top

  Info

  • Utilizzare la checkbox di selezione a fianco di ciascun documento per attivare le funzionalità di stampa, invio email, download nei formati disponibili del (i) record.

  Info

  • Utilizzare questo link per rimuovere la selezione effettuata.
1780-2022 - IEEE Standard for Specifying Inertial Measurement Units (IMUs) / / IEEE
1780-2022 - IEEE Standard for Specifying Inertial Measurement Units (IMUs) / / IEEE
Pubbl/distr/stampa New York : , : IEEE, , 2022
Descrizione fisica 1 online resource (61 pages)
Disciplina 530.8
Soggetto topico Units of measurement
ISBN 1-5044-8458-4
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Altri titoli varianti 1780-2022 - IEEE Standard for Specifying Inertial Measurement Units
Record Nr. UNISA-996574943003316
New York : , : IEEE, , 2022
Materiale a stampa
Lo trovi qui: Univ. di Salerno
Opac: Controlla la disponibilità qui
[Medidas] : [Longitudes y Pesos] / / [Chris Forest]
[Medidas] : [Longitudes y Pesos] / / [Chris Forest]
Autore Forest Chris
Pubbl/distr/stampa [Place of publication not identified] : , : [Classroom Complete Press Ltd], , [2015]
Descrizione fisica 1 online resource (20 p.)
Disciplina 530.8
Soggetto topico Weights and measures
Soggetto genere / forma Electronic books.
ISBN 1-77167-484-9
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione spa
Record Nr. UNINA-9910460740403321
Forest Chris  
[Place of publication not identified] : , : [Classroom Complete Press Ltd], , [2015]
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
[Medidas] : [Longitudes y Pesos] / / [Chris Forest]
[Medidas] : [Longitudes y Pesos] / / [Chris Forest]
Autore Forest Chris
Pubbl/distr/stampa [Place of publication not identified] : , : [Classroom Complete Press Ltd], , [2015]
Descrizione fisica 1 online resource (20 p.)
Disciplina 530.8
Soggetto topico Weights and measures
ISBN 1-77167-484-9
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione spa
Record Nr. UNINA-9910797924303321
Forest Chris  
[Place of publication not identified] : , : [Classroom Complete Press Ltd], , [2015]
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
[Medidas] : [Longitudes y Pesos] / / [Chris Forest]
[Medidas] : [Longitudes y Pesos] / / [Chris Forest]
Autore Forest Chris
Pubbl/distr/stampa [Place of publication not identified] : , : [Classroom Complete Press Ltd], , [2015]
Descrizione fisica 1 online resource (20 p.)
Disciplina 530.8
Soggetto topico Weights and measures
ISBN 1-77167-484-9
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione spa
Record Nr. UNINA-9910821443803321
Forest Chris  
[Place of publication not identified] : , : [Classroom Complete Press Ltd], , [2015]
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
A metrological analysis of the in-situ evaluation of the performance of a gas engine-driven heat pump / Cascetta f., Sasso M., Sibilio S.
A metrological analysis of the in-situ evaluation of the performance of a gas engine-driven heat pump / Cascetta f., Sasso M., Sibilio S.
Autore Cascetta, F.
Pubbl/distr/stampa Amsterdam : Elsevier, 1995
Disciplina 530.8
Altri autori (Persone) Sasso, Maurizio
Sibilio, Sergio
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNINA-990003975720403321
Cascetta, F.  
Amsterdam : Elsevier, 1995
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
Advanced mathematical & computational tools in metrology & testing VIII [[electronic resource] /] / editors, F. Pavese ... [et al.]
Advanced mathematical & computational tools in metrology & testing VIII [[electronic resource] /] / editors, F. Pavese ... [et al.]
Pubbl/distr/stampa Singapore ; ; Hackensack, NJ, : World Scientific, c2009
Descrizione fisica 1 online resource (419 p.)
Disciplina 530.8
Altri autori (Persone) PaveseFranco
Collana Series on advances in mathematics for applied sciences
Soggetto topico Measurement
Physical measurements
Metrology
Soggetto genere / forma Electronic books.
ISBN 1-282-44272-4
9786612442728
981-283-952-6
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto Foreword; Contents; Sensitivity Analysis in Metrology: Study and Comparison on Different Indices for Measurement Uncertainty A Allard and N Fischer; 1. Introduction to Sensitivity Analysis; 2. Sensitivity Analysis Indices; 2.1. Partial Derivative Approach - GUM; 2.2. "One At a Time" Index - GUM S1; 2.3. Rank Correlation; 2.4. Variance Based Method - Sobol Indices; 2.4.1. Definitions; 2.4.2. Estimation; 3. Examples; 3.1. Mass Calibration; 3.2. Ishigami Function; 4. Conclusion; Acknowledgments; References
Likelihood Maximization Against the Probability Density Function Shape S Aranda, J-M Linares and J-M Sprauel1. Introduction; 2. Statistical Best-Fit Approach; 3. Definition of Probability Density Function (PDF); 4. Definition of the Likelihood Criterion Function; 5. Conclusion; References; Methods for Estimation of the Effect of Correlation at the Measurement of Alternating Voltage T Barashkova; 1. The Research on the Effect of Correlation in the Measurement of Alternating Voltage; 2. Expert Statistical Method; Acknowledgments; References
Multi-Determination of Aerodynamic Loads Using Calibration Curve with a Polynomial and MLP Neural Network Combination I M Barbosa, O A De Faria Mello, M L Collucci da Costa Reis and E del Moral Hernandez1. Instrumentation; 2. Methodology; 2.1. Fitting by Polynomial Only; 2.2. Fitting by Multilayer Perceptron (MLP) Only; 2.3. Fitting by Combination between Polynomial and MLP; 3. Results; 3.1. The Polynomial Approach; 3.2. The MLP Approach; 3.3. Combination of MLP and Polynomial Approaches; 3.4. Other Indicators for Performance Function; 4. Conclusions; REFERENCES
Uncertainty Analysis in Calibration of Standard Volume Measures E Batista, N Almeida and E Filipe1. Introduction; 2. Uncertainty Evaluation; 2.1. The Measurement Model and Uncertainty Components; 2.2. Combined and Expanded Uncertainty; 3. Experimental Results; 4. Concluding Remarks; References; Virtual Atomic Force Microscope as a Tool for Nanometrology V S Bormashov, A S Baturin, A V Zablotskiy, R V Goldshtein and K B Ustinov; 1. Introduction; 2. "Virtual AFM" Features; 2.1. Scanning system; 2.2. Feedback system; 2.3. Optical registration system; 2.4. Probe-specimen interaction module
3. ConclusionAcknowledgments; References; Development of a Mathematical Procedure for Modelling and Inspecting Complex Surfaces for Measurement Process S Boukebbab, H Bouchenitfa and J-M Linares; 1. Introduction; 2. Presentation of the Mathematical Procedure; 3. Application for Rapid Prototyping Technology; 4. Conclusion; References; A Software Simulation Tool to Evaluate the Uncertainties for a Lock-in Amplifier P Clarkson, T J Esward, P M Harris, K J Lines, F O Onakunle and I M Smith; 1. Introduction; 2. Principles Of The Lock-in Amplifier; 3. Monte Carlo Calculation
4. Simulation Software Tool
Record Nr. UNINA-9910456701103321
Singapore ; ; Hackensack, NJ, : World Scientific, c2009
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
Advanced mathematical & computational tools in metrology & testing VIII [[electronic resource] /] / editors, F. Pavese ... [et al.]
Advanced mathematical & computational tools in metrology & testing VIII [[electronic resource] /] / editors, F. Pavese ... [et al.]
Pubbl/distr/stampa Singapore ; ; Hackensack, NJ, : World Scientific, c2009
Descrizione fisica 1 online resource (419 p.)
