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Auger electron spectroscopy : practical application to materials analysis and characterization of surfaces, interfaces, and thin films / / John Wolstenholme
| Auger electron spectroscopy : practical application to materials analysis and characterization of surfaces, interfaces, and thin films / / John Wolstenholme |
| Autore | Wolstenholme John |
| Pubbl/distr/stampa | New York, New York : , : Momentum Press, LLC, , [2015] |
| Descrizione fisica | 1 online resource (256 p.) |
| Disciplina | 543.0858 |
| Collana | Materials characterization and analysis collection |
| Soggetto topico | Electron spectroscopy |
| Soggetto genere / forma | Electronic books. |
| ISBN | 1-60650-682-X |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | 1. Introduction -- 2. The interaction of electrons with solid materials -- 3. AES methodologies -- 4. Instrumentation for auger analysis -- 5. Auger electron spectroscopy in materials analysis -- 6. Analytical methods for the characterization of materials -- Appendix 1. Abbreviations and acronyms -- Appendix 2. Quantum numbers -- Appendix 3. Comparison of surface and thin film analysis techniques -- Appendix 4. Standardization in surface analysis -- Appendix 5. Sources of the figures -- Further reading -- Index. |
| Record Nr. | UNINA-9910460798303321 |
Wolstenholme John
|
||
| New York, New York : , : Momentum Press, LLC, , [2015] | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Auger electron spectroscopy : practical application to materials analysis and characterization of surfaces, interfaces, and thin films / / John Wolstenholme
| Auger electron spectroscopy : practical application to materials analysis and characterization of surfaces, interfaces, and thin films / / John Wolstenholme |
| Autore | Wolstenholme John |
| Pubbl/distr/stampa | New York, New York : , : Momentum Press, LLC, , [2015] |
| Descrizione fisica | 1 online resource (256 p.) |
| Disciplina | 543.0858 |
| Collana | Materials characterization and analysis collection |
| Soggetto topico | Electron spectroscopy |
| ISBN | 1-60650-682-X |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | 1. Introduction -- 2. The interaction of electrons with solid materials -- 3. AES methodologies -- 4. Instrumentation for auger analysis -- 5. Auger electron spectroscopy in materials analysis -- 6. Analytical methods for the characterization of materials -- Appendix 1. Abbreviations and acronyms -- Appendix 2. Quantum numbers -- Appendix 3. Comparison of surface and thin film analysis techniques -- Appendix 4. Standardization in surface analysis -- Appendix 5. Sources of the figures -- Further reading -- Index. |
| Record Nr. | UNINA-9910797338903321 |
|
Wolstenholme John
|
||
| New York, New York : , : Momentum Press, LLC, , [2015] | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Auger electron spectroscopy : practical application to materials analysis and characterization of surfaces, interfaces, and thin films / / John Wolstenholme
| Auger electron spectroscopy : practical application to materials analysis and characterization of surfaces, interfaces, and thin films / / John Wolstenholme |
| Autore | Wolstenholme John |
| Pubbl/distr/stampa | New York, New York : , : Momentum Press, LLC, , [2015] |
| Descrizione fisica | 1 online resource (256 p.) |
| Disciplina | 543.0858 |
| Collana | Materials characterization and analysis collection |
| Soggetto topico | Electron spectroscopy |
| ISBN | 1-60650-682-X |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | 1. Introduction -- 2. The interaction of electrons with solid materials -- 3. AES methodologies -- 4. Instrumentation for auger analysis -- 5. Auger electron spectroscopy in materials analysis -- 6. Analytical methods for the characterization of materials -- Appendix 1. Abbreviations and acronyms -- Appendix 2. Quantum numbers -- Appendix 3. Comparison of surface and thin film analysis techniques -- Appendix 4. Standardization in surface analysis -- Appendix 5. Sources of the figures -- Further reading -- Index. |
| Record Nr. | UNINA-9910826934903321 |
|
Wolstenholme John
|
||
| New York, New York : , : Momentum Press, LLC, , [2015] | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||