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2018 Metrology for Archaeology and Cultural Heritage (MetroArchaeo) / / Institute of Electrical and Electronics Engineers
| 2018 Metrology for Archaeology and Cultural Heritage (MetroArchaeo) / / Institute of Electrical and Electronics Engineers |
| Pubbl/distr/stampa | Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers, , 2018 |
| Descrizione fisica | 1 online resource |
| Disciplina | 389.1 |
| Soggetto topico | Metrology |
| ISBN | 1-5386-5276-5 |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti | 2018 Metrology for Archaeology and Cultural Heritage |
| Record Nr. | UNISA-996575525303316 |
| Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers, , 2018 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
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2018 Metrology for Archaeology and Cultural Heritage (MetroArchaeo) / / Institute of Electrical and Electronics Engineers
| 2018 Metrology for Archaeology and Cultural Heritage (MetroArchaeo) / / Institute of Electrical and Electronics Engineers |
| Pubbl/distr/stampa | Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers, , 2018 |
| Descrizione fisica | 1 online resource |
| Disciplina | 389.1 |
| Soggetto topico | Metrology |
| ISBN | 1-5386-5276-5 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti | 2018 Metrology for Archaeology and Cultural Heritage |
| Record Nr. | UNINA-9910437209503321 |
| Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers, , 2018 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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2020 IEEE International Workshop on Metrology for Industry 4.0 & IoT / / Institute of Electrical and Electronics Engineers
| 2020 IEEE International Workshop on Metrology for Industry 4.0 & IoT / / Institute of Electrical and Electronics Engineers |
| Pubbl/distr/stampa | [Place of publication not identified] : , : Institute of Electrical and Electronics Engineers, , 2020 |
| Descrizione fisica | 1 online resource |
| Disciplina | 389.1 |
| Soggetto topico | Metrology |
| ISBN | 1-7281-4892-8 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910437340403321 |
| [Place of publication not identified] : , : Institute of Electrical and Electronics Engineers, , 2020 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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2020 IEEE International Workshop on Metrology for Industry 4.0 & IoT / / Institute of Electrical and Electronics Engineers
| 2020 IEEE International Workshop on Metrology for Industry 4.0 & IoT / / Institute of Electrical and Electronics Engineers |
| Pubbl/distr/stampa | [Place of publication not identified] : , : Institute of Electrical and Electronics Engineers, , 2020 |
| Descrizione fisica | 1 online resource |
| Disciplina | 389.1 |
| Soggetto topico | Metrology |
| ISBN | 1-7281-4892-8 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996575514903316 |
| [Place of publication not identified] : , : Institute of Electrical and Electronics Engineers, , 2020 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
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AIST bulletin of metrology = : Sansōken keiryō hyōjun hōkoku [[electronic resource]]
| AIST bulletin of metrology = : Sansōken keiryō hyōjun hōkoku [[electronic resource]] |
| Pubbl/distr/stampa | Tsukuba, Japan, : National Metrology Institute of Japan, AIST, 2002- |
| Descrizione fisica | 1 online resource |
| Disciplina | 389.1 |
| Soggetto topico |
Weights and measures - Japan
Metrology Metrology - Japan Measurement Measurement - Japan Poids et mesures - Japon Métrologie Métrologie - Japon Mesure Mesure - Japon Weights and measures |
| Soggetto genere / forma |
Electronic journals.
Periodicals. |
| Formato | Materiale a stampa |
| Livello bibliografico | Periodico |
| Lingua di pubblicazione | eng |
| Altri titoli varianti |
AIST BULL METROL
Advanced Industrial Science and Technology bulletin of metrology = Sansōken keiryō hyōjun hōkoku Sansōken keiryō hyōjun hōkoku Sangyō Gijutsu Sōgō Kenkyūjo keiryō hyōjun hōkoku |
| Record Nr. | UNINA-9910145801803321 |
| Tsukuba, Japan, : National Metrology Institute of Japan, AIST, 2002- | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Applications and metrology at nanometer scale 2 : measurement systems, quantum engineering and RBDO method / / Pierre Richard Dahoo, Philippe Pougnet, Abdelkhalak El Hami
| Applications and metrology at nanometer scale 2 : measurement systems, quantum engineering and RBDO method / / Pierre Richard Dahoo, Philippe Pougnet, Abdelkhalak El Hami |
| Autore | Dahoo Pierre Richard |
