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Biblioteca

MARC Lista (tabellare)
21st century surface science : a handbook / / Phuong Pham [and three others] editors
21st century surface science : a handbook / / Phuong Pham [and three others] editors
Pubbl/distr/stampa [Place of publication not identified] : , : IntechOpen, , [2020]
Descrizione fisica 1 online resource (294 pages) : illustrations
Disciplina 541.33
Soggetto topico Surface chemistry
ISBN 1-78985-200-5
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Altri titoli varianti 21St century surface science
Record Nr. UNINA-9910431357503321
[Place of publication not identified] : , : IntechOpen, , [2020]
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
21st Century Surface Science : a handbook / / edited by Phuong Pham [and three others]
21st Century Surface Science : a handbook / / edited by Phuong Pham [and three others]
Pubbl/distr/stampa London : , : IntechOpen, , 2020
Descrizione fisica 1 online resource (257 pages)
Disciplina 541.33
Soggetto topico Surface chemistry
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Altri titoli varianti 21st Century Surface Science
Record Nr. UNINA-9910688461803321
London : , : IntechOpen, , 2020
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
Adhesion [[electronic resource] ] : current research and applications / / edited by Wulff Possart
Adhesion [[electronic resource] ] : current research and applications / / edited by Wulff Possart
Pubbl/distr/stampa Weinheim, : Wiley-VCH, c2005
Descrizione fisica 1 online resource (609 p.)
Disciplina 541.33
620.199
Altri autori (Persone) PossartWulff
Soggetto topico Adhesion
Adsorption
ISBN 1-280-85418-9
9786610854189
3-527-60730-7
3-527-60710-2
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto Adhesion; Preface; Contents; List of Contributors; 1 The Interfacial Chemistry of Adhesion: Novel Routes to the Holy Grail?; Abstract; 1.1 Introduction; 1.2 Development of a Model Interphase; 1.3 The Buried Interface; 1.4 Conclusion; Acknowledgments; References; 2 Modeling Fundamental Aspects of the Surface Chemistry of Oxides and their Interactions with Coupling Agents; Abstract; 2.1 Introduction: Atomistic Simulations in Adhesion; 2.2 Prediction of Surface Properties: Ideal Reconstructions on α-SiO(2) (0001); 2.3 Organic Components of the Adhesive and Substrate-Adhesive Interaction
2.4 Conclusion and OutlookReferences; 3 Adhesion at the Nanoscale: an Approach by AFM; Abstract; 3.1 Introduction; 3.2 Materials and Methods; 3.2.1 Preparation of Oxidized Silica Surface; 3.2.2 Grafting of Functionalized SAMs onto Silicon Wafer; 3.2.3 Crosslinking and Functionalization of PDMS Networks; 3.2.4 Characterization of the SAMs; 3.3 Results and Discussion; 3.3.1 Force-Distance Curve Measurements and AFM Calibration; 3.3.1.1 Force-Distance Curve Features; 3.3.1.2 The DD Curve (Contact Mode); 3.3.1.3 AFM Calibration; 3.3.1.3.1 Determination of the Spring Constant of the Cantilever
3.3.1.3.2 Nonlinearity of the Quadrant of Photodiodes3.3.1.3.3 Scan Rate of the Cantilever; 3.3.1.3.4 Systematic Check; 3.3.2 Force-Distance Curves on Rigid Systems of Controlled Surface Chemistry; 3.3.3 Force-Distance Measurements on Polymers; 3.3.3.1 Force-Indentation Measurements on Polymers; 3.3.3.2 Force-Indentation Curves on Systems of Controlled Surface Chemistry and Controlled Mechanical Properties; 3.4 Conclusion; References; 4 Organization of PCL-b-PMMA Diblock Thin Films: Relationship to the Adsorption Substrate Chemistry; Abstract; 4.1 Introduction; 4.2 Materials and Methods
4.2.1 PCL-b-PMMA Diblocks4.2.2 Infrared Spectroscopy; 4.2.2.1 Transmission; 4.2.2.2 Polarization-Modulation Infrared Reflection-Absorption Spectroscopy (PM-IRRAS); 4.2.3 Atomic Force Microscopy (AFM); 4.3 Results and Discussion; 4.3.1 PCL-b-PMMA Bulk Characterization; 4.3.2 PCL-b-PMMA Thin Films on OH-Functionalized Gold Substrates; 4.3.3 PCL-b-PMMA Thin Films on Gold Substrates; 4.4 Conclusion; References; 5 Adhesion and Friction Properties of Elastomers at Macroscopic and Nanoscopic Scales; Abstract; 5.1 Introduction; 5.2 Materials and Methods; 5.3 Results and Discussion
5.3.1 Adherence Energy5.3.2 Macroscale Friction; 5.3.3 Nanoscale Friction and Adhesion; 5.4 Conclusion; References; 6 Chemical Structure Formation and Morphology in Ultrathin Polyurethane Films on Metals; Abstract; 6.1 Introduction; 6.2 Materials and Methods; 6.2.1 Sample Preparation; 6.2.2 Experimental Characterization; 6.2.3 IR Spectra Calculation; 6.2.4 IR Band Assignment; 6.3 Results and Discussion; 6.3.1 Curing at Room Temperature; 6.3.2 Morphology of Thin Films; 6.3.3 Chemical Structure of Cured Films; 6.4 Conclusion; Acknowledgments; References
7 Properties of the Interphase Epoxy-Amine/Metal: Influences from the Nature of the Amine and the Metal
Record Nr. UNINA-9910144005303321
Weinheim, : Wiley-VCH, c2005
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
Adhesion [[electronic resource] ] : current research and applications / / edited by Wulff Possart
Adhesion [[electronic resource] ] : current research and applications / / edited by Wulff Possart
Pubbl/distr/stampa Weinheim, : Wiley-VCH, c2005
Descrizione fisica 1 online resource (609 p.)
