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Coordinate Metrology : Accuracy of Systems and Measurements / / by Jerzy A. Sładek
| Coordinate Metrology : Accuracy of Systems and Measurements / / by Jerzy A. Sładek |
| Autore | Sładek Jerzy A |
| Edizione | [1st ed. 2016.] |
| Pubbl/distr/stampa | Berlin, Heidelberg : , : Springer Berlin Heidelberg : , : Imprint : Springer, , 2016 |
| Descrizione fisica | 1 online resource (472 p.) |
| Disciplina | 389.1015195 |
| Collana | Springer Tracts in Mechanical Engineering |
| Soggetto topico |
Manufactures
Measurement Measuring instruments Computational intelligence Machines, Tools, Processes Measurement Science and Instrumentation Computational Intelligence |
| ISBN | 3-662-48465-X |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
Contents; 1 Introduction; Abstract; References; 2 Measurement Uncertainty and Requirements of Production System. Selected Issues of Measurement Uncertainty Theory; Abstract; 2.1 Coordinate Measurement During Production Process; 2.2 Measurement Uncertainty; 2.3 Vector Concept of Describing Coordinate Measurement Accuracy: Measuring Point Reproducibility Error; 2.4 Coordinate Measurement Uncertainty and Regulatory Requirements; References; 3 Classic (Nonsimulative) Methods of Measurement Accuracy Assessment; Abstract; 3.1 Method Using the Calibrated Object or the Standard
3.2 Noncalibrated Object Method (Multiposition Method)3.2.1 Measurement of an Object Characteristic; 3.2.2 Measurements of Length Standards; 3.2.3 Measurement of Diameter Standards; 3.2.4 Calculation of the Value of Measured Object Characteristic; 3.2.5 Calculation of Measurement Uncertainty; 3.2.6 Calculation of the Uncertainty Component urep; 3.2.7 Calculation of Uncertainty Component ugeo; 3.2.8 Calculation of Uncertainty Component ucorrL; 3.2.9 Calculation of Uncertainty Component of Length Change Derived from Thermal Influences 3.3 Monte Carlo Method for Uncertainty Determination in Multiposition and Substitution Method3.4 Determination of Uncertainty of Freeform Profile Measurement; 3.5 Measurement Uncertainty Estimation for Calibrations Based on Error Source Identification: Error Budget; 3.5.1 Uncertainty Budget for the Calibration Procedure of the Plate Standard (Hole Plate) Calibrated on PMM12106 Leitz Machine; 3.5.2 Thermodynamic Model; 3.5.3 Description of the Hole Plate Calibration Procedure; 3.6 Methods Based on Relations Resulting from the Model of Maximum Permissible Errors of Coordinate Measuring System 3.7 Analytical Method of Measurement Uncertainty Determination3.7.1 Geometric Error Model; 3.7.2 Measurement Models; 3.7.3 Measurement Uncertainty as a Complex Uncertainty; 3.7.4 Estimation of Maximum Value for the Geometric Error Difference; 3.7.5 Software; 3.7.6 Particular Stages in the Operating Software; References; 4 Analysis of the Accuracy of Coordinate Measuring Systems; Abstract; 4.1 Sources and Causes of Coordinate Measuring Machine Errors; 4.2 Identification and Software Correction of Measuring Machine Errors 4.2.1 Determination of Geometric Errors of the Measuring Machine Using the Laser Interferometer4.2.2 PTB Method Using Plate Standard for Geometric Errors of Coordinate Measuring Machine Identification; 4.2.3 Identification of Geometric Errors Using Laser Tracker Systems and Multilateration Method; 4.3 Error Sources of Point Coordinates Contact Acquisition System---Probe Head Error Function; 4.3.1 Analysis of Error Sources and Causes: Probe Head Error Function (PEF); 4.3.2 Contact Probe Head Error Tests; 4.4 Matrix Method (MM) of CMM Accuracy Identification; 4.4.1 Idea of the MM Method 4.4.2 Connection of MM Method with Reproducibility Error of Measuring Point (REMP) |
| Record Nr. | UNINA-9910254201503321 |
Sładek Jerzy A
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| Berlin, Heidelberg : , : Springer Berlin Heidelberg : , : Imprint : Springer, , 2016 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Introduction to Quantum Metrology : The Revised SI System and Quantum Standards / / by Waldemar Nawrocki
| Introduction to Quantum Metrology : The Revised SI System and Quantum Standards / / by Waldemar Nawrocki |
| Autore | Nawrocki Waldemar |
| Edizione | [2nd ed. 2019.] |
| Pubbl/distr/stampa | Cham : , : Springer International Publishing : , : Imprint : Springer, , 2019 |
| Descrizione fisica | 1 online resource (334 pages) |
| Disciplina |
389.1015195
530.8 |
| Soggetto topico |
Physical measurements
Measurement Electronics Microelectronics Nanoscale science Nanoscience Nanostructures Nanotechnology Measurement Science and Instrumentation Electronics and Microelectronics, Instrumentation Nanoscale Science and Technology Nanotechnology and Microengineering |
| ISBN | 3-030-19677-1 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | Preface -- Theoretical Background of Quantum Metrology -- Measurements, Standards and Systems of Units -- The Revised SI System of Units -- Quantum Voltage Standards -- SQUID Detectors of Magnetic Flux -- Quantum Hall Effect and the Resistance Standard -- Quantization of Electrical Conductance and Thermal Conductance in Nanostructures -- Single Electron Tunneling -- Atomic Clocks and Time Scales -- Standards and Measurements of Length -- Satellite Navigation Systems -- Scanning Probe Microscopes -- New Standards of Mass. |
| Record Nr. | UNINA-9910337880603321 |
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Nawrocki Waldemar
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| Cham : , : Springer International Publishing : , : Imprint : Springer, , 2019 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Mass Metrology : The Newly Defined Kilogram / / by S. V. Gupta
| Mass Metrology : The Newly Defined Kilogram / / by S. V. Gupta |
| Autore | Gupta S. V |
| Edizione | [2nd ed. 2019.] |
| Pubbl/distr/stampa | Cham : , : Springer International Publishing : , : Imprint : Springer, , 2019 |
| Descrizione fisica | 1 online resource (471 pages) |
| Disciplina | 389.1015195 |
| Collana | Springer Series in Materials Science |
| Soggetto topico |
Physical measurements
Measurement Materials science Mechanics Mechanics, Applied Measurement Science and Instrumentation Characterization and Evaluation of Materials Theoretical and Applied Mechanics |
| ISBN | 3-030-12465-7 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | Units of Mass and Standards of Mass -- Two-Pan Equal-Arm Balances -- Single-Pan Mechanical Balances -- Electronic Balances and Effect of Gravity -- Strain Gauge Load Cells -- Various Types of Transducers for Weighing -- Testing of Electronic Balances -- Air Density and Buoyancy Correction -- Weight Standards of Mass -- Group Weighing Method -- Nanotechnology for Detection of Small Mass Difference -- Redefining the Unit of Mass. |
| Record Nr. | UNINA-9910337872603321 |
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Gupta S. V
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| Cham : , : Springer International Publishing : , : Imprint : Springer, , 2019 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Measurement and monitoring / / Vytautis Giniotis and Anthony Hope
| Measurement and monitoring / / Vytautis Giniotis and Anthony Hope |
| Autore | Giniotis Vytautas |
| Pubbl/distr/stampa | New York : , : Momentum Press, LLC, , [2014] |
| Descrizione fisica | 1 online resource (210 p.) |
| Disciplina | 389.1015195 |
| Collana | Automation and control collection |
| Soggetto topico |
Metrology
Electric machinery - Monitoring |
| Soggetto genere / forma | Electronic books. |
| ISBN |
1-78684-359-5
1-60650-381-2 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
1. Monitoring of processes, systems, and equipment -- 1.1 Introduction -- 1.2 Parameters for system monitoring -- 1.3 Random and regular modes of monitoring -- 1.4 Principles of performance of information measuring systems --
2. Testing of geometrical accuracy parameters of machines -- 2.1 Geometrical accuracy parameters of machines and instruments -- 2.2 Accuracy control of geometrical parameters -- 2.2.1 Length (positioning) measurement -- 2.2.2 Inversion method in measurements -- 2.3 Testing of accuracy parameters of the rotary table -- 3. Measurement and monitoring of the accuracy of scales and encoders -- 3.1 Standards of measurement of length and angle -- 3.2 Measurement of circular scales -- 3.3 Applying new methods for measuring circular scales -- 3.4 Measurement of linear scales and transducers -- 3.5 Comparators for linear measurements -- 3.6 Comparators for angle