Info
- Utilizzare la checkbox di selezione a fianco di ciascun documento per attivare le funzionalità di stampa, invio email, download nei formati disponibili del (i) record.
Combined analysis [[electronic resource] /] / Daniel Chateigner
| Combined analysis [[electronic resource] /] / Daniel Chateigner |
| Autore | Chateigner Daniel |
| Edizione | [1st edition] |
| Pubbl/distr/stampa | London, U.K., : ISTE |
| Descrizione fisica | 1 online resource (517 p.) |
| Disciplina |
548.83
548/.83 |
| Collana | ISTE |
| Soggetto topico |
Analytical chemistry
Solid state chemistry Crystals |
| ISBN |
1-118-62264-2
1-118-62250-2 1-299-31555-0 1-118-62271-5 |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
Cover; Combined Analysis; Title Page; Copyright Page; Table of Contents; Introduction; Acknowledgements; Chapter 1. Some Basic Notions About Powder Diffraction; 1.1. Crystallite, grain, polycrystal and powder; 1.2. Bragg's law and harmonic reflections; 1.2.1. Bragg's law; 1.2.2. Monochromator; 1.2.3. Harmonic radiation components; 1.3. Geometric conditions of diffraction, Ewald sphere; 1.4. Imperfect powders; 1.5. Main diffraction line profile components; 1.5.1. Origin of g(x); 1.5.2. Origin of f(x); 1.5.3. Deconvolution-extraction of f(x) and g(x); 1.6. Peak profile parameters
1.7. Modeling of the diffraction peaks1.7.1. Why do we need modeling?; 1.7.2. Modeling of a powder diffraction pattern; 1.8. Experimental geometry; 1.8.1. Curved Position Sensitive detector, asymmetric reflection geometry; 1.8.2. CCD or image plate detector, transmission geometry; 1.8.3. Curved-Area Position-Sensitive detector, transmission geometry; 1.9. Intensity calibration (flat-field); 1.9.1. Counts and intensity; 1.9.2. Flat-field; 1.9.3. PSD detector; 1.9.4. CAPS detector; 1.10. Standard samples; 1.10.1. Laboratory x-ray standards; 1.10.2. Neutron texture standards 1.11. Probed thickness (penetration depth)Chapter 2. Structure Refinement by Diffraction Profile Adjustment (Rietveld Method); 2.1. Principle of the Rietveld method; 2.2. Rietveld-based codes; 2.3. Parameter modeling; 2.3.1. Background modeling; 2.3.2. Structure factor; 2.3.3. Crystallites' preferred orientation (texture) corrections; 2.3.4. Peak asymmetry; 2.3.5. Peak displacements; 2.3.6. Lorentz-polarization correction; 2.3.7. Volume, absorption, thickness corrections; 2.3.8. Localization corrections; 2.3.9. Microabsorption/roughness corrections; 2.3.10. Wavelength 2.4. Crystal structure databases2.5. Reliability factors in profile refinements; 2.6. Parameter exactness; 2.7. The Le Bail method; 2.8. Refinement procedures; 2.8.1. Least squares; 2.8.2. Genetic or evolutionary algorithms; 2.8.3. Derivative difference minimization (DDM); 2.8.4. Simulated annealing; 2.9. Refinement strategy; 2.10. Structural determination by diffraction; 2.10.1. The phase problem in diffraction; 2.10.2. Patterson function; 2.10.3. Direct methods; 2.10.4. Direct space methods; 2.10.5. Fourier difference map; 2.10.6. Extension to aperiodic structures Chapter 3. Automatic Indexing of Powder Diagrams3.1. Principle; 3.2. Dichotomy approach; 3.3. Criterions for quality; Chapter 4. Quantitative Texture Analysis; 4.1. Classic texture analysis; 4.1.1. Qualitative aspects of texture analysis; 4.1.2. Effects on diffraction diagrams; 4.1.3. Limitations of classic diagrams; 4.1.4. The Lotgering factor; 4.1.5. Representations of textures: pole figures; 4.1.6. Localization of crystallographic directions from pole figures; 4.1.7. Texture types; 4.2. Orientation distribution (OD) or orientation distribution function (ODF) 4.2.1. Pole figures and orientation spaces |
| Record Nr. | UNINA-9910139243703321 |