Disciplina 530.8
Altri autori (Persone) PaveseFranco
Collana Series on advances in mathematics for applied sciences
Soggetto topico Measurement
Physical measurements
Metrology
ISBN 1-282-44272-4
9786612442728
981-283-952-6
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto Foreword; Contents; Sensitivity Analysis in Metrology: Study and Comparison on Different Indices for Measurement Uncertainty A Allard and N Fischer; 1. Introduction to Sensitivity Analysis; 2. Sensitivity Analysis Indices; 2.1. Partial Derivative Approach - GUM; 2.2. "One At a Time" Index - GUM S1; 2.3. Rank Correlation; 2.4. Variance Based Method - Sobol Indices; 2.4.1. Definitions; 2.4.2. Estimation; 3. Examples; 3.1. Mass Calibration; 3.2. Ishigami Function; 4. Conclusion; Acknowledgments; References
Likelihood Maximization Against the Probability Density Function Shape S Aranda, J-M Linares and J-M Sprauel1. Introduction; 2. Statistical Best-Fit Approach; 3. Definition of Probability Density Function (PDF); 4. Definition of the Likelihood Criterion Function; 5. Conclusion; References; Methods for Estimation of the Effect of Correlation at the Measurement of Alternating Voltage T Barashkova; 1. The Research on the Effect of Correlation in the Measurement of Alternating Voltage; 2. Expert Statistical Method; Acknowledgments; References
Multi-Determination of Aerodynamic Loads Using Calibration Curve with a Polynomial and MLP Neural Network Combination I M Barbosa, O A De Faria Mello, M L Collucci da Costa Reis and E del Moral Hernandez1. Instrumentation; 2. Methodology; 2.1. Fitting by Polynomial Only; 2.2. Fitting by Multilayer Perceptron (MLP) Only; 2.3. Fitting by Combination between Polynomial and MLP; 3. Results; 3.1. The Polynomial Approach; 3.2. The MLP Approach; 3.3. Combination of MLP and Polynomial Approaches; 3.4. Other Indicators for Performance Function; 4. Conclusions; REFERENCES
Uncertainty Analysis in Calibration of Standard Volume Measures E Batista, N Almeida and E Filipe1. Introduction; 2. Uncertainty Evaluation; 2.1. The Measurement Model and Uncertainty Components; 2.2. Combined and Expanded Uncertainty; 3. Experimental Results; 4. Concluding Remarks; References; Virtual Atomic Force Microscope as a Tool for Nanometrology V S Bormashov, A S Baturin, A V Zablotskiy, R V Goldshtein and K B Ustinov; 1. Introduction; 2. "Virtual AFM" Features; 2.1. Scanning system; 2.2. Feedback system; 2.3. Optical registration system; 2.4. Probe-specimen interaction module
3. ConclusionAcknowledgments; References; Development of a Mathematical Procedure for Modelling and Inspecting Complex Surfaces for Measurement Process S Boukebbab, H Bouchenitfa and J-M Linares; 1. Introduction; 2. Presentation of the Mathematical Procedure; 3. Application for Rapid Prototyping Technology; 4. Conclusion; References; A Software Simulation Tool to Evaluate the Uncertainties for a Lock-in Amplifier P Clarkson, T J Esward, P M Harris, K J Lines, F O Onakunle and I M Smith; 1. Introduction; 2. Principles Of The Lock-in Amplifier; 3. Monte Carlo Calculation
4. Simulation Software Tool
Record Nr. UNINA-9910780808403321
Singapore ; ; Hackensack, NJ, : World Scientific, c2009
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
Advanced mathematical & computational tools in metrology & testing VIII [[electronic resource] /] / editors, F. Pavese ... [et al.]
Advanced mathematical & computational tools in metrology & testing VIII [[electronic resource] /] / editors, F. Pavese ... [et al.]
