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Electron Microscopy and Analysis, Third Edition / / Peter J. Goodhew, John Humphreys, Richard Beanland
| Electron Microscopy and Analysis, Third Edition / / Peter J. Goodhew, John Humphreys, Richard Beanland |
| Autore | Goodhew Peter J. |
| Edizione | [3rd ed.] |
| Pubbl/distr/stampa | Boca Raton, FL : , : CRC Press, , 2014 |
| Descrizione fisica | 1 online resource (262 p.) |
| Disciplina |
502.825
502/.8/25 |
| Soggetto topico | Electron microscopy |
| Soggetto genere / forma | Electronic books. |
| ISBN |
0-429-17625-2
1-4822-8934-2 1-4200-1725-X 1-282-77797-1 9786612777974 0-203-18425-4 |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
Book Cover; Title; Contents; Acronyms; Preface; Microscopy with light and electrons; Methods of image formation; Pixels; The light-optical microscope; Magnification; Resolution; Depth of field and depth of focus; Aberrations in optical systems; Electrons versus light; Questions; Electrons and their interaction with the specimen; Generating a beam of electrons; Deflection of electrons magnetic lenses; The scattering of electrons by atoms; Elastic scattering; Inelastic scattering; Secondary effects; The family of electron microscopes; Questions; Electron diffraction
The geometry of electron diffractionDiffraction spot patterns; Use of the reciprocal lattice in diffraction analysis; Other types of diffraction pattern; Questions; The transmission electron microscope; Contrast mechanisms; High voltage electron microscopy (HVEM); Scanning transmission electron microscopy (STEM); Questions; The scanning electron microscope; Obtaining a signal in the SEM; The optics of the SEM; The performance of the SEM; The ultimate resolu |
| Record Nr. | UNINA-9910449760303321 |
Goodhew Peter J.
|
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| Boca Raton, FL : , : CRC Press, , 2014 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Electron Microscopy and Analysis, Third Edition / / Peter J. Goodhew, John Humphreys, Richard Beanland
| Electron Microscopy and Analysis, Third Edition / / Peter J. Goodhew, John Humphreys, Richard Beanland |
| Autore | Goodhew Peter J. |
| Edizione | [3rd edition.] |
| Pubbl/distr/stampa | Boca Raton, FL : , : CRC Press, , 2014 |
| Descrizione fisica | 1 online resource (262 p.) |
| Disciplina |
502.825
502/.8/25 |
| Soggetto topico | Electron microscopy |
| ISBN |
0-429-17625-2
1-4822-8934-2 1-4200-1725-X 1-282-77797-1 9786612777974 0-203-18425-4 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
Book Cover; Title; Contents; Acronyms; Preface; Microscopy with light and electrons; Methods of image formation; Pixels; The light-optical microscope; Magnification; Resolution; Depth of field and depth of focus; Aberrations in optical systems; Electrons versus light; Questions; Electrons and their interaction with the specimen; Generating a beam of electrons; Deflection of electrons magnetic lenses; The scattering of electrons by atoms; Elastic scattering; Inelastic scattering; Secondary effects; The family of electron microscopes; Questions; Electron diffraction
The geometry of electron diffractionDiffraction spot patterns; Use of the reciprocal lattice in diffraction analysis; Other types of diffraction pattern; Questions; The transmission electron microscope; Contrast mechanisms; High voltage electron microscopy (HVEM); Scanning transmission electron microscopy (STEM); Questions; The scanning electron microscope; Obtaining a signal in the SEM; The optics of the SEM; The performance of the SEM; The ultimate resolu |
| Record Nr. | UNINA-9910777360903321 |
|
Goodhew Peter J.
