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Compression guidance for 1000 ppi friction ridge imagery / / Shahram Orandi, John Libert, Kenneth Ko, Stephen Wood, Frederick Byers, Stephen Harvey, Michael Garris, John Grantham, Bruce Bandini
| Compression guidance for 1000 ppi friction ridge imagery / / Shahram Orandi, John Libert, Kenneth Ko, Stephen Wood, Frederick Byers, Stephen Harvey, Michael Garris, John Grantham, Bruce Bandini |
| Pubbl/distr/stampa | Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 2014 |
| Descrizione fisica | 1 online resource (22 pages) : illustrations (black and white) |
| Altri autori (Persone) |
BandiniJohn
ByersFrederick GarrisMichael GranthamJohn HarveyStephen KoKenneth LibertJohn OrandiShahram WoodStephen |
| Collana | NIST special publication |
| Soggetto topico |
Fingerprints
Image compression |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910709583303321 |
| Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 2014 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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A rational foundation for software metrology / / David Flater; Paul E. Black; Elizabeth Fong; Raghy Kacker; Vadim Okum; Stephen Wood; D. Richard Kuhn
| A rational foundation for software metrology / / David Flater; Paul E. Black; Elizabeth Fong; Raghy Kacker; Vadim Okum; Stephen Wood; D. Richard Kuhn |
| Autore | Flater David |
| Pubbl/distr/stampa | Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 2016 |
| Descrizione fisica | 1 online resource (ii, 38 pages) : illustrations (chiefly color) |
| Altri autori (Persone) |
BlackPaul E
FlaterDavid FongElizabeth KackerRaghy KuhnD. Richard OkumVadim WoodStephen |
| Collana | NISTIR |
| Soggetto topico |
Computer software
Metrology |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910709600703321 |
Flater David
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| Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 2016 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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