Info
- Utilizzare la checkbox di selezione a fianco di ciascun documento per attivare le funzionalità di stampa, invio email, download nei formati disponibili del (i) record.
Application of Ambient Pressure X-Ray Photoelectron Spectroscopy to Catalysis
| Application of Ambient Pressure X-Ray Photoelectron Spectroscopy to Catalysis |
| Autore | Tao Franklin |
| Edizione | [1st ed.] |
| Pubbl/distr/stampa | Newark : , : John Wiley & Sons, Incorporated, , 2023 |
| Descrizione fisica | 1 online resource (286 pages) |
| Disciplina | 543.62 |
| ISBN |
1-119-84548-3
1-119-84545-9 |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
Cover -- Title Page -- Copyright Page -- Contents -- Preface -- Chapter 1 From Surface of Model Catalyst in UHV to Surface of Nanoparticle Catalyst During Catalysis -- References -- Chapter 2 Application of XPS: from Surface in UHV to Surface in Gas or Liquid Phase -- 2.1 Origin of X-ray Photoelectron Spectroscopy -- 2.2 Applications of XPS to Study Surface in High Vacuum -- 2.3 Applications of XPS to Study Sample in Gas Phase -- 2.4 Applications of XPS to Study Sample in Liquid Phase -- 2.4.1 XPS Studies of Surface of Nanoparticle Catalyst in Static Liquid -- 2.4.2 XPS Studies of Surface of Nanoparticle Catalyst in Flowing Liquid -- 2.4.3 XPS Study of Flowing Gas with a Pressure of 1 atm or Higher -- References -- Chapter 3 Fundamentals of X-ray Photoelectron Spectroscopy -- 3.1 Principle of XPS -- 3.2 Generation of X-ray -- 3.3 Excitation of Photoelectron and Chemical Shift -- 3.3.1 Initial State Effect -- 3.3.2 Final State Effect -- 3.3.2.1 Core Hole-Induced Polarization Final State Effect -- 3.3.2.2 Core Hole-Induced Rearrangement Final State Effect -- 3.4 Measurements of Energy of Photoelectrons -- 3.5 Measurements of Intensity of Photoelectrons -- References -- Chapter 4 Instrumentation of XPS -- 4.1 Regular X-ray Source -- 4.2 X-ray Source with a Monochromator -- 4.3 Energy Analyzer -- 4.4 Detector -- References -- Chapter 5 Significance and Challenge of Studying Surface of a Catalyst in Gaseous Phase -- 5.1 Origin of Difference between Surface in UHV and Surface in Reactant Gas -- 5.2 Intrinsic Feature of Catalytic Sites on Surface: Environmental Sensitivity -- 5.3 Ex Situ, Semi-in Situ, and In Situ/Operando Studies of Catalyst Surface at Ambient Pressure of Reactants -- 5.3.1 Difference among Ex Situ, Semi-In Situ, and In Situ/Operando Studies.
5.3.2 Example of Surface Structures Only Formed and Maintained by Reactant at a Relatively High Pressure -- 5.3.3 Example of Catalyst Structure Only Observable during Catalysis -- 5.4 Ex Situ, Semi-in Situ, and In Situ/Operando Studies of Catalyst Structure at High Pressure -- 5.5 Technical Challenges in Studying Surface of a Catalyst in Gas Phase -- References -- Chapter 6 Instrumentation of Ambient Pressure X-ray Photoelectron Spectrometer -- 6.1 X-ray Source for AP-XPS Studies -- 6.1.1 Brief of X-ray Sources -- 6.1.2 Soft X-ray for AP-XPS and Its Limitation in High Pressure Studies -- 6.1.3 Al K for AP-XPS and Its Challenge in Working at Higher Pressure -- 6.1.4 Hard X-ray for AP-XPS and its Application to High Pressure Studies -- 6.2 Reaction Cell with Capability of Flowing Gas -- 6.2.1 Necessity of Having a Reaction Cell for Performing In Situ/Operando Studies of Catalysis -- 6.2.2 Structure of Reaction Cell -- 6.2.3 