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Aberration-corrected analytical transmission electron microscopy [[electronic resource] /] / edited by Rik Brydson ; published in association with the Royal Microscopical Society ; series editor, Susan Brooks
| Aberration-corrected analytical transmission electron microscopy [[electronic resource] /] / edited by Rik Brydson ; published in association with the Royal Microscopical Society ; series editor, Susan Brooks |
| Pubbl/distr/stampa | Hoboken, N.J., : Wiley, 2011 |
| Descrizione fisica | 1 online resource (306 p.) |
| Disciplina |
502.8/25
502.825 |
| Altri autori (Persone) |
BrydsonRik
BrooksSusan |
| Collana | RMS - Royal Microscopical Society |
| Soggetto topico |
Transmission electron microscopy
Aberration Achromatism |
| ISBN |
1-119-97990-0
1-283-20457-6 9786613204578 1-119-97884-X 1-119-97885-8 |
| Classificazione | SCI053000 |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
Aberration-Corrected Analytical Transmission Electron Microscopy; Contents; List of Contributors; Preface; 1 General Introduction to Transmission Electron Microscopy (TEM); 1.1 What TEM Offers; 1.2 Electron Scattering; 1.2.1 Elastic Scattering; 1.2.2 Inelastic Scattering; 1.3 Signals which could be Collected; 1.4 Image Computing; 1.4.1 Image Processing; 1.4.2 Image Simulation; 1.5 Requirements of a Specimen; 1.6 STEM Versus CTEM; 1.7 Two Dimensional and Three Dimensional Information; 2 Introduction to Electron Optics; 2.1 Revision of Microscopy with Visible Light and Electrons
2.2 Fresnel and Fraunhofer Diffraction2.3 Image Resolution; 2.4 Electron Lenses; 2.4.1 Electron Trajectories; 2.4.2 Aberrations; 2.5 Electron Sources; 2.6 Probe Forming Optics and Apertures; 2.7 SEM, TEM and STEM; 3 Development of STEM; 3.1 Introduction: Structural and Analytical Information in Electron Microscopy; 3.2 The Crewe Revolution: How STEM Solves the Information Problem; 3.3 Electron Optical Simplicity of STEM; 3.4 The Signal Freedom of STEM; 3.4.1 Bright-Field Detector (Phase Contrast, Diffraction Contrast); 3.4.2 ADF, HAADF; 3.4.3 Nanodiffraction; 3.4.4 EELS; 3.4.5 EDX 3.4.6 Other Techniques3.5 Beam Damage and Beam Writing; 3.6 Correction of Spherical Aberration; 3.7 What does the Future Hold?; 4 Lens Aberrations: Diagnosis and Correction; 4.1 Introduction; 4.2 Geometric Lens Aberrations and Their Classification; 4.3 Spherical Aberration-Correctors; 4.3.1 Quadrupole-Octupole Corrector; 4.3.2 Hexapole Corrector; 4.3.3 Parasitic Aberrations; 4.4 Getting Around Chromatic Aberrations; 4.5 Diagnosing Lens Aberrations; 4.5.1 Image-based Methods; 4.5.2 Ronchigram-based Methods; 4.5.3 Precision Needed; 4.6 Fifth Order Aberration-Correction; 4.7 Conclusions 5 Theory and Simulations of STEM Imaging5.1 Introduction; 5.2 Z-Contrast Imaging of Single Atoms; 5.3 STEM Imaging Of Crystalline Materials; 5.3.1 Bright-field Imaging and Phase Contrast; 5.3.2 Annular Dark-field Imaging; 5.4 Incoherent Imaging with Dynamical Scattering; 5.5 Thermal Diffuse Scattering; 5.5.1 Approximations for Phonon Scattering; 5.6 Methods of Simulation for ADF Imaging; 5.6.1 Absorptive Potentials; 5.6.2 Frozen Phonon Approach; 5.7 Conclusions; 6 Details of STEM; 6.1 Signal to Noise Ratio and Some of its Implications 6.2 The Relationships Between Probe Size, Probe Current and Probe Angle6.2.1 The Geometric Model Revisited; 6.2.2 The Minimum Probe Size, the Optimum Angle and the Probe Current; 6.2.3 The Probe Current; 6.2.4 A Simple Approximation to Wave Optical Probe Size; 6.2.5 The Effect of Chromatic Aberration; 6.2.6 Choosing aopt in Practice; 6.2.7 The Effect of Making a Small Error in the Choice of aopt; 6.2.8 The Effect of a On the Diffraction Pattern; 6.2.9 Probe Spreading and Depth of Field; 6.3 The Condenser System; 6.4 The Scanning System; 6.4.1 Principles of the Scanning System 6.4.2 Implementation of the Scanning System |