Pubbl/distr/stampa Singapore ; ; Hackensack, NJ, : World Scientific, c2009
Descrizione fisica 1 online resource (419 p.)
Disciplina 530.8
Altri autori (Persone) PaveseFranco
Collana Series on advances in mathematics for applied sciences
Soggetto topico Measurement
Physical measurements
Metrology
ISBN 1-282-44272-4
9786612442728
981-283-952-6
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto Foreword; Contents; Sensitivity Analysis in Metrology: Study and Comparison on Different Indices for Measurement Uncertainty A Allard and N Fischer; 1. Introduction to Sensitivity Analysis; 2. Sensitivity Analysis Indices; 2.1. Partial Derivative Approach - GUM; 2.2. "One At a Time" Index - GUM S1; 2.3. Rank Correlation; 2.4. Variance Based Method - Sobol Indices; 2.4.1. Definitions; 2.4.2. Estimation; 3. Examples; 3.1. Mass Calibration; 3.2. Ishigami Function; 4. Conclusion; Acknowledgments; References
Likelihood Maximization Against the Probability Density Function Shape S Aranda, J-M Linares and J-M Sprauel1. Introduction; 2. Statistical Best-Fit Approach; 3. Definition of Probability Density Function (PDF); 4. Definition of the Likelihood Criterion Function; 5. Conclusion; References; Methods for Estimation of the Effect of Correlation at the Measurement of Alternating Voltage T Barashkova; 1. The Research on the Effect of Correlation in the Measurement of Alternating Voltage; 2. Expert Statistical Method; Acknowledgments; References
Multi-Determination of Aerodynamic Loads Using Calibration Curve with a Polynomial and MLP Neural Network Combination I M Barbosa, O A De Faria Mello, M L Collucci da Costa Reis and E del Moral Hernandez1. Instrumentation; 2. Methodology; 2.1. Fitting by Polynomial Only; 2.2. Fitting by Multilayer Perceptron (MLP) Only; 2.3. Fitting by Combination between Polynomial and MLP; 3. Results; 3.1. The Polynomial Approach; 3.2. The MLP Approach; 3.3. Combination of MLP and Polynomial Approaches; 3.4. Other Indicators for Performance Function; 4. Conclusions; REFERENCES
Uncertainty Analysis in Calibration of Standard Volume Measures E Batista, N Almeida and E Filipe1. Introduction; 2. Uncertainty Evaluation; 2.1. The Measurement Model and Uncertainty Components; 2.2. Combined and Expanded Uncertainty; 3. Experimental Results; 4. Concluding Remarks; References; Virtual Atomic Force Microscope as a Tool for Nanometrology V S Bormashov, A S Baturin, A V Zablotskiy, R V Goldshtein and K B Ustinov; 1. Introduction; 2. "Virtual AFM" Features; 2.1. Scanning system; 2.2. Feedback system; 2.3. Optical registration system; 2.4. Probe-specimen interaction module
3. ConclusionAcknowledgments; References; Development of a Mathematical Procedure for Modelling and Inspecting Complex Surfaces for Measurement Process S Boukebbab, H Bouchenitfa and J-M Linares; 1. Introduction; 2. Presentation of the Mathematical Procedure; 3. Application for Rapid Prototyping Technology; 4. Conclusion; References; A Software Simulation Tool to Evaluate the Uncertainties for a Lock-in Amplifier P Clarkson, T J Esward, P M Harris, K J Lines, F O Onakunle and I M Smith; 1. Introduction; 2. Principles Of The Lock-in Amplifier; 3. Monte Carlo Calculation
4. Simulation Software Tool
Record Nr. UNINA-9910827281703321
Singapore ; ; Hackensack, NJ, : World Scientific, c2009
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
Advanced mathematical & computational tools in metrology VI [[electronic resource] /] / editors, P. Ciarlini ... [et al.]
Advanced mathematical & computational tools in metrology VI [[electronic resource] /] / editors, P. Ciarlini ... [et al.]
