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1.1: Specimen preparation in materials science / P. J. Goodhew
| 1.1: Specimen preparation in materials science / P. J. Goodhew |
| Autore | Goodhew, Peter J. |
| Pubbl/distr/stampa | Amsterdam ; London, : North-Holland |
| Descrizione fisica | 180 p. : ill. ; 23 cm. |
| Disciplina | 502.825 |
| Soggetto non controllato | preparazione dei campioni nella scienza dei materiali |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910588000403321 |
Goodhew, Peter J.
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| Amsterdam ; London, : North-Holland | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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A guidebook to microscopical methods / A. V. Grimstone and R. J. Skaer
| A guidebook to microscopical methods / A. V. Grimstone and R. J. Skaer |
| Autore | Grimstone, Albert Victor |
| Pubbl/distr/stampa | Cambridge, : at the University press, c1972 |
| Descrizione fisica | VIII, 134 p. : ill. ; 23 cm |
| Disciplina | 502.825 |
| Altri autori (Persone) | Skaer, R. J. |
| Soggetto non controllato | Microscopia |
| ISBN |
0521084458
0521097002 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-990009415300403321 |
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Grimstone, Albert Victor
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| Cambridge, : at the University press, c1972 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Aberration-corrected analytical transmission electron microscopy [[electronic resource] /] / edited by Rik Brydson ; published in association with the Royal Microscopical Society ; series editor, Susan Brooks
| Aberration-corrected analytical transmission electron microscopy [[electronic resource] /] / edited by Rik Brydson ; published in association with the Royal Microscopical Society ; series editor, Susan Brooks |
| Pubbl/distr/stampa | Hoboken, N.J., : Wiley, 2011 |
| Descrizione fisica | 1 online resource (306 p.) |
| Disciplina |
502.8/25
502.825 |
| Altri autori (Persone) |
BrydsonRik
BrooksSusan |
| Collana | RMS - Royal Microscopical Society |
| Soggetto topico |
Transmission electron microscopy
Aberration Achromatism |
| ISBN |
1-119-97990-0
1-283-20457-6 9786613204578 1-119-97884-X 1-119-97885-8 |
| Classificazione | SCI053000 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
Aberration-Corrected Analytical Transmission Electron Microscopy; Contents; List of Contributors; Preface; 1 General Introduction to Transmission Electron Microscopy (TEM); 1.1 What TEM Offers; 1.2 Electron Scattering; 1.2.1 Elastic Scattering; 1.2.2 Inelastic Scattering; 1.3 Signals which could be Collected; 1.4 Image Computing; 1.4.1 Image Processing; 1.4.2 Image Simulation; 1.5 Requirements of a Specimen; 1.6 STEM Versus CTEM; 1.7 Two Dimensional and Three Dimensional Information; 2 Introduction to Electron Optics; 2.1 Revision of Microscopy with Visible Light and Electrons
2.2 Fresnel and Fraunhofer Diffraction2.3 Image Resolution; 2.4 Electron Lenses; 2.4.1 Electron Trajectories; 2.4.2 Aberrations; 2.5 Electron Sources; 2.6 Probe Forming Optics and Apertures; 2.7 SEM, TEM and STEM; 3 Development of STEM; 3.1 Introduction: Structural and Analytical Information in Electron Microscopy; 3.2 The Crewe Revolution: How STEM Solves the Information Problem; 3.3 Electron Optical Simplicity of STEM; 3.4 The Signal Freedom of STEM; 3.4.1 Bright-Field Detector (Phase Contrast, Diffraction Contrast); 3.4.2 ADF, HAADF; 3.4.3 Nanodiffraction; 3.4.4 EELS; 3.4.5 EDX 3.4.6 Other Techniques3.5 Beam Damage and Beam Writing; 3.6 Correction of Spherical Aberration; 3.7 What does the Future Hold?; 4 Lens Aberrations: Diagnosis and Correction; 4.1 Introduction; 4.2 Geometric Lens Aberrations and Their Classification; 4.3 Spherical Aberration-Correctors; 4.3.1 Quadrupole-Octupole Corrector; 4.3.2 Hexapole Corrector; 4.3.3 Parasitic Aberrations; 4.4 Getting Around Chromatic Aberrations; 4.5 Diagnosing Lens Aberrations; 4.5.1 Image-based Methods; 4.5.2 Ronchigram-based Methods; 4.5.3 Precision Needed; 4.6 Fifth Order Aberration-Correction; 4.7 Conclusions 5 Theory and Simulations of STEM Imaging5.1 Introduction; 5.2 Z-Contrast Imaging of Single