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Importance measures in reliability, risk, and optimization [[electronic resource] ] : principles and applications / / Way Kuo, Xiaoyan Zhu
Importance measures in reliability, risk, and optimization [[electronic resource] ] : principles and applications / / Way Kuo, Xiaoyan Zhu
Autore Kuo Way <1951->
Pubbl/distr/stampa Chichester, West Sussex, U.K., : Wiley, 2012
Descrizione fisica 1 online resource (474 p.)
Disciplina 620/.00452
Altri autori (Persone) ZhuXiaoyan
Soggetto topico Reliability (Engineering)
Risk assessment
Industrial priorities
ISBN 1-280-59275-3
9786613622587
1-118-30416-0
1-118-31459-X
Classificazione TEC032000
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto pt. 1. Introduction and background -- pt. 2. Principles of importance measures -- pt. 3. Importance measures for reliability design -- pt. 4. Relations and generalizations -- pt. 5. Broad implications to risk and mathematical programming.
Record Nr. UNINA-9910141284203321
Kuo Way <1951->  
Chichester, West Sussex, U.K., : Wiley, 2012
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
Importance measures in reliability, risk, and optimization : principles and applications / / Way Kuo, Xiaoyan Zhu
Importance measures in reliability, risk, and optimization : principles and applications / / Way Kuo, Xiaoyan Zhu
Autore Kuo Way <1951->
Edizione [1st ed.]
Pubbl/distr/stampa Chichester, West Sussex, U.K., : Wiley, 2012
Descrizione fisica 1 online resource (474 p.)
Disciplina 620/.00452
Altri autori (Persone) ZhuXiaoyan
Soggetto topico Reliability (Engineering)
Risk assessment
Industrial priorities
ISBN 1-280-59275-3
9786613622587
1-118-30416-0
1-118-31459-X
Classificazione TEC032000
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto pt. 1. Introduction and background -- pt. 2. Principles of importance measures -- pt. 3. Importance measures for reliability design -- pt. 4. Relations and generalizations -- pt. 5. Broad implications to risk and mathematical programming.
Record Nr. UNINA-9910814365003321
Kuo Way <1951->  
Chichester, West Sussex, U.K., : Wiley, 2012
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
Knowledge Graph and Semantic Computing: Knowledge Computing and Language Understanding : 4th China Conference, CCKS 2019, Hangzhou, China, August 24–27, 2019, Revised Selected Papers / / edited by Xiaoyan Zhu, Bing Qin, Xiaodan Zhu, Ming Liu, Longhua Qian
Knowledge Graph and Semantic Computing: Knowledge Computing and Language Understanding : 4th China Conference, CCKS 2019, Hangzhou, China, August 24–27, 2019, Revised Selected Papers / / edited by Xiaoyan Zhu, Bing Qin, Xiaodan Zhu, Ming Liu, Longhua Qian
Edizione [1st ed. 2019.]
Pubbl/distr/stampa Singapore : , : Springer Singapore : , : Imprint : Springer, , 2019
Descrizione fisica 1 online resource (XIV, 211 p. 205 illus., 56 illus. in color.)
Disciplina 006
Collana Communications in Computer and Information Science
Soggetto topico Artificial intelligence
Computers
Application software
Artificial Intelligence
Information Systems and Communication Service
Computer Applications
Theory of Computation
ISBN 981-15-1956-0
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto language understanding -- knowledge acquisition -- intelligent services in the context of big data -- academic workshops -- industrial forum -- evaluation and competition -- knowledge graph summit review -- knowledge graph representation and reasoning -- information extraction and knowledge graph construction -- link data -- NLP -- knowledge integration -- knowledge graph storage management -- natural language understanding -- semantic computing and knowledge graph mining -- knowledge graph application -- semantic search -- assistant decision system -- recommendation.
Record Nr. UNINA-9910370256503321
Singapore : , : Springer Singapore : , : Imprint : Springer, , 2019
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui