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Very High Resolution Photoelectron Spectroscopy [[electronic resource] /] / edited by Stephan Hüfner
| Very High Resolution Photoelectron Spectroscopy [[electronic resource] /] / edited by Stephan Hüfner |
| Edizione | [1st ed. 2007.] |
| Pubbl/distr/stampa | Berlin, Heidelberg : , : Springer Berlin Heidelberg : , : Imprint : Springer, , 2007 |
| Descrizione fisica | 1 online resource (409 p.) |
| Disciplina | 543/.62 |
| Collana | Lecture Notes in Physics |
| Soggetto topico |
Solid state physics
Spectroscopy Microscopy Atomic structure Molecular structure Physical measurements Measurement Materials—Surfaces Thin films Solid State Physics Spectroscopy and Microscopy Atomic/Molecular Structure and Spectra Measurement Science and Instrumentation Surfaces and Interfaces, Thin Films |
| ISBN |
1-280-81692-9
9786610816927 3-540-68133-7 |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | Many-Body Effects -- Photoemission Spectroscopy with Very High Energy Resolution: Studying the Influence of Electronic Correlations on the Millielectronvolt Scale -- Photoemission as a Probe of the Collective Excitations in Condensed Matter Systems -- High-resolution Photoemission Spectroscopy of Solids Using Synchrotron Radiation -- Low-Dimensional Systems -- Photoemission on Quasi-One-Dimensional Solids: Peierls, Luttinger & Co. -- Atomic Chains at Surfaces -- Ultimate Resolution -- High-Resolution Photoemission Spectroscopy of Low-T c Superconductors -- Molecules -- Very-High-Resolution Laser Photoelectron Spectroscopy of Molecules -- High-Temperature Superconductors and Transition-Metal Oxides -- Doping Evolution of the Cuprate Superconductors from High-Resolution ARPES -- Many-Body Interaction in Holeand Electron-Doped High-T c Cuprate Superconductors -- Dressing of the Charge Carriers in High-T c Superconductors -- High-Resolution Photoemission Spectroscopy of Perovskite-Type Transition-Metal Oxides -- High Energy and High Resolution -- High-Resolution High-Energy Photoemission Study of Rare-Earth Heavy Fermion Systems -- Hard X-Ray Photoemission Spectroscopy. |
| Record Nr. | UNISA-996466679103316 |
| Berlin, Heidelberg : , : Springer Berlin Heidelberg : , : Imprint : Springer, , 2007 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
Very High Resolution Photoelectron Spectroscopy / / edited by Stephan Hüfner
| Very High Resolution Photoelectron Spectroscopy / / edited by Stephan Hüfner |
| Edizione | [1st ed. 2007.] |
| Pubbl/distr/stampa | Berlin, Heidelberg : , : Springer Berlin Heidelberg : , : Imprint : Springer, , 2007 |
| Descrizione fisica | 1 online resource (409 p.) |
| Disciplina | 543/.62 |
| Collana | Lecture Notes in Physics |
| Soggetto topico |
Solid state physics
Spectrum analysis Microscopy Atomic structure Molecular structure Physical measurements Measurement Materials—Surfaces Thin films Solid State Physics Spectroscopy and Microscopy Atomic/Molecular Structure and Spectra Measurement Science and Instrumentation Surfaces and Interfaces, Thin Films |