Sealing of a Reaction Cell and its Engaging Mechanism -- 6.2.4 Function of a Reaction Cell for AP-XPS Studies of Catalyst -- 6.3 Differential Pumping Energy Analyzer with High Transmission -- 6.4 Mass Spectrometer with Capability of Measurement of Catalytic Performance -- References -- Chapter 7 Experimental Methods of AP-XPS Studies -- 7.1 Leak Test of Reaction Cell -- 7.2 Exclusion of Catalysis by Reaction Cell -- 7.3 Tunning and Control of Sample-Aperture Distance -- 7.4 Sample Heating and Temperature Control -- 7.5 Online Measurement of Reactants and Products -- 7.6 Spectroscopic Titration of Surface Species -- References -- Chapter 8 Difference in Data Analysis Between AP-XPS and High Vacuum XPS -- 8.1 Potential Difference in Measuring Atomic Ratio of Two Elements on Catalyst Surface -- 8.2 Difference in Intensity of Photoelectrons Collected by Energy Analyzer -- 8.3 Difference in Resolution and Baseline of Spectrum. 8.4 Difference in Spectrum between Free Molecules in Gas and Adsorbed Molecules on Surface -- 8.5 Calibration of Nominal Atomic Ratio A/Z of a Catalyst Surface in a Pure Gas -- 8.6 Calibration of Nominal Atomic Ratio A/Z of a Catalyst Surface in a Mixture of Reactants -- 8.7 Calibration of Nominal Atomic Ratio A/Z of a Catalyst Surface in a Pure Gas Obtained at Different Temperature for Fair Comparison -- References -- Chapter 9 Significance of Using AP-XPS in Studies of Catalysis -- 9.1 Fundamental of Catalyst Surface -- 9.2 Significance of Characterization of Surface of a Catalyst in Gas Phase -- 9.3 Significance of Using AP-XPS in Fundamental Studies of Catalysis -- References -- Chapter 10 CO Oxidation on Single Crystal Model Catalysts -- 10.1 Pt(557) and Pt(332) in CO -- 10.2 CO Oxidation on Pd(100), Pd(111), and Pd(110) -- 10.2.1 CO Oxidation on Pd(100) -- 10.2.2 CO Oxidation on Pd(111) -- 10.2.3 CO Oxidation on Pd(110) -- 10.3 CO Oxidation on Pt(110) and Pt(111) -- 10.3.1 CO Oxidation on Pt(110) -- 10.3.2 CO Oxidation on Pt(111) -- 10.4 CO Oxidation on Rh(110) -- 10.5 CO Oxidation on Cu(111) -- References -- Chapter 11 CO Oxidation on High Surface Area Catalysts -- 11.1 CO Oxidation on Rh Nanoparticles -- 11.2 CO Oxidation on Ru Nanoparticles -- References -- Chapter 12 Hydrogenation of Carbon Dioxide -- References -- Chapter 13 Water-Gas Shift -- 13.1 Co3O4 and Pt/Co3O4 -- 13.1.1 Gas Composition-dependent Reducibility -- 13.1.2 Active Phase of Co3O4 during Water-Gas Shift -- 13.1.3 Active Phase of 0.5 wt% Pt/Co3O4 at 150-200 °C -- 13.1.4 Active Phase of 0.5 wt% Pt/Co3O4 at 280-350 °C -- 13.1.5 Temperature-dependent Evolution of Active Phase -- 13.2 Pt,Au, Pd, and Cu Supported on CeO2 Nanorods -- 13.3 CuO−Cr2O3−Fe2O3 -- References -- Chapter 14 Complete Oxidation of Methane -- 14.1 Complete Oxidation of Methane on NiCo2O4. 14.2 Complete Oxidation of Methane on NiFe2O4 -- 14.3 Complete Oxidation of Methane on NiO with Different Surface Structures -- References -- Chapter 15 Partial Oxidation of Methanol -- 15.1 Partial Oxidation of Methanol on Pd1Zn3/ZnO -- 15.2 Partial Oxidation of Methanol on Ir1Zn3/ZnO -- References -- Chapter 16 Partial Oxidation of Methane -- 16.1 Partial Oxidation of Methane on Pd/CeO2 -- 16.2 Partial Oxidation of Methane on Pt/CeO2 -- 16.3 Partial Oxidation of Methane on Rh/CeO2 -- References -- Chapter 17 Oxidative Coupling of Methane -- 17.1 