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Optical interferometry [[electronic resource] /] / by P. Hariharan
| Optical interferometry [[electronic resource] /] / by P. Hariharan |
| Autore | Hariharan P |
| Edizione | [2nd ed.] |
| Pubbl/distr/stampa | Amsterdam ; ; Boston, : Academic Press, c2003 |
| Descrizione fisica | 1 online resource (368 p.) |
| Disciplina | 535/.47/0287 |
| Soggetto topico | Interferometry |
| Soggetto genere / forma | Electronic books. |
| ISBN |
1-280-96836-2
9786610968367 0-08-047364-4 |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
front cover; copyright; table of contents; front matter; Preface to the First Edition; Preface to the Second Edition; body; 1. Interferometry: Its Development; 1.1 The Wave Theory of Light; 1.2 The Michelson-Morley Experiment; 1.3 Measurement of the Metre; 1.4 Optical Testing; 1.5 Coherence; 1.6 Interference Spectroscopy; 1.7 The Laser; 1.8 Electronic Techniques; 1.9 Heterodyne Techniques; 1.10 Fiber Interferometers; 1.11 Nonlinear Interferometers; 1.12 Stellar Interferometry; 1.13 Space-Time and Gravitation; 1.14 Quantum Effects; 1.15 Future Directions; 2. Two-Beam Interference
2.1 Complex Representation of Light Waves2.2 Interference of Two Monochromatic Waves; 2.3 Wavefront Division; 2.4 Amplitude Division; 2.5 Localization of Fringes; 2.6 Two-Beam Interferometers; 2.7 The Michelson Interferometer; 2.8 The Mach-Zehnder Interferometer; 2.9 The Sagnac Interferometer; 2.10 Interference with White Light; 2.11 Channeled Spectra; 2.12 Achromatic Fringes; 2.13 Standing Waves; 2.14 Interferential Color Photography; 3. Coherence; 3.1 Quasi-Monochromatic Light; 3.2 Waves and Wave Groups; 3.3 Phase Velocity and Group Velocity; 3.4 The Mutual Coherence Function 3.5 Spatial Coherence3.6 Temporal Coherence; 3.7 Coherence Time and Coherence Length; 3.8 Coherence in the Space-Frequency Domain; 3.9 Nonclassical Light; 3.10 Effects in Two-Beam Interferometers; 3.11 Source-Size Effects; 3.12 Spectral Bandwidth Effects; 3.13 Spectral Changes Due to Coherence; 3.14 Polarization Effects; 4. Multiple-Beam Interference; 4.1 Fringes in a Plane-Parallel Plate; 4.2 Fringes by Reflection; 4.3 Fringes of Equal Thickness; 4.4 Fringes of Equal Chromatic Order; 4.5 Fringes of Superposition; 4.6 Three-Beam Fringes; 4.7 Double-Passed Fringes; 5. Lasers 5.1 Lasers for Interferometry5.2 Laser Modes; 5.3 Comparison of Laser Frequencies; 5.4 Frequency Stabilization; 5.5 Laser Beams; 6. Electronic Phase Measurements; 6.1 Photoelectric Settings; 6.2 Fringe Counting; 6.3 Heterodyne Interferometry; 6.4 Phase-Locked Interferometry; 6.5 Computer-Aided Fringe Analysis; 6.6 Phase-Shifting Interferometry; 6.7 Techniques of Phase Shifting; 6.8 Sinusoidal Phase Modulation; 7. Measurements of Length; 7.1 Line Standards; 7.2 End Standards; 7.3 The Integral Interference Order; 7.4 Exact Fractions; 7.5 The Refractive Index of Air 7.6 The International Prototype Metre7.7 The 86Kr Standard; 7.8 Frequency Measurements; 7.9 The Definition of the Metre; 7.10 Length Measurements with Lasers; 7.11 Changes in Length; 7.12 Displacements; 7.13 Dynamic Angle Measurements; 8. Optical Testing; 8.1 The Fizeau Interferometer; 8.2 The Twyman-Green Interferometer; 8.3 Unequal-Path Interferometers; 8.4 Phase Unwrapping; 8.5 Analysis of Wavefront Aberrations; 8.6 Shearing Interferometers; 8.7 Grating Interferometers; 8.8 The Scatter-Plate Interferometer; 8.9 The Point-Diffraction Interferometer; 8.10 Computerized Test Methods 8.11 Aspheric Surfaces |
| Record Nr. | UNINA-9910458723103321 |
Hariharan P
|
||