| ISBN |
1-280-81692-9
9786610816927 3-540-68133-7 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | Many-Body Effects -- Photoemission Spectroscopy with Very High Energy Resolution: Studying the Influence of Electronic Correlations on the Millielectronvolt Scale -- Photoemission as a Probe of the Collective Excitations in Condensed Matter Systems -- High-resolution Photoemission Spectroscopy of Solids Using Synchrotron Radiation -- Low-Dimensional Systems -- Photoemission on Quasi-One-Dimensional Solids: Peierls, Luttinger & Co. -- Atomic Chains at Surfaces -- Ultimate Resolution -- High-Resolution Photoemission Spectroscopy of Low-T c Superconductors -- Molecules -- Very-High-Resolution Laser Photoelectron Spectroscopy of Molecules -- High-Temperature Superconductors and Transition-Metal Oxides -- Doping Evolution of the Cuprate Superconductors from High-Resolution ARPES -- Many-Body Interaction in Holeand Electron-Doped High-T c Cuprate Superconductors -- Dressing of the Charge Carriers in High-T c Superconductors -- High-Resolution Photoemission Spectroscopy of Perovskite-Type Transition-Metal Oxides -- High Energy and High Resolution -- High-Resolution High-Energy Photoemission Study of Rare-Earth Heavy Fermion Systems -- Hard X-Ray Photoemission Spectroscopy. |
| Record Nr. | UNINA-9910146575403321 |
| Berlin, Heidelberg : , : Springer Berlin Heidelberg : , : Imprint : Springer, , 2007 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
X-ray absorption spectroscopy for the chemical and materials sciences / / John Evans, Chemistry, University of Southampton, UK, Diamond Light Source, UK
| X-ray absorption spectroscopy for the chemical and materials sciences / / John Evans, Chemistry, University of Southampton, UK, Diamond Light Source, UK |
| Autore | Evans John <1949 June 2-> |
| Pubbl/distr/stampa | Hoboken, New Jersey : , : Wiley, , 2018 |
| Descrizione fisica | 1 online resource (288 pages) |
| Disciplina | 543/.62 |
| Soggetto topico | X-ray spectroscopy |
| Soggetto genere / forma | Electronic books. |
| ISBN | 1-118-67618-1 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910555261303321 |
Evans John <1949 June 2->
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| Hoboken, New Jersey : , : Wiley, , 2018 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
X-ray absorption spectroscopy for the chemical and materials sciences / / Professor, John Evans, Chemistry, University of Southampton, UK, Diamond Light Source, UK
| X-ray absorption spectroscopy for the chemical and materials sciences / / Professor, John Evans, Chemistry, University of Southampton, UK, Diamond Light Source, UK |
| Autore | Evans John <1949 June 2-> |
| Pubbl/distr/stampa | John Wiley & Sons, Inc |
| Disciplina | 543/.62 |
| Soggetto topico | X-ray spectroscopy |
| ISBN |
1-118-67618-1
1-118-67617-3 1-118-67616-5 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910571891303321 |
|
Evans John <1949 June 2->
|
||
| John Wiley & Sons, Inc | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
