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Elektrochemische Herstellung und Charakterisierung von Nanostrukturen - Entwicklung ultrascharfer STM-Spitzen als Nanoelektroden / / Philipp Hugelmann
| Elektrochemische Herstellung und Charakterisierung von Nanostrukturen - Entwicklung ultrascharfer STM-Spitzen als Nanoelektroden / / Philipp Hugelmann |
| Autore | Hugelmann Philipp |
| Pubbl/distr/stampa | [Place of publication not identified] : , : KIT Scientific Publishing, , 2005 |
| Descrizione fisica | 1 online resource (190 pages) |
| Disciplina | 502/.8/2 |
| Soggetto topico |
Scanning tunneling microscopy
Scanning probe microscopy |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | ger |
| Record Nr. | UNINA-9910688209503321 |
Hugelmann Philipp
|
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| [Place of publication not identified] : , : KIT Scientific Publishing, , 2005 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Introduction to scanning tunneling microscopy [[electronic resource] /] / C. Julian Chen
| Introduction to scanning tunneling microscopy [[electronic resource] /] / C. Julian Chen |
| Autore | Chen C. Julian |
| Pubbl/distr/stampa | New York, : Oxford University Press, 1993 |
| Descrizione fisica | 1 online resource (469 p.) |
| Disciplina | 502/.8/2 |
| Collana | Oxford series in optical and imaging sciences |
| Soggetto topico |
Scanning tunneling microscopy
Microscopy |
| Soggetto genere / forma | Electronic books. |
| ISBN |
0-19-802356-1
1-4237-6461-7 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | Contents; List of Figures; Gallery of STM Images; 1 Overview; PART I: IMAGING MECHANISM; PART II : INSTRUMENTATION; Appendix A: Real wavefunctions; Appendix B: Green's functions; Appendix C: Spherical modified Bessel functions; Appendix D: Two-dimensional Fourier series; Appendix E: Plane groups and invariant functions; Appendix F: Elementary elasticity theory; Appendix G: A short table of Laplace transforms; Appendix H: Operational amplifiers; References; Index |
| Record Nr. | UNINA-9910452148103321 |
|
Chen C. Julian
|
||
| New York, : Oxford University Press, 1993 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Introduction to scanning tunneling microscopy [[electronic resource] /] / C. Julian Chen
| Introduction to scanning tunneling microscopy [[electronic resource] /] / C. Julian Chen |
| Autore | Chen C. Julian |
| Pubbl/distr/stampa | New York, : Oxford University Press, 1993 |
| Descrizione fisica | 1 online resource (469 p.) |
| Disciplina | 502/.8/2 |
| Collana | Oxford series in optical and imaging sciences |
| Soggetto topico |
Scanning tunneling microscopy
Microscopy |
| ISBN |
0-19-773239-9
0-19-802356-1 1-4237-6461-7 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | Contents; List of Figures; Gallery of STM Images; 1 Overview; PART I: IMAGING MECHANISM; PART II : INSTRUMENTATION; Appendix A: Real wavefunctions; Appendix B: Green's functions; Appendix C: Spherical modified Bessel functions; Appendix D: Two-dimensional Fourier series; Appendix E: Plane groups and invariant functions; Appendix F: Elementary elasticity theory; Appendix G: A short table of Laplace transforms; Appendix H: Operational amplifiers; References; Index |
| Record Nr. | UNINA-9910777534003321 |
|
Chen C. Julian
|
||
| New York, : Oxford University Press, 1993 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Introduction to scanning tunneling microscopy / / C. Julian Chen
| Introduction to scanning tunneling microscopy / / C. Julian Chen |
| Autore | Chen C. Julian |
| Edizione | [1st ed.] |
| Pubbl/distr/stampa | New York, : Oxford University Press, 1993 |
| Descrizione fisica | 1 online resource (469 p.) |
| Disciplina | 502/.8/2 |
| Collana | Oxford series in optical and imaging sciences |
| Soggetto topico |
Scanning tunneling microscopy
Microscopy |
| ISBN |
0-19-773239-9
0-19-802356-1 1-4237-6461-7 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | Contents; List of Figures; Gallery of STM Images; 1 Overview; PART I: IMAGING MECHANISM; PART II : INSTRUMENTATION; Appendix A: Real wavefunctions; Appendix B: Green's functions; Appendix C: Spherical modified Bessel functions; Appendix D: Two-dimensional Fourier series; Appendix E: Plane groups and invariant functions; Appendix F: Elementary elasticity theory; Appendix G: A short table of Laplace transforms; Appendix H: Operational amplifiers; References; Index |
| Record Nr. | UNINA-9910809771503321 |
|
Chen C. Julian
|
||
| New York, : Oxford University Press, 1993 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Methods II [[electronic resource] /] / edited by S. Amelinckx ... [et al.]