| Amsterdam ; ; Boston, : Academic Press, c2003 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Optical interferometry [[electronic resource] /] / by P. Hariharan
| Optical interferometry [[electronic resource] /] / by P. Hariharan |
| Autore | Hariharan P |
| Edizione | [2nd ed.] |
| Pubbl/distr/stampa | Amsterdam ; ; Boston, : Academic Press, c2003 |
| Descrizione fisica | 1 online resource (368 p.) |
| Disciplina | 535/.47/0287 |
| Soggetto topico | Interferometry |
| ISBN |
1-280-96836-2
9786610968367 0-08-047364-4 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
front cover; copyright; table of contents; front matter; Preface to the First Edition; Preface to the Second Edition; body; 1. Interferometry: Its Development; 1.1 The Wave Theory of Light; 1.2 The Michelson-Morley Experiment; 1.3 Measurement of the Metre; 1.4 Optical Testing; 1.5 Coherence; 1.6 Interference Spectroscopy; 1.7 The Laser; 1.8 Electronic Techniques; 1.9 Heterodyne Techniques; 1.10 Fiber Interferometers; 1.11 Nonlinear Interferometers; 1.12 Stellar Interferometry; 1.13 Space-Time and Gravitation; 1.14 Quantum Effects; 1.15 Future Directions; 2. Two-Beam Interference
2.1 Complex Representation of Light Waves2.2 Interference of Two Monochromatic Waves; 2.3 Wavefront Division; 2.4 Amplitude Division; 2.5 Localization of Fringes; 2.6 Two-Beam Interferometers; 2.7 The Michelson Interferometer; 2.8 The Mach-Zehnder Interferometer; 2.9 The Sagnac Interferometer; 2.10 Interference with White Light; 2.11 Channeled Spectra; 2.12 Achromatic Fringes; 2.13 Standing Waves; 2.14 Interferential Color Photography; 3. Coherence; 3.1 Quasi-Monochromatic Light; 3.2 Waves and Wave Groups; 3.3 Phase Velocity and Group Velocity; 3.4 The Mutual Coherence Function 3.5 Spatial Coherence3.6 Temporal Coherence; 3.7 Coherence Time and Coherence Length; 3.8 Coherence in the Space-Frequency Domain; 3.9 Nonclassical Light; 3.10 Effects in Two-Beam Interferometers; 3.11 Source-Size Effects; 3.12 Spectral Bandwidth Effects; 3.13 Spectral Changes Due to Coherence; 3.14 Polarization Effects; 4. Multiple-Beam Interference; 4.1 Fringes in a Plane-Parallel Plate; 4.2 Fringes by Reflection; 4.3 Fringes of Equal Thickness; 4.4 Fringes of Equal Chromatic Order; 4.5 Fringes of Superposition; 4.6 Three-Beam Fringes; 4.7 Double-Passed Fringes; 5. Lasers 5.1 Lasers for Interferometry5.2 Laser Modes; 5.3 Comparison of Laser Frequencies; 5.4 Frequency Stabilization; 5.5 Laser Beams; 6. Electronic Phase Measurements; 6.1 Photoelectric Settings; 6.2 Fringe Counting; 6.3 Heterodyne Interferometry; 6.4 Phase-Locked Interferometry; 6.5 Computer-Aided Fringe Analysis; 6.6 Phase-Shifting Interferometry; 6.7 Techniques of Phase Shifting; 6.8 Sinusoidal Phase Modulation; 7. Measurements of Length; 7.1 Line Standards; 7.2 End Standards; 7.3 The Integral Interference Order; 7.4 Exact Fractions; 7.5 The Refractive Index of Air 7.6 The International Prototype Metre7.7 The 86Kr Standard; 7.8 Frequency Measurements; 7.9 The Definition of the Metre; 7.10 Length Measurements with Lasers; 7.11 Changes in Length; 7.12 Displacements; 7.13 Dynamic Angle Measurements; 8. Optical Testing; 8.1 The Fizeau Interferometer; 8.2 The Twyman-Green Interferometer; 8.3 Unequal-Path Interferometers; 8.4 Phase Unwrapping; 8.5 Analysis of Wavefront Aberrations; 8.6 Shearing Interferometers; 8.7 Grating Interferometers; 8.8 The Scatter-Plate Interferometer; 8.9 The Point-Diffraction Interferometer; 8.10 Computerized Test Methods 8.11 Aspheric Surfaces |
| Record Nr. | UNINA-9910784643803321 |
|
Hariharan P
|
||
