An introduction to synchrotron radiation : techniques and applications / / Phil Willmott |
Autore | Willmott Philip |
Edizione | [Second edition.] |
Pubbl/distr/stampa | Hoboken, NJ : , : Wiley, , 2019 |
Descrizione fisica | 1 online resource (504 pages) |
Disciplina | 539.735 |
Soggetto topico |
Synchrotron radiation
X-ray optics |
Soggetto genere / forma | Electronic books. |
ISBN |
1-119-28038-9
1-119-28037-0 1-119-28045-1 |
Formato | Materiale a stampa |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Nota di contenuto | The interaction of x-rays with matter -- Synchrotron physics -- Free-electron lasers -- Beamlines -- Scattering techniques -- Spectroscopic techniques -- Imaging techniques. |
Record Nr. | UNINA-9910554855703321 |
Willmott Philip | ||
Hoboken, NJ : , : Wiley, , 2019 | ||
Materiale a stampa | ||
Lo trovi qui: Univ. Federico II | ||
|
An introduction to synchrotron radiation : techniques and applications / / Phil Willmott |
Autore | Willmott Philip |
Edizione | [Second edition.] |
Pubbl/distr/stampa | Hoboken, NJ : , : Wiley, , 2019 |
Descrizione fisica | 1 online resource (504 pages) |
Disciplina | 539.735 |
Soggetto topico |
Synchrotron radiation
X-ray optics |
ISBN |
1-119-28038-9
1-119-28037-0 1-119-28045-1 |
Classificazione | OPT 280 |
Formato | Materiale a stampa |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Nota di contenuto | The interaction of x-rays with matter -- Synchrotron physics -- Free-electron lasers -- Beamlines -- Scattering techniques -- Spectroscopic techniques -- Imaging techniques. |
Record Nr. | UNINA-9910677834703321 |
Willmott Philip | ||
Hoboken, NJ : , : Wiley, , 2019 | ||
Materiale a stampa | ||
Lo trovi qui: Univ. Federico II | ||
|
Introduction to Synchrotron Radiation [[electronic resource] ] : Techniques and Applications |
Autore | Willmott Philip |
Pubbl/distr/stampa | Hoboken, : Wiley, 2011 |
Descrizione fisica | 1 online resource (370 p.) |
Disciplina | 539.7/35 |
Soggetto topico |
Synchrotron radiation
X-ray optics |
Soggetto genere / forma | Electronic books. |
ISBN | 1-119-97286-8 |
Formato | Materiale a stampa |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Nota di contenuto |
An Introduction to Synchrotron Radiation; Contents; Preface; Acknowledgements; 1. Introduction; 1.1 A Potted History of X-rays; 1.2 Synchrotron Sources Over the Last 50 Years; References; 2. The Interaction of X-rays with Matter; 2.1 Introduction; 2.2 The Electromagnetic Spectrum; 2.3 Thomson Scattering; 2.4 Compton Scattering; 2.5 Atomic Scattering Factors; 2.5.1 Scattering From a Cloud of Free Electrons; 2.5.2 Correction Terms for the Atomic Scattering Factor; 2.6 The Refractive Index, Reflection and Absorption; 2.6.1 The Refractive Index; 2.6.2 Refraction and Reflection; 2.6.3 Absorption
2.7 X-ray Fluorescence and Auger Emission2.7.1 X-ray Fluorescence; 2.7.2 Auger Emission; 2.7.3 Fluorescence or Auger?; 2.8 Concluding Remarks; References; 3. Synchrotron Physics; 3.1 Introduction; 3.2 Overview; 3.3 Radiation From Relativistic Electrons; 3.3.1 Magnetic Deflection Fields; 3.3.2 Radiated Power Loss in Synchrotrons; 3.4 Radio Frequency Power Supply and Bunching; 3.5 Photon Beam Properties; 3.5.1 Flux and Brilliance; 3.5.2 Emittance; 3.5.3 Coherence; 3.5.4 Polarization of Synchrotron Radiation; 3.6 Bending Magnets and Superbends; 3.7 Insertion Devices; 3.7.1 Wigglers 3.7.2 Worked Example: The SLS Materials Science Beamline Wiggler3.7.3 Undulators; 3.8 Future Sources of Synchrotron Light; 3.8.1 The Energy Recovery Linac; 3.8.2 The Free-Electron Laser; 3.8.3 Tabletop Synchrotrons; 3.9 Concluding Remarks; References; 4. Beamlines; 4.1 Introduction; 4.2 Front End; 4.2.1 Beam-Position Monitors; 4.2.2 Primary Aperture and Front-End Slits; 4.2.3 Low-Energy Filters; 4.3 Primary Optics; 4.3.1 X-ray Mirrors; 4.3.2 Mirror Focal Lengths - The Coddington Equations; 4.3.3 Monochromators; 4.3.4 Focusing Geometry; 4.4 Microfocus and Nanofocus Optics; 4.4.1 Lens Types 4.5 Beam Intensity Monitors4.6 Detectors; 4.6.1 Photographic Plates; 4.6.2 Scintillator Detectors; 4.6.3 The Point-Spread Function; 4.6.4 Crystal Analysers; 4.6.5 Image Plates and Charge-Coupled Devices; 4.6.6 Pixel and Microstrip