| Methods II [[electronic resource] /] / edited by S. Amelinckx ... [et al.] |
| Pubbl/distr/stampa | Weinheim, : VCH, 1997 |
| Descrizione fisica | 1 online resource (509 p.) |
| Disciplina |
502.82
502/.8/2 |
| Altri autori (Persone) | AmelinckxS |
| Collana | Handbook of microscopy : applications in materials science, solid-state physics, and chemistry |
| Soggetto topico |
Microscopy
Materials - Microscopy |
| Soggetto genere / forma | Electronic books. |
| ISBN |
1-281-76465-5
9786611764654 3-527-62052-4 3-527-62053-2 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
Handbook of Microscopy, Applications in Materials Science , Solid-state Physics and Chemistry; Contents; IV Electron Microscopy; 2 Scanning Beam Methods; 2.1 Scanning Reflection Electron Microscopy; 2.1.1 Introduction; 2.1.2 Instrumentation; 2.1.3 Performance; 2.1.4 Modes of Operation; 2.1.4.1 Secondary Electron Imaging; 2.1.4.2 Backscattered Electrons; 2.1.4.3 Special Techniques; 2.1.5 Conclusions; 2.1.6 References; 2.2 Scanning Transmission Electron Microscopy; 2.2.1 Introduction; 2.2.2 Scanning Transmission Electron Microscopy Imaging Modes
2.2.3 Scanning Transmission Electron Microscopy Theory2.2.4 Inelastic Scattering and Secondary Radiations; 2.2.5 Convergent-Beam and Nanodiffraction; 2.2.6 Coherent Nanodiffraction, Electron Holography, Ptychology; 2.2.7 Holography; 2.2.8 STEM Instrumentation; 2.2.9 Applications of Scanning Transmission Electron Microscopy; 2.2.10 References; 2.3 Scanning Transmission Electron Microscopy: Z Contrast; 2.3.1 Introduction; 2.3.2 Incoherent Imaging with Elastically Scattered Electrons; 2.3.3 Incoherent Imaging with Thermally Scattered Electrons 2.3.4 Incoherent Imaging using Inelastically Scattered Electrons2.3.5 Probe Channeling; 2.3.6 Applications to Materials Research; 2.3.6.1 Semiconductors; 2.3.6.2 Ceramics; 2.3.6.3 Nanocrystalline Materials; 2.3.7 References; 2.4 Scanning Auger Microscopy (SAM) and Imaging X-Ray Photoelectron Microscopy (XPS); 2.4.1 Introduction; 2.4.2 Basic Principles of Auger Electron Spectroscopy (AES) and X-Ray Photoelectron Spectroscopy (XPS); 2.4.2.1 Auger Electron Spectroscopy (AES); 2.4.2.2 X-Ray Photoelectron Spectroscopy (XPS); 2.4.2.3 Quantitative Analysis in AES and XPS 2.4.3 Scanning Auger Microscopy (SAM) and Imaging XPS2.4.3.1 Basic Principles of Imaging; 2.4.3.2 General Aspects of Analyzers; 2.4.3.3 Energy Resolution of Deflecting Electrostatic Analyzers; 2.4.3.4 Cylindrical Mirror Analyzer (CMA) versus the Concentric Hemispherical Analyzer (CHA); 2.4.3.5 Imaging Techniques; 2.4.3.6 Magnetic Fields in Imaging XPS; 2.4.4 Characteristics of Scanning Auger Microscopy Images; 2.4.4.1 General Aspects; 2.4.4.2 Background Slope