measurements -- 3.7 Calibration of geodetic instruments -- 3.7.1 Methods and means for vertical angle calibration -- 4. Control of nano-displacement and position -- 4.1 Accuracy control of the position and displacement of machine parts -- 4.1.1 The elements of position and displacement -- 4.2 Measurement of nanometric parameters -- 4.3 Linear and circular piezoelectric actuators for the nanometric displacement -- 5. Testing and calibration of coordinate measuring machines -- 5.1 Introduction to principles of operation and application of CMMs -- 5.2 Principles of MHs and touch trigger probes -- 5.3 Performance verification of MHs and touch trigger probes -- 5.4 Complex accuracy verification of CMMs -- 5.5 Performance verification using artifacts -- 5.6 Performance verification using lasers -- 5.7 Methods and means for accuracy improvement of machines -- 5.7.1 Piezomechanical correction -- 6. Future trends in machine monitoring and performance verification of coordinate measuring machines -- 6.1 Introduction -- 6.2 The determination of physical surface coordinates using a CCD camera -- 6.3 Volumetric detection of position -- 6.4 A proposed telemetric CMM -- References -- Bibliography -- Index. |
| Record Nr. | UNINA-9910464314003321 |
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Giniotis Vytautas
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| New York : , : Momentum Press, LLC, , [2014] | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Measurement and monitoring / / Vytautis Giniotis and Anthony Hope
| Measurement and monitoring / / Vytautis Giniotis and Anthony Hope |
| Autore | Giniotis Vytautas |
| Pubbl/distr/stampa | New York : , : Momentum Press, LLC, , [2014] |
| Descrizione fisica | 1 online resource (210 p.) |
| Disciplina | 389.1015195 |
| Collana | Automation and control collection |
| Soggetto topico |
Metrology
Electric machinery - Monitoring |
| ISBN |
1-78684-359-5
1-60650-381-2 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
1. Monitoring of processes, systems, and equipment -- 1.1 Introduction -- 1.2 Parameters for system monitoring -- 1.3 Random and regular modes of monitoring -- 1.4 Principles of performance of information measuring systems --
2. Testing of geometrical accuracy parameters of machines -- 2.1 Geometrical accuracy parameters of machines and instruments -- 2.2 Accuracy control of geometrical parameters -- 2.2.1 Length (positioning) measurement -- 2.2.2 Inversion method in measurements -- 2.3 Testing of accuracy parameters of the rotary table -- 3. Measurement and monitoring of the accuracy of scales and encoders -- 3.1 Standards of measurement of length and angle -- 3.2 Measurement of circular scales -- 3.3 Applying new methods for measuring circular scales -- 3.4 Measurement of linear scales and transducers -- 3.5 Comparators for linear measurements -- 3.6 Comparators for angle measurements -- 3.7 Calibration of geodetic instruments -- 3.7.1 Methods and means for vertical angle calibration -- 4. Control of nano-displacement and position -- 4.1 Accuracy control of the position and displacement of machine parts -- 4.1.1 The elements of position and displacement -- 4.2 Measurement of nanometric parameters -- 4.3 Linear and circular piezoelectric actuators for the nanometric displacement -- 5. Testing and calibration of coordinate measuring machines -- 5.1 Introduction to principles of operation and application of CMMs -- 5.2 Principles of MHs and touch trigger probes -- 5.3 Performance verification of MHs and touch trigger probes -- 5.4 Complex accuracy verification of CMMs -- 5.5 Performance verification using artifacts -- 5.6 Performance verification using lasers -- 5.7 Methods and means for accuracy improvement of machines -- 5.7.1 Piezomechanical correction -- 6. Future trends in machine monitoring and performance verification of coordinate measuring machines -- 6.1 Introduction -- 6.2 The determination of physical surface coordinates using a CCD camera -- 6.3 Volumetric detection of position -- 6.4 A proposed telemetric CMM -- References -- Bibliography -- Index. |
| Record Nr. | UNINA-9910786460203321 |
|
Giniotis Vytautas
|
||
| New York : , : Momentum Press, LLC, , [2014] | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Measurement and monitoring / / Vytautis Giniotis and Anthony Hope
