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2018 Metrology for Archaeology and Cultural Heritage (MetroArchaeo) / / Institute of Electrical and Electronics Engineers
2018 Metrology for Archaeology and Cultural Heritage (MetroArchaeo) / / Institute of Electrical and Electronics Engineers
Pubbl/distr/stampa Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers, , 2018
Descrizione fisica 1 online resource
Disciplina 389.1
Soggetto topico Metrology
ISBN 1-5386-5276-5
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Altri titoli varianti 2018 Metrology for Archaeology and Cultural Heritage
Record Nr. UNINA-9910437209503321
Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers, , 2018
Materiale a stampa
Lo trovi qui: Univ. Federico II
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2018 Metrology for Archaeology and Cultural Heritage (MetroArchaeo) / / Institute of Electrical and Electronics Engineers
2018 Metrology for Archaeology and Cultural Heritage (MetroArchaeo) / / Institute of Electrical and Electronics Engineers
Pubbl/distr/stampa Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers, , 2018
Descrizione fisica 1 online resource
Disciplina 389.1
Soggetto topico Metrology
ISBN 1-5386-5276-5
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Altri titoli varianti 2018 Metrology for Archaeology and Cultural Heritage
Record Nr. UNISA-996575525303316
Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers, , 2018
Materiale a stampa
Lo trovi qui: Univ. di Salerno
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2020 IEEE International Workshop on Metrology for Industry 4.0 & IoT / / Institute of Electrical and Electronics Engineers
2020 IEEE International Workshop on Metrology for Industry 4.0 & IoT / / Institute of Electrical and Electronics Engineers
Pubbl/distr/stampa [Place of publication not identified] : , : Institute of Electrical and Electronics Engineers, , 2020
Descrizione fisica 1 online resource
Disciplina 389.1
Soggetto topico Metrology
ISBN 1-7281-4892-8
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNINA-9910437340403321
[Place of publication not identified] : , : Institute of Electrical and Electronics Engineers, , 2020
Materiale a stampa
Lo trovi qui: Univ. Federico II
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2020 IEEE International Workshop on Metrology for Industry 4.0 & IoT / / Institute of Electrical and Electronics Engineers
2020 IEEE International Workshop on Metrology for Industry 4.0 & IoT / / Institute of Electrical and Electronics Engineers
Pubbl/distr/stampa [Place of publication not identified] : , : Institute of Electrical and Electronics Engineers, , 2020
Descrizione fisica 1 online resource
Disciplina 389.1
Soggetto topico Metrology
ISBN 1-7281-4892-8
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNISA-996575514903316
[Place of publication not identified] : , : Institute of Electrical and Electronics Engineers, , 2020
Materiale a stampa
Lo trovi qui: Univ. di Salerno
Opac: Controlla la disponibilità qui
AIST bulletin of metrology = : Sansōken keiryō hyōjun hōkoku [[electronic resource]]
AIST bulletin of metrology = : Sansōken keiryō hyōjun hōkoku [[electronic resource]]
Pubbl/distr/stampa Tsukuba, Japan, : National Metrology Institute of Japan, AIST, 2002-
Descrizione fisica 1 online resource
Disciplina 389.1
Soggetto topico Weights and measures - Japan
Metrology
Metrology - Japan
Measurement
Measurement - Japan
Poids et mesures - Japon
Métrologie
Métrologie - Japon
Mesure
Mesure - Japon
Weights and measures
Soggetto genere / forma Electronic journals.
Periodicals.
Formato Materiale a stampa
Livello bibliografico Periodico
Lingua di pubblicazione eng
Altri titoli varianti AIST BULL METROL
Advanced Industrial Science and Technology bulletin of metrology = Sansōken keiryō hyōjun hōkoku
Sansōken keiryō hyōjun hōkoku
Sangyō Gijutsu Sōgō Kenkyūjo keiryō hyōjun hōkoku
Record Nr. UNINA-9910145801803321
Tsukuba, Japan, : National Metrology Institute of Japan, AIST, 2002-
Materiale a stampa
Lo trovi qui: Univ. Federico II
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Applications and metrology at nanometer scale 2 : measurement systems, quantum engineering and RBDO method / / Pierre Richard Dahoo, Philippe Pougnet, Abdelkhalak El Hami
Applications and metrology at nanometer scale 2 : measurement systems, quantum engineering and RBDO method / / Pierre Richard Dahoo, Philippe Pougnet, Abdelkhalak El Hami
Autore Dahoo Pierre Richard
Pubbl/distr/stampa Hoboken, New Jersey ; ; London, England : , : John Wiley & Sons, Incorporated : , : ISTE Ltd., , [2021]
Descrizione fisica 1 online resource (279 pages) : illustrations
Disciplina 389.1
Soggetto topico Metrology
Soggetto genere / forma Electronic books.