| Record Nr. | UNINA-9910139612403321 |
| Hoboken, N.J., : Wiley, 2011 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Aberration-corrected analytical transmission electron microscopy / / edited by Rik Brydson ; published in association with the Royal Microscopical Society ; series editor, Susan Brooks
| Aberration-corrected analytical transmission electron microscopy / / edited by Rik Brydson ; published in association with the Royal Microscopical Society ; series editor, Susan Brooks |
| Edizione | [1st ed.] |
| Pubbl/distr/stampa | Hoboken, N.J., : Wiley, 2011 |
| Descrizione fisica | 1 online resource (306 p.) |
| Disciplina |
502.8/25
502.825 |
| Altri autori (Persone) |
BrydsonRik
BrooksSusan |
| Collana | RMS - Royal Microscopical Society |
| Soggetto topico |
Transmission electron microscopy
Aberration Achromatism |
| ISBN |
1-119-97990-0
1-283-20457-6 9786613204578 1-119-97884-X 1-119-97885-8 |
| Classificazione | SCI053000 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
Aberration-Corrected Analytical Transmission Electron Microscopy; Contents; List of Contributors; Preface; 1 General Introduction to Transmission Electron Microscopy (TEM); 1.1 What TEM Offers; 1.2 Electron Scattering; 1.2.1 Elastic Scattering; 1.2.2 Inelastic Scattering; 1.3 Signals which could be Collected; 1.4 Image Computing; 1.4.1 Image Processing; 1.4.2 Image Simulation; 1.5 Requirements of a Specimen; 1.6 STEM Versus CTEM; 1.7 Two Dimensional and Three Dimensional Information; 2 Introduction to Electron Optics; 2.1 Revision of Microscopy with Visible Light and Electrons
2.2 Fresnel and Fraunhofer Diffraction2.3 Image Resolution; 2.4 Electron Lenses; 2.4.1 Electron Trajectories; 2.4.2 Aberrations; 2.5 Electron Sources; 2.6 Probe Forming Optics and Apertures; 2.7 SEM, TEM and STEM; 3 Development of STEM; 3.1 Introduction: Structural and Analytical Information in Electron Microscopy; 3.2 The Crewe Revolution: How STEM Solves the Information Problem; 3.3 Electron Optical Simplicity of STEM; 3.4 The Signal Freedom of STEM; 3.4.1 Bright-Field Detector (Phase Contrast, Diffraction Contrast); 3.4.2 ADF, HAADF; 3.4.3 Nanodiffraction; 3.4.4 EELS; 3.4.5 EDX 3.4.6 Other Techniques3.5 Beam Damage and Beam Writing; 3.6 Correction of Spherical Aberration; 3.7 What does the Future Hold?; 4 Lens Aberrations: Diagnosis and Correction; 4.1 Introduction; 4.2 Geometric Lens Aberrations and Their Classification; 4.3 Spherical Aberration-Correctors; 4.3.1 Quadrupole-Octupole Corrector; 4.3.2 Hexapole Corrector; 4.3.3 Parasitic Aberrations; 4.4 Getting Around Chromatic Aberrations; 4.5 Diagnosing Lens Aberrations; 4.5.1 Image-based Methods; 4.5.2 Ronchigram-based Methods; 4.5.3 Precision Needed; 4.6 Fifth Order Aberration-Correction; 4.7 Conclusions 5 Theory and Simulations of STEM Imaging5.1 Introduction; 5.2 Z-Contrast Imaging of Single Atoms; 5.3 STEM Imaging Of Crystalline Materials; 5.3.1 Bright-field Imaging and Phase Contrast; 5.3.2 Annular Dark-field Imaging; 5.4 Incoherent Imaging with Dynamical Scattering; 5.5 Thermal Diffuse Scattering; 5.5.1 Approximations for Phonon Scattering; 5.6 Methods of Simulation for ADF Imaging; 5.6.1 Absorptive Potentials; 5.6.2 Frozen Phonon Approach; 5.7 Conclusions; 6 Details of STEM; 6.1 Signal to Noise Ratio and Some of its Implications 6.2 The Relationships Between Probe Size, Probe Current and Probe Angle6.2.1 The Geometric Model Revisited; 6.2.2 The Minimum Probe Size, the Optimum Angle and the Probe Current; 6.2.3 The Probe Current; 6.2.4 A Simple Approximation to Wave Optical Probe Size; 6.2.5 The Effect of Chromatic Aberration; 6.2.6 Choosing aopt in Practice; 6.2.7 The Effect of Making a Small Error in the Choice of aopt; 6.2.8 The Effect of a On the Diffraction Pattern; 6.2.9 Probe Spreading and Depth of Field; 6.3 The Condenser System; 6.4 The Scanning System; 6.4.1 Principles of the Scanning System 6.4.2 Implementation of the Scanning System |
| Record Nr. | UNINA-9910822805803321 |
| Hoboken, N.J., : Wiley, 2011 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Biological field emission scanning electron microscopy / / edited by Roland A. Fleck, Bruno M. Humbel
| Biological field emission scanning electron microscopy / / edited by Roland A. Fleck, Bruno M. Humbel |
| Pubbl/distr/stampa | John Wiley & Sons, Inc |
| Disciplina | 502.8/25 |
| Soggetto topico |
Microscopy, Electron, Scanning - methods
Microscopy, Electron, Scanning - instrumentation |
| ISBN |
1-118-66324-1
1-118-66326-8 1-118-66323-3 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910555129703321 |
| John Wiley & Sons, Inc | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Biological field emission scanning electron microscopy / / edited by Roland A. Fleck, Bruno M. Humbel
| Biological field emission scanning electron microscopy / / edited by Roland A. Fleck, Bruno M. Humbel |
| Pubbl/distr/stampa | John Wiley & Sons, Inc |
| Disciplina | 502.8/25 |
| Soggetto topico |
Microscopy, Electron, Scanning - methods
Microscopy, Electron, Scanning - instrumentation |
| ISBN |
1-118-66324-1
1-118-66326-8 1-118-66323-3 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910830210003321 |
| John Wiley & Sons, Inc | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Image analysis, enhancement, and interpretation / D.L. Misell
| Image analysis, enhancement, and interpretation / D.L. Misell |
| Descrizione fisica | xv, 305 pages : illustrations ; 23 cm |
| Disciplina | 502.8/25 |
| Altri autori (Persone) | Misell, D. L.author |
| Collana | Practical methods in electron microscopy ; 7 |
| Soggetto topico | Electron microscopy - Technique |
| ISBN | 0720406668 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISALENTO-991004289038107536 |
| Materiale a stampa | ||
| Lo trovi qui: Univ. del Salento | ||
|
Liquid cell electron microscopy / / [edited by] Frances M. Ross [[electronic resource]]
| Liquid cell electron microscopy / / [edited by] Frances M. Ross [[electronic resource]] |
| Autore | Ross Frances M. <1964-> |
| Pubbl/distr/stampa | Cambridge : , : Cambridge University Press, , 2017 |
| Descrizione fisica | 1 online resource (xviii, 509 pages) : digital, PDF file(s) |
| Disciplina | 502.8/25 |
| Collana | Advances in microscopy and microanalysis |
| Soggetto topico |
Electron microscopy - Technique
Liquids - Microscopy Transmission electron microscopy |
| ISBN |
1-316-88287-X