Disciplina 541.33
620.199
Altri autori (Persone) PossartWulff
Soggetto topico Adhesion
Adsorption
ISBN 1-280-85418-9
9786610854189
3-527-60730-7
3-527-60710-2
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto Adhesion; Preface; Contents; List of Contributors; 1 The Interfacial Chemistry of Adhesion: Novel Routes to the Holy Grail?; Abstract; 1.1 Introduction; 1.2 Development of a Model Interphase; 1.3 The Buried Interface; 1.4 Conclusion; Acknowledgments; References; 2 Modeling Fundamental Aspects of the Surface Chemistry of Oxides and their Interactions with Coupling Agents; Abstract; 2.1 Introduction: Atomistic Simulations in Adhesion; 2.2 Prediction of Surface Properties: Ideal Reconstructions on α-SiO(2) (0001); 2.3 Organic Components of the Adhesive and Substrate-Adhesive Interaction
2.4 Conclusion and OutlookReferences; 3 Adhesion at the Nanoscale: an Approach by AFM; Abstract; 3.1 Introduction; 3.2 Materials and Methods; 3.2.1 Preparation of Oxidized Silica Surface; 3.2.2 Grafting of Functionalized SAMs onto Silicon Wafer; 3.2.3 Crosslinking and Functionalization of PDMS Networks; 3.2.4 Characterization of the SAMs; 3.3 Results and Discussion; 3.3.1 Force-Distance Curve Measurements and AFM Calibration; 3.3.1.1 Force-Distance Curve Features; 3.3.1.2 The DD Curve (Contact Mode); 3.3.1.3 AFM Calibration; 3.3.1.3.1 Determination of the Spring Constant of the Cantilever
3.3.1.3.2 Nonlinearity of the Quadrant of Photodiodes3.3.1.3.3 Scan Rate of the Cantilever; 3.3.1.3.4 Systematic Check; 3.3.2 Force-Distance Curves on Rigid Systems of Controlled Surface Chemistry; 3.3.3 Force-Distance Measurements on Polymers; 3.3.3.1 Force-Indentation Measurements on Polymers; 3.3.3.2 Force-Indentation Curves on Systems of Controlled Surface Chemistry and Controlled Mechanical Properties; 3.4 Conclusion; References; 4 Organization of PCL-b-PMMA Diblock Thin Films: Relationship to the Adsorption Substrate Chemistry; Abstract; 4.1 Introduction; 4.2 Materials and Methods
4.2.1 PCL-b-PMMA Diblocks4.2.2 Infrared Spectroscopy; 4.2.2.1 Transmission; 4.2.2.2 Polarization-Modulation Infrared Reflection-Absorption Spectroscopy (PM-IRRAS); 4.2.3 Atomic Force Microscopy (AFM); 4.3 Results and Discussion; 4.3.1 PCL-b-PMMA Bulk Characterization; 4.3.2 PCL-b-PMMA Thin Films on OH-Functionalized Gold Substrates; 4.3.3 PCL-b-PMMA Thin Films on Gold Substrates; 4.4 Conclusion; References; 5 Adhesion and Friction Properties of Elastomers at Macroscopic and Nanoscopic Scales; Abstract; 5.1 Introduction; 5.2 Materials and Methods; 5.3 Results and Discussion
5.3.1 Adherence Energy5.3.2 Macroscale Friction; 5.3.3 Nanoscale Friction and Adhesion; 5.4 Conclusion; References; 6 Chemical Structure Formation and Morphology in Ultrathin Polyurethane Films on Metals; Abstract; 6.1 Introduction; 6.2 Materials and Methods; 6.2.1 Sample Preparation; 6.2.2 Experimental Characterization; 6.2.3 IR Spectra Calculation; 6.2.4 IR Band Assignment; 6.3 Results and Discussion; 6.3.1 Curing at Room Temperature; 6.3.2 Morphology of Thin Films; 6.3.3 Chemical Structure of Cured Films; 6.4 Conclusion; Acknowledgments; References
7 Properties of the Interphase Epoxy-Amine/Metal: Influences from the Nature of the Amine and the Metal
Record Nr. UNINA-9910830596403321
Weinheim, : Wiley-VCH, c2005
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
Adhesion : current research and applications / / edited by Wulff Possart
Adhesion : current research and applications / / edited by Wulff Possart
Pubbl/distr/stampa Weinheim, : Wiley-VCH, c2005
Descrizione fisica 1 online resource (609 p.)