Chateigner Daniel
|
||
| London, U.K., : ISTE | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Combined analysis [[electronic resource] /] / Daniel Chateigner
| Combined analysis [[electronic resource] /] / Daniel Chateigner |
| Autore | Chateigner Daniel |
| Edizione | [1st edition] |
| Pubbl/distr/stampa | London, U.K., : ISTE |
| Descrizione fisica | 1 online resource (517 p.) |
| Disciplina |
548.83
548/.83 |
| Collana | ISTE |
| Soggetto topico |
Analytical chemistry
Solid state chemistry Crystals |
| ISBN |
1-118-62264-2
1-118-62250-2 1-299-31555-0 1-118-62271-5 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
Cover; Combined Analysis; Title Page; Copyright Page; Table of Contents; Introduction; Acknowledgements; Chapter 1. Some Basic Notions About Powder Diffraction; 1.1. Crystallite, grain, polycrystal and powder; 1.2. Bragg's law and harmonic reflections; 1.2.1. Bragg's law; 1.2.2. Monochromator; 1.2.3. Harmonic radiation components; 1.3. Geometric conditions of diffraction, Ewald sphere; 1.4. Imperfect powders; 1.5. Main diffraction line profile components; 1.5.1. Origin of g(x); 1.5.2. Origin of f(x); 1.5.3. Deconvolution-extraction of f(x) and g(x); 1.6. Peak profile parameters
1.7. Modeling of the diffraction peaks1.7.1. Why do we need modeling?; 1.7.2. Modeling of a powder diffraction pattern; 1.8. Experimental geometry; 1.8.1. Curved Position Sensitive detector, asymmetric reflection geometry; 1.8.2. CCD or image plate detector, transmission geometry; 1.8.3. Curved-Area Position-Sensitive detector, transmission geometry; 1.9. Intensity calibration (flat-field); 1.9.1. Counts and intensity; 1.9.2. Flat-field; 1.9.3. PSD detector; 1.9.4. CAPS detector; 1.10. Standard samples; 1.10.1. Laboratory x-ray standards; 1.10.2. Neutron texture standards 1.11. Probed thickness (penetration depth)Chapter 2. Structure Refinement by Diffraction Profile Adjustment (Rietveld Method); 2.1. Principle of the Rietveld method; 2.2. Rietveld-based codes; 2.3. Parameter modeling; 2.3.1. Background modeling; 2.3.2. Structure factor; 2.3.3. Crystallites' preferred orientation (texture) corrections; 2.3.4. Peak asymmetry; 2.3.5. Peak displacements; 2.3.6. Lorentz-polarization correction; 2.3.7. Volume, absorption, thickness corrections; 2.3.8. Localization corrections; 2.3.9. Microabsorption/roughness corrections; 2.3.10. Wavelength 2.4. Crystal structure databases2.5. Reliability factors in profile refinements; 2.6. Parameter exactness; 2.7. The Le Bail method; 2.8. Refinement procedures; 2.8.1. Least squares; 2.8.2. Genetic or evolutionary algorithms; 2.8.3. Derivative difference minimization (DDM); 2.8.4. Simulated annealing; 2.9. Refinement strategy; 2.10. Structural determination by diffraction; 2.10.1. The phase problem in diffraction; 2.10.2. Patterson function; 2.10.3. Direct methods; 2.10.4. Direct space methods; 2.10.5. Fourier difference map; 2.10.6. Extension to aperiodic structures Chapter 3. Automatic Indexing of Powder Diagrams3.1. Principle; 3.2. Dichotomy approach; 3.3. Criterions for quality; Chapter 4. Quantitative Texture Analysis; 4.1. Classic texture analysis; 4.1.1. Qualitative aspects of texture analysis; 4.1.2. Effects on diffraction diagrams; 4.1.3. Limitations of classic diagrams; 4.1.4. The Lotgering factor; 4.1.5. Representations of textures: pole figures; 4.1.6. Localization of crystallographic directions from pole figures; 4.1.7. Texture types; 4.2. Orientation distribution (OD) or orientation distribution function (ODF) 4.2.1. Pole figures and orientation spaces |
| Record Nr. | UNINA-9910830141803321 |
|
Chateigner Daniel
|
||
