top

  Info

  • Utilizzare la checkbox di selezione a fianco di ciascun documento per attivare le funzionalità di stampa, invio email, download nei formati disponibili del (i) record.

  Info

  • Utilizzare questo link per rimuovere la selezione effettuata.

Biblioteca

MARC Lista (tabellare)
Combined analysis [[electronic resource] /] / Daniel Chateigner
Combined analysis [[electronic resource] /] / Daniel Chateigner
Autore Chateigner Daniel
Edizione [1st edition]
Pubbl/distr/stampa London, U.K., : ISTE
Descrizione fisica 1 online resource (517 p.)
Disciplina 548.83
548/.83
Collana ISTE
Soggetto topico Analytical chemistry
Solid state chemistry
Crystals
ISBN 1-118-62264-2
1-118-62250-2
1-299-31555-0
1-118-62271-5
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto Cover; Combined Analysis; Title Page; Copyright Page; Table of Contents; Introduction; Acknowledgements; Chapter 1. Some Basic Notions About Powder Diffraction; 1.1. Crystallite, grain, polycrystal and powder; 1.2. Bragg's law and harmonic reflections; 1.2.1. Bragg's law; 1.2.2. Monochromator; 1.2.3. Harmonic radiation components; 1.3. Geometric conditions of diffraction, Ewald sphere; 1.4. Imperfect powders; 1.5. Main diffraction line profile components; 1.5.1. Origin of g(x); 1.5.2. Origin of f(x); 1.5.3. Deconvolution-extraction of f(x) and g(x); 1.6. Peak profile parameters
1.7. Modeling of the diffraction peaks1.7.1. Why do we need modeling?; 1.7.2. Modeling of a powder diffraction pattern; 1.8. Experimental geometry; 1.8.1. Curved Position Sensitive detector, asymmetric reflection geometry; 1.8.2. CCD or image plate detector, transmission geometry; 1.8.3. Curved-Area Position-Sensitive detector, transmission geometry; 1.9. Intensity calibration (flat-field); 1.9.1. Counts and intensity; 1.9.2. Flat-field; 1.9.3. PSD detector; 1.9.4. CAPS detector; 1.10. Standard samples; 1.10.1. Laboratory x-ray standards; 1.10.2. Neutron texture standards
1.11. Probed thickness (penetration depth)Chapter 2. Structure Refinement by Diffraction Profile Adjustment (Rietveld Method); 2.1. Principle of the Rietveld method; 2.2. Rietveld-based codes; 2.3. Parameter modeling; 2.3.1. Background modeling; 2.3.2. Structure factor; 2.3.3. Crystallites' preferred orientation (texture) corrections; 2.3.4. Peak asymmetry; 2.3.5. Peak displacements; 2.3.6. Lorentz-polarization correction; 2.3.7. Volume, absorption, thickness corrections; 2.3.8. Localization corrections; 2.3.9. Microabsorption/roughness corrections; 2.3.10. Wavelength
2.4. Crystal structure databases2.5. Reliability factors in profile refinements; 2.6. Parameter exactness; 2.7. The Le Bail method; 2.8. Refinement procedures; 2.8.1. Least squares; 2.8.2. Genetic or evolutionary algorithms; 2.8.3. Derivative difference minimization (DDM); 2.8.4. Simulated annealing; 2.9. Refinement strategy; 2.10. Structural determination by diffraction; 2.10.1. The phase problem in diffraction; 2.10.2. Patterson function; 2.10.3. Direct methods; 2.10.4. Direct space methods; 2.10.5. Fourier difference map; 2.10.6. Extension to aperiodic structures
Chapter 3. Automatic Indexing of Powder Diagrams3.1. Principle; 3.2. Dichotomy approach; 3.3. Criterions for quality; Chapter 4. Quantitative Texture Analysis; 4.1. Classic texture analysis; 4.1.1. Qualitative aspects of texture analysis; 4.1.2. Effects on diffraction diagrams; 4.1.3. Limitations of classic diagrams; 4.1.4. The Lotgering factor; 4.1.5. Representations of textures: pole figures; 4.1.6. Localization of crystallographic directions from pole figures; 4.1.7. Texture types; 4.2. Orientation distribution (OD) or orientation distribution function (ODF)
4.2.1. Pole figures and orientation spaces
Record Nr. UNINA-9910139243703321
Chateigner Daniel  
London, U.K., : ISTE
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
Combined analysis [[electronic resource] /] / Daniel Chateigner
Combined analysis [[electronic resource] /] / Daniel Chateigner
Autore Chateigner Daniel
Edizione [1st edition]
Pubbl/distr/stampa London, U.K., : ISTE
Descrizione fisica 1 online resource (517 p.)
Disciplina 548.83
548/.83
Collana ISTE
Soggetto topico Analytical chemistry
Solid state chemistry
Crystals
ISBN 1-118-62264-2
1-118-62250-2
1-299-31555-0
1-118-62271-5
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto Cover; Combined Analysis; Title Page; Copyright Page; Table of Contents; Introduction; Acknowledgements; Chapter 1. Some Basic Notions About Powder Diffraction; 1.1. Crystallite, grain, polycrystal and powder; 1.2. Bragg's law and harmonic reflections; 1.2.1. Bragg's law; 1.2.2. Monochromator; 1.2.3. Harmonic radiation components; 1.3. Geometric conditions of diffraction, Ewald sphere; 1.4. Imperfect powders; 1.5. Main diffraction line profile components; 1.5.1. Origin of g(x); 1.5.2. Origin of f(x); 1.5.3. Deconvolution-extraction of f(x) and g(x); 1.6. Peak profile parameters
1.7. Modeling of the diffraction peaks1.7.1. Why do we need modeling?; 1.7.2. Modeling of a powder diffraction pattern; 1.8. Experimental geometry; 1.8.1. Curved Position Sensitive detector, asymmetric reflection geometry; 1.8.2. CCD or image plate detector, transmission geometry; 1.8.3. Curved-Area Position-Sensitive detector, transmission geometry; 1.9. Intensity calibration (flat-field); 1.9.1. Counts and intensity; 1.9.2. Flat-field; 1.9.3. PSD detector; 1.9.4. CAPS detector; 1.10. Standard samples; 1.10.1. Laboratory x-ray standards; 1.10.2. Neutron texture standards
1.11. Probed thickness (penetration depth)Chapter 2. Structure Refinement by Diffraction Profile Adjustment (Rietveld Method); 2.1. Principle of the Rietveld method; 2.2. Rietveld-based codes; 2.3. Parameter modeling; 2.3.1. Background modeling; 2.3.2. Structure factor; 2.3.3. Crystallites' preferred orientation (texture) corrections; 2.3.4. Peak asymmetry; 2.3.5. Peak displacements; 2.3.6. Lorentz-polarization correction; 2.3.7. Volume, absorption, thickness corrections; 2.3.8. Localization corrections; 2.3.9. Microabsorption/roughness corrections; 2.3.10. Wavelength
2.4. Crystal structure databases2.5. Reliability factors in profile refinements; 2.6. Parameter exactness; 2.7. The Le Bail method; 2.8. Refinement procedures; 2.8.1. Least squares; 2.8.2. Genetic or evolutionary algorithms; 2.8.3. Derivative difference minimization (DDM); 2.8.4. Simulated annealing; 2.9. Refinement strategy; 2.10. Structural determination by diffraction; 2.10.1. The phase problem in diffraction; 2.10.2. Patterson function; 2.10.3. Direct methods; 2.10.4. Direct space methods; 2.10.5. Fourier difference map; 2.10.6. Extension to aperiodic structures
Chapter 3. Automatic Indexing of Powder Diagrams3.1. Principle; 3.2. Dichotomy approach; 3.3. Criterions for quality; Chapter 4. Quantitative Texture Analysis; 4.1. Classic texture analysis; 4.1.1. Qualitative aspects of texture analysis; 4.1.2. Effects on diffraction diagrams; 4.1.3. Limitations of classic diagrams; 4.1.4. The Lotgering factor; 4.1.5. Representations of textures: pole figures; 4.1.6. Localization of crystallographic directions from pole figures; 4.1.7. Texture types; 4.2. Orientation distribution (OD) or orientation distribution function (ODF)
4.2.1. Pole figures and orientation spaces
Record Nr. UNINA-9910830141803321
Chateigner Daniel  
London, U.K., : ISTE
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
Combined analysis / / Daniel Chateigner
Combined analysis / / Daniel Chateigner
Autore Chateigner Daniel
Edizione [1st edition]
Pubbl/distr/stampa London, U.K., : ISTE
Descrizione fisica 1 online resource (517 p.)