X-ray absorption spectroscopy for the chemical and materials sciences / / Professor, John Evans, Chemistry, University of Southampton, UK, Diamond Light Source, UK
| X-ray absorption spectroscopy for the chemical and materials sciences / / Professor, John Evans, Chemistry, University of Southampton, UK, Diamond Light Source, UK |
| Autore | Evans John <1949 June 2-> |
| Pubbl/distr/stampa | John Wiley & Sons, Inc |
| Disciplina | 543/.62 |
| Soggetto topico | X-ray spectroscopy |
| ISBN |
1-118-67618-1
1-118-67617-3 1-118-67616-5 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910830747103321 |
|
Evans John <1949 June 2->
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||
| John Wiley & Sons, Inc | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
X-ray photoelectron spectroscopy : an introduction to principles and practices / / Paul van der Heide
| X-ray photoelectron spectroscopy : an introduction to principles and practices / / Paul van der Heide |
| Autore | Van der Heide Paul <1962-> |
| Pubbl/distr/stampa | Hoboken, N.J., : Wiley, c2012 |
| Descrizione fisica | 1 online resource (262 p.) |
| Disciplina | 543/.62 |
| Soggetto topico |
X-ray photoelectron spectroscopy
Spectrum analysis |
| ISBN |
1-283-33247-7
9786613332479 1-118-16290-0 1-118-16289-7 1-118-16292-7 |
| Classificazione | SCI078000 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
X-RAY PHOTOELECTRON SPECTROSCOPY: An Introduction to Principles and Practices; CONTENTS; FOREWORD; PREFACE; ACKNOWLEDGMENTS; LIST OF CONSTANTS; CHAPTER 1: INTRODUCTION; 1.1 SURFACE ANALYSIS; 1.2 XPS/ESCA FOR SURFACE ANALYSIS; 1.3 HISTORICAL PERSPECTIVE; 1.4 PHYSICAL BASIS OF XPS; 1.5 SENSITIVITY AND SPECIFICITY OF XPS; 1.6 SUMMARY; CHAPTER 2: ATOMS, IONS, AND THEIR ELECTRONIC STRUCTURE; 2.1 ATOMS, IONS, AND MATTER; 2.1.1 Atomic Structure; 2.1.2 Electronic Structure; 2.1.2.1 Quantum Numbers; 2.1.2.2 Stationary-State Notation; 2.1.2.3 Stationary-State Transition Notation
2.1.2.4 Stationary States 2.1.2.5 Spin Orbit Splitting; 2.2 SUMMARY; CHAPTER 3: XPS INSTRUMENTATION; 3.1 PREREQUISITES OF X-RAY PHOTOELECTRON SPECTROSCOPY (XPS); 3.1.1 Vacuum; 3.1.1.1 Vacuum Systems; 3.1.2 X-ray Sources; 3.1.2.1 Standard Sources; 3.1.2.2 Monochromated Sources; 3.1.2.3 Gas Discharge Lamps; 3.1.2.4 Synchrotron Sources; 3.1.3 Electron Sources; 3.1.3.1 Thermionic Sources; 3.1.4 Ion Sources; 3.1.4.1 EI Sources; 3.1.5 Energy Analyzers; 3.1.5.1 CMA; 3.1.5.2 CHA; 3.1.5.3 Modes of Operation; 3.1.5.4 Energy Resolution; 3.1.6 Detectors; 3.1.6.1 EMs; 3.1.7 Imaging; 3.1.7.1 Serial Imaging 3.1.7.2 Parallel Imaging 3.1.7.3 Spatial Resolution; 3.2 SUMMARY; CHAPTER 4: DATA COLLECTION AND QUANTIFICATION; 4.1 ANALYSIS PROCEDURES; 4.1.1 Sample Handling; 4.1.2 Data Collection; 4.1.3 Energy Referencing; 4.1.4 Charge Compensation; 4.1.5 X-ray and Electron-Induced Damage; 4.2 PHOTOELECTRON INTENSITIES; 4.2.1 Photoelectron Cross Sections; 4.2.2 The Analyzed Volume; 4.2.2.1 Electron Path Lengths; 4.2.2.2 Takeoff Angle; 4.2.3 The Background Signal; 4.2.4 