Effects; 2.4.4.3 Substrate Backscattering Effects; 2.4.4.4 Topographic Effects; 2.4.4.5 Beam Current Fluctuation Effects 2.4.4.6 Edge Effects2.4.5 Conclusion; 2.4.6 References; 2.5 Scanning Microanalysis; 2.5.1 Physical Basis of Electron Probe Microanalysis; 2.5.1.1 Electron Interactions with Solids; 2.5.1.2 X-Ray Emission Spectra; 2.5.1.3 Characteristic X-Ray Spectra; 2.5.1.4 Soft X-Ray Spectra; 2.5.1.5 X-Ray Continuum; 2.5.1.6 Overview of Methods of Scanning Electron Beam Analysis; 2.5.1.7 Electron Probe X-Ray Microanalyzers; 2.5.1.8 Analytical Electron Microscopes; 2.5.1.9 Multipurpose Electron Probe Analytical Systems; 2.5.1.10 X-Ray Emission Spectrometry; 2.5.1.11 Wavelength-Dispersive Spectrometry 2.5.1.12 Energy-Dispersive Spectrometry |
| Record Nr. | UNINA-9910143988403321 |
| Weinheim, : VCH, 1997 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Methods II [[electronic resource] /] / edited by S. Amelinckx ... [et al.]
| Methods II [[electronic resource] /] / edited by S. Amelinckx ... [et al.] |
| Pubbl/distr/stampa | Weinheim, : VCH, 1997 |
| Descrizione fisica | 1 online resource (509 p.) |
| Disciplina |
502.82
502/.8/2 |
| Altri autori (Persone) | AmelinckxS |
| Collana | Handbook of microscopy : applications in materials science, solid-state physics, and chemistry |
| Soggetto topico |
Microscopy
Materials - Microscopy |
| ISBN |
1-281-76465-5
9786611764654 3-527-62052-4 3-527-62053-2 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
Handbook of Microscopy, Applications in Materials Science , Solid-state Physics and Chemistry; Contents; IV Electron Microscopy; 2 Scanning Beam Methods; 2.1 Scanning Reflection Electron Microscopy; 2.1.1 Introduction; 2.1.2 Instrumentation; 2.1.3 Performance; 2.1.4 Modes of Operation; 2.1.4.1 Secondary Electron Imaging; 2.1.4.2 Backscattered Electrons; 2.1.4.3 Special Techniques; 2.1.5 Conclusions; 2.1.6 References; 2.2 Scanning Transmission Electron Microscopy; 2.2.1 Introduction; 2.2.2 Scanning Transmission Electron Microscopy Imaging Modes
2.2.3 Scanning Transmission Electron Microscopy Theory2.2.4 Inelastic Scattering and Secondary Radiations; 2.2.5 Convergent-Beam and Nanodiffraction; 2.2.6 Coherent Nanodiffraction, Electron Holography, Ptychology; 2.2.7 Holography; 2.2.8 STEM Instrumentation; 2.2.9 Applications of Scanning Transmission Electron Microscopy; 2.2.10 References; 2.3 Scanning Transmission Electron Microscopy: Z Contrast; 2.3.1 Introduction; 2.3.2 Incoherent Imaging with Elastically Scattered Electrons; 2.3.3 Incoherent Imaging with Thermally Scattered Electrons 2.3.4 Incoherent Imaging using Inelastically Scattered Electrons2.3.5 Probe Channeling; 2.3.6 Applications to Materials Research; 2.3.6.1 