Pubbl/distr/stampa Singapore ; ; River Edge, NJ, : World Scientific, c2004
Descrizione fisica 1 online resource (367 p.)
Disciplina 530.8
Altri autori (Persone) CiarliniP
Collana Series on advances in mathematics for applied sciences
Soggetto topico Measurement
Physical measurements
Soggetto genere / forma Electronic books.
Soggetto non controllato Metrology
ISBN 1-281-89868-6
9786611898687
981-270-264-4
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto Foreword; Contents; Estimation of Precision and Uncertainty of a Calibration Artefact for CMMs S. D. Antunes and M. A. F. Vicente; Uncertainty in Semi-Qualitative Testing W. Bremser and W. Hasselbarth; Processing the Coherent Anomalies on Digitalized Surfaces in Wavelet Domain P. Ciarlini and M. L. Lo Cascio; Least Squares Adjustment in the Presence of Discrepant Data M. G. Cox, A. B. Forbes, J. L. Flowers and P. M. Harris; Harmonization of Correlated Calibration Curves with an Application to the Analysis of Natural Gases M. G. Cox, S. Kamvissis, M. J. T. Milton and G. Vargha
Parametrized Approximation Estimators for Mixed Noise Distributions D. P. Jenkinson, J. C. Mason, A. Crampton, M. G. Cox, A. B. Forbes and R. BoudjemaaAlgorithms for the Calibration of Laser-Plane Sensors on CMMs C. Lartigue, P. Bourdet, L. Mathieu and C. Mehdi-Souzani; Some Differences between the Applied Statistical Approach for Measurement Uncertainty Theory and the Traditional Approach in Metrology and Testing C. Perruchet; Metrology Software for the Expression of Measurement Results by Direct Calculation of Probability Distributions G. B. Rossi, F. Crenna and M. Codda
Feasibility Study of Using Bootstrap to Compute the Uncertainty Contribution from Few Repeated Measurements B. R. L. Siebert and P. CiarliniRecursive and Parallel Algorithms for Approximating Surface Data on a Family of Lines or Curves G. Allasia; Process Measurement Impact on the Verification Uncertainty J. Bachmann, J. M. Linares, S. Aranda and J. M. Sprauel; On the In-Use Uncertainty of an Instrument W. Bich and F. Pennecchi; Automatic Differentiation and Its Application in Metrology R. Boudjemaa, M. G. Cox, A. B. Forbes and P. M. Harris
Usage of Non-Central Probability Distributions for Data Analysis in Metrology A. ChunovkinaImplementation of a General Least Squares Method in Mass Measurements J. Hald and L. Nielsen; The GUM Tree Design Pattern for Uncertainty Software B. D. Hall; Statistical Hypotheses Testing for Phase Transition Identification in Cryogenic Thermometry D. Ichim, I. Peroni and F: Sparasci; The Impact of Entropy Optimization Principles on the Probability Assignment to the Measurement Uncertainty G. Iuculano, A. Zanobini and G. Pellegrini
Stochastic Processes for Modelling and Evaluating Atomic Clock Behaviour G. Panfilo, P. Tavella and C. ZuccaCompound-Modelling of Metrological Data Series F. Pavese; Homotopic Solution of EW-TLS Problems M. L. Rastello and A. Premoli; Pooled Data Distributions: Graphical and Statistical Tools for Examining Comparison Reference Values A. G. Steele, K. D. Hill and R. J. Douglas; Numerical Uncertainty Evaluation for Complex-Valued Quantities: A Case Example L. Callegaro, F. Pennecchi and W. Bich
Bayesian Approach to Quantum State Tomography S. Castelletto, I. P. Degiovanni, M. L. Rastello and I. Ruo Berchera
Record Nr. UNINA-9910451331203321
Singapore ; ; River Edge, NJ, : World Scientific, c2004
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
Advanced mathematical & computational tools in metrology VI [[electronic resource] /] / editors, P. Ciarlini ... [et al.]
