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Circuit Design for Reliability / / edited by Ricardo Reis, Yu Cao, Gilson Wirth
| Circuit Design for Reliability / / edited by Ricardo Reis, Yu Cao, Gilson Wirth |
| Edizione | [1st ed. 2015.] |
| Pubbl/distr/stampa | New York, NY : , : Springer New York : , : Imprint : Springer, , 2015 |
| Descrizione fisica | 1 online resource (271 p.) |
| Disciplina |
620
620.00420285 621.3815 658.56 |
| Soggetto topico |
Electronic circuits
Security systems Computer-aided engineering Electronic Circuits and Systems Security Science and Technology Computer-Aided Engineering (CAD, CAE) and Design |
| ISBN | 1-4614-4078-5 |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | Introduction -- Recent Trends in Bias Temperature Instability -- Charge trapping phenomena in MOSFETS: From Noise to Bias Temperature Instability -- Atomistic Simulations on Reliability -- On-chip characterization of statistical device degradation -- Circuit Resilience Roadmap -- Layout Aware Electromigration Analysis of Power/Ground Networks -- Power-Gating for Leakage Control and Beyond -- Soft Error Rate and Fault Tolerance Techniques for FPGAs. |
| Record Nr. | UNINA-9910299666303321 |
| New York, NY : , : Springer New York : , : Imprint : Springer, , 2015 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Protecting Chips Against Hold Time Violations Due to Variability / / by Gustavo Neuberger, Gilson Wirth, Ricardo Reis
| Protecting Chips Against Hold Time Violations Due to Variability / / by Gustavo Neuberger, Gilson Wirth, Ricardo Reis |
| Autore | Neuberger Gustavo |
| Edizione | [1st ed. 2014.] |
| Pubbl/distr/stampa | Dordrecht : , : Springer Netherlands : , : Imprint : Springer, , 2014 |
| Descrizione fisica | 1 online resource (xi, 107 pages) : illustrations (some color) |
| Disciplina | 621.3815 |
| Collana | Gale eBooks |
| Soggetto topico |
Electronic circuits
Microprocessors Computer architecture Electronic Circuits and Systems Processor Architectures |
| ISBN |
9789400724273
9400724276 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | Introduction, Process Variations and Flip-Flops -- Process Variability -- Flip-Flops and Hold Time Violations -- Circuits Under Test -- Measurement Circuits -- Experimental Results -- Systematic and Random Variablility -- Normality Tests -- Probability of Hold Time Violations -- Protecting Circuits Against Hold Time Violations -- Padding Efficiency Of the Proposed Padding Algorithm -- Final Remarks. |
| Record Nr. | UNINA-9910299733003321 |
Neuberger Gustavo
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| Dordrecht : , : Springer Netherlands : , : Imprint : Springer, , 2014 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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ZnO Thin-Film Transistors for Cost-Efficient Flexible Electronics / / by Fábio Fedrizzi Vidor, Gilson Inácio Wirth, Ulrich Hilleringmann
| ZnO Thin-Film Transistors for Cost-Efficient Flexible Electronics / / by Fábio Fedrizzi Vidor, Gilson Inácio Wirth, Ulrich Hilleringmann |
| Autore | Vidor |
| Edizione | [1st ed.. 2018.] |
| Pubbl/distr/stampa | Cham : , : Springer International Publishing : , : Imprint : Springer, , 2018 |
| Descrizione fisica | 1 online resource (XVII, 179 p. 123 illus., 98 illus. in color.) |
| Disciplina | 621.3815 |
| Altri autori (Persone) | Fábio Fedrizzi |
| Soggetto topico |
Electronic circuits
Electronics Microelectronics Circuits and Systems Electronic Circuits and Devices Electronics and Microelectronics, Instrumentation |
| ISBN | 3-319-72556-4 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | Chapter 1.Introduction -- Chapter 2.Fundamentals -- Chapter 3.Integration -- Chapter 4. Zinc Oxide Transistors -- Chapter 5.Electronic Circuits -- Chapter 6.Improvements -- Chapter 7.Conclusion and Future Perspectives. |
| Record Nr. | UNINA-9910299580203321 |
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Vidor
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| Cham : , : Springer International Publishing : , : Imprint : Springer, , 2018 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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