| Pubbl/distr/stampa | Hoboken, New Jersey ; ; London, England : , : John Wiley & Sons, Incorporated : , : ISTE Ltd., , [2021] |
| Descrizione fisica | 1 online resource (279 pages) : illustrations |
| Disciplina | 389.1 |
| Soggetto topico | Metrology |
| Soggetto genere / forma | Electronic books. |
| ISBN |
1-119-81897-4
1-119-81896-6 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
Cover -- Half-Title Page -- Title Page -- Copyright Page -- Contents -- Preface -- Introduction -- 1 Measurement Systems Using Polarized Light -- 1.1. Introduction -- 1.2. Matrix optics -- 1.3. Photon emission and detection -- 1.4. Application exercises on interferometry -- 1.4.1. Propagation of electromagnetic waves in a Fabry-Pérot cavity -- 1.4.2. Propagation of electromagnetic waves in a material -- 1.4.3. Interferometry and optical lambda meter -- 1.4.4. The homodyne interferometer and refractometer -- 1.4.5. The heterodyne interferometer -- 1.4.6. Application exercises on ellipsometry -- 1.5. Appendices matrices -- 1.5.1. Conventions used for Jones vectors and Jones ABCD -- 1.5.2. 2×2 transfer dies -- 1.5.3. 2×2 matrix multiplication -- 1.5.4. Trigonometric forms -- 1.5.5. Solution by MATLAB (exercises 1.4.3, 1.4.4 and 1.4.5). -- 1.6. Conclusion -- 2 Quantum-scale Interaction -- 2.1. Introduction -- 2.2. The spin through the Dirac equation -- 2.2.1. Theoretical background -- 2.2.2. Application: the Dirac equation and Pauli matrices -- 2.3. The density matrix for a two-level laser system -- 2.3.1. Definition of the density matrix -- 2.3.2. Density matrix properties -- 2.3.3. Equation of motion of the density matrix -- 2.3.4. Application to a two-level system -- 2.4. Ising's phenomenological model for cooperative effects -- 2.4.1. The Ising 1D model -- 3 Quantum Optics and Quantum Computers -- 3.1. Introduction -- 3.2. Polarized light in quantum mechanics -- 3.3. Introduction to quantum computers -- 3.4. Preparing a qubit -- 3.4.1. Application of the Bloch sphere -- 3.5. Application: interaction of a qubit with a classical field -- 3.5.1. Answer to question 1 -- 3.5.2. Answer to question 2 -- 3.6. Applying Ramsey fringes to evaluate the duration of phase coherence -- 3.6.1. Answer to question 1 -- 3.6.2. Answer to question 2.
4 Reliability-based Design Optimization of Structures -- 4.1. Introduction -- 4.2. Deterministic optimization -- 4.3. Reliability analysis -- 4.3.1. Optimal conditions -- 4.4. Reliability-based design optimization -- 4.4.1. The objective function -- 4.4.2. Taking into account the total cost -- 4.4.3. Design variables -- 4.4.4. Response of a system by RBDO -- 4.4.5. Limit states -- 4.4.6. Solving methods -- 4.5. Applications -- 4.5.1. Application on a bending beam -- 4.5.2. Application on a circular plate with different thicknesses -- 4.5.3. Application: hook A -- 4.5.4. Application: optimization of the materials of an electronic board -- 4.6. Reliability-based design optimization in nanotechnology -- 4.6.1. Thin-film SWCNT structures -- 4.6.2. Digital model of thin-film SWCNT structures -- 4.6.3. Numerical results -- 4.7. Conclusion -- Appendix: Short Overview of Quantum Mechanics -- References -- Index -- Other titles from iSTE in Mechanical Engineering and Solid Mechanics -- EULA. |
| Record Nr. | UNINA-9910554855903321 |
Dahoo Pierre Richard
|
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| Hoboken, New Jersey ; ; London, England : , : John Wiley & Sons, Incorporated : , : ISTE Ltd., , [2021] | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Applications and metrology at nanometer scale 2 : measurement systems, quantum engineering and RBDO method / / Pierre Richard Dahoo, Philippe Pougnet, Abdelkhalak El Hami
| Applications and metrology at nanometer scale 2 : measurement systems, quantum engineering and RBDO method / / Pierre Richard Dahoo, Philippe Pougnet, Abdelkhalak El Hami |
| Autore | Dahoo Pierre Richard |
| Pubbl/distr/stampa | Hoboken, New Jersey ; ; London, England : , : John Wiley & Sons, Incorporated : , : ISTE Ltd., , [2021] |
| Descrizione fisica | 1 online resource (279 pages) : illustrations |
| Disciplina | 389.1 |
| Soggetto topico | Metrology |
| ISBN |
1-119-81897-4
1-119-81896-6 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