Atoms; 5.3 STEM Imaging Of Crystalline Materials; 5.3.1 Bright-field Imaging and Phase Contrast; 5.3.2 Annular Dark-field Imaging; 5.4 Incoherent Imaging with Dynamical Scattering; 5.5 Thermal Diffuse Scattering; 5.5.1 Approximations for Phonon Scattering; 5.6 Methods of Simulation for ADF Imaging; 5.6.1 Absorptive Potentials; 5.6.2 Frozen Phonon Approach; 5.7 Conclusions; 6 Details of STEM; 6.1 Signal to Noise Ratio and Some of its Implications 6.2 The Relationships Between Probe Size, Probe Current and Probe Angle6.2.1 The Geometric Model Revisited; 6.2.2 The Minimum Probe Size, the Optimum Angle and the Probe Current; 6.2.3 The Probe Current; 6.2.4 A Simple Approximation to Wave Optical Probe Size; 6.2.5 The Effect of Chromatic Aberration; 6.2.6 Choosing aopt in Practice; 6.2.7 The Effect of Making a Small Error in the Choice of aopt; 6.2.8 The Effect of a On the Diffraction Pattern; 6.2.9 Probe Spreading and Depth of Field; 6.3 The Condenser System; 6.4 The Scanning System; 6.4.1 Principles of the Scanning System 6.4.2 Implementation of the Scanning System |
| Record Nr. | UNINA-9910139612403321 |
| Hoboken, N.J., : Wiley, 2011 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Aberration-corrected analytical transmission electron microscopy / / edited by Rik Brydson ; published in association with the Royal Microscopical Society ; series editor, Susan Brooks
| Aberration-corrected analytical transmission electron microscopy / / edited by Rik Brydson ; published in association with the Royal Microscopical Society ; series editor, Susan Brooks |
| Edizione | [1st ed.] |
| Pubbl/distr/stampa | Hoboken, N.J., : Wiley, 2011 |
| Descrizione fisica | 1 online resource (306 p.) |
| Disciplina |
502.8/25
502.825 |
| Altri autori (Persone) |
BrydsonRik
BrooksSusan |
| Collana | RMS - Royal Microscopical Society |
| Soggetto topico |
Transmission electron microscopy
Aberration Achromatism |
| ISBN |
1-119-97990-0
1-283-20457-6 9786613204578 1-119-97884-X 1-119-97885-8 |
| Classificazione | SCI053000 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
Aberration-Corrected Analytical Transmission Electron Microscopy; Contents; List of Contributors; Preface; 1 General Introduction to Transmission Electron Microscopy (TEM); 1.1 What TEM Offers; 1.2 Electron Scattering; 1.2.1 Elastic Scattering; 1.2.2 Inelastic Scattering; 1.3 Signals which could be Collected; 1.4 Image Computing; 1.4.1 Image Processing; 1.4.2 Image Simulation; 1.5 Requirements of a Specimen; 1.6 STEM Versus CTEM; 1.7 Two Dimensional and Three Dimensional Information; 2 Introduction to Electron Optics; 2.1 Revision of Microscopy with Visible Light and Electrons
2.2 Fresnel and Fraunhofer Diffraction2.3 Image Resolution; 2.4 Electron Lenses; 2.4.1 Electron Trajectories; 2.4.2 Aberrations; 2.5 Electron Sources; 2.6 Probe Forming Optics and Apertures; 2.7 SEM, TEM and STEM; 3 Development of STEM; 3.1 Introduction: Structural and Analytical Information in Electron Microscopy; 3.2 The Crewe Revolution: How STEM Solves the Information Problem; 3.3 Electron Optical Simplicity of STEM; 3.4 The Signal Freedom of STEM; 3.4.1 Bright-Field Detector (Phase Contrast, Diffraction Contrast); 3.4.2 ADF, HAADF; 3.4.3 Nanodiffraction; 3.4.4 EELS; 3.4.5 EDX 3.4.6 Other Techniques3.5 Beam Damage and Beam Writing; 3.6 Correction of Spherical Aberration; 3.7 What does the Future Hold?; 4 Lens Aberrations: Diagnosis and Correction; 4.1 Introduction; 4.2 Geometric Lens Aberrations and Their Classification; 4.3 Spherical Aberration-Correctors; 4.3.1 Quadrupole-Octupole Corrector; 4.3.2 Hexapole Corrector; 4.3.3 Parasitic Aberrations; 4.4 Getting Around Chromatic Aberrations; 4.5 Diagnosing Lens Aberrations; 4.5.1 Image-based Methods; 4.5.2 Ronchigram-based Methods; 4.5.3 Precision Needed; 4.6 Fifth Order Aberration-Correction; 4.7 Conclusions 5 Theory and Simulations of STEM Imaging5.1 Introduction; 5.2 Z-Contrast Imaging of Single Atoms; 5.3 STEM Imaging Of Crystalline Materials; 5.3.1 Bright-field Imaging and Phase Contrast; 5.3.2 Annular Dark-field Imaging; 5.4 Incoherent Imaging with Dynamical Scattering; 5.5 Thermal Diffuse Scattering; 5.5.1 Approximations for Phonon Scattering; 5.6 Methods of Simulation for ADF