OCM on Supported Na2WO4 and Hypothesized Active Phase Na2O2 -- 17.2 First Observation of Na2O2 through AP-XPS Studies at 800 °C -- 17.3 Formation of a Thin Layer of Na2O2 Supported on Na2WO4 -- References -- Chapter 18 Dry and Steam Reforming of Methane -- 18.1 Dry Reforming of CH4 on CeO2 Anchored with Ni1 and Ru1 Sites -- 18.2 Steam Reforming of CH4 on CeO2 Anchored with Ni1 and Ru1 Single-atom Sites -- References -- Chapter 19 Reduction of NO with CO -- 19.1 Reduction of NO with CO on Co3O4 -- 19.2 Reduction of NO with CO on Rh1Co3 Clusters Supported on CoO -- References -- Chapter 20 Tuning Catalyst Surfaces for Developing Catalysts -- 20.1 Capability of Compositional Restructuring Checkable with AP-XPS -- 20.2 Tracking Restructuring of Bimetallic Surface under Reaction and Catalytic Conditions for Tuning Catalytic Performance of a Bimetallic Catalyst -- References -- Chapter 21 Photocatalysis -- References -- Index -- EULA. |
| Record Nr. | UNINA-9910830867603321 |
Tao Franklin
|
||
| Newark : , : John Wiley & Sons, Incorporated, , 2023 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Application of Ambient Pressure X-Ray Photoelectron Spectroscopy to Catalysis
| Application of Ambient Pressure X-Ray Photoelectron Spectroscopy to Catalysis |
| Autore | Tao Franklin |
| Edizione | [1st ed.] |
| Pubbl/distr/stampa | Newark : , : John Wiley & Sons, Incorporated, , 2023 |
| Descrizione fisica | 1 online resource (286 pages) |
| Disciplina | 543.62 |
| ISBN |
1-119-84548-3
1-119-84545-9 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
Cover -- Title Page -- Copyright Page -- Contents -- Preface -- Chapter 1 From Surface of Model Catalyst in UHV to Surface of Nanoparticle Catalyst During Catalysis -- References -- Chapter 2 Application of XPS: from Surface in UHV to Surface in Gas or Liquid Phase -- 2.1 Origin of X-ray Photoelectron Spectroscopy -- 2.2 Applications of XPS to Study Surface in High Vacuum -- 2.3 Applications of XPS to Study Sample in Gas Phase -- 2.4 Applications of XPS to Study Sample in Liquid Phase -- 2.4.1 XPS Studies of Surface of Nanoparticle Catalyst in Static Liquid -- 2.4.2 XPS Studies of Surface of Nanoparticle Catalyst in Flowing Liquid -- 2.4.3 XPS Study of Flowing Gas with a Pressure of 1 atm or Higher -- References -- Chapter 3 Fundamentals of X-ray Photoelectron Spectroscopy -- 3.1 Principle of XPS -- 3.2 Generation of X-ray -- 3.3 Excitation of Photoelectron and Chemical Shift -- 3.3.1 Initial State Effect -- 3.3.2 Final State Effect -- 3.3.2.1 Core Hole-Induced Polarization Final State Effect -- 3.3.2.2 Core Hole-Induced Rearrangement Final State Effect -- 3.4 Measurements of Energy of Photoelectrons -- 3.5 Measurements of Intensity of Photoelectrons -- References -- Chapter 4 Instrumentation of XPS -- 4.1 Regular X-ray Source -- 4.2 X-ray Source with a Monochromator -- 4.3 Energy Analyzer -- 4.4 Detector -- References -- Chapter 5 Significance and Challenge of Studying Surface of a Catalyst in Gaseous Phase -- 5.1 Origin of Difference between Surface in UHV and Surface in Reactant Gas -- 5.2 Intrinsic Feature of Catalytic Sites on Surface: Environmental Sensitivity -- 5.3 Ex Situ, Semi-in Situ, and In Situ/Operando Studies of Catalyst Surface at Ambient Pressure of Reactants -- 5.3.1 Difference among Ex Situ, Semi-In Situ, and In Situ/Operando Studies.
5.3.2 Example of Surface Structures Only Formed and Maintained by Reactant at a Relatively High Pressure -- 5.3.3 Example of Catalyst Structure Only Observable during Catalysis -- 5.4 Ex Situ, Semi-in Situ, and In Situ/Operando Studies of Catalyst Structure at High Pressure -- 5.5 Technical Challenges in Studying Surface of a Catalyst in Gas Phase -- References -- Chapter 6 Instrumentation of Ambient Pressure X-ray Photoelectron Spectrometer -- 6.1 X-ray Source for AP-XPS Studies -- 6.1.1 Brief of X-ray Sources -- 6.1.2 Soft X-ray for AP-XPS and Its Limitation in High Pressure Studies -- 6.1.3 Al K for AP-XPS and Its Challenge in Working at Higher Pressure -- 6.1.4 Hard X-ray for AP-XPS and its Application to High Pressure Studies -- 6.2 Reaction Cell with Capability of Flowing Gas -- 6.2.1 Necessity of Having a Reaction Cell for Performing In Situ/Operando Studies of Catalysis -- 6.2.2 Structure of Reaction Cell -- 6.2.3 Sealing of a Reaction Cell and its Engaging Mechanism -- 6.2.4 Function of a Reaction Cell for AP-XPS Studies of Catalyst -- 6.3 Differential Pumping Energy Analyzer with High Transmission -- 6.4 Mass Spectrometer with Capability of Measurement of Catalytic Performance -- References -- Chapter 7 Experimental Methods of AP-XPS Studies -- 7.1 Leak Test of Reaction Cell -- 7.2 Exclusion of Catalysis by Reaction Cell -- 7.3 Tunning and Control of Sample-Aperture Distance -- 7.4 Sample Heating and Temperature Control -- 7.5 Online Measurement of Reactants and Products -- 7.6 Spectroscopic Titration of Surface Species -- References -- Chapter 8 Difference in Data Analysis Between AP-XPS and High Vacuum XPS -- 8.1 Potential Difference in Measuring Atomic Ratio of Two Elements on Catalyst Surface -- 8.2 Difference in Intensity of Photoelectrons Collected by Energy Analyzer -- 8.3 Difference in Resolution and Baseline of Spectrum. 8.4 Difference in Spectrum between Free Molecules in Gas and Adsorbed Molecules on Surface -- 8.5 Calibration of Nominal Atomic Ratio A/Z of a Catalyst Surface in a Pure Gas -- 8.6 Calibration of Nominal Atomic Ratio A/Z of a Catalyst Surface in a Mixture of Reactants -- 8.7 Calibration of Nominal Atomic Ratio A/Z of a Catalyst Surface in a Pure Gas Obtained at Different Temperature for Fair Comparison -- References -- Chapter 9 Significance of Using AP-XPS in Studies of Catalysis -- 9.1 Fundamental of Catalyst Surface -- 9.2 Significance of Characterization of Surface of a Catalyst in Gas Phase -- 9.3 Significance of Using AP-XPS in Fundamental Studies of Catalysis -- References -- Chapter 10 CO Oxidation on Single Crystal Model Catalysts -- 10.1 Pt(557) and Pt(332) in CO -- 10.2 CO Oxidation on Pd(100), Pd(111), and Pd(110) -- 10.2.1 CO Oxidation on Pd(100) -- 10.2.2 CO Oxidation on Pd(111) -- 10.2.3 CO Oxidation on Pd(110) -- 10.3 CO Oxidation on Pt(110) and Pt(111) -- 10.3.1 CO Oxidation on Pt(110) -- 10.3.2 CO Oxidation on Pt(111) -- 10.4 CO Oxidation on Rh(110) -- 10.5 CO Oxidation on Cu(111) -- References -- Chapter 11 CO Oxidation on High Surface Area Catalysts -- 11.1 CO Oxidation on Rh Nanoparticles -- 11.2 CO Oxidation on Ru Nanoparticles -- References -- Chapter 12 Hydrogenation of Carbon Dioxide -- References -- Chapter 13 Water-Gas Shift -- 13.1 Co3O4 and Pt/Co3O4 -- 13.1.1 Gas Composition-dependent Reducibility -- 13.1.2 Active Phase of Co3O4 during Water-Gas Shift -- 13.1.3 Active Phase of 0.5 wt% Pt/Co3O4 at 150-200 °C -- 13.1.4 Active Phase of 0.5 wt% Pt/Co3O4 at 280-350 °C -- 13.1.5 Temperature-dependent Evolution of Active Phase -- 13.2 Pt,Au, Pd, and Cu Supported on CeO2 Nanorods -- 13.3 CuO−Cr2O3−Fe2O3 -- References -- Chapter 14 Complete Oxidation of Methane -- 14.1 Complete Oxidation of Methane on NiCo2O4. 