1-316-88353-1 1-316-88364-7 1-316-88375-2 1-316-33745-6 1-316-88386-8 1-316-88419-8 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | Past, present and future electron microscopy of liquid specimens / Niels de Jonge and Frances M. Ross -- Encapsulated liquid cells for transmission electron microscopy / Eric Jensen and Kristian Mølhave -- Imaging liquid processes using open cells in the tem, sem, and beyond / Chongmin Wang -- Membrane based environmental cells for sem in liquids / Andrei Kolmakov -- Observations in liquids using an inverted SEM / Chikara Sato and Mitsuo Suga -- Temperature control in liquid cells for TEM / Shen J. Dillon and Xin Chen -- Electron beam effects in liquid cell TEM and STEM / Nicholas M. Schneider -- Resolution in liquid cell experiments / Niels de Jonge, Nigel Browning, James E. Evans, See Wee Chee and Frances M. Ross -- Nanostructure growth, interactions and assembly in the liquid phase / Hong-Gang Liao, Kai-Yang Niu and Haimei Zheng -- Quantifying electrochemical processes using liquid cell TEM / Frances M. Ross -- Application of electrochemical liquid cells for electrical energy storage and conversion studies / Raymond R. Unocic and Karren L. More -- Applications of liquid cell TEM in corrosion science / See Wee Chee and M. Grace Burke -- Nanoscale water imaged by liquid cell TEM / Utkur Mirsaidov and Paul Matsudaira -- Nanoscale deposition and etching of materials using focused electron beams and liquid reactants / Eugenii U. Donev, Matthew Bresin and J. Todd Hastings -- Liquid cell TEM for studying environmental and biological mineral systems / Michael H. Nielsen and James J. De Yoreo -- Liquid STEM for studying biological function in whole cells / Diana B. Peckys and Niels de Jonge -- Visualizing macromolecules in liquid at the nanoscale / Andrew C. Demmert, Madeline J. Dukes, Elliot Pohlmann, Kaya Patel, A. Cameron Varano, Zhi Sheng, Sarah M. McDonald, Michael Spillman, Utkur Mirsaidov, Paul Matsudaira, and Deborah F. Kelly -- Application of liquid cell microscopy to study function of muscle proteins / Haruo Sugi, Shigeru Chaen, Tsuyoshi Akimoto, Masaru Tanokura, Takuya Miyakawa and Hiroki Minoda -- High resolution imaging in the graphene liquid cell / Jungwon Park, Vivekananda P. Adiga, Alex Zettl, and A. Paul Alivisatos -- Analytical electron microscopy during in situ liquid cell studies / Megan E. Holtz, David A. Muller, and Nestor J. Zaluzec -- Spherical and chromatic aberration correction for atomic-resolution liquid cell electron microscopy / Rafal E. Dunin-Borkowski and Lothar Houben -- The potential for imaging dynamic processes in liquids with high temporal resolution / Nigel D. Browning and James E. Evans -- Future prospects for biomolecular, biomimetic and biomaterials research enabled by new liquid cell electron microscopy techniques / Taylor Woehl and Tanya Prozorov. |
| Record Nr. | UNINA-9910150170503321 |
Ross Frances M. <1964->
|
||
| Cambridge : , : Cambridge University Press, , 2017 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Low voltage electron microscopy [[electronic resource] ] : principles and applications / / edited by David C. Bell and Natasha Erdman
| Low voltage electron microscopy [[electronic resource] ] : principles and applications / / edited by David C. Bell and Natasha Erdman |
| Edizione | [1st edition] |
| Pubbl/distr/stampa | Hoboken, : John Wiley & Sons Inc., 2013 |
| Descrizione fisica | 1 online resource (257 p.) |
| Disciplina | 502.8/25 |
| Altri autori (Persone) |
BellD. C (David C.)
ErdmanNatasha |
| Collana | Royal Microscopical Society-John Wiley series |
| Soggetto topico | Electron microscopy - Technique |
| ISBN |
1-118-49851-8
1-118-49848-8 1-299-18823-0 1-118-49850-X |
| Classificazione | SCI047000 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
Cover; Current and future titles in the Royal Microscopical Society- John Wiley Series; Title Page; Copyright; List of Contributors; Preface; Chapter 1: Introduction to the Theory and Advantages of Low Voltage Electron Microscopy; 1.1 Introduction; 1.2 Historical Perspective; 1.3 Beam Interaction with Specimen-Elastic and Inelastic Scattering; 1.4 Instrument Configuration; 1.5 Influence of Electron Optics Aberrations at Low Voltages; 1.6 SEM Imaging at Low Voltages; 1.7 TEM/STEM Imaging and Analysis at Low Voltages; 1.8 Conclusion; References
Chapter 2: SEM Instrumentation Developments for Low kV Imaging and Microanalysis2.1 Introduction; 2.2 The Electron Source; 2.3 SEM Column Design Considerations; 2.4 Beam Deceleration; 2.5 Novel Detector Options and Energy Filters; 2.6 Low Voltage STEM in SEM; 2.7 Aberration Correction in SEM; 2.8 Conclusions; References; Chapter 3: Extreme High-Resolution (XHR) SEM Using a Beam Monochromator; 3.1 Introduction; 3.2 Limitations in Low Voltage SEM Performance; 3.3 Beam Monochromator Design and Implementation; 3.4 XHR Systems and Applications; 3.5 Conclusions; Acknowledgements; References Chapter 4: The Application of Low-Voltage SEM-From Nanotechnology to Biological Research4.1 Introduction; 4.2 Specimen Preparation Considerations; 4.3 Nanomaterials Applications; 4.4 Beam Sensitive Materials; 4.5 Semiconductor Materials; 4.6 Biological Specimens; 4.7 Low-Voltage Microanalysis; 4.8 Conclusions; References; Chapter 5: Low Voltage High-Resolution Transmission Electron Microscopy; 5.1 Introduction; 5.2 So How Low is Low?; 5.3 The Effect of Chromatic Aberration and Chromatic Aberration Correction; 5.4 The Electron Monochromator; 5.5 Theoretical Tradeoffs of Low kV Imaging 5.6 Our Experience at 40 keV LV-HREM5.7 Examples of LV-HREM Imaging; 5.8 Conclusions; References; Chapter 6: Gentle STEM of Single Atoms: Low keV Imaging and Analysis at Ultimate Detection Limits; 6.1 Introduction; 6.2 Optimizing STEM Resolution and Probe Current at Low Primary Energies; 6.3 STEM Image Formation; 6.4 Gentle STEM Applications; 6.5 Discussion; 6.6 Conclusion; Acknowledgements; References; Chapter 7: Low Voltage Scanning Transmission Electron Microscopy of Oxide Interfaces; 7.1 Introduction; 7.2 Methods and Instrumentation; 7.3 Low Voltage Imaging and Spectroscopy; 7.4 Summary AcknowledgementsReferences; Chapter 8: What's Next? The Future Directions in Low Voltage Electron Microscopy; 8.1 Introduction; 8.2 Unique Low Voltage SEM and TEM Instruments; 8.3 Cameras, Detectors, and Other Accessories; 8.4 Conclusions; References; Index |
| Record Nr. | UNINA-9910141489403321 |
| Hoboken, : John Wiley & Sons Inc., 2013 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Low voltage electron microscopy : principles and applications / / edited by David C. Bell and Natasha Erdman
| Low voltage electron microscopy : principles and applications / / edited by David C. Bell and Natasha Erdman |
| Edizione | [1st edition] |
| Pubbl/distr/stampa | Hoboken, : John Wiley & Sons Inc., 2013 |
| Descrizione fisica | 1 online resource (257 p.) |
| Disciplina | 502.8/25 |
| Altri autori (Persone) |
BellD. C (David C.)