Disciplina 541.33
620.199
Altri autori (Persone) PossartWulff
Soggetto topico Adhesion
Adsorption
ISBN 9786610854189
9781280854187
1280854189
9783527607303
3527607307
9783527607105
3527607102
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto Adhesion; Preface; Contents; List of Contributors; 1 The Interfacial Chemistry of Adhesion: Novel Routes to the Holy Grail?; Abstract; 1.1 Introduction; 1.2 Development of a Model Interphase; 1.3 The Buried Interface; 1.4 Conclusion; Acknowledgments; References; 2 Modeling Fundamental Aspects of the Surface Chemistry of Oxides and their Interactions with Coupling Agents; Abstract; 2.1 Introduction: Atomistic Simulations in Adhesion; 2.2 Prediction of Surface Properties: Ideal Reconstructions on α-SiO(2) (0001); 2.3 Organic Components of the Adhesive and Substrate-Adhesive Interaction
2.4 Conclusion and OutlookReferences; 3 Adhesion at the Nanoscale: an Approach by AFM; Abstract; 3.1 Introduction; 3.2 Materials and Methods; 3.2.1 Preparation of Oxidized Silica Surface; 3.2.2 Grafting of Functionalized SAMs onto Silicon Wafer; 3.2.3 Crosslinking and Functionalization of PDMS Networks; 3.2.4 Characterization of the SAMs; 3.3 Results and Discussion; 3.3.1 Force-Distance Curve Measurements and AFM Calibration; 3.3.1.1 Force-Distance Curve Features; 3.3.1.2 The DD Curve (Contact Mode); 3.3.1.3 AFM Calibration; 3.3.1.3.1 Determination of the Spring Constant of the Cantilever
3.3.1.3.2 Nonlinearity of the Quadrant of Photodiodes3.3.1.3.3 Scan Rate of the Cantilever; 3.3.1.3.4 Systematic Check; 3.3.2 Force-Distance Curves on Rigid Systems of Controlled Surface Chemistry; 3.3.3 Force-Distance Measurements on Polymers; 3.3.3.1 Force-Indentation Measurements on Polymers; 3.3.3.2 Force-Indentation Curves on Systems of Controlled Surface Chemistry and Controlled Mechanical Properties; 3.4 Conclusion; References; 4 Organization of PCL-b-PMMA Diblock Thin Films: Relationship to the Adsorption Substrate Chemistry; Abstract; 4.1 Introduction; 4.2 Materials and Methods
4.2.1 PCL-b-PMMA Diblocks4.2.2 Infrared Spectroscopy; 4.2.2.1 Transmission; 4.2.2.2 Polarization-Modulation Infrared Reflection-Absorption Spectroscopy (PM-IRRAS); 4.2.3 Atomic Force Microscopy (AFM); 4.3 Results and Discussion; 4.3.1 PCL-b-PMMA Bulk Characterization; 4.3.2 PCL-b-PMMA Thin Films on OH-Functionalized Gold Substrates; 4.3.3 PCL-b-PMMA Thin Films on Gold Substrates; 4.4 Conclusion; References; 5 Adhesion and Friction Properties of Elastomers at Macroscopic and Nanoscopic Scales; Abstract; 5.1 Introduction; 5.2 Materials and Methods; 5.3 Results and Discussion
5.3.1 Adherence Energy5.3.2 Macroscale Friction; 5.3.3 Nanoscale Friction and Adhesion; 5.4 Conclusion; References; 6 Chemical Structure Formation and Morphology in Ultrathin Polyurethane Films on Metals; Abstract; 6.1 Introduction; 6.2 Materials and Methods; 6.2.1 Sample Preparation; 6.2.2 Experimental Characterization; 6.2.3 IR Spectra Calculation; 6.2.4 IR Band Assignment; 6.3 Results and Discussion; 6.3.1 Curing at Room Temperature; 6.3.2 Morphology of Thin Films; 6.3.3 Chemical Structure of Cured Films; 6.4 Conclusion; Acknowledgments; References
7 Properties of the Interphase Epoxy-Amine/Metal: Influences from the Nature of the Amine and the Metal
Record Nr. UNINA-9911019766603321
Weinheim, : Wiley-VCH, c2005
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
Adhesion science [[electronic resource] /] / John Comyn
Adhesion science [[electronic resource] /] / John Comyn
Autore Comyn John <1942->
Pubbl/distr/stampa Cambridge, : Royal Society of Chemistry, Information Services, c1997
Descrizione fisica 1 online resource (162 p.)
Disciplina 541.33
Collana RSC paperbacks
Soggetto topico Adhesion
Adhesives
Soggetto genere / forma Electronic books.
ISBN 1-62198-701-9
1-84755-006-1
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto BK9780854045433-FX001; BK9780854045433-FP001; BK9780854045433-FP005; BK9780854045433-FP007; BK9780854045433-00001; BK9780854045433-00018; BK9780854045433-00026; BK9780854045433-00040; BK9780854045433-00054; BK9780854045433-00070; BK9780854045433-00073; BK9780854045433-00098; BK9780854045433-00114; BK9780854045433-00126; BK9780854045433-00144; BK9780854045433-00147
Record Nr. UNINA-9910455254403321
Comyn John <1942->  
Cambridge, : Royal Society of Chemistry, Information Services, c1997
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
Adhesion science [[electronic resource] /] / John Comyn
Adhesion science [[electronic resource] /] / John Comyn
Autore Comyn John <1942->
Pubbl/distr/stampa Cambridge, : Royal Society of Chemistry, Information Services, c1997
Descrizione fisica 1 online resource (162 p.)
Disciplina 541.33
Collana RSC paperbacks
Soggetto topico Adhesion
Adhesives
ISBN 1-62198-701-9
1-84755-006-1
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto BK9780854045433-FX001; BK9780854045433-FP001; BK9780854045433-FP005; BK9780854045433-FP007; BK9780854045433-00001; BK9780854045433-00018; BK9780854045433-00026; BK9780854045433-00040; BK9780854045433-00054; BK9780854045433-00070; BK9780854045433-00073; BK9780854045433-00098; BK9780854045433-00114; BK9780854045433-00126; BK9780854045433-00144; BK9780854045433-00147
Record Nr. UNINA-9910778306303321
Comyn John <1942->  
Cambridge, : Royal Society of Chemistry, Information Services, c1997
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
Adsorption : theory, modeling, and analysis / edited by József Tóth
Adsorption : theory, modeling, and analysis / edited by József Tóth
Autore Tóth, József
Pubbl/distr/stampa New York : Dekker, 2002
Descrizione fisica VIII, 878 p. : ill. ; 26 cm.
Disciplina 541.33(Chimica delle superfici. Adsorbimento)
ISBN 978-08-247-0747-7
08-247-0747-8
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNICAMPANIA-SUN0080970
Tóth, József  
New York : Dekker, 2002
Materiale a stampa
Lo trovi qui: Univ. Vanvitelli
Opac: Controlla la disponibilità qui
Adsorption : theory, modeling, and analysis / edited by József Tóth
Adsorption : theory, modeling, and analysis / edited by József Tóth
Autore Tóth, József
Pubbl/distr/stampa New York, : Dekker, 2002
Descrizione fisica VIII, 878 p. : ill. ; 26 cm
Disciplina 541.33(Chimica delle superfici. Adsorbimento)
ISBN 08-247-0747-8
978-08-247-0747-7
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNISOB-VAN0080970
Tóth, József  
New York, : Dekker, 2002
Materiale a stampa
Lo trovi qui: Univ. Suor Orsola Benincasa
Opac: Controlla la disponibilità qui
Adsorption : theory, modeling, and analysis / edited by József Tóth
Adsorption : theory, modeling, and analysis / edited by József Tóth
Autore Tóth, József
Pubbl/distr/stampa New York, : Dekker, 2002
Descrizione fisica VIII, 878 p. : ill. ; 26 cm
Disciplina 541.33(Chimica delle superfici. Adsorbimento)
ISBN 08-247-0747-8
978-08-247-0747-7
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNICAMPANIA-VAN0080970
Tóth, József  
New York, : Dekker, 2002
Materiale a stampa
Lo trovi qui: Univ. Vanvitelli
Opac: Controlla la disponibilità qui