14.2 Complete Oxidation of Methane on NiFe2O4 -- 14.3 Complete Oxidation of Methane on NiO with Different Surface Structures -- References -- Chapter 15 Partial Oxidation of Methanol -- 15.1 Partial Oxidation of Methanol on Pd1Zn3/ZnO -- 15.2 Partial Oxidation of Methanol on Ir1Zn3/ZnO -- References -- Chapter 16 Partial Oxidation of Methane -- 16.1 Partial Oxidation of Methane on Pd/CeO2 -- 16.2 Partial Oxidation of Methane on Pt/CeO2 -- 16.3 Partial Oxidation of Methane on Rh/CeO2 -- References -- Chapter 17 Oxidative Coupling of Methane -- 17.1 OCM on Supported Na2WO4 and Hypothesized Active Phase Na2O2 -- 17.2 First Observation of Na2O2 through AP-XPS Studies at 800 °C -- 17.3 Formation of a Thin Layer of Na2O2 Supported on Na2WO4 -- References -- Chapter 18 Dry and Steam Reforming of Methane -- 18.1 Dry Reforming of CH4 on CeO2 Anchored with Ni1 and Ru1 Sites -- 18.2 Steam Reforming of CH4 on CeO2 Anchored with Ni1 and Ru1 Single-atom Sites -- References -- Chapter 19 Reduction of NO with CO -- 19.1 Reduction of NO with CO on Co3O4 -- 19.2 Reduction of NO with CO on Rh1Co3 Clusters Supported on CoO -- References -- Chapter 20 Tuning Catalyst Surfaces for Developing Catalysts -- 20.1 Capability of Compositional Restructuring Checkable with AP-XPS -- 20.2 Tracking Restructuring of Bimetallic Surface under Reaction and Catalytic Conditions for Tuning Catalytic Performance of a Bimetallic Catalyst -- References -- Chapter 21 Photocatalysis -- References -- Index -- EULA. |
| Record Nr. | UNINA-9910841224403321 |
|
Tao Franklin
|
||
| Newark : , : John Wiley & Sons, Incorporated, , 2023 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Auger- and X-Ray Photoelectron Spectroscopy in Materials Science [[electronic resource] ] : A User-Oriented Guide / / by Siegfried Hofmann
| Auger- and X-Ray Photoelectron Spectroscopy in Materials Science [[electronic resource] ] : A User-Oriented Guide / / by Siegfried Hofmann |
| Autore | Hofmann Siegfried |
| Edizione | [1st ed. 2013.] |
| Pubbl/distr/stampa | Berlin, Heidelberg : , : Springer Berlin Heidelberg : , : Imprint : Springer, , 2013 |
| Descrizione fisica | 1 online resource (543 p.) |
| Disciplina | 543.62 |
| Collana | Springer Series in Surface Sciences |
| Soggetto topico |
Solid state physics
Spectroscopy Microscopy Materials—Surfaces Thin films Solid State Physics Spectroscopy and Microscopy Surfaces and Interfaces, Thin Films |
| ISBN | 3-642-27381-5 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | Outline of the Technique/Brief Description -- Theoretical Background -- Instrumentation -- Practical Surface Analysis with AES -- Data Evaluation/Quantification -- Problem Solving with AES (Examples). |
| Record Nr. | UNINA-9910437802903321 |
|
Hofmann Siegfried
|
||
| Berlin, Heidelberg : , : Springer Berlin Heidelberg : , : Imprint : Springer, , 2013 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Catalytic removal of volatile organic compounds [[electronic resource] /] / Jean-François Lamonier [editor]