| Amsterdam ; ; Boston, : Academic Press, c2003 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Optical interferometry / / by P. Hariharan
| Optical interferometry / / by P. Hariharan |
| Autore | Hariharan P |
| Edizione | [2nd ed.] |
| Pubbl/distr/stampa | Amsterdam ; ; Boston, : Academic Press, c2003 |
| Descrizione fisica | 1 online resource (368 p.) |
| Disciplina | 535/.47/0287 |
| Soggetto topico | Interferometry |
| ISBN |
1-280-96836-2
9786610968367 0-08-047364-4 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
front cover; copyright; table of contents; front matter; Preface to the First Edition; Preface to the Second Edition; body; 1. Interferometry: Its Development; 1.1 The Wave Theory of Light; 1.2 The Michelson-Morley Experiment; 1.3 Measurement of the Metre; 1.4 Optical Testing; 1.5 Coherence; 1.6 Interference Spectroscopy; 1.7 The Laser; 1.8 Electronic Techniques; 1.9 Heterodyne Techniques; 1.10 Fiber Interferometers; 1.11 Nonlinear Interferometers; 1.12 Stellar Interferometry; 1.13 Space-Time and Gravitation; 1.14 Quantum Effects; 1.15 Future Directions; 2. Two-Beam Interference
2.1 Complex Representation of Light Waves2.2 Interference of Two Monochromatic Waves; 2.3 Wavefront Division; 2.4 Amplitude Division; 2.5 Localization of Fringes; 2.6 Two-Beam Interferometers; 2.7 The Michelson Interferometer; 2.8 The Mach-Zehnder Interferometer; 2.9 The Sagnac Interferometer; 2.10 Interference with White Light; 2.11 Channeled Spectra; 2.12 Achromatic Fringes; 2.13 Standing Waves; 2.14 Interferential Color Photography; 3. Coherence; 3.1 Quasi-Monochromatic Light; 3.2 Waves and Wave Groups; 3.3 Phase Velocity and Group Velocity; 3.4 The Mutual Coherence Function 3.5 Spatial Coherence3.6 Temporal Coherence; 3.7 Coherence Time and Coherence Length; 3.8 Coherence in the Space-Frequency Domain; 3.9 Nonclassical Light; 3.10 Effects in Two-Beam Interferometers; 3.11 Source-Size Effects; 3.12 Spectral Bandwidth Effects; 3.13 Spectral Changes Due to Coherence; 3.14 Polarization Effects; 4. Multiple-Beam Interference; 4.1 Fringes in a Plane-Parallel Plate; 4.2 Fringes by Reflection; 4.3 Fringes of Equal Thickness; 4.4 Fringes of Equal Chromatic Order; 4.5 Fringes of Superposition; 4.6 Three-Beam Fringes; 4.7 Double-Passed Fringes; 5. Lasers 5.1 Lasers for Interferometry5.2 Laser Modes; 5.3 Comparison of Laser Frequencies; 5.4 Frequency Stabilization; 5.5 Laser Beams; 6. Electronic Phase Measurements; 6.1 Photoelectric Settings; 6.2 Fringe Counting; 6.3 Heterodyne Interferometry; 6.4 Phase-Locked Interferometry; 6.5 Computer-Aided Fringe Analysis; 6.6 Phase-Shifting Interferometry; 6.7 Techniques of Phase Shifting; 6.8 Sinusoidal Phase Modulation; 7. Measurements of Length; 7.1 Line Standards; 7.2 End Standards; 7.3 The Integral Interference Order; 7.4 Exact Fractions; 7.5 The Refractive Index of Air 7.6 The International Prototype Metre7.7 The 86Kr Standard; 7.8 Frequency Measurements; 7.9 The Definition of the Metre; 7.10 Length Measurements with Lasers; 7.11 Changes in Length; 7.12 Displacements; 7.13 Dynamic Angle Measurements; 8. Optical Testing; 8.1 The Fizeau Interferometer; 8.2 The Twyman-Green Interferometer; 8.3 Unequal-Path Interferometers; 8.4 Phase Unwrapping; 8.5 Analysis of Wavefront Aberrations; 8.6 Shearing Interferometers; 8.7 Grating Interferometers; 8.8 The Scatter-Plate Interferometer; 8.9 The Point-Diffraction Interferometer; 8.10 Computerized Test Methods 8.11 Aspheric Surfaces |
| Record Nr. | UNINA-9910826098303321 |
|
Hariharan P
|
||
| Amsterdam ; ; Boston, : Academic Press, c2003 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||