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Characterization of high Tc materials and devices by electron microscopy / / edited by Nigel D. Browning, Stephen J. Pennycook [[electronic resource]]
| Characterization of high Tc materials and devices by electron microscopy / / edited by Nigel D. Browning, Stephen J. Pennycook [[electronic resource]] |
| Pubbl/distr/stampa | Cambridge : , : Cambridge University Press, , 2000 |
| Descrizione fisica | 1 online resource (xii, 391 pages) : digital, PDF file(s) |
| Disciplina | 537.6/23/0284 |
| Soggetto topico |
High temperature superconductors
Electron microscopy - Technique |
| ISBN |
1-107-11301-6
1-280-41701-3 9786610417018 0-511-17507-8 0-511-03966-2 0-511-15517-4 0-511-32866-4 0-511-53482-5 0-511-05339-8 |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | ; 1. High-resolution transmission electron microscopy / S. Horiuchi and L. He -- ; 2. Holography in the transmission electron microscope / A. Tonomura -- ; 3. Microanalysis by scanning transmission electron microscopy / L.M. Brown and J. Yuan -- ; 4. Specimen preparation for transmission electron microscopy / J.G. Wen -- ; 5. Low-temperature scanning electron microscopy / R.P. Huebener -- ; 6. Scanning tunneling microscopy / M.E. Hawley -- ; 7. Identification of new superconducting compounds by electron microscopy / G. Van Tendeloo and T. Krekels -- ; 8. Valence band electron energy loss spectroscopy (EELS) of oxide superconductors / Y.Y. Wang and V.P. Dravid. |
| Altri titoli varianti | Characterization of High Tc Materials & Devices by Electron Microscopy |
| Record Nr. | UNINA-9910449815603321 |
| Cambridge : , : Cambridge University Press, , 2000 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Characterization of high Tc materials and devices by electron microscopy / / edited by Nigel D. Browning, Stephen J. Pennycook [[electronic resource]]
| Characterization of high Tc materials and devices by electron microscopy / / edited by Nigel D. Browning, Stephen J. Pennycook [[electronic resource]] |
| Pubbl/distr/stampa | Cambridge : , : Cambridge University Press, , 2000 |
| Descrizione fisica | 1 online resource (xii, 391 pages) : digital, PDF file(s) |
| Disciplina | 537.6/23/0284 |
| Soggetto topico |
High temperature superconductors
Electron microscopy - Technique |
| ISBN |
1-107-11301-6
1-280-41701-3 9786610417018 0-511-17507-8 0-511-03966-2 0-511-15517-4 0-511-32866-4 0-511-53482-5 0-511-05339-8 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | ; 1. High-resolution transmission electron microscopy / S. Horiuchi and L. He -- ; 2. Holography in the transmission electron microscope / A. Tonomura -- ; 3. Microanalysis by scanning transmission electron microscopy / L.M. Brown and J. Yuan -- ; 4. Specimen preparation for transmission electron microscopy / J.G. Wen -- ; 5. Low-temperature scanning electron microscopy / R.P. Huebener -- ; 6. Scanning tunneling microscopy / M.E. Hawley -- ; 7. Identification of new superconducting compounds by electron microscopy / G. Van Tendeloo and T. Krekels -- ; 8. Valence band electron energy loss spectroscopy (EELS) of oxide superconductors / Y.Y. Wang and V.P. Dravid. |
| Altri titoli varianti | Characterization of High Tc Materials & Devices by Electron Microscopy |
| Record Nr. | UNINA-9910777075803321 |
| Cambridge : , : Cambridge University Press, , 2000 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Characterization of high Tc materials and devices by electron microscopy / / edited by Nigel D. Browning, Stephen J. Pennycook
| Characterization of high Tc materials and devices by electron microscopy / / edited by Nigel D. Browning, Stephen J. Pennycook |
| Edizione | [1st ed.] |
| Pubbl/distr/stampa | Cambridge ; ; New York, : Cambridge University Press, 2000 |
| Descrizione fisica | 1 online resource (xii, 391 pages) : digital, PDF file(s) |
| Disciplina | 537.6/23/0284 |
| Altri autori (Persone) |
BrowningNigel D
PennycookStephen J |
| Soggetto topico |
High temperature superconductors
Electron microscopy - Technique |
| ISBN |
1-107-11301-6
1-280-41701-3 9786610417018 0-511-17507-8 0-511-03966-2 0-511-15517-4 0-511-32866-4 0-511-53482-5 0-511-05339-8 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | ; 1. High-resolution transmission electron microscopy / S. Horiuchi and L. He -- ; 2. Holography in the transmission electron microscope / A. Tonomura -- ; 3. Microanalysis by scanning transmission electron microscopy / L.M. Brown and J. Yuan -- ; 4. Specimen preparation for transmission electron microscopy / J.G. Wen -- ; 5. Low-temperature scanning electron microscopy / R.P. Huebener -- ; 6. Scanning tunneling microscopy / M.E. Hawley -- ; 7. Identification of new superconducting compounds by electron microscopy / G. Van Tendeloo and T. Krekels -- ; 8. Valence band electron energy loss spectroscopy (EELS) of oxide superconductors / Y.Y. Wang and V.P. Dravid. |
| Record Nr. | UNINA-9910816504803321 |
| Cambridge ; ; New York, : Cambridge University Press, 2000 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||