| Catalytic removal of volatile organic compounds [[electronic resource] /] / Jean-François Lamonier [editor] |
| Pubbl/distr/stampa | Basel : , : MDPI - Multidisciplinary Digital Publishing Institute, , 2016 |
| Descrizione fisica | 1 online resource (288 pages) : illustrations, charts |
| Disciplina | 543.62 |
| Soggetto topico | Organic compounds |
| ISBN |
9783038422143 (ebook)
9783038422136 (hardbook) |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | List of Contributors -- About the Guest Editor -- Preface to "Catalytic Removal of Volatile Organic Compounds" -- Non-Calorimetric Determination of the Adsorption Heat of Volatile Organic Compounds under Dynamic Conditions -- Catalytic Oxidation of Propene over Pd Catalysts Supported on CeO2, TiO2, Al2O3 and M/Al2O3 Oxides (M = Ce, Ti, Fe, Mn) -- Silica Supported Platinum Catalysts for Total Oxidation of the Polyaromatic Hydrocarbon Naphthalene: An Investigation of Metal Loading and Calcination Temperature -- Abatement of VOCs with Alternate Adsorption and Plasma-Assisted Regeneration: A Review -- Coupling Noble Metals and Carbon Supports in the Development of Combustion Catalysts for the Abatement of BTX Compounds in Air Streams -- Catalysts for the Decomposition of Diethylether -- The Role of Ozone in the Reaction Mechanism of a Bare Zeolite-Plasma Hybrid System Co-Al Mixed Oxides Prepared via LDH Route Using Microwaves or Ultrasound: Application for Catalytic Toluene Total Oxidation -- Oxygen Storage Capacity and Oxygen Mobility of Co-Mn-Mg-Al Mixed Oxides and Their Relation in the VOC Oxidation Reaction -- Utilization of Volatile Organic Compounds as an Alternative for Destructive Abatement -- Removal of Toluene over NaX Zeolite Exchanged with Cu2+ -- TiO2-Impregnated Porous Silica Tube and Its Application for Compact Air- and Water-Purification Units. |
| Record Nr. | UNINA-9910674399503321 |
| Basel : , : MDPI - Multidisciplinary Digital Publishing Institute, , 2016 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Hard X-ray Photoelectron Spectroscopy (HAXPES) [[electronic resource] /] / edited by Joseph Woicik
| Hard X-ray Photoelectron Spectroscopy (HAXPES) [[electronic resource] /] / edited by Joseph Woicik |
| Edizione | [1st ed. 2016.] |
| Pubbl/distr/stampa | Cham : , : Springer International Publishing : , : Imprint : Springer, , 2016 |
| Descrizione fisica | 1 online resource (576 p.) |
| Disciplina | 543.62 |
| Collana | Springer Series in Surface Sciences |
| Soggetto topico |
Atomic structure
Molecular structure Spectroscopy Microscopy Materials—Surfaces Thin films Surfaces (Physics) Interfaces (Physical sciences) Atomic/Molecular Structure and Spectra Spectroscopy/Spectrometry Spectroscopy and Microscopy Surfaces and Interfaces, Thin Films Surface and Interface Science, Thin Films |
| ISBN | 3-319-24043-9 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | Overview -- Early Work and SSRP -- Instrumentation and Spin Resolved -- Theory -- Inelastic Mean Free Path -- Final State Effects -- Recoil Effects -- Atomic and Molecular -- Angle Resolved -- Valence Density of States -- Diffraction -- Advanced Materials -- Correlated Materials -- Perovskite Interfaces and Superlattices -- Heusler Compounds -- In-Situ Surface Chemistry -- Heterojunction Band Alignment -- Semiconductor Electronics -- Photoelectron Imaging -- Time Resolved. |
| Record Nr. | UNINA-9910254613703321 |