|
||
| Boca Raton, FL : , : CRC Press, , 2014 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
High-resolution transmission electron microscopy and associated techniques / / editors, Peter R. Buseck, John M. Cowley, Leroy Eyring
| High-resolution transmission electron microscopy and associated techniques / / editors, Peter R. Buseck, John M. Cowley, Leroy Eyring |
| Pubbl/distr/stampa | New York, New York ; ; Oxford, [England] : , : Oxford University Press, , 1988 |
| Descrizione fisica | 1 online resource (668 p.) |
| Disciplina | 502/.8/25 |
| Soggetto topico | Transmission electron microscopy |
| Soggetto genere / forma | Electronic books. |
| ISBN |
1-280-52324-7
9786610523245 0-19-536465-1 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
CONTENTS; RECOMMENDED SYMBOLS, SIGN CONVENTIONS, AND ACRONYMS; CONTRIBUTORS; 1. IMAGING; 2. IMAGING THEORY; 3. ELASTIC SCATTERING OF ELECTRONS BY CRYSTALS; 4. ELASTIC-SCATTERING THEORY; 5. INELASTIC ELECTRON SCATTERING: PART I; 6. INELASTIC ELECTRON SCATTERING: PART II; 7. TECHNIQUES CLOSELY RELATED TO HIGH-RESOLUTION ELECTRON MICROSCOPY; 8. CALCULATION OF DIFFRACTION PATTERNS AND IMAGES FOR FAST ELECTRONS; 9. MINERALOGY; 10. SOLID-STATE CHEMISTRY; 11. MATERIALS SCIENCE: METALS, CERAMICS, AND SEMICONDUCTORS; 12. PRACTICAL HIGH-RESOLUTION ELECTRON MICROSCOPY; 13. SURFACES
14. HIGHLY DISORDERED MATERIALSINDEX |
| Record Nr. | UNINA-9910458542203321 |
| New York, New York ; ; Oxford, [England] : , : Oxford University Press, , 1988 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
High-resolution transmission electron microscopy and associated techniques / / editors, Peter R. Buseck, John M. Cowley, Leroy Eyring
| High-resolution transmission electron microscopy and associated techniques / / editors, Peter R. Buseck, John M. Cowley, Leroy Eyring |
| Pubbl/distr/stampa | New York, New York ; ; Oxford, [England] : , : Oxford University Press, , 1988 |
| Descrizione fisica | 1 online resource (668 p.) |
| Disciplina | 502/.8/25 |
| Soggetto topico | Transmission electron microscopy |
| ISBN |
1-280-52324-7
9786610523245 0-19-536465-1 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
CONTENTS; RECOMMENDED SYMBOLS, SIGN CONVENTIONS, AND ACRONYMS; CONTRIBUTORS; 1. IMAGING; 2. IMAGING THEORY; 3. ELASTIC SCATTERING OF ELECTRONS BY CRYSTALS; 4. ELASTIC-SCATTERING THEORY; 5. INELASTIC ELECTRON SCATTERING: PART I; 6. INELASTIC ELECTRON SCATTERING: PART II; 7. TECHNIQUES CLOSELY RELATED TO HIGH-RESOLUTION ELECTRON MICROSCOPY; 8. CALCULATION OF DIFFRACTION PATTERNS AND IMAGES FOR FAST ELECTRONS; 9. MINERALOGY; 10. SOLID-STATE CHEMISTRY; 11. MATERIALS SCIENCE: METALS, CERAMICS, AND SEMICONDUCTORS; 12. PRACTICAL HIGH-RESOLUTION ELECTRON MICROSCOPY; 13. SURFACES
14. HIGHLY DISORDERED MATERIALSINDEX |
| Record Nr. | UNINA-9910784513003321 |
| New York, New York ; ; Oxford, [England] : , : Oxford University Press, , 1988 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
High-resolution transmission electron microscopy and associated techniques / / editors, Peter R. Buseck, John M. Cowley, Leroy Eyring
| High-resolution transmission electron microscopy and associated techniques / / editors, Peter R. Buseck, John M. Cowley, Leroy Eyring |
| Pubbl/distr/stampa | New York, New York ; ; Oxford, [England] : , : Oxford University Press, , 1988 |
| Descrizione fisica | 1 online resource (668 p.) |
| Disciplina | 502/.8/25 |
| Soggetto topico | Transmission electron microscopy |
| ISBN |
1-280-52324-7
9786610523245 0-19-536465-1 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
CONTENTS; RECOMMENDED SYMBOLS, SIGN CONVENTIONS, AND ACRONYMS; CONTRIBUTORS; 1. IMAGING; 2. IMAGING THEORY; 3. ELASTIC SCATTERING OF ELECTRONS BY CRYSTALS; 4. ELASTIC-SCATTERING THEORY; 5. INELASTIC ELECTRON SCATTERING: PART I; 6. INELASTIC ELECTRON SCATTERING: PART II; 7. TECHNIQUES CLOSELY RELATED TO HIGH-RESOLUTION ELECTRON MICROSCOPY; 8. CALCULATION OF DIFFRACTION PATTERNS AND IMAGES FOR FAST ELECTRONS; 9. MINERALOGY; 10. SOLID-STATE CHEMISTRY; 11. MATERIALS SCIENCE: METALS, CERAMICS, AND SEMICONDUCTORS; 12. PRACTICAL HIGH-RESOLUTION ELECTRON MICROSCOPY; 13. SURFACES
14. HIGHLY DISORDERED MATERIALSINDEX |
| Record Nr. | UNINA-9910822480903321 |
| New York, New York ; ; Oxford, [England] : , : Oxford University Press, , 1988 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Monte Carlo modeling for electron microscopy and microanalysis [[electronic resource] /] / David C. Joy
| Monte Carlo modeling for electron microscopy and microanalysis [[electronic resource] /] / David C. Joy |
| Autore | Joy David C. <1943-> |
| Pubbl/distr/stampa | New York, : Oxford University Press, 1995 |
| Descrizione fisica | 1 online resource (225 p.) |
| Disciplina | 502/.8/25 |
| Collana | Oxford series in optical and imaging sciences |
| Soggetto topico |
Electron microscopy - Computer simulation
Electron probe microanalysis - Computer simulation Monte Carlo method |
| Soggetto genere / forma | Electronic books. |