Quantification; 4.3 INFORMATION AS A FUNCTION OF DEPTH; 4.3.1 Opening up the Third Dimension; 4.3.1.1 AR-XPS and Energy-Resolved XPS 4.3.1.2 Sputter Depth Profiling 4.4 SUMMARY; CHAPTER 5: SPECTRAL INTERPRETATION; 5.1 SPECIATION; 5.1.1 Photoelectron Binding Energies; 5.1.1.1 The Z + 1 Approximation; 5.1.1.2 Initial State Effects; 5.1.1.3 Final State Effects; 5.1.1.4 The Auger Parameter; 5.1.1.5 Curve Fitting; 5.2 SUMMARY; CHAPTER 6: SOME CASE STUDIES; 6.1 OVERVIEW; 6.1.1 Iodine Impregnation of Single-Walled Carbon Nanotube (SWNT); 6.1.2 Analysis of Group IIA-IV Metal Oxides; 6.1.3 Analysis of Mixed Metal Oxides of Interest as SOFC Cathodes; 6.1.4 Analysis of YBCO and Related Oxides/Carbonates; 6.2 SUMMARY; APPENDICES APPENDIX A: PERIODIC TABLE OF THE ELEMENTS APPENDIX B: BINDING ENERGIES (B.E.XPS ORB.E.XRF) OF THE ELEMENTS; B.1 1S-3S, 2P-3P, AND 3D VALUES; B.2 4S-5S, 4P-5P, AND 4D VALUES; APPENDIX C: SOME QUANTUM MECHANICS CALCULATIONS OF INTEREST; APPENDIX D: SOME STATISTICAL DISTRIBUTIONS OF INTEREST; D.1 GAUSSIAN DISTRIBUTION; D.2 POISSON DISTRIBUTION; D.3 LORENTZIAN DISTRIBUTIONS; APPENDIX E: SOME OPTICAL PROPERTIES OF INTEREST; E.1 CHROMATIC ABERRATIONS; E.2 SPHERICAL ABERRATIONS; E.3 DIFFRACTION LIMIT; APPENDIX F: SOME OTHER SPECTROSCOPIC/SPECTROMETRIC TECHNIQUES OF INTEREST F.1 PHOTON SPECTROSCOPIES |
| Record Nr. | UNINA-9910139552903321 |
|
Van der Heide Paul <1962->
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| Hoboken, N.J., : Wiley, c2012 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
X-ray photoelectron spectroscopy [[electronic resource] /] / Johanna M. Wagner, editor
| X-ray photoelectron spectroscopy [[electronic resource] /] / Johanna M. Wagner, editor |
| Pubbl/distr/stampa | New York, : Nova Science Publishers, c2011 |
| Descrizione fisica | 1 online resource (290 p.) |
| Disciplina | 543/.62 |
| Altri autori (Persone) | WagnerJohanna M |
| Collana | Chemical engineering methods and technology |
| Soggetto topico | X-ray photoelectron spectroscopy |
| Soggetto genere / forma | Electronic books. |
| ISBN | 1-61728-240-5 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
""X-RAY PHOTOELECTRON SPECTROSCOPY""; ""X-RAY PHOTOELECTRON SPECTROSCOPY""; ""LIBRARY OF CONGRESS CATALOGING-IN-PUBLICATION DATA""; ""CONTENTS ""; ""PREFACE ""; ""Chapter 1: X-RAY PHOTOELECTRON SPECTROSCOPY: STUDIES FROM INDUSTRIAL & BIOACTIVE GLASS TO BIOMATERIALS""; ""ABSTRACT ""; ""1. X-RAY PHOTOELECTRON SPECTROSCOPY: CONCEPT AND PRINCIPLES""; ""2. RELATING GLASS TO XPS ""; ""3. SILICATE GLASS CORROSION ""; ""4. APPLICATION OF XPS TO GLASS CORROSION""; ""5. XPS ROLE IN GLASS FABRICATION ""; ""6. EVOLUTION OF BIOACTIVE GLASSES ""; ""7. GLASS BASED BIOMATERIALS: GLASS IONOMER CEMENTS ""
