Design and testing guides for the CMOS and lateral bipolar-on-SOI test library / / Janet C. Marshall, Mona E. Zaghloul |
Autore | Marshall J. C (Janet C.) |
Pubbl/distr/stampa | Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1994 |
Descrizione fisica | 1 online resource |
Altri autori (Persone) |
MarshallJ. C (Janet C.)
ZaghloulM. E (Mona Elwakkad) |
Collana | NIST special publication |
Formato | Materiale a stampa ![]() |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Record Nr. | UNINA-9910711191803321 |
Marshall J. C (Janet C.)
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Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1994 | ||
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Lo trovi qui: Univ. Federico II | ||
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Implementation of simulation program for modeling the effective resistivity of nanometer scale film and line interconnects / / A. Emre Yarimbiyik [and others] |
Pubbl/distr/stampa | [Gaithersburg, MD] : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , [2006] |
Descrizione fisica | 1 online resource (21 unnumbered pages) : illustrations |
Altri autori (Persone) |
AllenRicky
BlackburnDavid L SchafftHarry A YarimbiyikA. Emre ZaghloulM. E (Mona Elwakkad) |
Collana | NISTIR |
Soggetto topico |
Nanoelectromechanical systems
Thin films - Size effects - Computer simulation |
Formato | Materiale a stampa ![]() |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Record Nr. | UNINA-9910709939003321 |
[Gaithersburg, MD] : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , [2006] | ||
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Lo trovi qui: Univ. Federico II | ||
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