Semiconductors; 2.3.6.2 Ceramics; 2.3.6.3 Nanocrystalline Materials; 2.3.7 References; 2.4 Scanning Auger Microscopy (SAM) and Imaging X-Ray Photoelectron Microscopy (XPS); 2.4.1 Introduction; 2.4.2 Basic Principles of Auger Electron Spectroscopy (AES) and X-Ray Photoelectron Spectroscopy (XPS); 2.4.2.1 Auger Electron Spectroscopy (AES); 2.4.2.2 X-Ray Photoelectron Spectroscopy (XPS); 2.4.2.3 Quantitative Analysis in AES and XPS 2.4.3 Scanning Auger Microscopy (SAM) and Imaging XPS2.4.3.1 Basic Principles of Imaging; 2.4.3.2 General Aspects of Analyzers; 2.4.3.3 Energy Resolution of Deflecting Electrostatic Analyzers; 2.4.3.4 Cylindrical Mirror Analyzer (CMA) versus the Concentric Hemispherical Analyzer (CHA); 2.4.3.5 Imaging Techniques; 2.4.3.6 Magnetic Fields in Imaging XPS; 2.4.4 Characteristics of Scanning Auger Microscopy Images; 2.4.4.1 General Aspects; 2.4.4.2 Background Slope Effects; 2.4.4.3 Substrate Backscattering Effects; 2.4.4.4 Topographic Effects; 2.4.4.5 Beam Current Fluctuation Effects 2.4.4.6 Edge Effects2.4.5 Conclusion; 2.4.6 References; 2.5 Scanning Microanalysis; 2.5.1 Physical Basis of Electron Probe Microanalysis; 2.5.1.1 Electron Interactions with Solids; 2.5.1.2 X-Ray Emission Spectra; 2.5.1.3 Characteristic X-Ray Spectra; 2.5.1.4 Soft X-Ray Spectra; 2.5.1.5 X-Ray Continuum; 2.5.1.6 Overview of Methods of Scanning Electron Beam Analysis; 2.5.1.7 Electron Probe X-Ray Microanalyzers; 2.5.1.8 Analytical Electron Microscopes; 2.5.1.9 Multipurpose Electron Probe Analytical Systems; 2.5.1.10 X-Ray Emission Spectrometry; 2.5.1.11 Wavelength-Dispersive Spectrometry 2.5.1.12 Energy-Dispersive Spectrometry |
| Record Nr. | UNISA-996218389603316 |
| Weinheim, : VCH, 1997 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
Methods II [[electronic resource] /] / edited by S. Amelinckx ... [et al.]
| Methods II [[electronic resource] /] / edited by S. Amelinckx ... [et al.] |
| Pubbl/distr/stampa | Weinheim, : VCH, 1997 |
| Descrizione fisica | 1 online resource (509 p.) |
| Disciplina |
502.82
502/.8/2 |
| Altri autori (Persone) | AmelinckxS |
| Collana | Handbook of microscopy : applications in materials science, solid-state physics, and chemistry |
| Soggetto topico |
Microscopy
Materials - Microscopy |
| ISBN |
1-281-76465-5
9786611764654 3-527-62052-4 3-527-62053-2 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
Handbook of Microscopy, Applications in Materials Science , Solid-state Physics and Chemistry; Contents; IV Electron Microscopy; 2 Scanning Beam Methods; 2.1 Scanning Reflection Electron Microscopy; 2.1.1 Introduction; 2.1.2 Instrumentation; 2.1.3 Performance; 2.1.4 Modes of Operation; 2.1.4.1 Secondary Electron Imaging; 2.1.4.2 Backscattered Electrons; 2.1.4.3 Special Techniques; 2.1.5 Conclusions; 2.1.6 References; 2.2 Scanning Transmission Electron Microscopy; 2.2.1 Introduction; 2.2.2 Scanning Transmission Electron Microscopy Imaging Modes
2.2.3 Scanning Transmission Electron Microscopy Theory2.2.4 Inelastic Scattering and Secondary Radiations; 2.2.5 Convergent-Beam and Nanodiffraction; 2.2.6 Coherent Nanodiffraction, Electron Holography, Ptychology; 2.2.7 Holography; 2.2.8 STEM Instrumentation; 2.2.9 Applications of Scanning Transmission Electron Microscopy; 2.2.10 References; 2.3 Scanning Transmission Electron Microscopy: Z Contrast; 2.3.1 Introduction; 2.3.2 Incoherent Imaging with Elastically Scattered Electrons; 2.3.3 Incoherent Imaging with Thermally Scattered Electrons 2.3.4 Incoherent Imaging using Inelastically Scattered Electrons2.3.5 Probe Channeling; 2.3.6 Applications to Materials Research; 2.3.6.1 Semiconductors; 2.3.6.2 Ceramics; 2.3.6.3 Nanocrystalline Materials; 2.3.7 References; 2.4 Scanning Auger Microscopy (SAM) and Imaging X-Ray Photoelectron Microscopy (XPS); 2.4.1 Introduction; 2.4.2 Basic Principles of Auger Electron Spectroscopy (AES) and X-Ray Photoelectron Spectroscopy (XPS); 2.4.2.1 Auger Electron Spectroscopy (AES); 2.4.2.2 X-Ray Photoelectron Spectroscopy (XPS); 2.4.2.3 Quantitative Analysis in AES and XPS 2.4.3 Scanning Auger Microscopy (SAM) and Imaging XPS2.4.3.1 Basic Principles of Imaging; 2.4.3.2 General Aspects of Analyzers; 2.4.3.3 Energy Resolution of Deflecting Electrostatic Analyzers; 2.4.3.4 Cylindrical Mirror Analyzer (CMA) versus the Concentric Hemispherical Analyzer (CHA); 2.4.3.5 Imaging Techniques; 2.4.3.6 Magnetic Fields in Imaging XPS; 2.4.4 Characteristics of Scanning Auger Microscopy Images; 2.4.4.1 General Aspects; 2.4.4.2 Background Slope Effects; 2.4.4.3 Substrate Backscattering Effects; 2.4.4.4 Topographic Effects; 2.4.4.5 Beam Current Fluctuation Effects 2.4.4.6 Edge Effects2.4.5 Conclusion; 2.4.6 References; 2.5 Scanning Microanalysis; 2.5.1 Physical Basis of Electron Probe Microanalysis; 2.5.1.1 Electron Interactions with Solids; 2.5.1.2 X-Ray Emission Spectra; 2.5.1.3 Characteristic X-Ray Spectra; 2.5.1.4 Soft X-Ray Spectra; 2.5.1.5 X-Ray Continuum; 2.5.1.6 Overview of Methods of Scanning Electron Beam Analysis; 2.5.1.7 Electron Probe X-Ray Microanalyzers; 2.5.1.8 Analytical Electron Microscopes; 2.5.1.9 Multipurpose Electron Probe Analytical Systems; 2.5.1.10 X-Ray Emission Spectrometry; 2.5.1.11 Wavelength-Dispersive Spectrometry 2.5.1.12 Energy-Dispersive Spectrometry |
| Record Nr. | UNINA-9910830565703321 |
| Weinheim, : VCH, 1997 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Methods II / / edited by S. Amelinckx ... [et al.]
