Info
- Utilizzare la checkbox di selezione a fianco di ciascun documento per attivare le funzionalità di stampa, invio email, download nei formati disponibili del (i) record.
Defects and Impurities in Silicon Materials [[electronic resource] ] : An Introduction to Atomic-Level Silicon Engineering / / edited by Yutaka Yoshida, Guido Langouche
| Defects and Impurities in Silicon Materials [[electronic resource] ] : An Introduction to Atomic-Level Silicon Engineering / / edited by Yutaka Yoshida, Guido Langouche |
| Edizione | [1st ed. 2015.] |
| Pubbl/distr/stampa | Tokyo : , : Springer Japan : , : Imprint : Springer, , 2015 |
| Descrizione fisica | 1 online resource (XV, 487 p. 292 illus., 180 illus. in color.) |
| Disciplina | 546.683 |
| Collana | Lecture Notes in Physics |
| Soggetto topico |
Semiconductors
Nanotechnology Engineering—Materials Solid state physics Nanoscale science Nanoscience Nanostructures Materials Engineering Nanotechnology and Microengineering Solid State Physics Nanoscale Science and Technology |
| ISBN | 4-431-55800-4 |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | Diffusion and point defects in silicon materials -- Density functional modeling of defects and impurities in silicon materials -- Electrical and optical defect evaluation techniques for electronic and solar grade silicon -- Intrinsic point defect engineering during single crystal Si and Ge growth from a melt -- Computer simulation of crystal growth for CZ-Si single crystals and Si solar cells -- Oxygen precipitation in silicon -- Defect characterization by electron beam induced current and cathode luminescence methods -- Nuclear methods to study defects and impurities in Si materials using heavy ion accelerators -- Defect Engineering in silicon materials. |
| Record Nr. | UNISA-996466796403316 |
| Tokyo : , : Springer Japan : , : Imprint : Springer, , 2015 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
Defects and Impurities in Silicon Materials : An Introduction to Atomic-Level Silicon Engineering / / edited by Yutaka Yoshida, Guido Langouche
| Defects and Impurities in Silicon Materials : An Introduction to Atomic-Level Silicon Engineering / / edited by Yutaka Yoshida, Guido Langouche |
| Edizione | [1st ed. 2015.] |
| Pubbl/distr/stampa | Tokyo : , : Springer Japan : , : Imprint : Springer, , 2015 |
| Descrizione fisica | 1 online resource (XV, 487 p. 292 illus., 180 illus. in color.) |
| Disciplina | 546.683 |
| Collana | Lecture Notes in Physics |
| Soggetto topico |
Semiconductors
Nanotechnology Engineering—Materials Solid state physics Nanoscience Nanostructures Materials Engineering Nanotechnology and Microengineering Solid State Physics Nanoscale Science and Technology |
| ISBN | 4-431-55800-4 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | Diffusion and point defects in silicon materials -- Density functional modeling of defects and impurities in silicon materials -- Electrical and optical defect evaluation techniques for electronic and solar grade silicon -- Intrinsic point defect engineering during single crystal Si and Ge growth from a melt -- Computer simulation of crystal growth for CZ-Si single crystals and Si solar cells -- Oxygen precipitation in silicon -- Defect characterization by electron beam induced current and cathode luminescence methods -- Nuclear methods to study defects and impurities in Si materials using heavy ion accelerators -- Defect Engineering in silicon materials. |
| Record Nr. | UNINA-9910136808703321 |
| Tokyo : , : Springer Japan : , : Imprint : Springer, , 2015 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
ICAME 2011 [[electronic resource] ] : Proceedings of the 31st International Conference on the Applications of the Mössbauer Effect (ICAME 2011) held in Tokyo, Japan, 25-30 September 2011 / / edited by Yutaka Yoshida
| ICAME 2011 [[electronic resource] ] : Proceedings of the 31st International Conference on the Applications of the Mössbauer Effect (ICAME 2011) held in Tokyo, Japan, 25-30 September 2011 / / edited by Yutaka Yoshida |
| Edizione | [1st ed. 2013.] |
| Pubbl/distr/stampa | Dordrecht : , : Springer Netherlands : , : Imprint : Springer, , 2013 |
| Descrizione fisica | 1 online resource (674 p.) |
| Disciplina | 539.7 |
| Soggetto topico |
Nuclear physics
Spectrum analysis Microscopy Materials science Particle and Nuclear Physics Spectroscopy and Microscopy Spectroscopy/Spectrometry Characterization and Evaluation of Materials |
| ISBN |
1-283-63409-0
9786613946546 94-007-4762-4 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910438118703321 |
| Dordrecht : , : Springer Netherlands : , : Imprint : Springer, , 2013 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Modern MoÌssbauer spectroscopy : new challenges based on cutting-edge techniques / / Yutaka Yoshida, Guido Langouche, editors
| Modern MoÌssbauer spectroscopy : new challenges based on cutting-edge techniques / / Yutaka Yoshida, Guido Langouche, editors |
| Edizione | [1st ed. 2021.] |
| Pubbl/distr/stampa | Singapore : , : Springer, , [2021] |
| Descrizione fisica | 1 online resource (XV, 523 p. 319 illus., 253 illus. in color.) |
| Disciplina | 621.381 |
| Collana | Topics in Applied Physics |
| Soggetto topico |
Electronics - Materials
Spectrum analysis - Statistical methods |
| ISBN | 981-15-9422-8 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | Historical Developments and Future Perspectives in Nuclear Resonance Scattering -- Synchrotron-Radiation-Based Mössbauer Spectroscopy and Nuclear Resonant Quasi- and Inelastic-Scattering -- Quantum Optical Phenomena in Nuclear Resonant Scattering -- From Small Molecules to Complex Systems: A Survey of Chemical and Biological Applications of the Mössbauer Effect -- Mössbauer Spectroscopy with High Spatial Resolution -- Molecular Magnetism of Metal Complexes and Light-Induced Phase Transitions -- Applications of Mössbauer Spectroscopy for Li-Ion and Na-Ion Batteries -- Mössbauer Spectroscopy in External Magnetic Fields -- Mössbauer Spectroscopic Microscope Studies on Diffusion in Solids. |
| Record Nr. | UNISA-996466739103316 |
| Singapore : , : Springer, , [2021] | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
Modern MoÌssbauer spectroscopy : new challenges based on cutting-edge techniques / / Yutaka Yoshida, Guido Langouche, editors
| Modern MoÌssbauer spectroscopy : new challenges based on cutting-edge techniques / / Yutaka Yoshida, Guido Langouche, editors |
| Edizione | [1st ed. 2021.] |
| Pubbl/distr/stampa | Singapore : , : Springer, , [2021] |
| Descrizione fisica | 1 online resource (XV, 523 p. 319 illus., 253 illus. in color.) |
| Disciplina | 621.381 |
| Collana | Topics in Applied Physics |
| Soggetto topico |
Electronics - Materials
Spectrum analysis - Statistical methods |
| ISBN | 981-15-9422-8 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | Historical Developments and Future Perspectives in Nuclear Resonance Scattering -- Synchrotron-Radiation-Based Mössbauer Spectroscopy and Nuclear Resonant Quasi- and Inelastic-Scattering -- Quantum Optical Phenomena in Nuclear Resonant Scattering -- From Small Molecules to Complex Systems: A Survey of Chemical and Biological Applications of the Mössbauer Effect -- Mössbauer Spectroscopy with High Spatial Resolution -- Molecular Magnetism of Metal Complexes and Light-Induced Phase Transitions -- Applications of Mössbauer Spectroscopy for Li-Ion and Na-Ion Batteries -- Mössbauer Spectroscopy in External Magnetic Fields -- Mössbauer Spectroscopic Microscope Studies on Diffusion in Solids. |
| Record Nr. | UNINA-9910483102903321 |
| Singapore : , : Springer, , [2021] | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Mössbauer Spectroscopy : Tutorial Book / / edited by Yutaka Yoshida, Guido Langouche
| Mössbauer Spectroscopy : Tutorial Book / / edited by Yutaka Yoshida, Guido Langouche |
| Edizione | [1st ed. 2013.] |
| Pubbl/distr/stampa | Berlin, Heidelberg : , : Springer Berlin Heidelberg : , : Imprint : Springer, , 2013 |
| Descrizione fisica | 1 online resource (310 p.) |
| Disciplina | 543.085 |
| Soggetto topico |
Nuclear physics
Atomic structure Molecular structure Spectrum analysis Geophysics Materials science Particle and Nuclear Physics Atomic/Molecular Structure and Spectra Spectroscopy/Spectrometry Geophysics/Geodesy Characterization and Evaluation of Materials |
| ISBN | 3-642-32220-4 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | General Introduction to Mössbauer Spectroscopy (S. Nasu) -- Chemical Applications of Mössbauer Spectroscopy (P. Gütlich and Y. Garcia) -- Application of Mössbauer Spectroscopy in Earth Sciences (R. E. Vandenberghe) -- Fe-based Nanostructures Investigated by Mössbauer Spectrometry (J.-M. Greneche) -- Magnetic Multilayers and Interfaces (T. Shinjo and K. Mibu) -- Implantation Techniques to Extract Atomistic Information in Materials Research (G. Langouche and Y. Yoshida). |
| Record Nr. | UNINA-9910438121503321 |
| Berlin, Heidelberg : , : Springer Berlin Heidelberg : , : Imprint : Springer, , 2013 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||