MOS1 a program for two-dimensional analysis of Si MOSFETs / / Charles L. Wilson, James L. Blue |
Autore | Wilson Charles L |
Pubbl/distr/stampa | Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1985 |
Descrizione fisica | 1 online resource |
Altri autori (Persone) |
BlueJ. L
WilsonCharles L |
Collana | NBS special publication |
Formato | Materiale a stampa ![]() |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Record Nr. | UNINA-9910709504603321 |
Wilson Charles L
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Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1985 | ||
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Lo trovi qui: Univ. Federico II | ||
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Nonparamentric analysis of fingerprint data / / Jin Chu Wu; Charles L. Wilson |
Autore | Wu Jin Chu |
Pubbl/distr/stampa | Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 2005 |
Descrizione fisica | 1 online resource |
Altri autori (Persone) |
WilsonCharles L
WuJin Chu |
Collana | NISTIR |
Formato | Materiale a stampa ![]() |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Record Nr. | UNINA-9910710766503321 |
Wu Jin Chu
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Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 2005 | ||
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Lo trovi qui: Univ. Federico II | ||
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Studies of fingerprint matching using the NIST Verification Test Bed (VTB) / / Charles L. Wilson; Craig I. Watson; Michael D. Garris; Austin Hicklin |
Autore | Wilson Charles L |
Pubbl/distr/stampa | Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 2003 |
Descrizione fisica | 1 online resource |
Altri autori (Persone) |
GarrisMichael D
HicklinR. Austin WatsonC. I (Craig I.) WilsonCharles L |
Collana | NISTIR |
Formato | Materiale a stampa ![]() |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Altri titoli varianti | Studies of fingerprint matching using the NIST Verification Test Bed |
Record Nr. | UNINA-9910710776003321 |
Wilson Charles L
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Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 2003 | ||
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Lo trovi qui: Univ. Federico II | ||
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User's guide to export controlled distribution of NIST biometric image software (NBIS-EC) / / Craig I. Watson; Michael D. Garris; Elham Tabassi; Charles L. Wilson; R. Michael McCabe; Stanley Janet; Kenneth Ko |
Autore | Watson C. I (Craig I.) |
Pubbl/distr/stampa | Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 2007 |
Descrizione fisica | 1 online resource |
Altri autori (Persone) |
GarrisMichael D
JanetStanley KoKenneth McCabeR. Michael TabassiElham WatsonC. I (Craig I.) WilsonCharles L |
Collana | NISTIR |
Formato | Materiale a stampa ![]() |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Altri titoli varianti | User's guide to export controlled distribution of NIST biometric image software |
Record Nr. | UNINA-9910710758303321 |
Watson C. I (Craig I.)
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Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 2007 | ||
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Lo trovi qui: Univ. Federico II | ||
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User's guide to NIST biometric image software (NBIS) / / Craig I. Watson; Michael D. Garris; Elham Tabassi; Charles L. Wilson; R. Michael McCabe; Stanley Janet; Kenneth Ko |
Autore | Watson C. I (Craig I.) |
Pubbl/distr/stampa | Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 2007 |
Descrizione fisica | 1 online resource |
Altri autori (Persone) |
GarrisMichael D
JanetStanley KoKenneth McCabeR. Michael TabassiElham WatsonC. I (Craig I.) WilsonCharles L |
Collana | NISTIR |
Formato | Materiale a stampa ![]() |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Altri titoli varianti | User's guide to NIST biometric image software |
Record Nr. | UNINA-9910710758203321 |
Watson C. I (Craig I.)
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Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 2007 | ||
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Lo trovi qui: Univ. Federico II | ||
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Using Chebyshev's inequality to determine sample size in biometric evaluation of fingerprint data / / Jin Chu Wu; Charles L. Wilson |
Autore | Wu Jin Chu |
Pubbl/distr/stampa | Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 2005 |
Descrizione fisica | 1 online resource |
Altri autori (Persone) |
WilsonCharles L
WuJin Chu |
Collana | NISTIR |
Formato | Materiale a stampa ![]() |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Record Nr. | UNINA-9910710777103321 |
Wu Jin Chu
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Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 2005 | ||
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Lo trovi qui: Univ. Federico II | ||
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