| London, U.K., : ISTE | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Computer Simulation Tools for X-ray Analysis : Scattering and Diffraction Methods / / by Sérgio Luiz Morelhão
| Computer Simulation Tools for X-ray Analysis : Scattering and Diffraction Methods / / by Sérgio Luiz Morelhão |
| Autore | Morelhão Sérgio Luiz |
| Edizione | [1st ed. 2016.] |
| Pubbl/distr/stampa | Cham : , : Springer International Publishing : , : Imprint : Springer, , 2016 |
| Descrizione fisica | 1 online resource (XV, 294 p. 105 illus., 104 illus. in color.) |
| Disciplina | 548.83 |
| Collana | Graduate Texts in Physics |
| Soggetto topico |
Crystallography
Materials science Physical chemistry Physics Crystallography and Scattering Methods Characterization and Evaluation of Materials Physical Chemistry Numerical and Computational Physics, Simulation |
| ISBN | 3-319-19554-9 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | Radiation-electron (free electron) elementary interaction -- Scattering of X-rays by distributions of free electrons -- Atoms and molecules -- X-ray absorption -- Low correlated systems: gases and dilute solutions -- Complex systems I: short-range correlations -- Complex systems II: arbitrary long-range correlations -- Crystals -- Application of kinematic diffraction -- Introduction to dynamical diffraction. |
| Record Nr. | UNINA-9910254615703321 |
|
Morelhão Sérgio Luiz
|
||
| Cham : , : Springer International Publishing : , : Imprint : Springer, , 2016 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
La Cristallographie Aux Rayons X / / William Clegg ; traduction Julien Robert-Paganin
| La Cristallographie Aux Rayons X / / William Clegg ; traduction Julien Robert-Paganin |
| Autore | Clegg William |
| Pubbl/distr/stampa | [Place of publication not identified] : , : Oxford University Press : , : EDP Sciences, , 2015 |
| Descrizione fisica | 1 online resource (135 pages) |
| Disciplina | 548.83 |
| Collana | Enseignement Sup Chimie |
| Soggetto topico | X-rays--Diffraction |
| Soggetto genere / forma | Electronic books. |
| ISBN | 2-7598-2226-5 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | fre |
| Nota di contenuto | Frontmatter -- Avant-propos -- Sommaire -- 1. Aspects fondamentaux de cristallographie aux rayons X -- 2. La cristallographie aux rayons X en pratique -- 3. Études de cas de cristallographie aux rayons X -- 4. Sujets associés -- Glossaire -- Bibliographie -- Index |
| Record Nr. | UNINA-9910466993003321 |
|
Clegg William
|
||
| [Place of publication not identified] : , : Oxford University Press : , : EDP Sciences, , 2015 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
La Cristallographie Aux Rayons X / / William Clegg ; traduction Julien Robert-Paganin
| La Cristallographie Aux Rayons X / / William Clegg ; traduction Julien Robert-Paganin |
| Autore | Clegg William |
| Pubbl/distr/stampa | [Place of publication not identified] : , : Oxford University Press : , : EDP Sciences, , 2015 |
| Descrizione fisica | 1 online resource (135 pages) |
| Disciplina | 548.83 |
| Collana | Enseignement Sup Chimie |
| Soggetto topico | X-rays--Diffraction |
| ISBN | 2-7598-2226-5 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | fre |
| Nota di contenuto | Frontmatter -- Avant-propos -- Sommaire -- 1. Aspects fondamentaux de cristallographie aux rayons X -- 2. La cristallographie aux rayons X en pratique -- 3. Études de cas de cristallographie aux rayons X -- 4. Sujets associés -- Glossaire -- Bibliographie -- Index |
| Record Nr. | UNINA-9910796971403321 |
|
Clegg William
|
||
| [Place of publication not identified] : , : Oxford University Press : , : EDP Sciences, , 2015 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
La Cristallographie Aux Rayons X / / William Clegg ; traduction Julien Robert-Paganin
| La Cristallographie Aux Rayons X / / William Clegg ; traduction Julien Robert-Paganin |
| Autore | Clegg William |
| Pubbl/distr/stampa | [Place of publication not identified] : , : Oxford University Press : , : EDP Sciences, , 2015 |
| Descrizione fisica | 1 online resource (135 pages) |
| Disciplina | 548.83 |
| Collana | Enseignement Sup Chimie |
| Soggetto topico | X-rays--Diffraction |
| ISBN | 2-7598-2226-5 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | fre |
| Nota di contenuto | Frontmatter -- Avant-propos -- Sommaire -- 1. Aspects fondamentaux de cristallographie aux rayons X -- 2. La cristallographie aux rayons X en pratique -- 3. Études de cas de cristallographie aux rayons X -- 4. Sujets associés -- Glossaire -- Bibliographie -- Index |
| Record Nr. | UNINA-9910826336803321 |
|
Clegg William
|
||
| [Place of publication not identified] : , : Oxford University Press : , : EDP Sciences, , 2015 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Current trends in X-ray crystallography / / edited by Annamalai Chandrasekaran
| Current trends in X-ray crystallography / / edited by Annamalai Chandrasekaran |
| Autore | Annamalai Chandrasekaran |
| Edizione | [1st ed.] |
| Pubbl/distr/stampa | IntechOpen, 2011 |
| Descrizione fisica | 1 online resource (xii, 436 pages) : illustrations |
| Disciplina | 548.83 |
| Soggetto topico | X-ray crystallography |
| Soggetto non controllato |
Physical Sciences
Engineering and Technology Chemistry Inorganic Chemistry Solid-State Chemistry |
| ISBN | 953-51-4387-5 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910138435003321 |
|
Annamalai Chandrasekaran
|
||
| IntechOpen, 2011 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Defect and microstructure analysis by diffraction / Robert L. Snyder, Jaroslav Fiala, Hans J. Bunge
| Defect and microstructure analysis by diffraction / Robert L. Snyder, Jaroslav Fiala, Hans J. Bunge |
| Autore | Snyder, Robert L. |
| Pubbl/distr/stampa | Oxford, : Oxford University Press, 1999 |
| Descrizione fisica | xxii, 785 p. ; 24 cm |
| Disciplina | 548.83 |
| Altri autori (Persone) |
Bunge, Hans J.
Fiala, Jaroslav |
| Soggetto topico |
Cristallografia
Diffrazione di polveri Microstruttura |
| ISBN | 0198501897 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNICAS-RML0266477 |
|
Snyder, Robert L.
|
||
| Oxford, : Oxford University Press, 1999 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Cassino e del Lazio Meridionale | ||
| ||
Diffraction of X-Ray by chain molecules / B. K. Vianshtein
| Diffraction of X-Ray by chain molecules / B. K. Vianshtein |
| Autore | VAINSHTEIN, B. K. |
| Pubbl/distr/stampa | Amsterdam : Elsevier Publishing Company, 1966 |
| Descrizione fisica | X, 414 p. : ill. graf. tab. ; 23 cm |
| Disciplina | 548.83 |
| Soggetto topico |
Cristalli (Struttura moleculare)
Analisi ai raggi |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-990003301120203316 |
|
VAINSHTEIN, B. K.
|
||
| Amsterdam : Elsevier Publishing Company, 1966 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
Electron Crystallography / / edited by Devinder Singh, Simona Condurache-Bota
| Electron Crystallography / / edited by Devinder Singh, Simona Condurache-Bota |
| Pubbl/distr/stampa | London : , : IntechOpen, , 2020 |
| Descrizione fisica | 1 online resource (114 pages) |
| Disciplina | 548.83 |
| Soggetto topico | Electrons - Diffraction |
| ISBN | 1-83880-190-1 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910417992603321 |
| London : , : IntechOpen, , 2020 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