Disciplina 548/.83
Collana ISTE
Soggetto topico Chemistry, Analytic
Solid state chemistry
Crystals
ISBN 1-118-62264-2
1-118-62250-2
1-299-31555-0
1-118-62271-5
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto Cover; Combined Analysis; Title Page; Copyright Page; Table of Contents; Introduction; Acknowledgements; Chapter 1. Some Basic Notions About Powder Diffraction; 1.1. Crystallite, grain, polycrystal and powder; 1.2. Bragg's law and harmonic reflections; 1.2.1. Bragg's law; 1.2.2. Monochromator; 1.2.3. Harmonic radiation components; 1.3. Geometric conditions of diffraction, Ewald sphere; 1.4. Imperfect powders; 1.5. Main diffraction line profile components; 1.5.1. Origin of g(x); 1.5.2. Origin of f(x); 1.5.3. Deconvolution-extraction of f(x) and g(x); 1.6. Peak profile parameters
1.7. Modeling of the diffraction peaks1.7.1. Why do we need modeling?; 1.7.2. Modeling of a powder diffraction pattern; 1.8. Experimental geometry; 1.8.1. Curved Position Sensitive detector, asymmetric reflection geometry; 1.8.2. CCD or image plate detector, transmission geometry; 1.8.3. Curved-Area Position-Sensitive detector, transmission geometry; 1.9. Intensity calibration (flat-field); 1.9.1. Counts and intensity; 1.9.2. Flat-field; 1.9.3. PSD detector; 1.9.4. CAPS detector; 1.10. Standard samples; 1.10.1. Laboratory x-ray standards; 1.10.2. Neutron texture standards
1.11. Probed thickness (penetration depth)Chapter 2. Structure Refinement by Diffraction Profile Adjustment (Rietveld Method); 2.1. Principle of the Rietveld method; 2.2. Rietveld-based codes; 2.3. Parameter modeling; 2.3.1. Background modeling; 2.3.2. Structure factor; 2.3.3. Crystallites' preferred orientation (texture) corrections; 2.3.4. Peak asymmetry; 2.3.5. Peak displacements; 2.3.6. Lorentz-polarization correction; 2.3.7. Volume, absorption, thickness corrections; 2.3.8. Localization corrections; 2.3.9. Microabsorption/roughness corrections; 2.3.10. Wavelength
2.4. Crystal structure databases2.5. Reliability factors in profile refinements; 2.6. Parameter exactness; 2.7. The Le Bail method; 2.8. Refinement procedures; 2.8.1. Least squares; 2.8.2. Genetic or evolutionary algorithms; 2.8.3. Derivative difference minimization (DDM); 2.8.4. Simulated annealing; 2.9. Refinement strategy; 2.10. Structural determination by diffraction; 2.10.1. The phase problem in diffraction; 2.10.2. Patterson function; 2.10.3. Direct methods; 2.10.4. Direct space methods; 2.10.5. Fourier difference map; 2.10.6. Extension to aperiodic structures
Chapter 3. Automatic Indexing of Powder Diagrams3.1. Principle; 3.2. Dichotomy approach; 3.3. Criterions for quality; Chapter 4. Quantitative Texture Analysis; 4.1. Classic texture analysis; 4.1.1. Qualitative aspects of texture analysis; 4.1.2. Effects on diffraction diagrams; 4.1.3. Limitations of classic diagrams; 4.1.4. The Lotgering factor; 4.1.5. Representations of textures: pole figures; 4.1.6. Localization of crystallographic directions from pole figures; 4.1.7. Texture types; 4.2. Orientation distribution (OD) or orientation distribution function (ODF)
4.2.1. Pole figures and orientation spaces
Record Nr. UNINA-9910876630203321
Chateigner Daniel  
London, U.K., : ISTE
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
Diffuse x-ray scattering and models of disorder [[electronic resource] /] / T.R. Welberry
Diffuse x-ray scattering and models of disorder [[electronic resource] /] / T.R. Welberry
Autore Welberry T. R (Thomas Richard)
Pubbl/distr/stampa Oxford, : Oxford University Press, 2004
Descrizione fisica 1 online resource (281 p.)
Disciplina 548/.83
Collana International Union of Crystallography monographs on crystallography
Soggetto topico X-rays - Scattering
X-ray crystallography
Soggetto genere / forma Electronic books.
