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X-ray phase-contrast imaging using near-field speckles / / Marie-Christine Zdora
| X-ray phase-contrast imaging using near-field speckles / / Marie-Christine Zdora |
| Autore | Zdora Marie-Christine |
| Edizione | [1st ed. 2021.] |
| Pubbl/distr/stampa | Cham, Switzerland : , : Springer, , [2021] |
| Descrizione fisica | 1 online resource (XXI, 337 p. 102 illus., 88 illus. in color.) |
| Disciplina | 538.36 |
| Collana | Springer Theses, Recognizing Outstanding Ph.D. Research |
| Soggetto topico | Physics |
| ISBN | 3-030-66329-9 |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | Introduction -- Principles of X-Ray Imaging -- Synchrotron Beamlines, Instrumentation and Contributions -- X-ray Single-Grating Interferometry -- Principles and State of the Art Of X-Ray Speckle-Based Imaging -- The Unified Modulated Pattern Analysis -- At-Wavelength Optics Characterisation Via X-Ray Speckle- And Grating-Based Unified Modulated Pattern Analysis -- 3d Virtual Histology Using X-Ray Speckle With The Unified Modulated Pattern Analysis -- Recent Developments and Ongoing Work In X-Ray Speckle-Based Imaging -- Summary, Conclusions and Outlook -- Appendices. |
| Record Nr. | UNINA-9910483013903321 |
Zdora Marie-Christine
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| Cham, Switzerland : , : Springer, , [2021] | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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X-ray phase-contrast imaging using near-field speckles / / Marie-Christine Zdora
| X-ray phase-contrast imaging using near-field speckles / / Marie-Christine Zdora |
| Autore | Zdora Marie-Christine |
| Edizione | [1st ed. 2021.] |
| Pubbl/distr/stampa | Cham, Switzerland : , : Springer, , [2021] |
| Descrizione fisica | 1 online resource (XXI, 337 p. 102 illus., 88 illus. in color.) |
| Disciplina | 538.36 |
| Collana | Springer Theses, Recognizing Outstanding Ph.D. Research |
| Soggetto topico | Physics |
| ISBN | 3-030-66329-9 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | Introduction -- Principles of X-Ray Imaging -- Synchrotron Beamlines, Instrumentation and Contributions -- X-ray Single-Grating Interferometry -- Principles and State of the Art Of X-Ray Speckle-Based Imaging -- The Unified Modulated Pattern Analysis -- At-Wavelength Optics Characterisation Via X-Ray Speckle- And Grating-Based Unified Modulated Pattern Analysis -- 3d Virtual Histology Using X-Ray Speckle With The Unified Modulated Pattern Analysis -- Recent Developments and Ongoing Work In X-Ray Speckle-Based Imaging -- Summary, Conclusions and Outlook -- Appendices. |
| Record Nr. | UNISA-996466731903316 |
|
Zdora Marie-Christine
|
||
| Cham, Switzerland : , : Springer, , [2021] | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
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