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Advanced X-ray Imaging of Electrochemical Energy Materials and Devices / / edited by Jiajun Wang
| Advanced X-ray Imaging of Electrochemical Energy Materials and Devices / / edited by Jiajun Wang |
| Edizione | [1st ed. 2021.] |
| Pubbl/distr/stampa | Singapore : , : Springer Nature Singapore : , : Imprint : Springer, , 2021 |
| Descrizione fisica | 1 online resource (252 pages) |
| Disciplina | 543.08586 |
| Collana | Chemistry and Materials Science Series |
| Soggetto topico |
Materials - Analysis
Electrochemistry Materials Catalysis Force and energy Characterization and Analytical Technique Materials for Energy and Catalysis |
| ISBN | 981-16-5328-3 |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | A category of synchrotron X-ray imaging methods -- Practical basics and applications of X-ray tomography -- Advanced transmission X-ray microscopy for energy materials and devices -- Principles of transmission X-ray microscopy and its applications in battery study -- Coherent diffractive imaging and its application in energy materials and devices study -- Synchrotron radiation based X-ray fluorescence imaging -- Applications of soft X-ray spectromicroscopy in energy research from materials to batteries -- Principles and applications of industrial X-ray computed tomography -- Machine learning in X-ray imaging and microscopy applications -- In situ/operando synchrotron X-ray imaging techniques for energy-related applications. |
| Record Nr. | UNINA-9910503010503321 |
| Singapore : , : Springer Nature Singapore : , : Imprint : Springer, , 2021 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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ANSI/IEEE Std 759-1984 : IEEE standard test procedures for semiconductor x-ray energy spectrometers / / Institute of Electrical and Electronics Engineers
| ANSI/IEEE Std 759-1984 : IEEE standard test procedures for semiconductor x-ray energy spectrometers / / Institute of Electrical and Electronics Engineers |
| Pubbl/distr/stampa | Piscataway, New Jersey : , : IEEE, , 1984 |
| Descrizione fisica | 1 online resource (39 pages) |
| Disciplina | 543.08586 |
| Soggetto topico |
X-ray spectroscopy
Semiconductors |
| ISBN | 0-7381-0715-8 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti | ANSI/IEEE Std 759-1984: IEEE Standard Test Procedures for Semiconductor X-Ray Energy Spectrometers |
| Record Nr. | UNISA-996279553103316 |
| Piscataway, New Jersey : , : IEEE, , 1984 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
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ANSI/IEEE Std 759-1984 : IEEE standard test procedures for semiconductor x-ray energy spectrometers / / Institute of Electrical and Electronics Engineers
| ANSI/IEEE Std 759-1984 : IEEE standard test procedures for semiconductor x-ray energy spectrometers / / Institute of Electrical and Electronics Engineers |
| Pubbl/distr/stampa | Piscataway, New Jersey : , : IEEE, , 1984 |
| Descrizione fisica | 1 online resource (39 pages) |
| Disciplina | 543.08586 |
| Soggetto topico |
X-ray spectroscopy
Semiconductors |
| ISBN | 0-7381-0715-8 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti | ANSI/IEEE Std 759-1984: IEEE Standard Test Procedures for Semiconductor X-Ray Energy Spectrometers |
| Record Nr. | UNINA-9910135417703321 |
| Piscataway, New Jersey : , : IEEE, , 1984 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Applied X-rays / George L. Clark
| Applied X-rays / George L. Clark |
| Autore | Clark, George L. |
| Edizione | [4. ed] |
| Pubbl/distr/stampa | New York etc., : McGraw-Hill, 1955 |
| Descrizione fisica | ix, 843 p. : ill. ; 25 cm. |
| Disciplina | 543.08586 |
| Collana | International series in pure and applied physics |
| Soggetto non controllato | Analisi spettroscopica |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910920148203321 |
Clark, George L.
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| New York etc., : McGraw-Hill, 1955 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Handbook of monochromatic XPS spectra / B. Vincent Crist
| Handbook of monochromatic XPS spectra / B. Vincent Crist |
| Autore | Crist, B. Vincent |
| Pubbl/distr/stampa |
< |
| Descrizione fisica | 3 v. : ill. ; 23x27cm. |
| Disciplina | 543.08586 |
| Soggetto topico |
Raggi X - Analisi spettroscopica
Spettroscopia - Raggi X |
| ISBN | 0-471-49266-3 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNIBAS-000008104 |
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Crist, B. Vincent
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| <<John>> Wiley | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. della Basilicata | ||
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Handbook of monochromatic XPS spectra / B. Vincent Crist
| Handbook of monochromatic XPS spectra / B. Vincent Crist |
| Autore | Crist, B. Vincent |
| Pubbl/distr/stampa | Chichester ; New York : Wiley, c2000 |
| Descrizione fisica | v. : ill. ; 22 x 27 cm |
| Disciplina | 543.08586 |
| Soggetto topico | Raggio-X - Spettroscopia |
| ISBN |
0471492655 (v. 1)
0471492671 (v. 2 ) |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
[v.1]: The elements and native oxides / B. Vincent Christ . - 2000. - xxviii, 519 p.