ErdmanNatasha |
| Collana | Royal Microscopical Society-John Wiley series |
| Soggetto topico | Electron microscopy - Technique |
| ISBN |
1-118-49851-8
1-118-49848-8 1-299-18823-0 1-118-49850-X |
| Classificazione | SCI047000 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
Cover; Current and future titles in the Royal Microscopical Society- John Wiley Series; Title Page; Copyright; List of Contributors; Preface; Chapter 1: Introduction to the Theory and Advantages of Low Voltage Electron Microscopy; 1.1 Introduction; 1.2 Historical Perspective; 1.3 Beam Interaction with Specimen-Elastic and Inelastic Scattering; 1.4 Instrument Configuration; 1.5 Influence of Electron Optics Aberrations at Low Voltages; 1.6 SEM Imaging at Low Voltages; 1.7 TEM/STEM Imaging and Analysis at Low Voltages; 1.8 Conclusion; References
Chapter 2: SEM Instrumentation Developments for Low kV Imaging and Microanalysis2.1 Introduction; 2.2 The Electron Source; 2.3 SEM Column Design Considerations; 2.4 Beam Deceleration; 2.5 Novel Detector Options and Energy Filters; 2.6 Low Voltage STEM in SEM; 2.7 Aberration Correction in SEM; 2.8 Conclusions; References; Chapter 3: Extreme High-Resolution (XHR) SEM Using a Beam Monochromator; 3.1 Introduction; 3.2 Limitations in Low Voltage SEM Performance; 3.3 Beam Monochromator Design and Implementation; 3.4 XHR Systems and Applications; 3.5 Conclusions; Acknowledgements; References Chapter 4: The Application of Low-Voltage SEM-From Nanotechnology to Biological Research4.1 Introduction; 4.2 Specimen Preparation Considerations; 4.3 Nanomaterials Applications; 4.4 Beam Sensitive Materials; 4.5 Semiconductor Materials; 4.6 Biological Specimens; 4.7 Low-Voltage Microanalysis; 4.8 Conclusions; References; Chapter 5: Low Voltage High-Resolution Transmission Electron Microscopy; 5.1 Introduction; 5.2 So How Low is Low?; 5.3 The Effect of Chromatic Aberration and Chromatic Aberration Correction; 5.4 The Electron Monochromator; 5.5 Theoretical Tradeoffs of Low kV Imaging 5.6 Our Experience at 40 keV LV-HREM5.7 Examples of LV-HREM Imaging; 5.8 Conclusions; References; Chapter 6: Gentle STEM of Single Atoms: Low keV Imaging and Analysis at Ultimate Detection Limits; 6.1 Introduction; 6.2 Optimizing STEM Resolution and Probe Current at Low Primary Energies; 6.3 STEM Image Formation; 6.4 Gentle STEM Applications; 6.5 Discussion; 6.6 Conclusion; Acknowledgements; References; Chapter 7: Low Voltage Scanning Transmission Electron Microscopy of Oxide Interfaces; 7.1 Introduction; 7.2 Methods and Instrumentation; 7.3 Low Voltage Imaging and Spectroscopy; 7.4 Summary AcknowledgementsReferences; Chapter 8: What's Next? The Future Directions in Low Voltage Electron Microscopy; 8.1 Introduction; 8.2 Unique Low Voltage SEM and TEM Instruments; 8.3 Cameras, Detectors, and Other Accessories; 8.4 Conclusions; References; Index |
| Record Nr. | UNINA-9910809297503321 |
| Hoboken, : John Wiley & Sons Inc., 2013 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Principles and practice of variable pressure/environmental scanning electron microscopy (VP-ESEM) [[electronic resource] /] / Debbie J. Stokes
| Principles and practice of variable pressure/environmental scanning electron microscopy (VP-ESEM) [[electronic resource] /] / Debbie J. Stokes |
| Autore | Stokes Debbie |
| Pubbl/distr/stampa | Chichester, U.K., : Wiley, 2008 |
| Descrizione fisica | 1 online resource (235 p.) |
| Disciplina | 502.8/25 |
| Collana | RMS - Royal Microscopical Society |
| Soggetto topico |
Scanning electron microscopy
Microscopy |
| ISBN |