| ISBN |
1-280-53489-3
9786610534890 0-19-535846-5 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | Contents; 1. An Introduction to Monte Carlo Methods; 2. Constructing a Simulation; 3. The Single Scattering Model; 4. The Plural Scattering Model; 5. The Practical Application of Monte Carlo Models; 6. Backscattered Electrons; 7. Charge Collection Microscopy and Cathodoluminescence; 8. Secondary Electrons and Imaging; 9. X-ray Production and Microanalysis; 10. What Next in Monte Carlo Simulations?; References; Index |
| Record Nr. | UNINA-9910451259803321 |
|
Joy David C. <1943->
|
||
| New York, : Oxford University Press, 1995 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Monte Carlo modeling for electron microscopy and microanalysis [[electronic resource] /] / David C. Joy
| Monte Carlo modeling for electron microscopy and microanalysis [[electronic resource] /] / David C. Joy |
| Autore | Joy David C. <1943-> |
| Pubbl/distr/stampa | New York, : Oxford University Press, 1995 |
| Descrizione fisica | 1 online resource (225 p.) |
| Disciplina | 502/.8/25 |
| Collana | Oxford series in optical and imaging sciences |
| Soggetto topico |
Electron microscopy - Computer simulation
Electron probe microanalysis - Computer simulation Monte Carlo method |
| ISBN |
0-19-773242-9
1-280-53489-3 9786610534890 0-19-535846-5 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | Contents; 1. An Introduction to Monte Carlo Methods; 2. Constructing a Simulation; 3. The Single Scattering Model; 4. The Plural Scattering Model; 5. The Practical Application of Monte Carlo Models; 6. Backscattered Electrons; 7. Charge Collection Microscopy and Cathodoluminescence; 8. Secondary Electrons and Imaging; 9. X-ray Production and Microanalysis; 10. What Next in Monte Carlo Simulations?; References; Index |
| Record Nr. | UNINA-9910784733103321 |
|
Joy David C. <1943->
|
||
| New York, : Oxford University Press, 1995 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Monte Carlo modeling for electron microscopy and microanalysis / / David C. Joy
| Monte Carlo modeling for electron microscopy and microanalysis / / David C. Joy |
| Autore | Joy David C. <1943-> |
| Edizione | [1st ed.] |
| Pubbl/distr/stampa | New York, : Oxford University Press, 1995 |
| Descrizione fisica | 1 online resource (225 p.) |
| Disciplina | 502/.8/25 |
| Collana | Oxford series in optical and imaging sciences |
| Soggetto topico |
Electron microscopy - Computer simulation
Electron probe microanalysis - Computer simulation Monte Carlo method |
| ISBN |
0-19-773242-9
1-280-53489-3 9786610534890 0-19-535846-5 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | Contents; 1. An Introduction to Monte Carlo Methods; 2. Constructing a Simulation; 3. The Single Scattering Model; 4. The Plural Scattering Model; 5. The Practical Application of Monte Carlo Models; 6. Backscattered Electrons; 7. Charge Collection Microscopy and Cathodoluminescence; 8. Secondary Electrons and Imaging; 9. X-ray Production and Microanalysis; 10. What Next in Monte Carlo Simulations?; References; Index |
| Record Nr. | UNINA-9910808190203321 |
|
Joy David C. <1943->
|
||
| New York, : Oxford University Press, 1995 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
The operation of the transmission electron microscope / Dawn Chescoe and Peter J. Goodhew
| The operation of the transmission electron microscope / Dawn Chescoe and Peter J. Goodhew |
| Autore | Chescoe, Dawn |
| Pubbl/distr/stampa | Oxford, OX ; New York : Oxford University Press |
| Descrizione fisica | iv, 51 p. : ill. ; 24 cm |
| Disciplina | 502/.8/25 |
| Altri autori (Persone) | Goodhew, Peter J. |
| Collana |
Microscopy handbooks ; 02
Oxford science publications |
| Soggetto topico | Transmission electron microscopes |
| ISBN | 0198564023 (pbk.) |
| Classificazione |
LC QH212.T7
621.3.3 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISALENTO-991003481229707536 |
|
Chescoe, Dawn
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| Oxford, OX ; New York : Oxford University Press | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. del Salento | ||
| ||
Scanning electron microscopy and X-ray microanalysis : a text for biologists, materials scientists, and geologists / Joseph I. Goldstein...[et al.]
| Scanning electron microscopy and X-ray microanalysis : a text for biologists, materials scientists, and geologists / Joseph I. Goldstein...[et al.] |
| Pubbl/distr/stampa | New York ; London : Plenum Press, c1981 |
| Descrizione fisica | xiii, 673 p. : ill. ; 24 cm |
| Disciplina | 502/.8/25 |
| Altri autori (Persone) | Goldstein, Joseph |
| Soggetto topico |
Scanning electron microscope
X-ray microanalysis |
| ISBN | 030640768X |
| Classificazione |
53.0.692
LC QH212.S3 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISALENTO-991001224919707536 |
| New York ; London : Plenum Press, c1981 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. del Salento | ||
| ||