| Methods II / / edited by S. Amelinckx ... [et al.] |
| Pubbl/distr/stampa | Weinheim, : VCH, 1997 |
| Descrizione fisica | 1 online resource (509 p.) |
| Disciplina |
502.82
502/.8/2 |
| Altri autori (Persone) | AmelinckxS |
| Collana | Handbook of microscopy : applications in materials science, solid-state physics, and chemistry |
| Soggetto topico |
Microscopy
Materials - Microscopy |
| ISBN |
1-281-76465-5
9786611764654 3-527-62052-4 3-527-62053-2 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
Handbook of Microscopy, Applications in Materials Science , Solid-state Physics and Chemistry; Contents; IV Electron Microscopy; 2 Scanning Beam Methods; 2.1 Scanning Reflection Electron Microscopy; 2.1.1 Introduction; 2.1.2 Instrumentation; 2.1.3 Performance; 2.1.4 Modes of Operation; 2.1.4.1 Secondary Electron Imaging; 2.1.4.2 Backscattered Electrons; 2.1.4.3 Special Techniques; 2.1.5 Conclusions; 2.1.6 References; 2.2 Scanning Transmission Electron Microscopy; 2.2.1 Introduction; 2.2.2 Scanning Transmission Electron Microscopy Imaging Modes
2.2.3 Scanning Transmission Electron Microscopy Theory2.2.4 Inelastic Scattering and Secondary Radiations; 2.2.5 Convergent-Beam and Nanodiffraction; 2.2.6 Coherent Nanodiffraction, Electron Holography, Ptychology; 2.2.7 Holography; 2.2.8 STEM Instrumentation; 2.2.9 Applications of Scanning Transmission Electron Microscopy; 2.2.10 References; 2.3 Scanning Transmission Electron Microscopy: Z Contrast; 2.3.1 Introduction; 2.3.2 Incoherent Imaging with Elastically Scattered Electrons; 2.3.3 Incoherent Imaging with Thermally Scattered Electrons 2.3.4 Incoherent Imaging using Inelastically Scattered Electrons2.3.5 Probe Channeling; 2.3.6 Applications to Materials Research; 2.3.6.1 Semiconductors; 2.3.6.2 Ceramics; 2.3.6.3 Nanocrystalline Materials; 2.3.7 References; 2.4 Scanning Auger Microscopy (SAM) and Imaging X-Ray Photoelectron Microscopy (XPS); 2.4.1 Introduction; 2.4.2 Basic Principles of Auger Electron Spectroscopy (AES) and X-Ray Photoelectron Spectroscopy (XPS); 2.4.2.1 Auger Electron Spectroscopy (AES); 2.4.2.2 X-Ray Photoelectron Spectroscopy (XPS); 2.4.2.3 Quantitative Analysis in AES and XPS 2.4.3 Scanning Auger Microscopy (SAM) and Imaging XPS2.4.3.1 Basic Principles of Imaging; 2.4.3.2 General Aspects of Analyzers; 2.4.3.3 Energy Resolution of Deflecting Electrostatic Analyzers; 2.4.3.4 Cylindrical Mirror Analyzer (CMA) versus the Concentric Hemispherical Analyzer (CHA); 2.4.3.5 Imaging Techniques; 2.4.3.6 Magnetic Fields in Imaging XPS; 2.4.4 Characteristics of Scanning Auger Microscopy Images; 2.4.4.1 General Aspects; 2.4.4.2 Background Slope Effects; 2.4.4.3 Substrate Backscattering Effects; 2.4.4.4 Topographic Effects; 2.4.4.5 Beam Current Fluctuation Effects 2.4.4.6 Edge Effects2.4.5 Conclusion; 2.4.6 References; 2.5 Scanning Microanalysis; 2.5.1 Physical Basis of Electron Probe Microanalysis; 2.5.1.1 Electron Interactions with Solids; 2.5.1.2 X-Ray Emission Spectra; 2.5.1.3 Characteristic X-Ray Spectra; 2.5.1.4 Soft X-Ray Spectra; 2.5.1.5 X-Ray Continuum; 2.5.1.6 Overview of Methods of Scanning Electron Beam Analysis; 2.5.1.7 Electron Probe X-Ray Microanalyzers; 2.5.1.8 Analytical Electron Microscopes; 2.5.1.9 Multipurpose Electron Probe Analytical Systems; 2.5.1.10 X-Ray Emission Spectrometry; 2.5.1.11 Wavelength-Dispersive Spectrometry 2.5.1.12 Energy-Dispersive Spectrometry |
| Altri titoli varianti |
Methods 2
Methods two |
| Record Nr. | UNINA-9910877211603321 |
| Weinheim, : VCH, 1997 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||