""REFERENCES """"Chapter 2: XPS FOR INVESTIGATING CULTURAL HERITAGE MATERIALS""; ""ABSTRACT ""; ""1. INTRODUCTION ""; ""2. PIGMENTS IDENTIFICATION AND ALTERATION IN PAINT LAYERS""; ""2.1. The Case of Copper Resinate ""; ""2.2. The Case of Smalt""; ""3. STONE ""; ""3.1. The Case of Michealgelo's David ""; ""4. GLASS ""; ""5. SURFACE MODIFICATIONS INDUCED BY CLEANING AND PROTECTIVE TREATMENTS ""; ""6. BRONZE ""; ""REFERENCES ""; ""Chapter 3: X-RAY PHOTOELECTRON SPECTROSCOPY APPLIED TO ATOMIC STRUCTURE ANALYSIS OF SILICATE GLASSES THIN LAYERS ""; ""ABSTRACT ""; ""INTRODUCTION"" ""EXPERIMENTAL """"SILICA STRUCTURE ""; ""STRUCTURE OF SILICA FILMS PRODUCED BY CATHODE SPRAY DEPOSITION OF SILICON IN OXYGEN MEDIUM""; ""STRUCTURE OF SOL-GEL SILICA FILMS""; ""STRUCTURE OF LEAD-SILICATE GLASSES ""; ""THE SECONDARY-ELECTRON EMISSION COEFFICIENTS OF LEAD SILICATE GLASSES ""; ""CONCLUSION ""; ""REFERENCES ""; ""Chapter 4: INFLUENCE OF NO2 ON ATMOSPHERIC CORROSION OF ZINC EXPOSED IN A CLIMATE CHAMBER ""; ""ABSTRACT ""; ""INTRODUCTION ""; ""EXPERIMENTAL PROCEDURE ""; ""ZINC SAMPLES WITHOUT EXPOSURE ""; ""EXPOSITION AT 35°C ""; ""EXPOSITION AT 25°C "" ""INFLUENCE OF ION SPUTTERING ON THE S2P PHOTOELECTRON PEAK FOR ZINC-SULFUR CORROSION PRODUCTS """"CONCLUSION ""; ""REFERENCES ""; ""Chapter 5: X-RAY PHOTOELECTRON SPECTROSCOPY AS A TOOL IN THE STUDY OF NANOSTRUCTURED TITANIUM AND COMMERCIAL PET SURFACES IN BIOTECHNOLOGICAL APPLICATIONS ""; ""ABSTRACT ""; ""1. XPS AND BIOTECHNOLOGY ""; ""2. CASE STUDY 1 TITANIUM OXIDATION STATES ON TITANIUM THIN FILMS AND BULK SURFACES ""; ""2.1. Experimental Design ""; ""2.2. Elemental Analysis ""; ""2.3. Titanium Oxidation States ""; ""2.4. Carbon Contamination ""; ""2.5. Conclusions "" ""3. CASE STUDY 2 BACTERIAL MODIFICATION OF POLY(ETHYLENE TEREPHTHALATE) POLYMER SURFACES""""3.1. Experimental Design ""; ""3.2. Elemental Analysis ""; ""3.3. High-Resolution Spectra ""; ""3.4. Bacterial Modifications ""; ""3.5. Carbon Contamination ""; ""3.6. Conclusions ""; ""4. SUMMARY ""; ""5. REFERENCES ""; ""Chapter 6: XPS AS A POWERFUL TOOL TO INVESTIGATE THE SURFACE PROPERTIES OF SIMPLE, DOPED AND MIXED METAL OXIDES ""; ""ABSTRACT ""; ""ABBREVIATIONS AND ACRONYMS ""; ""GENERAL REMARKS ""; ""1. Metal oxides: a general overview ""; ""1.1. General remarks on metal oxides "" ""1.2 Importance of surface in metal oxides "" |
| Record Nr. | UNINA-9910457922903321 |
| New York, : Nova Science Publishers, c2011 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
X-ray photoelectron spectroscopy [[electronic resource] /] / Johanna M. Wagner, editor
| X-ray photoelectron spectroscopy [[electronic resource] /] / Johanna M. Wagner, editor |
| Pubbl/distr/stampa | New York, : Nova Science Publishers, c2011 |
| Descrizione fisica | 1 online resource (290 p.) |
| Disciplina | 543/.62 |
| Altri autori (Persone) | WagnerJohanna M |
| Collana | Chemical engineering methods and technology |
| Soggetto topico | X-ray photoelectron spectroscopy |
| ISBN | 1-61728-240-5 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
""X-RAY PHOTOELECTRON SPECTROSCOPY""; ""X-RAY PHOTOELECTRON SPECTROSCOPY""; ""LIBRARY OF CONGRESS CATALOGING-IN-PUBLICATION DATA""; ""CONTENTS ""; ""PREFACE ""; ""Chapter 1: X-RAY PHOTOELECTRON SPECTROSCOPY: STUDIES FROM INDUSTRIAL & BIOACTIVE GLASS TO BIOMATERIALS""; ""ABSTRACT ""; ""1. X-RAY PHOTOELECTRON SPECTROSCOPY: CONCEPT AND PRINCIPLES""; ""2. RELATING GLASS TO XPS ""; ""3. SILICATE GLASS CORROSION ""; ""4. APPLICATION OF XPS TO GLASS CORROSION""; ""5. XPS ROLE IN GLASS FABRICATION ""; ""6. EVOLUTION OF BIOACTIVE GLASSES ""; ""7. GLASS BASED BIOMATERIALS: GLASS IONOMER CEMENTS ""