Imaging; 5.6.1 Absorptive Potentials; 5.6.2 Frozen Phonon Approach; 5.7 Conclusions; 6 Details of STEM; 6.1 Signal to Noise Ratio and Some of its Implications 6.2 The Relationships Between Probe Size, Probe Current and Probe Angle6.2.1 The Geometric Model Revisited; 6.2.2 The Minimum Probe Size, the Optimum Angle and the Probe Current; 6.2.3 The Probe Current; 6.2.4 A Simple Approximation to Wave Optical Probe Size; 6.2.5 The Effect of Chromatic Aberration; 6.2.6 Choosing aopt in Practice; 6.2.7 The Effect of Making a Small Error in the Choice of aopt; 6.2.8 The Effect of a On the Diffraction Pattern; 6.2.9 Probe Spreading and Depth of Field; 6.3 The Condenser System; 6.4 The Scanning System; 6.4.1 Principles of the Scanning System 6.4.2 Implementation of the Scanning System |
| Record Nr. | UNINA-9910822805803321 |
| Hoboken, N.J., : Wiley, 2011 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Advanced Computing in Electron Microscopy [[electronic resource] /] / by Earl J. Kirkland
| Advanced Computing in Electron Microscopy [[electronic resource] /] / by Earl J. Kirkland |
| Autore | Kirkland Earl J |
| Edizione | [3rd ed. 2020.] |
| Pubbl/distr/stampa | Cham : , : Springer International Publishing : , : Imprint : Springer, , 2020 |
| Descrizione fisica | 1 online resource (XII, 354 p. 146 illus., 8 illus. in color.) |
| Disciplina | 502.825 |
| Soggetto topico |
Spectroscopy
Microscopy Optical data processing Materials science Spectroscopy and Microscopy Image Processing and Computer Vision Characterization and Evaluation of Materials Biological Microscopy Spectroscopy/Spectrometry |
| ISBN | 3-030-33260-8 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | Introduction -- The Transmission Electron Microscope -- Some Image Approximations -- Sampling and the Fast Fourier Transform -- Calculation of Images of Thin Specimens -- Theory of Calculation of Images of Thick Specimens -- Multislice Applications and Examples -- The Programss -- App. A: Plotting Transfer Functions -- App. B: The Fourier Projection Theorem -- App. C: Atomic Potentials and Scattering Factors -- App. D: The Inverse Problem -- App. E: Bilinear Interpolation -- App. F: 3D Perspective View. |
| Record Nr. | UNISA-996418444503316 |
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Kirkland Earl J
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| Cham : , : Springer International Publishing : , : Imprint : Springer, , 2020 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
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Advanced Computing in Electron Microscopy / / by Earl J. Kirkland
| Advanced Computing in Electron Microscopy / / by Earl J. Kirkland |
| Autore | Kirkland Earl J |
| Edizione | [3rd ed. 2020.] |
| Pubbl/distr/stampa | Cham : , : Springer International Publishing : , : Imprint : Springer, , 2020 |
| Descrizione fisica | 1 online resource (XII, 354 p. 146 illus., 8 illus. in color.) |
| Disciplina | 502.825 |
| Soggetto topico |
Spectroscopy
Microscopy Optical data processing Materials science Spectroscopy and Microscopy Image Processing and Computer Vision Characterization and Evaluation of Materials Biological Microscopy Spectroscopy/Spectrometry |
| ISBN | 3-030-33260-8 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | Introduction -- The Transmission Electron Microscope -- Some Image Approximations -- Sampling and the Fast Fourier Transform -- Calculation of Images of Thin Specimens -- Theory of Calculation of Images of Thick Specimens -- Multislice Applications and Examples -- The Programss -- App. A: Plotting Transfer Functions -- App. B: The Fourier Projection Theorem -- App. C: Atomic Potentials and Scattering Factors -- App. D: The Inverse Problem -- App. E: Bilinear Interpolation -- App. F: 3D Perspective View. |
| Record Nr. | UNINA-9910409987503321 |
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Kirkland Earl J
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| Cham : , : Springer International Publishing : , : Imprint : Springer, , 2020 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Advanced Transmission Electron Microscopy : Imaging and Diffraction in Nanoscience / / by Jian Min Zuo, John C.H. Spence