| Cham : , : Springer International Publishing : , : Imprint : Springer, , 2016 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Heterocycles : Synthesis and Biological Activities / / edited by B P Nandeshwarappa and S O Sadashiv
| Heterocycles : Synthesis and Biological Activities / / edited by B P Nandeshwarappa and S O Sadashiv |
| Pubbl/distr/stampa | London, England : , : IntechOpen, , 2020 |
| Descrizione fisica | 1 online resource (202 pages) : IntechOpen |
| Disciplina | 543.62 |
| Soggetto topico | Organic compounds |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti | Heterocycles |
| Record Nr. | UNINA-9910409740703321 |
| London, England : , : IntechOpen, , 2020 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Nonlinear X-Ray Spectroscopy for Materials Science [[electronic resource] /] / edited by Iwao Matsuda, Ryuichi Arafune
| Nonlinear X-Ray Spectroscopy for Materials Science [[electronic resource] /] / edited by Iwao Matsuda, Ryuichi Arafune |
| Autore | Matsuda Iwao |
| Edizione | [1st ed. 2023.] |
| Pubbl/distr/stampa | Singapore : , : Springer Nature Singapore : , : Imprint : Springer, , 2023 |
| Descrizione fisica | 1 online resource (170 pages) |
| Disciplina | 543.62 |
| Altri autori (Persone) | ArafuneRyuichi |
| Collana | Springer Series in Optical Sciences |
| Soggetto topico |
X-ray spectroscopy
Nonlinear Optics Materials - Analysis Optical spectroscopy Lasers X-Ray Spectroscopy Characterization and Analytical Technique Optical Spectroscopy Laser |
| ISBN | 981-9967-14-7 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
Intro -- Preface -- Contents -- Contributors -- Abbreviations -- 1 Introduction -- 1.1 Nonlinearity -- 1.2 Classical Model of Nonlinear Optical Process -- 1.3 Pragmatic Importance of Nonlinear Spectroscopy for Materials Science -- 1.4 Synopsys -- Bibliography -- 2 Linear X-Ray Spectroscopy -- 2.1 Basics -- 2.1.1 Optical Responses of Materials in the X-Ray Region -- 2.1.2 X-Ray Sources -- 2.1.3 Light-Matter Interactions -- 2.2 X-Ray Spectroscopy -- 2.2.1 X-Ray Absorption Spectroscopy -- 2.2.2 Photoelectron Spectroscopy -- 2.2.3 X-Ray Emission Spectroscopy -- 2.3 Time-Resolved X-Ray Spectroscopy -- 2.3.1 Measurement Principles -- 2.3.2 Examples of Time-Resolved Photoemission Spectroscopy Measurement -- 2.4 Researcher's Guide to Material Characterization with X-Rays -- 2.4.1 The Guiding Chart for Experiments -- 2.4.2 Application for Beamtime at the X-Ray Facility -- 2.5 Summary -- References -- 3 Probing Nonlinear Light-Matter Interaction in Momentum Space: Coherent Multiphoton Photoemission Spectroscopy -- 3.1 Introduction -- 3.2 Experimental Setup -- 3.2.1 Experimental Setup: The Photoelectron Analyzer -- 3.2.2 Experimental Setup: The Light-Source -- 3.3 mPP: Highly Nonlinear Mapping of the Energy- and Momentum-Dispersive Electronic Band Structure -- 3.3.1 Static mPP in Threshold Order of Photoemission -- 3.3.2 Above Threshold Photoemission -- 3.3.3 Toward Full Surface Brillouin Zone Mapping by Coherent mPP -- 3.4 Coherent Two-Dimensional Photoelectron Spectroscopy -- 3.4.1 Coherent 2D FT Photoelectron Spectroscopy-Optical Bloch Equation Modeling -- 3.4.2 Coherent 2D FT Photoelectron Spectroscopy of Ag(111) -- 3.4.3 Coherent Above Threshold Photoemission -- 3.5 Ultrafast Quasiparticle Dressing by Light -- 3.6 Conclusion -- References -- 4 Nonlinear Soft X-Ray Spectroscopy -- 4.1 Nonlinear Spectroscopy-Development with Visible Light.