Cover -- Half-Title Page -- Title Page -- Copyright Page -- Contents -- Preface -- Introduction -- 1 Measurement Systems Using Polarized Light -- 1.1. Introduction -- 1.2. Matrix optics -- 1.3. Photon emission and detection -- 1.4. Application exercises on interferometry -- 1.4.1. Propagation of electromagnetic waves in a Fabry-Pérot cavity -- 1.4.2. Propagation of electromagnetic waves in a material -- 1.4.3. Interferometry and optical lambda meter -- 1.4.4. The homodyne interferometer and refractometer -- 1.4.5. The heterodyne interferometer -- 1.4.6. Application exercises on ellipsometry -- 1.5. Appendices matrices -- 1.5.1. Conventions used for Jones vectors and Jones ABCD -- 1.5.2. 2×2 transfer dies -- 1.5.3. 2×2 matrix multiplication -- 1.5.4. Trigonometric forms -- 1.5.5. Solution by MATLAB (exercises 1.4.3, 1.4.4 and 1.4.5). -- 1.6. Conclusion -- 2 Quantum-scale Interaction -- 2.1. Introduction -- 2.2. The spin through the Dirac equation -- 2.2.1. Theoretical background -- 2.2.2. Application: the Dirac equation and Pauli matrices -- 2.3. The density matrix for a two-level laser system -- 2.3.1. Definition of the density matrix -- 2.3.2. Density matrix properties -- 2.3.3. Equation of motion of the density matrix -- 2.3.4. Application to a two-level system -- 2.4. Ising's phenomenological model for cooperative effects -- 2.4.1. The Ising 1D model -- 3 Quantum Optics and Quantum Computers -- 3.1. Introduction -- 3.2. Polarized light in quantum mechanics -- 3.3. Introduction to quantum computers -- 3.4. Preparing a qubit -- 3.4.1. Application of the Bloch sphere -- 3.5. Application: interaction of a qubit with a classical field -- 3.5.1. Answer to question 1 -- 3.5.2. Answer to question 2 -- 3.6. Applying Ramsey fringes to evaluate the duration of phase coherence -- 3.6.1. Answer to question 1 -- 3.6.2. Answer to question 2.
4 Reliability-based Design Optimization of Structures -- 4.1. Introduction -- 4.2. Deterministic optimization -- 4.3. Reliability analysis -- 4.3.1. Optimal conditions -- 4.4. Reliability-based design optimization -- 4.4.1. The objective function -- 4.4.2. Taking into account the total cost -- 4.4.3. Design variables -- 4.4.4. Response of a system by RBDO -- 4.4.5. Limit states -- 4.4.6. Solving methods -- 4.5. Applications -- 4.5.1. Application on a bending beam -- 4.5.2. Application on a circular plate with different thicknesses -- 4.5.3. Application: hook A -- 4.5.4. Application: optimization of the materials of an electronic board -- 4.6. Reliability-based design optimization in nanotechnology -- 4.6.1. Thin-film SWCNT structures -- 4.6.2. Digital model of thin-film SWCNT structures -- 4.6.3. Numerical results -- 4.7. Conclusion -- Appendix: Short Overview of Quantum Mechanics -- References -- Index -- Other titles from iSTE in Mechanical Engineering and Solid Mechanics -- EULA. |
| Record Nr. | UNINA-9910829930303321 |
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Dahoo Pierre Richard
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| Hoboken, New Jersey ; ; London, England : , : John Wiley & Sons, Incorporated : , : ISTE Ltd., , [2021] | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Applied aspects of modern metrology / / edited by Oleh Velychko
| Applied aspects of modern metrology / / edited by Oleh Velychko |
| Pubbl/distr/stampa | London, England : , : IntechOpen, , [2022] |
| Descrizione fisica | 1 online resource (150 pages) |
| Disciplina | 389.1 |
| Soggetto topico | Metrology |
| ISBN | 1-80355-049-X |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910586647903321 |
| London, England : , : IntechOpen, , [2022] | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Applied Aspects of Modern Metrology / / edited by Oleh Velychko
| Applied Aspects of Modern Metrology / / edited by Oleh Velychko |
| Pubbl/distr/stampa | London : , : IntechOpen, , 2022 |
| Descrizione fisica | 1 online resource (xi, 150 pages) : illustrations |
| Disciplina | 389.1 |
| Soggetto topico | Metrology |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910688240003321 |
| London : , : IntechOpen, , 2022 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Conferenza di metrologia dell'Europa occidentale : atti della conferenza tenuta al National physical laboratory, Teddington, Regno Unito 2-6 aprile 1973
| Conferenza di metrologia dell'Europa occidentale : atti della conferenza tenuta al National physical laboratory, Teddington, Regno Unito 2-6 aprile 1973 |
| Autore | Conferenza di metrologia dell'Europa Occidentale : <1973 |
| Pubbl/distr/stampa | London : National physical laboratory, ©1974 |
| Descrizione fisica | 346 p. : ill. ; 30 cm |
| Disciplina | 389.1 |
| Soggetto non controllato | Metrologia - Congressi |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | ita |
| Record Nr. | UNINA-990000475340403321 |
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Conferenza di metrologia dell'Europa Occidentale : <1973
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| London : National physical laboratory, ©1974 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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