ISBN 1-119-81897-4
1-119-81896-6
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto Cover -- Half-Title Page -- Title Page -- Copyright Page -- Contents -- Preface -- Introduction -- 1 Measurement Systems Using Polarized Light -- 1.1. Introduction -- 1.2. Matrix optics -- 1.3. Photon emission and detection -- 1.4. Application exercises on interferometry -- 1.4.1. Propagation of electromagnetic waves in a Fabry-Pérot cavity -- 1.4.2. Propagation of electromagnetic waves in a material -- 1.4.3. Interferometry and optical lambda meter -- 1.4.4. The homodyne interferometer and refractometer -- 1.4.5. The heterodyne interferometer -- 1.4.6. Application exercises on ellipsometry -- 1.5. Appendices matrices -- 1.5.1. Conventions used for Jones vectors and Jones ABCD -- 1.5.2. 2×2 transfer dies -- 1.5.3. 2×2 matrix multiplication -- 1.5.4. Trigonometric forms -- 1.5.5. Solution by MATLAB (exercises 1.4.3, 1.4.4 and 1.4.5). -- 1.6. Conclusion -- 2 Quantum-scale Interaction -- 2.1. Introduction -- 2.2. The spin through the Dirac equation -- 2.2.1. Theoretical background -- 2.2.2. Application: the Dirac equation and Pauli matrices -- 2.3. The density matrix for a two-level laser system -- 2.3.1. Definition of the density matrix -- 2.3.2. Density matrix properties -- 2.3.3. Equation of motion of the density matrix -- 2.3.4. Application to a two-level system -- 2.4. Ising's phenomenological model for cooperative effects -- 2.4.1. The Ising 1D model -- 3 Quantum Optics and Quantum Computers -- 3.1. Introduction -- 3.2. Polarized light in quantum mechanics -- 3.3. Introduction to quantum computers -- 3.4. Preparing a qubit -- 3.4.1. Application of the Bloch sphere -- 3.5. Application: interaction of a qubit with a classical field -- 3.5.1. Answer to question 1 -- 3.5.2. Answer to question 2 -- 3.6. Applying Ramsey fringes to evaluate the duration of phase coherence -- 3.6.1. Answer to question 1 -- 3.6.2. Answer to question 2.
4 Reliability-based Design Optimization of Structures -- 4.1. Introduction -- 4.2. Deterministic optimization -- 4.3. Reliability analysis -- 4.3.1. Optimal conditions -- 4.4. Reliability-based design optimization -- 4.4.1. The objective function -- 4.4.2. Taking into account the total cost -- 4.4.3. Design variables -- 4.4.4. Response of a system by RBDO -- 4.4.5. Limit states -- 4.4.6. Solving methods -- 4.5. Applications -- 4.5.1. Application on a bending beam -- 4.5.2. Application on a circular plate with different thicknesses -- 4.5.3. Application: hook A -- 4.5.4. Application: optimization of the materials of an electronic board -- 4.6. Reliability-based design optimization in nanotechnology -- 4.6.1. Thin-film SWCNT structures -- 4.6.2. Digital model of thin-film SWCNT structures -- 4.6.3. Numerical results -- 4.7. Conclusion -- Appendix: Short Overview of Quantum Mechanics -- References -- Index -- Other titles from iSTE in Mechanical Engineering and Solid Mechanics -- EULA.
