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Optical radiation measurements : Stability and temperature characteristics of some silicon and selenium photodetectors / / Kshitij Mohan, A. Russell Schaefer, Edward F. Zalewski
| Optical radiation measurements : Stability and temperature characteristics of some silicon and selenium photodetectors / / Kshitij Mohan, A. Russell Schaefer, Edward F. Zalewski |
| Autore | Mohan Kshitij |
| Pubbl/distr/stampa | Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1973 |
| Descrizione fisica | 1 online resource |
| Altri autori (Persone) |
MohanKshitij
SchaeferA. Russell ZalewskiEdward F |
| Collana | NBS technical note |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti | Optical radiation measurements |
| Record Nr. | UNINA-9910711390103321 |
Mohan Kshitij
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| Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1973 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Optical radiation measurements : Photometric instrumentation and research (1970 to 1971) / / Edward F. Zalewski, A. Russell Schaefer, Kshitij Mohan, Donald A. McSparron
| Optical radiation measurements : Photometric instrumentation and research (1970 to 1971) / / Edward F. Zalewski, A. Russell Schaefer, Kshitij Mohan, Donald A. McSparron |
| Autore | Zalewski Edward F |
| Pubbl/distr/stampa | Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1972 |
| Descrizione fisica | 1 online resource |
| Altri autori (Persone) |
McSparronDonald A
MohanKshitij SchaeferA. Russell ZalewskiEdward F |
| Collana | NBS technical note |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti | Optical radiation measurements |
| Record Nr. | UNINA-9910711390403321 |
|
Zalewski Edward F
|
||
| Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1972 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||