1-282-34350-5
9786612343506 0-470-75873-2 0-470-75874-0 |
| Classificazione | UH 6310 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
Principles and Practice of Variable Pressure/Environmental Scanning Electron Microscopy (VP-ESEM); Contents; Preface; 1 A Brief Historical Overview; 1.1 Scanning Electron Microscopy; 1.1.1 The Beginnings; 1.1.2 The Need for Added Capabilities; 1.2 The Development of Imaging in a Gas Environment; 1.2.1 Overcoming the Limits of Conventional SEM; 1.2.2 Leaps and Bounds; 2 Principles of SEM; 2.1 Introduction; 2.1.1 Why Use An Electron Beam?; 2.1.2 The SEM Column; 2.1.3 Why Do We Need a Vacuum System?; 2.2 Electron Sources; 2.2.1 Thermionic Emission Sources; 2.2.2 Field Emission Sources
2.3 Electron Optics2.3.1 Lenses; 2.3.2 Lens Aberrations; 2.4 Signals and Detection; 2.4.1 Primary Electrons and the Interaction Volume; 2.4.2 Backscattered Electrons; 2.4.3 Secondary Electrons; 2.4.4 X-ray Radiation; 2.4.5 Cathodoluminescence; 2.5 Practical Aspects of Electron Beam Irradiation; 2.5.1 Radiation Damage; 2.5.2 Minimising Specimen Charging - Low-Voltage SEM; 2.5.3 Increasing Surface and Bulk Conductivities; 2.6 SEM in Operation; 2.6.1 Building Up an Image; 2.6.2 Magnification; 2.6.3 Signal-to-Noise Ratio; 2.6.4 Contrast; 2.6.5 Adjusting the Contrast; 2.6.6 Resolution 2.6.7 Depth of Field2.6.8 Image Capture; 3 General Principles of VP-ESEM: Utilising a Gas; 3.1 Introduction; 3.2 VP-ESEM Instrumentation; 3.2.1 Typical Features; 3.2.2 Primary Electron Scattering in VP-ESEM - the General Case; 3.2.3 Units of Pressure; 3.3 Signal Generation in a Gas; 3.3.1 Introduction; 3.3.2 Direct Collection of Electrons and Ions; 3.3.3 Collection of Photons - the Gas Luminescence Signal; 3.3.4 Detecting Indirect Electron and Ion Currents; 3.4 Imaging with Water Vapour; 3.4.1 Introduction; 3.4.2 Thermodynamic Equilibria; 3.4.3 Nonequilibrium Conditions 3.4.4 Practicalities of Stabilising Hydrated Specimens4 Imaging and Analysis in VP-ESEM: The Influence of a Gas; 4.1 Introduction; 4.2 Background to Theoretical Calculations; 4.2.1 Calculating the Mean Free Paths of Primary Electrons; 4.2.2 Calculating Pressure-Dependent Variables; 4.2.3 Estimating the 'Useful' Primary Electron Current; 4.3 Which Gas?; 4.3.1 Introduction; 4.3.2 Usefulness of the Gas - Experimental Conditions; 4.3.3 Ionisation and Excitation for Different Gases; 4.3.4 Scattering of the Primary Electron Beam in Different Gases; 4.4 Exploring the Gas Path Length 4.4.1 Introduction4.4.2 Influence of GPL on the Skirt Radius; 4.4.3 Gas Path Length and Useful Primary Electron Beam Current; 4.4.4 Constraints on Reducing the Gas Path Length; 4.4.5 Separating Gas Path Length from Working Distance; 4.5 How Much Gas?; 4.5.1 Introduction; 4.5.2 Scattering of Primary Electrons as a Function of Pressure; 4.6 X-ray Microanalysis in VP-ESEM; 4.6.1 Introduction; 4.6.2 Effects of Chamber Gas on X-ray Signals; 4.6.3 Considerations for Minimising the Effects of the Gas; 4.6.4 Post-Acquisition Methods to Correct for Scattering 5 Imaging Uncoated Specimens in the VP-ESEM |
| Record Nr. | UNINA-9910144405803321 |
|
Stokes Debbie
|
||
| Chichester, U.K., : Wiley, 2008 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Principles and practice of variable pressure/environmental scanning electron microscopy (VP-ESEM) / / Debbie J. Stokes
| Principles and practice of variable pressure/environmental scanning electron microscopy (VP-ESEM) / / Debbie J. Stokes |
| Autore | Stokes Debbie |
| Edizione | [1st ed.] |
| Pubbl/distr/stampa | Chichester, U.K., : Wiley, 2008 |