[v. 2]: Polymers and polymers damaged by X-rays / B. Vincent Christ . - 2000. - xxviii, 426 p. |
| Record Nr. | UNISALENTO-991001938619707536 |
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Crist, B. Vincent
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| Chichester ; New York : Wiley, c2000 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. del Salento | ||
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Handbook of X-ray Photoelectron Spectroscopy : a reference book of standard spectra for identification and interpretation of XPS data / John F. Moulder...[et al.] ; edited by Jill Chastain, Roger C. King, Jr.
| Handbook of X-ray Photoelectron Spectroscopy : a reference book of standard spectra for identification and interpretation of XPS data / John F. Moulder...[et al.] ; edited by Jill Chastain, Roger C. King, Jr. |
| Pubbl/distr/stampa | Eden Prairie (Minnesota) : Physical Electronics, Inc., c1995 |
| Descrizione fisica | 261 p. : ill. ; 29x29 cm. |
| Disciplina | 543.08586 |
| Soggetto topico |
Spettroscopia fotoelettrica - Manuali
Spettroscopia a raggi X - Manuali |
| ISBN | 0-9648124-1-X |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNIBAS-000008119 |
| Eden Prairie (Minnesota) : Physical Electronics, Inc., c1995 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. della Basilicata | ||
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Handbook of X-ray spectrometry / edited by René E. Van Grieken, Andrzej A. Markowicz
| Handbook of X-ray spectrometry / edited by René E. Van Grieken, Andrzej A. Markowicz |
| Edizione | [2nd ed., rev. and expanded] |
| Pubbl/distr/stampa | New York : Marcel Dekker, c2002 |
| Descrizione fisica | xvi, 983 p. : ill. ; 26 cm |
| Disciplina | 543.08586 |
| Altri autori (Persone) |
Grieken, R. van (René)
Markowicz, Andrzej |
| Collana | Practical spectroscopy ; v. 29 |
| Soggetto topico |
X-ray spectroscopy
Spectrometry, X-Ray Emission - methods |
| ISBN | 0824706005 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISALENTO-991000555579707536 |
| New York : Marcel Dekker, c2002 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. del Salento | ||
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High-Resolution X-ray Spectroscopy : Instrumentation, Data Analysis, and Science / / edited by Cosimo Bambi, Jiachen Jiang
| High-Resolution X-ray Spectroscopy : Instrumentation, Data Analysis, and Science / / edited by Cosimo Bambi, Jiachen Jiang |
| Edizione | [1st ed. 2023.] |
| Pubbl/distr/stampa | Singapore : , : Springer Nature Singapore : , : Imprint : Springer, , 2023 |
| Descrizione fisica | 1 online resource (417 pages) |
| Disciplina | 543.08586 |
| Collana | Springer Series in Astrophysics and Cosmology |
| Soggetto topico |
X-ray spectroscopy
Astronomy Measurement Measuring instruments Astrophysics X-Ray Spectroscopy Astronomy, Observations and Techniques Measurement Science and Instrumentation |
| ISBN | 981-9944-09-0 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | Part I: Instrumentation and data analysis -- 1. History, present and future of high-resolution X-ray spectroscopy -- 2. X-ray Diffraction Grating Spectrometers -- 3. XMM-Newton grating -- - Introduction to RGS -- - Data reduction for RGS data -- 4. Chandra grating -- - Introduction to LETG/HETG -- - Data reduction for Chandra data -- 5. High-resolution grating spectral analysis -- - Statistics and spectral grouping -- - Line search -- - Spectral analysis with SPEX -- 6. Micro-calorimeters with transition edge sensors -- 7. Hitomi micro-calorimeter -- - Introduction to the micro-calorimeter on Hitomi -- - Data reduction for SXT data -- 8. High-resolution spectral analysis of Hitomi data -- Part II: Science -- 9. Overview of astrophysical plasmas -- 10. Clusters of galaxies -- 11. Active galactic nuclei -- 12. Circumgalactic and intergalactic medium -- 13. Solar wind and charge exchange -- 14. Galactic black hole X-ray binaries -- 15. Supernova remnants -- 16. Galactic cataclysmic variables -- 17. Dynamics of gas and plasma in cool and hot stars. |
| Record Nr. | UNINA-9910743685103321 |
| Singapore : , : Springer Nature Singapore : , : Imprint : Springer, , 2023 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Index to the Literature on X-Ray Spectrographic Analysis Part I, 1913-1957
| Index to the Literature on X-Ray Spectrographic Analysis Part I, 1913-1957 |
| Pubbl/distr/stampa | [Place of publication not identified], : American Society for Testing & Materials, 1961 |
| Descrizione fisica | 1 online resource (42 pages) |
| Disciplina | 543.08586 |
| Soggetto topico | X-ray spectroscopy |
| ISBN | 0-8031-5961-7 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910164755203321 |
| [Place of publication not identified], : American Society for Testing & Materials, 1961 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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