| Measurement and monitoring / / Vytautis Giniotis and Anthony Hope |
| Autore | Giniotis Vytautas |
| Pubbl/distr/stampa | New York : , : Momentum Press, LLC, , [2014] |
| Descrizione fisica | 1 online resource (210 p.) |
| Disciplina | 389.1015195 |
| Collana | Automation and control collection |
| Soggetto topico |
Metrology
Electric machinery - Monitoring |
| ISBN |
1-78684-359-5
1-60650-381-2 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
1. Monitoring of processes, systems, and equipment -- 1.1 Introduction -- 1.2 Parameters for system monitoring -- 1.3 Random and regular modes of monitoring -- 1.4 Principles of performance of information measuring systems --
2. Testing of geometrical accuracy parameters of machines -- 2.1 Geometrical accuracy parameters of machines and instruments -- 2.2 Accuracy control of geometrical parameters -- 2.2.1 Length (positioning) measurement -- 2.2.2 Inversion method in measurements -- 2.3 Testing of accuracy parameters of the rotary table -- 3. Measurement and monitoring of the accuracy of scales and encoders -- 3.1 Standards of measurement of length and angle -- 3.2 Measurement of circular scales -- 3.3 Applying new methods for measuring circular scales -- 3.4 Measurement of linear scales and transducers -- 3.5 Comparators for linear measurements -- 3.6 Comparators for angle measurements -- 3.7 Calibration of geodetic instruments -- 3.7.1 Methods and means for vertical angle calibration -- 4. Control of nano-displacement and position -- 4.1 Accuracy control of the position and displacement of machine parts -- 4.1.1 The elements of position and displacement -- 4.2 Measurement of nanometric parameters -- 4.3 Linear and circular piezoelectric actuators for the nanometric displacement -- 5. Testing and calibration of coordinate measuring machines -- 5.1 Introduction to principles of operation and application of CMMs -- 5.2 Principles of MHs and touch trigger probes -- 5.3 Performance verification of MHs and touch trigger probes -- 5.4 Complex accuracy verification of CMMs -- 5.5 Performance verification using artifacts -- 5.6 Performance verification using lasers -- 5.7 Methods and means for accuracy improvement of machines -- 5.7.1 Piezomechanical correction -- 6. Future trends in machine monitoring and performance verification of coordinate measuring machines -- 6.1 Introduction -- 6.2 The determination of physical surface coordinates using a CCD camera -- 6.3 Volumetric detection of position -- 6.4 A proposed telemetric CMM -- References -- Bibliography -- Index. |
| Record Nr. | UNINA-9910811276703321 |
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Giniotis Vytautas
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| New York : , : Momentum Press, LLC, , [2014] | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Metrology in Chemistry / / by Ewa Bulska
| Metrology in Chemistry / / by Ewa Bulska |
| Autore | Bulska Ewa |
| Edizione | [1st ed. 2018.] |
| Pubbl/distr/stampa | Cham : , : Springer International Publishing : , : Imprint : Springer, , 2018 |
| Descrizione fisica | 1 online resource (201 pages) |
| Disciplina | 389.1015195 |
| Collana | Lecture Notes in Chemistry |
| Soggetto topico |
Analytical chemistry
Physical measurements Measurement Environmental monitoring Analytical Chemistry Measurement Science and Instrumentation Monitoring/Environmental Analysis |
| ISBN | 3-319-99206-6 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | Introduction -- General aspect of metrology -- Metrological infrastructure -- System of units -- Metrological traceabilityTesting and calibration -- Chemical reference materials -- Validation of the measurement procedure -- Uncertainty of results -- Quality management -- Inter-laboratory Comparisons (ILC)/Proficiency Testing (PT) -- Accreditation of chemical laboratories -- Basic operation on numbers. |
| Record Nr. | UNINA-9910298592503321 |
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Bulska Ewa
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| Cham : , : Springer International Publishing : , : Imprint : Springer, , 2018 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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