ISBN 1-280-84704-2
0-19-152376-3
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto Contents; I: EXPERIMENT; II: DISORDER MODELS; III: EXAMPLES OF REAL DISORDERED SYSTEMS; References; Index
Record Nr. UNINA-9910452975303321
Welberry T. R (Thomas Richard)  
Oxford, : Oxford University Press, 2004
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
Introduction to macromolecular crystallography [[electronic resource] /] / Alexander McPherson
Introduction to macromolecular crystallography [[electronic resource] /] / Alexander McPherson
Autore McPherson Alexander <1944->
Edizione [2nd ed.]
Pubbl/distr/stampa Hoboken, N.J., : Wiley-Blackwell, c2009
Descrizione fisica 1 online resource (279 p.)
Disciplina 548.8
548/.83
Soggetto topico Macromolecules - Structure
X-ray crystallography
ISBN 1-118-21063-8
1-282-11271-6
9786612112713
0-470-39151-0
0-470-39154-5
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto An overview of macromolecular crystallography -- Crystallization of macromolecules -- The nature of crystals: symmetry and the unit cell -- Waves and their properties -- Diffraction from points, planes, molecules, and crystals -- Interpretation of diffraction patterns -- Data collection -- Solving the phase problem -- Interpreting Patterson maps -- Electron density, refinement, and difference Fourier maps.
Record Nr. UNINA-9910146409903321
McPherson Alexander <1944->  
Hoboken, N.J., : Wiley-Blackwell, c2009
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
Introduction to macromolecular crystallography / / Alexander McPherson
Introduction to macromolecular crystallography / / Alexander McPherson
Autore McPherson Alexander <1944->
Edizione [2nd ed.]
Pubbl/distr/stampa Hoboken, N.J., : Wiley-Blackwell, c2009
Descrizione fisica 1 online resource (279 p.)
Disciplina 548/.83
Soggetto topico Macromolecules - Structure
X-ray crystallography
ISBN 1-118-21063-8
1-282-11271-6
9786612112713
0-470-39151-0
0-470-39154-5
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto An overview of macromolecular crystallography -- Crystallization of macromolecules -- The nature of crystals: symmetry and the unit cell -- Waves and their properties -- Diffraction from points, planes, molecules, and crystals -- Interpretation of diffraction patterns -- Data collection -- Solving the phase problem -- Interpreting Patterson maps -- Electron density, refinement, and difference Fourier maps.
Record Nr. UNINA-9910808695703321
McPherson Alexander <1944->  
Hoboken, N.J., : Wiley-Blackwell, c2009
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
Introduction to X-ray powder diffractometry / / Ron Jenkins, Robert L. Snyder
Introduction to X-ray powder diffractometry / / Ron Jenkins, Robert L. Snyder
Autore Jenkins Ron <1932->
Pubbl/distr/stampa New York, : Wiley, c1996
Descrizione fisica 1 online resource (428 p.)
Disciplina 548/.83
Altri autori (Persone) SnyderR. L <1941-> (Robert L.)
Collana Chemical analysis
Soggetto topico X-rays - Diffraction - Technique
X-ray diffractometer
Powders - Optical properties - Measurement
ISBN 1-283-59303-3
9786613905482
1-118-52091-2
1-118-52099-8
1-118-52092-0
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto Introduction to X-ray Powder Diffractometry; CONTENTS; PREFACE; CUMULATIVE LISTING OF VOLUMES IN SERIES; CHAPTER 1. CHARACTERISTICS OF X-RADIATION; 1.1. Early Development of X-ray Diffraction; 1.2. Origin of X-radiation; 1.3. Continuous Radiation; 1.4. Characteristic Radiation; 1.4.1. The Photoelectric Effect; 1.4.2. The Auger Effect; 1.4.3. Fluorescent Yield; 1.4.4. Selection Rules; 1.4.5. Nondiagram Lines; 1.4.6. Practical Form of the Copper K Spectrum; 1.5. Scattering of X-rays; 1.5.1. Coherent Scatter; 1.5.2. Compton Scatter; 1.6. Absorption of X-rays; 1.7. Safety Considerations
ReferencesCHAPTER 2. THE CRYSTALLINE STATE; 2.1. Introduction to the Crystalline State; 2.2. Crystallographic Symmetry; 2.2.1. Point Groups and Crystal Systems; 2.2.2. The Unit Cell and Bravais Lattices; 2.2.3. Reduced Cells; 2.2.4. Space Groups; 2.3. Space Group Notation; 2.3.1. The Triclinic or Anorthic Crystal System; 2.3.2. The Monoclinic Crystal System; 2.3.3. The Orthorhombic Crystal System; 2.3.4. The Tetragonal Crystal System; 2.3.5. The Hexagonal and Trigonal Crystal Systems; 2.3.6. The Cubic Crystal System; 2.3.7. Equivalent Positions; 2.3.8. Special Positions and Site Multiplicity
2.4. Space Group Theory2.5. Crystallographic Planes and Miller Indices; References; CHAPTER 3. DIFFRACTION THEORY; 3.1. Diffraction of X-rays; 3.2. The Reciprocal Lattice; 3.3. The Ewald Sphere of Reflection; 3.4. Origin of the Diffraction Pattern; 3.4.1. Single Crystal Diffraction; 3.4.2. The Powder Diffraction Pattern; 3.5. The Location of Diffraction Peaks; 3.6. Intensity of Diffraction Peaks; 3.6.1. Electron Scattering; 3.6.2. The Atomic Scattering Factor; 3.6.3. Anomalous Scattering; 3.6.4. Thermal Motion; 3.6.5. Scattering of X-rays by a Crystal: The Structure Factor
3.7. The Calculated Diffraction Pattern3.7.1. Factors Affecting the Relative Intensity of Bragg Reflections; 3.7.2. The Intensity Equation; 3.8. Calculation of the Powder Diffraction Pattern of KCl; 3.9. Anisotropic Distortions of the Diffraction Pattern; 3.9.1. Preferred Orientation; 3.9.2. Crystallite Size; 3.9.3. Residual Stress and Strain; References; CHAPTER 4. SOURCES FOR THE GENERATION OF X-RADIATION; 4.1. Components of the X-ray Source; 4.2. The Line-Voltage Supply; 4.3. The High-Voltage Generator; 4.3.1. Selection of Operating Conditions; 4.3.2. Source Stability
4.4. The Sealed X-ray Tube4.4.1. Typical X-ray Tube Configuration; 4.4.2. Specific Loading; 4.4.3. Care of the X-ray Tube; 4.5. Effective Line Width; 4.6. Spectral Contamination; 4.6.1. X-ray Tube Life; 4.7. The Rotating Anode X-ray Tube; References; CHAPTER 5. DETECTORS AND DETECTION ELECTRONICS; 5.1. X-ray Detectors; 5.2. Desired Properties of an X-ray Detector; 5.2.1. Quantum-Counting Efficiency; 5.2.2. Linearity; 5.2.3. Energy Proportionality; 5.2.4. Resolution; 5.3. Types of Detector; 5.3.1. The Gas Proportional Counter; 5.3.2. Position-Sensitive Detectors
5.3.3. The Scintillation Detector
Record Nr. UNINA-9910139078003321
Jenkins Ron <1932->  
New York, : Wiley, c1996
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
Photonic crystals : characteristics, performance and applications / / Barbara Goodwin, editor
Photonic crystals : characteristics, performance and applications / / Barbara Goodwin, editor
Pubbl/distr/stampa Hauppauge, New York : , : Nova Science Publishers, Incorporated, , [2017]
Descrizione fisica 1 online resource (236 pages) : illustrations (some color)
Disciplina 548/.83
Collana Physics Research and Technology
Soggetto topico Photonic crystals
Optoelectronic devices - Materials
Optical fibers
ISBN 1-63485-954-5
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto Photonic crystal fibers: design characteristics and optical properties / Sharafat Ali and Nasim Ahmed (School of Computer and Communication Engineering, University Malaysia Perlis Pauh Putra, Arau, Perlis, Malaysia) -- Band structure of metal/dielectric photonic crystals / Yi-Xin Zong and Jian-Bai Xia (SKLSM, Institute of Semiconductors, Chinese Academy of Sciences, Beijing, P.R. China) -- Multicore photonic crystal fiber based intensity splitters/couplers / Dror Malka and Zeev Zalevsky (Faculty of Engineering Holon Institute of Technology (HIT), Holon, Israel, and others) -- Switches, isolators, circulators and multifunctional components for optical and THZ regions based on 2D photonic crystals with magneto-optical resonators / Victor Dmitriev and Gianni Portela (Federal University of Para, Faculty of Electrical Engineering, Department of Electrical Engineering, Belem, Para, Brazil).
Record Nr. UNINA-9910160317403321
Hauppauge, New York : , : Nova Science Publishers, Incorporated, , [2017]
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
Photonic crystals [[electronic resource] ] : fabrication, band structure, and applications / / Venla E. Laine, editor
Photonic crystals [[electronic resource] ] : fabrication, band structure, and applications / / Venla E. Laine, editor
Pubbl/distr/stampa New York, : Nova Science Publishers, c2011
Descrizione fisica 1 online resource (319 p.)
Disciplina 548/.83
Altri autori (Persone) LaineVenla E
Collana Physics research and technology
Soggetto topico Photonic crystals
Chemistry
Soggetto genere / forma Electronic books.
ISBN 1-61728-340-1
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto ""PHOTONIC CRYSTALS: FABRICATION, BAND STRUCTURE AND APPLICATIONS ""; ""PHOTONIC CRYSTALS: FABRICATION, BAND STRUCTURE AND APPLICATIONS ""; ""CONTENTS ""; ""PREFACE ""; ""FABRICATION AND APPLICATIONS OF POLYMERPHOTONIC CRYSTALS""; ""1. Introduction""; ""2. Fabrication of Polymer PCs""; ""2.1. Self-Assembly of Latex Spheres from Gravity""; ""2.2. Self-Assembly of Latex Sphere by Exterior Field""; ""2.3. Self-Assembly of Latex Spheres Under Physical Confinement [44-52]""; ""2.4. PCs Fabricated from Micro-Phase Separation""; ""2.5. Large-Scale Fabrication of Polymer PCs""
""2.6. Fabrication of Patterned Polymer PCs by Printing""""3. Polymer PCs with Special Properties""; ""3.1. Polymer Pcs with High Strength""; ""3.2. Polymer PCs with Special Wettability[108]""; ""3.3. Polymer PCs with Stopband Modification""; ""4. Applications of Polymer PCs""; ""4.1. Optical Sensing Device""; ""4.2. PCs Used for Solar Cell""; ""4.3. PCs Used for Enhanced Fluorescence""; ""5. Future Outlook""; ""References""; ""ACHIEVING COMPLETE BAND GAPS USING LOWREFRACTIVE INDEX MATERIAL""; ""1. Introduction""; ""2. Complex Diamond Structure [23]""
""1) Experimental Method and the Samples""""2) Measured Spectra and Discussions""; ""3) Conclusion""; ""3. Self-simulating Structure [28,29]""; ""4. A Dnv Point Group Structure Based on Heterostructure [33]""; ""5. Theoretical Investigation [41]""; ""(1) Basic Considerations""; ""(2) Analytical Approach (AS)""; ""(3) Comparison with Plane Wave Expansion Method (PWEM)""; ""Analytical Solution""; ""Plane Wave Expansion Method""; ""(4) Conclusion""; ""6. Temperature Tunable Random Lasing in Weakly ScatteringStructure Formed by Speckle""; ""References""
""PHOTONIC CRYSTALS FOR MICROWAVE APPLICATIONS""""Abstract""; ""1. Introduction""; ""2. A New Type of Photonic Crystal Waveguidefor Millimeter-Wave Frequencies""; ""2.1. Structure of PC Waveguide""; ""2.2. Propagation Loss""; ""2.2.1. Dielectric and Metallic Losses""; ""2.2.2. Bending Loss""; ""2.2.3. Comparison of Loss Frequency Characteristics of Propagation and NRDWaveguide""; ""3. Two-Dimensional Photonic Crystals Using Metamaterials""; ""3.1. Metamaterials""; ""3.2. Band Characteristics of Split-Ring Metamaterials""
""4. Analysis of Propagation Loss of Metallic Photonic CrystalWaveguides [10]""""4.1. Basic Structure""; ""4.2. Attenuation Constant""; ""4.3. Varying the Waveguide Width""; ""5. Wide Band Metallic Waveguide with In-Line Dielectric Rods [3][18]""; ""5.1. Basic Principle""; ""5.2. Waveguide Structure""; ""5.3. Structure of a 90-Degree H-Plane Bent Waveguide [18]""; ""5.4. Simple Fabrication Method [18]""; ""6. Frequency Range Dependent TE30 to TE10 Mode Converter""; ""7. Conclusion""; ""References""; ""PHYSICS OF PHOTONIC CRYSTAL COUPLERS AND THEIR APPLICATIONS ""; ""Abstract ""
""1. Introduction ""
Record Nr. UNINA-9910461651803321
New York, : Nova Science Publishers, c2011
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
Photonic crystals [[electronic resource] ] : fabrication, band structure, and applications / / Venla E. Laine, editor
Photonic crystals [[electronic resource] ] : fabrication, band structure, and applications / / Venla E. Laine, editor
Pubbl/distr/stampa New York, : Nova Science Publishers, c2011
Descrizione fisica 1 online resource (319 p.)
Disciplina 548/.83
Altri autori (Persone) LaineVenla E
Collana Physics research and technology
Soggetto topico Photonic crystals
Chemistry
ISBN 1-61728-340-1
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto ""PHOTONIC CRYSTALS: FABRICATION, BAND STRUCTURE AND APPLICATIONS ""; ""PHOTONIC CRYSTALS: FABRICATION, BAND STRUCTURE AND APPLICATIONS ""; ""CONTENTS ""; ""PREFACE ""; ""FABRICATION AND APPLICATIONS OF POLYMERPHOTONIC CRYSTALS""; ""1. Introduction""; ""2. Fabrication of Polymer PCs""; ""2.1. Self-Assembly of Latex Spheres from Gravity""; ""2.2. Self-Assembly of Latex Sphere by Exterior Field""; ""2.3. Self-Assembly of Latex Spheres Under Physical Confinement [44-52]""; ""2.4. PCs Fabricated from Micro-Phase Separation""; ""2.5. Large-Scale Fabrication of Polymer PCs""
""2.6. Fabrication of Patterned Polymer PCs by Printing""""3. Polymer PCs with Special Properties""; ""3.1. Polymer Pcs with High Strength""; ""3.2. Polymer PCs with Special Wettability[108]""; ""3.3. Polymer PCs with Stopband Modification""; ""4. Applications of Polymer PCs""; ""4.1. Optical Sensing Device""; ""4.2. PCs Used for Solar Cell""; ""4.3. PCs Used for Enhanced Fluorescence""; ""5. Future Outlook""; ""References""; ""ACHIEVING COMPLETE BAND GAPS USING LOWREFRACTIVE INDEX MATERIAL""; ""1. Introduction""; ""2. Complex Diamond Structure [23]""
""1) Experimental Method and the Samples""""2) Measured Spectra and Discussions""; ""3) Conclusion""; ""3. Self-simulating Structure [28,29]""; ""4. A Dnv Point Group Structure Based on Heterostructure [33]""; ""5. Theoretical Investigation [41]""; ""(1) Basic Considerations""; ""(2) Analytical Approach (AS)""; ""(3) Comparison with Plane Wave Expansion Method (PWEM)""; ""Analytical Solution""; ""Plane Wave Expansion Method""; ""(4) Conclusion""; ""6. Temperature Tunable Random Lasing in Weakly ScatteringStructure Formed by Speckle""; ""References""
""PHOTONIC CRYSTALS FOR MICROWAVE APPLICATIONS""""Abstract""; ""1. Introduction""; ""2. A New Type of Photonic Crystal Waveguidefor Millimeter-Wave Frequencies""; ""2.1. Structure of PC Waveguide""; ""2.2. Propagation Loss""; ""2.2.1. Dielectric and Metallic Losses""; ""2.2.2. Bending Loss""; ""2.2.3. Comparison of Loss Frequency Characteristics of Propagation and NRDWaveguide""; ""3. Two-Dimensional Photonic Crystals Using Metamaterials""; ""3.1. Metamaterials""; ""3.2. Band Characteristics of Split-Ring Metamaterials""
""4. Analysis of Propagation Loss of Metallic Photonic CrystalWaveguides [10]""""4.1. Basic Structure""; ""4.2. Attenuation Constant""; ""4.3. Varying the Waveguide Width""; ""5. Wide Band Metallic Waveguide with In-Line Dielectric Rods [3][18]""; ""5.1. Basic Principle""; ""5.2. Waveguide Structure""; ""5.3. Structure of a 90-Degree H-Plane Bent Waveguide [18]""; ""5.4. Simple Fabrication Method [18]""; ""6. Frequency Range Dependent TE30 to TE10 Mode Converter""; ""7. Conclusion""; ""References""; ""PHYSICS OF PHOTONIC CRYSTAL COUPLERS AND THEIR APPLICATIONS ""; ""Abstract ""
""1. Introduction ""
Record Nr. UNINA-9910790280103321
New York, : Nova Science Publishers, c2011
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui