Phase-Contrast and Dark-Field Imaging / Simon Zabler

• Autore: Zabler Simon
• Pubblicazione: MDPI - Multidisciplinary Digital Publishing Institute, 2019; Basel, Switzerland : , : MDPI, , 2018
• Descrizione fisica: 1 electronic resource (146 p.)
• Soggetto non controllato: X-ray scattering; Coded-aperture imaging; Talbot-Interferometer; Moiré pattern analysis; Electron Backscatter imaging; Dark-field imaging; Computed Tomography; cultural heritage; X-ray Phase-contrast imaging; medical imaging; image processing: Fourier image analysis
• Sommario/riassunto: The intent of this Special Issue is to provide a framework with which scientists in several different disciplines, related to phase-contrast and dark-field imaging, can illustrate their ideas and results. The articles are reviews or very recent scientific reports; they address newcomers in the field, as well as experts and professors in fields of X-ray physics, electron, and phase-contrast X-ray imaging.
• Titolo autorizzato: Phase-Contrast and Dark-Field Imaging
• ISBN: 9783038972853; 3038972851
• Formato: Materiale a stampa
• Livello bibliografico: Monografia
• Lingua di pubblicazione: Inglese
• Record Nr.: 9910346845903321
• Lo trovi qui: Univ. Federico II