4.2 Ultrafast X-Ray Light Sources -- 4.3 Family of Soft X-Ray Nonlinear Spectroscopy -- 4.4 Nonlinear Soft X-Ray Optics and Spectroscopies -- 4.4.1 Multiphoton Absorption -- 4.4.2 Stimulated Emission/Forward Scattering -- 4.4.3 Stimulated Raman Scattering -- 4.4.4 Four Wave Mixing -- 4.4.5 Soft X-Ray Second Harmonic Generation/Sum Frequency Generation -- 4.5 Theoretical Calculations for the Spectral Analysis -- 4.6 Summary -- References -- 5 Nonlinear X-Ray Spectroscopy -- 5.1 Introduction -- 5.2 The Basic Theory of Nonlinear Optics in the Hard X-Ray Region -- 5.2.1 Nonlinear Polarizability -- 5.2.2 X-Ray Second Harmonic Generation -- 5.2.3 Parametric Down-Conversion -- 5.2.4 Sum Frequency Generation -- 5.3 Featuring Examples of Nonlinear X-Ray Spectroscopy -- 5.3.1 X-Ray Two-Photon Absorption Spectroscopy -- 5.3.2 Saturable Absorption -- 5.3.3 Atomic X-Ray Laser -- 5.3.4 Stimulated X-Ray Emission Spectroscopy -- 5.3.5 X-Ray Transient Grating Spectroscopy -- 5.4 Summary -- References -- 6 Future Prospects -- 6.1 Toward Multi-dimensional Spectroscopy -- 6.2 Phase Sensitive Spectroscopy -- 6.3 Vacuum Nonlinear X-Ray Optics -- 6.4 Developments in Experimental Stations for Materials Science -- 6.5 Into the Deep: Nonlinear Science -- References -- Index. |
| Record Nr. | UNINA-9910765495303321 |
|
Matsuda Iwao
|
||
| Singapore : , : Springer Nature Singapore : , : Imprint : Springer, , 2023 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Phenolic Compounds : Chemistry, Synthesis, Diversity, Non-Conventional Industrial, Pharmaceutical and Therapeutic Applications / / edited by Farid A. Badria, Miroslav Blumenberg
| Phenolic Compounds : Chemistry, Synthesis, Diversity, Non-Conventional Industrial, Pharmaceutical and Therapeutic Applications / / edited by Farid A. Badria, Miroslav Blumenberg |
| Pubbl/distr/stampa | London : , : IntechOpen, , 2022 |
| Descrizione fisica | 1 online resource (452 pages) : illustrations |
| Disciplina | 543.62 |
| Soggetto topico | Organic compounds |
| ISBN | 1-83969-347-9 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti | Phenolic Compounds |
| Record Nr. | UNINA-9910586658703321 |
| London : , : IntechOpen, , 2022 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Portable x-ray fluorescence spectrometry [[electronic resource] ] : capabilities for in situ analysis / / edited by Philip J. Potts, Margaret West
| Portable x-ray fluorescence spectrometry [[electronic resource] ] : capabilities for in situ analysis / / edited by Philip J. Potts, Margaret West |
| Pubbl/distr/stampa | Cambridge, UK, : RSC Pub., c2008 |
| Descrizione fisica | 1 online resource (304 p.) |
| Disciplina | 543.62 |
| Altri autori (Persone) |
PottsP. J
WestMargaret |
| Soggetto topico |
X-ray spectroscopy
X-ray photoelectron spectroscopy |
| Soggetto genere / forma | Electronic books. |
| ISBN | 1-84755-864-X |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | Portable X-ray_revised; i_iv; v_vi; vii_xii; 001_012; 013_038; 039_055; 056_082; 083_097; 098_140; 141_173; 174_205; 206_246; 247_278; 279_291 |
| Record Nr. | UNINA-9910454968703321 |
| Cambridge, UK, : RSC Pub., c2008 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Portable x-ray fluorescence spectrometry [[electronic resource] ] : capabilities for in situ analysis / / edited by Philip J. Potts, Margaret West
| Portable x-ray fluorescence spectrometry [[electronic resource] ] : capabilities for in situ analysis / / edited by Philip J. Potts, Margaret West |
| Pubbl/distr/stampa | Cambridge, UK, : RSC Pub., c2008 |
| Descrizione fisica | 1 online resource (304 p.) |
| Disciplina | 543.62 |
| Altri autori (Persone) |
PottsP. J
WestMargaret |
| Soggetto topico |
X-ray spectroscopy
X-ray photoelectron spectroscopy |
| ISBN | 1-84755-864-X |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | Portable X-ray_revised; i_iv; v_vi; vii_xii; 001_012; 013_038; 039_055; 056_082; 083_097; 098_140; 141_173; 174_205; 206_246; 247_278; 279_291 |
| Record Nr. | UNINA-9910778305603321 |
| Cambridge, UK, : RSC Pub., c2008 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
