; 3.3.3 Polishing and Etching Methods; 3.4 Image Contrast; 3.4.1 Reflection and Absorption of Light; 3.4.2 Bright-Field and Dark-Field Image Contrast; 3.4.3 Confocal Microscopy; 3.4.4 Interference Contrast and Interference Microscopy; 3.4.5 Optical Anisotropy and Polarized Light; 3.4.6 Phase Contrast Microscopy; 3.5 Working with Digital Images; 3.5.1 Data Collection and The Optical System; 3.5.2 Data Processing and Analysis; 3.5.3 Data Storage and Presentation 3.5.4 Dynamic Range and Digital Storage3.6 Resolution, Contrast and Image Interpretation; Summary; Bibliography; Worked Examples; Problems; 4 Transmission Electron Microscopy; 4.1 Basic Principles; 4.1.1 Wave Properties of Electrons; 4.1.2 Resolution Limitations and Lens Aberrations; 4.1.3 Comparative Performance of Transmission and Scanning Electron Microscopy; 4.2 Specimen Preparation; 4.2.1 Mechanical Thinning; 4.2.2 Electrochemical Thinning; 4.2.3 Ion Milling; 4.2.4 Sputter Coating and Carbon Coating; 4.2.5 Replica Methods; 4.3 The Origin of Contrast; 4.3.1 Mass-Thickness Contrast 4.3.2 Diffraction Contrast and Crystal Lattice Defects |
| Record Nr. | UNINA-9910829923603321 |
|
Brandon David
|
||
| Hoboken, : Wiley, 2008 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Microstructural Characterization of Materials
| Microstructural Characterization of Materials |
| Autore | Brandon David |
| Edizione | [2nd ed.] |
| Pubbl/distr/stampa | Hoboken, : Wiley, 2008 |
| Descrizione fisica | 1 online resource (554 p.) |
| Disciplina | 620.1/1299 |
| Altri autori (Persone) |
KaplanWayne D
BrandonD. G |
| Collana | Quantitative software engineering series Microstructural characterization of materials |
| Soggetto topico |
Electronic books. -- local
Materials -- Microscopy Microstructure Materials - Microscopy Materials Science Chemical & Materials Engineering Engineering & Applied Sciences |
| ISBN |
9786612342943
9781282342941 1282342940 9780470727126 0470727128 9780470727133 0470727136 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
Microstructural Characterization of Materials; Contents; Preface to the Second Edition; Preface to the First Edition; 1 The Concept of Microstructure; 1.1 Microstructural Features; 1.1.1 Structure-Property Relationships; 1.1.2 Microstructural Scale; 1.1.3 Microstructural Parameters; 1.2 Crystallography and Crystal Structure; 1.2.1 Interatomic Bonding in Solids; 1.2.2 Crystalline and Amorphous Phases; 1.2.3 The Crystal Lattice; Summary; Bibliography; Worked Examples; Problems; 2 Diffraction Analysis of Crystal Structure; 2.1 Scattering of Radiation by Crystals
2.1.1 The Laue Equations and Bragg's Law2.1.2 Allowed and Forbidden Reflections; 2.2 Reciprocal Space; 2.2.1 The Limiting Sphere Construction; 2.2.2 Vector Representation of Bragg's Law; 2.2.3 The Reciprocal Lattice; 2.3 X-Ray Diffraction Methods; 2.3.1 The X-Ray Diffractometer; 2.3.2 Powder Diffraction-Particles and Polycrystals; 2.3.3 Single Crystal Laue Diffraction; 2.3.4 Rotating Single Crystal Methods; 2.4 Diffraction Analysis; 2.4.1 Atomic Scattering Factors; 2.4.2 Scattering by the Unit Cell; 2.4.3 The Structure Factor in the Complex Plane 2.4.4 Interpretation of Diffracted Intensities2.4.5 Errors and Assumptions; 2.5 Electron Diffraction; 2.5.1 Wave Properties of Electrons; 2.5.2 Ring Patterns, Spot Patterns and Laue Zones; 2.5.3 Kikuchi Patterns and Their Interpretation; Summary; Bibliography; Worked Examples; Problems; 3 Optical Microscopy; 3.1 Geometrical Optics; 3.1.1 Optical Image Formation; 3.1.2 Resolution in the Optical Microscope; 3.1.3 Depth of Field and Depth of Focus; 3.2 Construction of the Microscope; 3.2.1 Light Sources and Condenser Systems; 3.2.2 The Specimen Stage; 3.2.3 Selection of Objective Lenses 3.2.4 Image Observation and Recording3.3 Specimen Preparation; 3.3.1 Sampling and Sectioning; 3.3.2 Mounting and Grinding; 3.3.3 Polishing and Etching Methods; 3.4 Image Contrast; 3.4.1 Reflection and Absorption of Light; 3.4.2 Bright-Field and Dark-Field Image Contrast; 3.4.3 Confocal Microscopy; 3.4.4 Interference Contrast and Interference Microscopy; 3.4.5 Optical Anisotropy and Polarized Light; 3.4.6 Phase Contrast Microscopy; 3.5 Working with Digital Images; 3.5.1 Data Collection and The Optical System; 3.5.2 Data Processing and Analysis; 3.5.3 Data Storage and Presentation 3.5.4 Dynamic Range and Digital Storage3.6 Resolution, Contrast and Image Interpretation; Summary; Bibliography; Worked Examples; Problems; 4 Transmission Electron Microscopy; 4.1 Basic Principles; 4.1.1 Wave Properties of Electrons; 4.1.2 Resolution Limitations and Lens Aberrations; 4.1.3 Comparative Performance of Transmission and Scanning Electron Microscopy; 4.2 Specimen Preparation; 4.2.1 Mechanical Thinning; 4.2.2 Electrochemical Thinning; 4.2.3 Ion Milling; 4.2.4 Sputter Coating and Carbon Coating; 4.2.5 Replica Methods; 4.3 The Origin of Contrast; 4.3.1 Mass-Thickness Contrast 4.3.2 Diffraction Contrast and Crystal Lattice Defects |
| Record Nr. | UNINA-9911019210903321 |
|
Brandon David
|
||
| Hoboken, : Wiley, 2008 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Microstructures, mechanical properties and processes--computer simulation and modelling
| Microstructures, mechanical properties and processes--computer simulation and modelling |
| Pubbl/distr/stampa | [Place of publication not identified], : Deutsche Gesellschaft für Materialkunde, 2000 |
| Descrizione fisica | 1 online resource (423 pages) |
| Disciplina | 620.1/1299 |
| Collana | EUROMAT 99 Microstructures, mechanical properties and processes--computer simulation and modelling |
| Soggetto topico |
Microstructure - Mathematical models
Materials Science Chemical & Materials Engineering Engineering & Applied Sciences |
| ISBN |
1-280-55810-5
9786610558100 3-527-60615-7 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996199405903316 |
| [Place of publication not identified], : Deutsche Gesellschaft für Materialkunde, 2000 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
Research opportunities for materials with ultrafine microstructures [[electronic resource] ] : report of the Committee on Materials with Submicron-sized Microstructures, National Materials Advisory Board, Commission on Engineering and Technical Systems, National Research Council
| Research opportunities for materials with ultrafine microstructures [[electronic resource] ] : report of the Committee on Materials with Submicron-sized Microstructures, National Materials Advisory Board, Commission on Engineering and Technical Systems, National Research Council |
| Pubbl/distr/stampa | Washington, DC, : National Academy Press |
| Descrizione fisica | 1 online resource (130 p.) |
| Disciplina | 620.1/1299 |
| Soggetto topico |
Materials - Research
Microstructure Nanostructured materials |
| Soggetto genere / forma | Electronic books. |
| ISBN |
1-280-21272-1
9786610212729 0-309-57191-X 0-585-14399-4 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
""Research Opportunities for Materials with Ultrafine Microstructures""; ""Copyright""; ""Abstract""; ""Acknowledgments""; ""Contents""; ""Tables and Figures""; ""Executive Summary""; ""1 Introduction.""; ""REFERENCES""; ""2 Synthesis and Processing: General Methods ""; ""MOLECULAR SYNTHESIS""; ""REDUCTIVE PYROLYSIS""; ""GEL SYNTHESIS""; ""In Situ Composites""; ""Porous Sol-Gel Composites.""; ""Volatile-Host Method""; ""Infiltrated Composites""; ""SUPERCRITICAL FLUID PROCESSING""; ""LASER PYROLYSIS""; ""COLLOIDAL SYNTHESIS""; ""REACTIVE SPUTTERING""; ""CRYOCHEMICAL SYNTHESIS.""
""CHEMICAL VAPOR SYNTHESIS""""ION-BEAM PROCESSING""; ""MECHANICAL PROCESSING""; ""GAS-CONDENSATION SYNTHESIS""; ""RAPID SOLIDIFICATION PROCESSING""; ""REFERENCES""; ""3 Synthesis and Processing: Morphologically Specific Methods. ""; ""FILAMENTARY STRUCTURES""; ""MULTILAYER STRUCTURES""; ""Molecular-Beam Epitaxy""; ""Electrodeposition""; ""Cluster Beam Deposition""; ""DISPERSED-PHASE STRUCTURES""; ""Carbon + SiC.""; ""Si3N4 Matrix Composites""; ""SiC + TiSi2""; ""Composites in the Ti-Si-C and Ti-Ge-C Systems""; ""MACROMOLECULAR COMPOSITE STRUCTURES""; ""HETEROGENEOUS NANOCOMPOSITES"" ""HIGH-SURFACE-AREA MATERIALS""""Impregnation and Ion Exchange.""; ""Decomposition of Metal Carbonyls""; ""Bare Metal Clusters""; ""Microporous Solids: Pillared Clays""; ""Zeolites""; ""MEMBRANES""; ""REFERENCES""; ""4 Characterization Methods. ""; ""X-RAY AND NEUTRON SCATTERING""; ""TRANSMISSION ELECTRON MICROSCOPY""; ""Structural Imaging""; ""Analytical Electron Microscopy""; ""SPECTROSCOPIES""; ""Optical Spectroscopy""; ""Nuclear Spectroscopy.""; ""Electron Spectroscopy""; ""CALORIMETRY""; ""OTHER PROMISING METHODS""; ""REFERENCES""; ""5 Properties ""; ""NANOPHASE COMPACTS"" ""Magnetic Properties.""""Densification and Sintering has recently been carried out using the gas-condensation method, and the ...""; ""Diffusion and Solid-State Reactions""; ""MECHANICAL PROPERTIES""; ""CATALYTIC PROPERTIES""; ""STABILITY""; ""REFERENCES""; ""6 Selected Application Areas. ""; ""ELECTROCERAMICS""; ""ULTRASTRUCTURED CERAMICS""; ""PERMANENT MAGNETS""; ""POLYMER-SILICA MICROCOMPOSITES""; ""CATALYSTS""; ""CERMETS""; ""MULTILAYER COATINGS.""; ""REFERENCES""; ""7 Summary and Recommendations ""; ""Bibliography""; ""Appendix A Definitions of Acronyms "" ""Appendix B Biographical Sketches of Committee Members "" |
| Record Nr. | UNINA-9910455415103321 |
| Washington, DC, : National Academy Press | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Research opportunities for materials with ultrafine microstructures [[electronic resource] ] : report of the Committee on Materials with Submicron-sized Microstructures, National Materials Advisory Board, Commission on Engineering and Technical Systems, National Research Council
| Research opportunities for materials with ultrafine microstructures [[electronic resource] ] : report of the Committee on Materials with Submicron-sized Microstructures, National Materials Advisory Board, Commission on Engineering and Technical Systems, National Research Council |
| Pubbl/distr/stampa | Washington, DC, : National Academy Press |
| Descrizione fisica | 1 online resource (130 p.) |
| Disciplina | 620.1/1299 |
| Soggetto topico |
Materials - Research
Microstructure Nanostructured materials |
| ISBN |
1-280-21272-1
9786610212729 0-309-57191-X 0-585-14399-4 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
""Research Opportunities for Materials with Ultrafine Microstructures""; ""Copyright""; ""Abstract""; ""Acknowledgments""; ""Contents""; ""Tables and Figures""; ""Executive Summary""; ""1 Introduction.""; ""REFERENCES""; ""2 Synthesis and Processing: General Methods ""; ""MOLECULAR SYNTHESIS""; ""REDUCTIVE PYROLYSIS""; ""GEL SYNTHESIS""; ""In Situ Composites""; ""Porous Sol-Gel Composites.""; ""Volatile-Host Method""; ""Infiltrated Composites""; ""SUPERCRITICAL FLUID PROCESSING""; ""LASER PYROLYSIS""; ""COLLOIDAL SYNTHESIS""; ""REACTIVE SPUTTERING""; ""CRYOCHEMICAL SYNTHESIS.""
""CHEMICAL VAPOR SYNTHESIS""""ION-BEAM PROCESSING""; ""MECHANICAL PROCESSING""; ""GAS-CONDENSATION SYNTHESIS""; ""RAPID SOLIDIFICATION PROCESSING""; ""REFERENCES""; ""3 Synthesis and Processing: Morphologically Specific Methods. ""; ""FILAMENTARY STRUCTURES""; ""MULTILAYER STRUCTURES""; ""Molecular-Beam Epitaxy""; ""Electrodeposition""; ""Cluster Beam Deposition""; ""DISPERSED-PHASE STRUCTURES""; ""Carbon + SiC.""; ""Si3N4 Matrix Composites""; ""SiC + TiSi2""; ""Composites in the Ti-Si-C and Ti-Ge-C Systems""; ""MACROMOLECULAR COMPOSITE STRUCTURES""; ""HETEROGENEOUS NANOCOMPOSITES"" ""HIGH-SURFACE-AREA MATERIALS""""Impregnation and Ion Exchange.""; ""Decomposition of Metal Carbonyls""; ""Bare Metal Clusters""; ""Microporous Solids: Pillared Clays""; ""Zeolites""; ""MEMBRANES""; ""REFERENCES""; ""4 Characterization Methods. ""; ""X-RAY AND NEUTRON SCATTERING""; ""TRANSMISSION ELECTRON MICROSCOPY""; ""Structural Imaging""; ""Analytical Electron Microscopy""; ""SPECTROSCOPIES""; ""Optical Spectroscopy""; ""Nuclear Spectroscopy.""; ""Electron Spectroscopy""; ""CALORIMETRY""; ""OTHER PROMISING METHODS""; ""REFERENCES""; ""5 Properties ""; ""NANOPHASE COMPACTS"" ""Magnetic Properties.""""Densification and Sintering has recently been carried out using the gas-condensation method, and the ...""; ""Diffusion and Solid-State Reactions""; ""MECHANICAL PROPERTIES""; ""CATALYTIC PROPERTIES""; ""STABILITY""; ""REFERENCES""; ""6 Selected Application Areas. ""; ""ELECTROCERAMICS""; ""ULTRASTRUCTURED CERAMICS""; ""PERMANENT MAGNETS""; ""POLYMER-SILICA MICROCOMPOSITES""; ""CATALYSTS""; ""CERMETS""; ""MULTILAYER COATINGS.""; ""REFERENCES""; ""7 Summary and Recommendations ""; ""Bibliography""; ""Appendix A Definitions of Acronyms "" ""Appendix B Biographical Sketches of Committee Members "" |
| Record Nr. | UNINA-9910778704703321 |
| Washington, DC, : National Academy Press | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