""REFERENCES """"Chapter 2: XPS FOR INVESTIGATING CULTURAL HERITAGE MATERIALS""; ""ABSTRACT ""; ""1. INTRODUCTION ""; ""2. PIGMENTS IDENTIFICATION AND ALTERATION IN PAINT LAYERS""; ""2.1. The Case of Copper Resinate ""; ""2.2. The Case of Smalt""; ""3. STONE ""; ""3.1. The Case of Michealgelo's David ""; ""4. GLASS ""; ""5. SURFACE MODIFICATIONS INDUCED BY CLEANING AND PROTECTIVE TREATMENTS ""; ""6. BRONZE ""; ""REFERENCES ""; ""Chapter 3: X-RAY PHOTOELECTRON SPECTROSCOPY APPLIED TO ATOMIC STRUCTURE ANALYSIS OF SILICATE GLASSES THIN LAYERS ""; ""ABSTRACT ""; ""INTRODUCTION"" ""EXPERIMENTAL """"SILICA STRUCTURE ""; ""STRUCTURE OF SILICA FILMS PRODUCED BY CATHODE SPRAY DEPOSITION OF SILICON IN OXYGEN MEDIUM""; ""STRUCTURE OF SOL-GEL SILICA FILMS""; ""STRUCTURE OF LEAD-SILICATE GLASSES ""; ""THE SECONDARY-ELECTRON EMISSION COEFFICIENTS OF LEAD SILICATE GLASSES ""; ""CONCLUSION ""; ""REFERENCES ""; ""Chapter 4: INFLUENCE OF NO2 ON ATMOSPHERIC CORROSION OF ZINC EXPOSED IN A CLIMATE CHAMBER ""; ""ABSTRACT ""; ""INTRODUCTION ""; ""EXPERIMENTAL PROCEDURE ""; ""ZINC SAMPLES WITHOUT EXPOSURE ""; ""EXPOSITION AT 35°C ""; ""EXPOSITION AT 25°C "" ""INFLUENCE OF ION SPUTTERING ON THE S2P PHOTOELECTRON PEAK FOR ZINC-SULFUR CORROSION PRODUCTS """"CONCLUSION ""; ""REFERENCES ""; ""Chapter 5: X-RAY PHOTOELECTRON SPECTROSCOPY AS A TOOL IN THE STUDY OF NANOSTRUCTURED TITANIUM AND COMMERCIAL PET SURFACES IN BIOTECHNOLOGICAL APPLICATIONS ""; ""ABSTRACT ""; ""1. XPS AND BIOTECHNOLOGY ""; ""2. CASE STUDY 1 TITANIUM OXIDATION STATES ON TITANIUM THIN FILMS AND BULK SURFACES ""; ""2.1. Experimental Design ""; ""2.2. Elemental Analysis ""; ""2.3. Titanium Oxidation States ""; ""2.4. Carbon Contamination ""; ""2.5. Conclusions "" ""3. CASE STUDY 2 BACTERIAL MODIFICATION OF POLY(ETHYLENE TEREPHTHALATE) POLYMER SURFACES""""3.1. Experimental Design ""; ""3.2. Elemental Analysis ""; ""3.3. High-Resolution Spectra ""; ""3.4. Bacterial Modifications ""; ""3.5. Carbon Contamination ""; ""3.6. Conclusions ""; ""4. SUMMARY ""; ""5. REFERENCES ""; ""Chapter 6: XPS AS A POWERFUL TOOL TO INVESTIGATE THE SURFACE PROPERTIES OF SIMPLE, DOPED AND MIXED METAL OXIDES ""; ""ABSTRACT ""; ""ABBREVIATIONS AND ACRONYMS ""; ""GENERAL REMARKS ""; ""1. Metal oxides: a general overview ""; ""1.1. General remarks on metal oxides "" ""1.2 Importance of surface in metal oxides "" |
| Record Nr. | UNINA-9910779094703321 |
| New York, : Nova Science Publishers, c2011 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
X-ray photoelectron spectroscopy [[electronic resource] /] / Johanna M. Wagner, editor
| X-ray photoelectron spectroscopy [[electronic resource] /] / Johanna M. Wagner, editor |
| Edizione | [1st ed.] |
| Pubbl/distr/stampa | New York, : Nova Science Publishers, c2011 |
| Descrizione fisica | 1 online resource (290 p.) |
| Disciplina | 543/.62 |
| Altri autori (Persone) | WagnerJohanna M |
| Collana | Chemical engineering methods and technology |
| Soggetto topico | X-ray photoelectron spectroscopy |
| ISBN | 1-61728-240-5 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
""X-RAY PHOTOELECTRON SPECTROSCOPY""; ""X-RAY PHOTOELECTRON SPECTROSCOPY""; ""LIBRARY OF CONGRESS CATALOGING-IN-PUBLICATION DATA""; ""CONTENTS ""; ""PREFACE ""; ""Chapter 1: X-RAY PHOTOELECTRON SPECTROSCOPY: STUDIES FROM INDUSTRIAL & BIOACTIVE GLASS TO BIOMATERIALS""; ""ABSTRACT ""; ""1. X-RAY PHOTOELECTRON SPECTROSCOPY: CONCEPT AND PRINCIPLES""; ""2. RELATING GLASS TO XPS ""; ""3. SILICATE GLASS CORROSION ""; ""4. APPLICATION OF XPS TO GLASS CORROSION""; ""5. XPS ROLE IN GLASS FABRICATION ""; ""6. EVOLUTION OF BIOACTIVE GLASSES ""; ""7. GLASS BASED BIOMATERIALS: GLASS IONOMER CEMENTS ""
""REFERENCES """"Chapter 2: XPS FOR INVESTIGATING CULTURAL HERITAGE MATERIALS""; ""ABSTRACT ""; ""1. INTRODUCTION ""; ""2. PIGMENTS IDENTIFICATION AND ALTERATION IN PAINT LAYERS""; ""2.1. The Case of Copper Resinate ""; ""2.2. The Case of Smalt""; ""3. STONE ""; ""3.1. The Case of Michealgelo's David ""; ""4. GLASS ""; ""5. SURFACE MODIFICATIONS INDUCED BY CLEANING AND PROTECTIVE TREATMENTS ""; ""6. BRONZE ""; ""REFERENCES ""; ""Chapter 3: X-RAY PHOTOELECTRON SPECTROSCOPY APPLIED TO ATOMIC STRUCTURE ANALYSIS OF SILICATE GLASSES THIN LAYERS ""; ""ABSTRACT ""; ""INTRODUCTION"" ""EXPERIMENTAL """"SILICA STRUCTURE ""; ""STRUCTURE OF SILICA FILMS PRODUCED BY CATHODE SPRAY DEPOSITION OF SILICON IN OXYGEN MEDIUM""; ""STRUCTURE OF SOL-GEL SILICA FILMS""; ""STRUCTURE OF LEAD-SILICATE GLASSES ""; ""THE SECONDARY-ELECTRON EMISSION COEFFICIENTS OF LEAD SILICATE GLASSES ""; ""CONCLUSION ""; ""REFERENCES ""; ""Chapter 4: INFLUENCE OF NO2 ON ATMOSPHERIC CORROSION OF ZINC EXPOSED IN A CLIMATE CHAMBER ""; ""ABSTRACT ""; ""INTRODUCTION ""; ""EXPERIMENTAL PROCEDURE ""; ""ZINC SAMPLES WITHOUT EXPOSURE ""; ""EXPOSITION AT 35°C ""; ""EXPOSITION AT 25°C "" ""INFLUENCE OF ION SPUTTERING ON THE S2P PHOTOELECTRON PEAK FOR ZINC-SULFUR CORROSION PRODUCTS """"CONCLUSION ""; ""REFERENCES ""; ""Chapter 5: X-RAY PHOTOELECTRON SPECTROSCOPY AS A TOOL IN THE STUDY OF NANOSTRUCTURED TITANIUM AND COMMERCIAL PET SURFACES IN BIOTECHNOLOGICAL APPLICATIONS ""; ""ABSTRACT ""; ""1. XPS AND BIOTECHNOLOGY ""; ""2. CASE STUDY 1 TITANIUM OXIDATION STATES ON TITANIUM THIN FILMS AND BULK SURFACES ""; ""2.1. Experimental Design ""; ""2.2. Elemental Analysis ""; ""2.3. Titanium Oxidation States ""; ""2.4. Carbon Contamination ""; ""2.5. Conclusions "" ""3. CASE STUDY 2 BACTERIAL MODIFICATION OF POLY(ETHYLENE TEREPHTHALATE) POLYMER SURFACES""""3.1. Experimental Design ""; ""3.2. Elemental Analysis ""; ""3.3. High-Resolution Spectra ""; ""3.4. Bacterial Modifications ""; ""3.5. Carbon Contamination ""; ""3.6. Conclusions ""; ""4. SUMMARY ""; ""5. REFERENCES ""; ""Chapter 6: XPS AS A POWERFUL TOOL TO INVESTIGATE THE SURFACE PROPERTIES OF SIMPLE, DOPED AND MIXED METAL OXIDES ""; ""ABSTRACT ""; ""ABBREVIATIONS AND ACRONYMS ""; ""GENERAL REMARKS ""; ""1. Metal oxides: a general overview ""; ""1.1. General remarks on metal oxides "" ""1.2 Importance of surface in metal oxides "" |