Record Nr. UNINA-9910554855903321
Dahoo Pierre Richard  
Hoboken, New Jersey ; ; London, England : , : John Wiley & Sons, Incorporated : , : ISTE Ltd., , [2021]
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
Applications and metrology at nanometer scale 2 : measurement systems, quantum engineering and RBDO method / / Pierre Richard Dahoo, Philippe Pougnet, Abdelkhalak El Hami
Applications and metrology at nanometer scale 2 : measurement systems, quantum engineering and RBDO method / / Pierre Richard Dahoo, Philippe Pougnet, Abdelkhalak El Hami
Autore Dahoo Pierre Richard
Pubbl/distr/stampa Hoboken, New Jersey ; ; London, England : , : John Wiley & Sons, Incorporated : , : ISTE Ltd., , [2021]
Descrizione fisica 1 online resource (279 pages) : illustrations
Disciplina 389.1
Soggetto topico Metrology
ISBN 1-119-81897-4
1-119-81896-6
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto Cover -- Half-Title Page -- Title Page -- Copyright Page -- Contents -- Preface -- Introduction -- 1 Measurement Systems Using Polarized Light -- 1.1. Introduction -- 1.2. Matrix optics -- 1.3. Photon emission and detection -- 1.4. Application exercises on interferometry -- 1.4.1. Propagation of electromagnetic waves in a Fabry-Pérot cavity -- 1.4.2. Propagation of electromagnetic waves in a material -- 1.4.3. Interferometry and optical lambda meter -- 1.4.4. The homodyne interferometer and refractometer -- 1.4.5. The heterodyne interferometer -- 1.4.6. Application exercises on ellipsometry -- 1.5. Appendices matrices -- 1.5.1. Conventions used for Jones vectors and Jones ABCD -- 1.5.2. 2×2 transfer dies -- 1.5.3. 2×2 matrix multiplication -- 1.5.4. Trigonometric forms -- 1.5.5. Solution by MATLAB (exercises 1.4.3, 1.4.4 and 1.4.5). -- 1.6. Conclusion -- 2 Quantum-scale Interaction -- 2.1. Introduction -- 2.2. The spin through the Dirac equation -- 2.2.1. Theoretical background -- 2.2.2. Application: the Dirac equation and Pauli matrices -- 2.3. The density matrix for a two-level laser system -- 2.3.1. Definition of the density matrix -- 2.3.2. Density matrix properties -- 2.3.3. Equation of motion of the density matrix -- 2.3.4. Application to a two-level system -- 2.4. Ising's phenomenological model for cooperative effects -- 2.4.1. The Ising 1D model -- 3 Quantum Optics and Quantum Computers -- 3.1. Introduction -- 3.2. Polarized light in quantum mechanics -- 3.3. Introduction to quantum computers -- 3.4. Preparing a qubit -- 3.4.1. Application of the Bloch sphere -- 3.5. Application: interaction of a qubit with a classical field -- 3.5.1. Answer to question 1 -- 3.5.2. Answer to question 2 -- 3.6. Applying Ramsey fringes to evaluate the duration of phase coherence -- 3.6.1. Answer to question 1 -- 3.6.2. Answer to question 2.
4 Reliability-based Design Optimization of Structures -- 4.1. Introduction -- 4.2. Deterministic optimization -- 4.3. Reliability analysis -- 4.3.1. Optimal conditions -- 4.4. Reliability-based design optimization -- 4.4.1. The objective function -- 4.4.2. Taking into account the total cost -- 4.4.3. Design variables -- 4.4.4. Response of a system by RBDO -- 4.4.5. Limit states -- 4.4.6. Solving methods -- 4.5. Applications -- 4.5.1. Application on a bending beam -- 4.5.2. Application on a circular plate with different thicknesses -- 4.5.3. Application: hook A -- 4.5.4. Application: optimization of the materials of an electronic board -- 4.6. Reliability-based design optimization in nanotechnology -- 4.6.1. Thin-film SWCNT structures -- 4.6.2. Digital model of thin-film SWCNT structures -- 4.6.3. Numerical results -- 4.7. Conclusion -- Appendix: Short Overview of Quantum Mechanics -- References -- Index -- Other titles from iSTE in Mechanical Engineering and Solid Mechanics -- EULA.
Record Nr. UNINA-9910829930303321
Dahoo Pierre Richard  
Hoboken, New Jersey ; ; London, England : , : John Wiley & Sons, Incorporated : , : ISTE Ltd., , [2021]
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
Applied aspects of modern metrology / / edited by Oleh Velychko
Applied aspects of modern metrology / / edited by Oleh Velychko
Pubbl/distr/stampa London, England : , : IntechOpen, , [2022]
Descrizione fisica 1 online resource (150 pages)
Disciplina 389.1
Soggetto topico Metrology
ISBN 1-80355-049-X
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNINA-9910586647903321
London, England : , : IntechOpen, , [2022]
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
Applied Aspects of Modern Metrology / / edited by Oleh Velychko
Applied Aspects of Modern Metrology / / edited by Oleh Velychko
Pubbl/distr/stampa London : , : IntechOpen, , 2022
Descrizione fisica 1 online resource (xi, 150 pages) : illustrations
Disciplina 389.1
Soggetto topico Metrology
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNINA-9910688240003321
London : , : IntechOpen, , 2022
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
Conferenza di metrologia dell'Europa occidentale : atti della conferenza tenuta al National physical laboratory, Teddington, Regno Unito 2-6 aprile 1973
Conferenza di metrologia dell'Europa occidentale : atti della conferenza tenuta al National physical laboratory, Teddington, Regno Unito 2-6 aprile 1973
Autore Conferenza di metrologia dell'Europa Occidentale : <1973
Pubbl/distr/stampa London : National physical laboratory, ©1974
Descrizione fisica 346 p. : ill. ; 30 cm
Disciplina 389.1
Soggetto non controllato Metrologia - Congressi
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione ita
Record Nr. UNINA-990000475340403321
Conferenza di metrologia dell'Europa Occidentale : <1973  
London : National physical laboratory, ©1974
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui