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Helium ion microscopy : principles and applications / / David C. Joy
| Helium ion microscopy : principles and applications / / David C. Joy |
| Autore | Joy David C |
| Edizione | [1st ed. 2013.] |
| Pubbl/distr/stampa | New York : , : Springer, , 2013 |
| Descrizione fisica | 1 online resource (viii, 64 pages) : illustrations (some color) |
| Disciplina |
578.1
620.11 |
| Collana | SpringerBriefs in Materials |
| Soggetto topico |
Field ion microscopy
Helium ions Ion bombardment |
| ISBN | 1-4614-8660-2 |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | Chapter 1: Introduction to Helium Ion Microscopy -- Chapter 2: Microscopy with Ions - A brief history -- Chapter 3: Operating the Helium Ion Microscope -- Chapter 4: Ion –Solid Interactions and Image Formation -- Chapter 5: Charging and Damage -- Chapter 6: Microanalysis with the HIM -- Chapter 7: Ion Generated Damage -- Chapter 8: Working with other Ion beams -- Chapter 9: Patterning and Nanofabrication -- Conclusion -- Bibliography -- Appendix: iSE Yields, and IONiSE parameters for He+ excitation of Elements and Compounds -- Index. |
| Record Nr. | UNINA-9910437805603321 |
Joy David C
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| New York : , : Springer, , 2013 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Helium Ion Microscopy / / edited by Gregor Hlawacek, Armin Gölzhäuser
| Helium Ion Microscopy / / edited by Gregor Hlawacek, Armin Gölzhäuser |
| Edizione | [1st ed. 2016.] |
| Pubbl/distr/stampa | Cham : , : Springer International Publishing : , : Imprint : Springer, , 2016 |
| Descrizione fisica | 1 online resource (XXIII, 526 p. 320 illus., 204 illus. in color.) |
| Disciplina | 578.1 |
| Collana | NanoScience and Technology |
| Soggetto topico |
Spectrum analysis
Microscopy Materials—Surfaces Thin films Surfaces (Physics) Interfaces (Physical sciences) Nanotechnology Spectroscopy and Microscopy Surfaces and Interfaces, Thin Films Surface and Interface Science, Thin Films Nanotechnology and Microengineering |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910254050803321 |
| Cham : , : Springer International Publishing : , : Imprint : Springer, , 2016 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Introduction to electron microscopy / Cecil Edwin Hall
| Introduction to electron microscopy / Cecil Edwin Hall |
| Autore | Hall, Cecil Edwin |
| Pubbl/distr/stampa | New York : McGraw-Hill, 1953 |
| Descrizione fisica | 451 p. : ill. ; 24 cm |
| Disciplina | 578.1 |
| Collana | International series in pure and applied physics |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-990007992220403321 |
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Hall, Cecil Edwin
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| New York : McGraw-Hill, 1953 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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