| Descrizione fisica | 1 online resource (235 p.) |
| Disciplina | 502.8/25 |
| Collana | RMS - Royal Microscopical Society |
| Soggetto topico |
Scanning electron microscopy
Microscopy |
| ISBN |
1-282-34350-5
9786612343506 0-470-75873-2 0-470-75874-0 |
| Classificazione | UH 6310 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
Principles and Practice of Variable Pressure/Environmental Scanning Electron Microscopy (VP-ESEM); Contents; Preface; 1 A Brief Historical Overview; 1.1 Scanning Electron Microscopy; 1.1.1 The Beginnings; 1.1.2 The Need for Added Capabilities; 1.2 The Development of Imaging in a Gas Environment; 1.2.1 Overcoming the Limits of Conventional SEM; 1.2.2 Leaps and Bounds; 2 Principles of SEM; 2.1 Introduction; 2.1.1 Why Use An Electron Beam?; 2.1.2 The SEM Column; 2.1.3 Why Do We Need a Vacuum System?; 2.2 Electron Sources; 2.2.1 Thermionic Emission Sources; 2.2.2 Field Emission Sources
2.3 Electron Optics2.3.1 Lenses; 2.3.2 Lens Aberrations; 2.4 Signals and Detection; 2.4.1 Primary Electrons and the Interaction Volume; 2.4.2 Backscattered Electrons; 2.4.3 Secondary Electrons; 2.4.4 X-ray Radiation; 2.4.5 Cathodoluminescence; 2.5 Practical Aspects of Electron Beam Irradiation; 2.5.1 Radiation Damage; 2.5.2 Minimising Specimen Charging - Low-Voltage SEM; 2.5.3 Increasing Surface and Bulk Conductivities; 2.6 SEM in Operation; 2.6.1 Building Up an Image; 2.6.2 Magnification; 2.6.3 Signal-to-Noise Ratio; 2.6.4 Contrast; 2.6.5 Adjusting the Contrast; 2.6.6 Resolution 2.6.7 Depth of Field2.6.8 Image Capture; 3 General Principles of VP-ESEM: Utilising a Gas; 3.1 Introduction; 3.2 VP-ESEM Instrumentation; 3.2.1 Typical Features; 3.2.2 Primary Electron Scattering in VP-ESEM - the General Case; 3.2.3 Units of Pressure; 3.3 Signal Generation in a Gas; 3.3.1 Introduction; 3.3.2 Direct Collection of Electrons and Ions; 3.3.3 Collection of Photons - the Gas Luminescence Signal; 3.3.4 Detecting Indirect Electron and Ion Currents; 3.4 Imaging with Water Vapour; 3.4.1 Introduction; 3.4.2 Thermodynamic Equilibria; 3.4.3 Nonequilibrium Conditions 3.4.4 Practicalities of Stabilising Hydrated Specimens4 Imaging and Analysis in VP-ESEM: The Influence of a Gas; 4.1 Introduction; 4.2 Background to Theoretical Calculations; 4.2.1 Calculating the Mean Free Paths of Primary Electrons; 4.2.2 Calculating Pressure-Dependent Variables; 4.2.3 Estimating the 'Useful' Primary Electron Current; 4.3 Which Gas?; 4.3.1 Introduction; 4.3.2 Usefulness of the Gas - Experimental Conditions; 4.3.3 Ionisation and Excitation for Different Gases; 4.3.4 Scattering of the Primary Electron Beam in Different Gases; 4.4 Exploring the Gas Path Length 4.4.1 Introduction4.4.2 Influence of GPL on the Skirt Radius; 4.4.3 Gas Path Length and Useful Primary Electron Beam Current; 4.4.4 Constraints on Reducing the Gas Path Length; 4.4.5 Separating Gas Path Length from Working Distance; 4.5 How Much Gas?; 4.5.1 Introduction; 4.5.2 Scattering of Primary Electrons as a Function of Pressure; 4.6 X-ray Microanalysis in VP-ESEM; 4.6.1 Introduction; 4.6.2 Effects of Chamber Gas on X-ray Signals; 4.6.3 Considerations for Minimising the Effects of the Gas; 4.6.4 Post-Acquisition Methods to Correct for Scattering 5 Imaging Uncoated Specimens in the VP-ESEM |
| Record Nr. | UNINA-9910817296103321 |
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Stokes Debbie
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| Chichester, U.K., : Wiley, 2008 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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