| Record Nr. | UNINA-9910807741103321 |
| New York, : Nova Science Publishers, c2011 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
X-ray spectrometry [[electronic resource] ] : recent technological advances / / edited by Kouichi Tsuji, Jasna Injuk, René Van Grieken
| X-ray spectrometry [[electronic resource] ] : recent technological advances / / edited by Kouichi Tsuji, Jasna Injuk, René Van Grieken |
| Pubbl/distr/stampa | Chichester, West Sussex, England ; ; Hoboken, NJ, USA, : Wiley, c2004 |
| Descrizione fisica | 1 online resource (617 p.) |
| Disciplina |
543.08586
543.62 543/.62 |
| Altri autori (Persone) |
TsujiKouichi
InjukJasna GriekenR. van (René) |
| Soggetto topico | X-ray spectroscopy |
| Soggetto genere / forma | Electronic books. |
| ISBN |
1-280-23888-7
9786610238880 0-470-02042-3 0-470-02043-1 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
X-Ray Spectrometry: Recent Technological Advances; Contents; Contributors; Preface; 1 Introduction; 1.1 Considering the Role of X-ray Spectrometry in Chemical Analysis and Outlining the Volume; 2 X-Ray Sources; 2.1 Micro X-ray Sources; 2.2 New Synchrotron Radiation Sources; 2.3 Laser-driven X-ray Sources; 3 X-Ray Optics; 3.1 Multilayers for Soft and Hard X-rays; 3.2 Single Capillaries X-ray Optics; 3.3 Polycapillary X-ray Optics; 3.4 Parabolic Compound Refractive X-ray Lenses; 4 X-Ray Detectors; 4.1 Semiconductor Detectors for (Imaging) X-ray Spectroscopy
4.2 Gas Proportional Scintillation Counters for X-ray Spectrometry4.3 Superconducting Tunnel Junctions; 4.4 Cryogenic Microcalorimeters; 4.5 Position Sensitive Semiconductor Strip Detectors; 5 Special Configurations; 5.1 Grazing-incidence X-ray Spectrometry; 5.2 Grazing-exit X-ray Spectrometry; 5.3 Portable Equipment for X-ray Fluorescence Analysis; 5.4 Synchrotron Radiation for Microscopic X-ray Fluorescence Analysis; 5.5 High-energy X-ray Fluorescence; 5.6 Low-energy Electron Probe Microanalysis and Scanning Electron Microscopy 5.7 Energy Dispersive X-ray Microanalysis in Scanning and Conventional Transmission Electron Microscopy5.8 X-Ray Absorption Techniques; 6 New Computerisation Methods; 6.1 Monte Carlo Simulation for X-ray Fluorescence Spectroscopy; 6.2 Spectrum Evaluation; 7 New Applications; 7.1 X-Ray Fluorescence Analysis in Medical Sciences; 7.2 Total Reflection X-ray Fluorescence for Semiconductors and Thin Films; 7.3 X-Ray Spectrometry in Archaeometry; 7.4 X-Ray Spectrometry in Forensic Research; 7.5 Speciation and Surface Analysis of Single Particles Using Electron-excited X-ray Emission Spectrometry Index |
| Record Nr. | UNINA-9910146051803321 |
| Chichester, West Sussex, England ; ; Hoboken, NJ, USA, : Wiley, c2004 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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