| Advanced Transmission Electron Microscopy : Imaging and Diffraction in Nanoscience / / by Jian Min Zuo, John C.H. Spence |
| Autore | Zuo Jian Min |
| Edizione | [1st ed. 2017.] |
| Pubbl/distr/stampa | New York, NY : , : Springer New York : , : Imprint : Springer, , 2017 |
| Descrizione fisica | 1 online resource (XXVI, 729 p. 310 illus., 218 illus. in color.) |
| Disciplina | 502.825 |
| Soggetto topico |
Materials science
Lasers Photonics Nanochemistry Nanoscale science Nanoscience Nanostructures Nanotechnology Solid state physics Characterization and Evaluation of Materials Optics, Lasers, Photonics, Optical Devices Nanoscale Science and Technology Solid State Physics |
| ISBN | 1-4939-6607-3 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | Introduction and historical background -- Electron Waves and Wave Propagation -- The geometry of electron diffraction patterns -- Kinematical Theory of Electron Diffraction -- Dynamical Theory of Electron Diffraction for Perfect Crystals -- Electron optics -- Lens aberrations and Aberration Correction -- Electron Sources -- Electron Detectors -- Instrumentation and experimental techniques -- Crystal symmetry -- Crystal structure and bonding -- Diffuse Scattering -- Atomic resolution electron imaging -- Imaging and characterization of crystal defects -- Strain Measurements and Mapping -- Structure of Nanocrystals, Nanoparticles and Nanotubes. |
| Record Nr. | UNINA-9910254141103321 |
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Zuo Jian Min
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| New York, NY : , : Springer New York : , : Imprint : Springer, , 2017 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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An introduction to microscopy by means of light, electrons, x-rays, or ultrasound / Theodore George Rochow, Eugene George Rochow
| An introduction to microscopy by means of light, electrons, x-rays, or ultrasound / Theodore George Rochow, Eugene George Rochow |
| Autore | Rochow, Theodore George |
| Pubbl/distr/stampa | New York, : Plenum Press, 1978 |
| Descrizione fisica | XVI, 367 p. : ill ; 24 cm |
| Disciplina |
502
502.825 |
| Altri autori (Persone) | Rochow, Eugene George |
| Soggetto non controllato | Microscopia elettronica |
| ISBN | 0306311119 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-990009642550403321 |
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Rochow, Theodore George
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| New York, : Plenum Press, 1978 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Applications of Electron Microfractography to Materials Research
| Applications of Electron Microfractography to Materials Research |
| Autore | Wiebe W |
| Pubbl/distr/stampa | [Place of publication not identified], : American Society for Testing & Materials, 1971 |
| Descrizione fisica | 1 online resource (96 pages) : illustrations |
| Disciplina | 502.825 |
| Collana | ASTM special technical publication |
| Soggetto topico | Electron microscopy |
| ISBN | 0-8031-4600-0 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910164725503321 |
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Wiebe W
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| [Place of publication not identified], : American Society for Testing & Materials, 1971 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Atti del 2. Congresso italiano di microscopia elettronica : Milano, Palazzo Visconti
| Atti del 2. Congresso italiano di microscopia elettronica : Milano, Palazzo Visconti |
| Autore | Congresso italiano di microscopia elettronica : <2. ; : 1959 |
| Pubbl/distr/stampa | Milano : s.n, 1959 |
| Descrizione fisica | 166 p. : ill. ; 21 cm |
| Disciplina | 502.825 |
| Soggetto topico | Microscopia elettronica - Atti di congressi - Milano - 1959 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | ita |
| Record Nr. | UNISA-990003500700203316 |
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Congresso italiano di microscopia elettronica : <2. ; : 1959
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| Milano : s.n, 1959 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
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