Advanced mathematical & computational tools in metrology VI [[electronic resource] /] / editors, P. Ciarlini ... [et al.]
Pubbl/distr/stampa Singapore ; ; River Edge, NJ, : World Scientific, c2004
Descrizione fisica 1 online resource (367 p.)
Disciplina 530.8
Altri autori (Persone) CiarliniP
Collana Series on advances in mathematics for applied sciences
Soggetto topico Measurement
Physical measurements
Soggetto non controllato Metrology
ISBN 1-281-89868-6
9786611898687
981-270-264-4
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto Foreword; Contents; Estimation of Precision and Uncertainty of a Calibration Artefact for CMMs S. D. Antunes and M. A. F. Vicente; Uncertainty in Semi-Qualitative Testing W. Bremser and W. Hasselbarth; Processing the Coherent Anomalies on Digitalized Surfaces in Wavelet Domain P. Ciarlini and M. L. Lo Cascio; Least Squares Adjustment in the Presence of Discrepant Data M. G. Cox, A. B. Forbes, J. L. Flowers and P. M. Harris; Harmonization of Correlated Calibration Curves with an Application to the Analysis of Natural Gases M. G. Cox, S. Kamvissis, M. J. T. Milton and G. Vargha
Parametrized Approximation Estimators for Mixed Noise Distributions D. P. Jenkinson, J. C. Mason, A. Crampton, M. G. Cox, A. B. Forbes and R. BoudjemaaAlgorithms for the Calibration of Laser-Plane Sensors on CMMs C. Lartigue, P. Bourdet, L. Mathieu and C. Mehdi-Souzani; Some Differences between the Applied Statistical Approach for Measurement Uncertainty Theory and the Traditional Approach in Metrology and Testing C. Perruchet; Metrology Software for the Expression of Measurement Results by Direct Calculation of Probability Distributions G. B. Rossi, F. Crenna and M. Codda
Feasibility Study of Using Bootstrap to Compute the Uncertainty Contribution from Few Repeated Measurements B. R. L. Siebert and P. CiarliniRecursive and Parallel Algorithms for Approximating Surface Data on a Family of Lines or Curves G. Allasia; Process Measurement Impact on the Verification Uncertainty J. Bachmann, J. M. Linares, S. Aranda and J. M. Sprauel; On the In-Use Uncertainty of an Instrument W. Bich and F. Pennecchi; Automatic Differentiation and Its Application in Metrology R. Boudjemaa, M. G. Cox, A. B. Forbes and P. M. Harris
Usage of Non-Central Probability Distributions for Data Analysis in Metrology A. ChunovkinaImplementation of a General Least Squares Method in Mass Measurements J. Hald and L. Nielsen; The GUM Tree Design Pattern for Uncertainty Software B. D. Hall; Statistical Hypotheses Testing for Phase Transition Identification in Cryogenic Thermometry D. Ichim, I. Peroni and F: Sparasci; The Impact of Entropy Optimization Principles on the Probability Assignment to the Measurement Uncertainty G. Iuculano, A. Zanobini and G. Pellegrini
Stochastic Processes for Modelling and Evaluating Atomic Clock Behaviour G. Panfilo, P. Tavella and C. ZuccaCompound-Modelling of Metrological Data Series F. Pavese; Homotopic Solution of EW-TLS Problems M. L. Rastello and A. Premoli; Pooled Data Distributions: Graphical and Statistical Tools for Examining Comparison Reference Values A. G. Steele, K. D. Hill and R. J. Douglas; Numerical Uncertainty Evaluation for Complex-Valued Quantities: A Case Example L. Callegaro, F. Pennecchi and W. Bich
Bayesian Approach to Quantum State Tomography S. Castelletto, I. P. Degiovanni, M. L. Rastello and I. Ruo Berchera
Record Nr. UNINA-9910783925203321
Singapore ; ; River Edge, NJ, : World Scientific, c2004
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui

Data di pubblicazione

Altro...