Detectors; 4.6.7 Energy-Dispersive Detectors; 4.7 Time-Resolved Experiments; 4.7.1 Avalanche Photodiodes; 4.7.2 Streak Cameras; 4.8 Concluding Remarks; References; 5. Scattering Techniques; 5.1 Introduction; 5.2 Diffraction at Synchrotron Sources; 5.3 Description of Crystals; 5.3.1 Lattices and Bases; 5.3.2 Crystal Planes 5.3.3 Labelling Crystallographic Planes and Axes5.4 Basic Tenets of X-ray Diffraction; 5.4.1 Introduction; 5.4.2 The Bragg Law and the Reciprocal Lattice; 5.4.3 The Influence of the Basis; 5.4.4 Kinematical and Dynamical Diffraction; 5.5 Diffraction and the Convolution Theorem; 5.5.1 The Convolution Theorem; 5.5.2 Understanding the Structure Factor; 5.6 The Phase Problem and Anomalous Diffraction; 5.6.1 Introduction; 5.6.2 The Patterson Map; 5.6.3 Friedel's Law and Bijvoet Mates; 5.6.4 Anomalous Diffraction; 5.6.5 Direct Methods; 5.7 Types of Crystalline Samples 5.8 Single Crystal Diffraction |
Record Nr. | UNINA-9910453593703321 |
Willmott Philip | ||
Hoboken, : Wiley, 2011 | ||
Materiale a stampa | ||
Lo trovi qui: Univ. Federico II | ||
|
Introduction to Synchrotron Radiation [[electronic resource] ] : Techniques and Applications |
Autore | Willmott Philip |
Edizione | [1st ed.] |
Pubbl/distr/stampa | Hoboken, : Wiley, 2011 |
Descrizione fisica | 1 online resource (370 p.) |
Disciplina | 539.7/35 |
Soggetto topico |
Synchrotron radiation
X-ray optics |
ISBN | 1-119-97286-8 |
Formato | Materiale a stampa |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Nota di contenuto |
An Introduction to Synchrotron Radiation; Contents; Preface; Acknowledgements; 1. Introduction; 1.1 A Potted History of X-rays; 1.2 Synchrotron Sources Over the Last 50 Years; References; 2. The Interaction of X-rays with Matter; 2.1 Introduction; 2.2 The Electromagnetic Spectrum; 2.3 Thomson Scattering; 2.4 Compton Scattering; 2.5 Atomic Scattering Factors; 2.5.1 Scattering From a Cloud of Free Electrons; 2.5.2 Correction Terms for the Atomic Scattering Factor; 2.6 The Refractive Index, Reflection and Absorption; 2.6.1 The Refractive Index; 2.6.2 Refraction and Reflection; 2.6.3 Absorption
2.7 X-ray Fluorescence and Auger Emission2.7.1 X-ray Fluorescence; 2.7.2 Auger Emission; 2.7.3 Fluorescence or Auger?; 2.8 Concluding Remarks; References; 3. Synchrotron Physics; 3.1 Introduction; 3.2 Overview; 3.3 Radiation From Relativistic Electrons; 3.3.1 Magnetic Deflection Fields; 3.3.2 Radiated Power Loss in Synchrotrons; 3.4 Radio Frequency Power Supply and Bunching; 3.5 Photon Beam Properties; 3.5.1 Flux and Brilliance; 3.5.2 Emittance; 3.5.3 Coherence; 3.5.4 Polarization of Synchrotron Radiation; 3.6 Bending Magnets and Superbends; 3.7 Insertion Devices; 3.7.1 Wigglers 3.7.2 Worked Example: The SLS Materials Science Beamline Wiggler3.7.3 Undulators; 3.8 Future Sources of Synchrotron Light; 3.8.1 The Energy Recovery Linac; 3.8.2 The Free-Electron Laser; 3.8.3 Tabletop Synchrotrons; 3.9 Concluding Remarks; References; 4. Beamlines; 4.1 Introduction; 4.2 Front End; 4.2.1 Beam-Position Monitors; 4.2.2 Primary Aperture and Front-End Slits; 4.2.3 Low-Energy Filters; 4.3 Primary Optics; 4.3.1 X-ray Mirrors; 4.3.2 Mirror Focal Lengths - The Coddington Equations; 4.3.3 Monochromators; 4.3.4 Focusing Geometry; 4.4 Microfocus and Nanofocus Optics; 4.4.1 Lens Types 4.5 Beam Intensity Monitors4.6 Detectors; 4.6.1 Photographic Plates; 4.6.2 Scintillator Detectors; 4.6.3 The Point-Spread Function; 4.6.4 Crystal Analysers; 4.6.5 Image Plates and Charge-Coupled Devices; 4.6.6 Pixel and Microstrip Detectors; 4.6.7 Energy-Dispersive Detectors; 4.7 Time-Resolved Experiments; 4.7.1 Avalanche Photodiodes; 4.7.2 Streak Cameras; 4.8 Concluding Remarks; References; 5. Scattering Techniques; 5.1 Introduction; 5.2 Diffraction at Synchrotron Sources; 5.3 Description of Crystals; 5.3.1 Lattices and Bases; 5.3.2 Crystal Planes 5.3.3 Labelling Crystallographic Planes and Axes5.4 Basic Tenets of X-ray Diffraction; 5.4.1 Introduction; 5.4.2 The Bragg Law and the Reciprocal Lattice; 5.4.3 The Influence of the Basis; 5.4.4 Kinematical and Dynamical Diffraction; 5.5 Diffraction and the Convolution Theorem; 5.5.1 The Convolution Theorem; 5.5.2 Understanding the Structure Factor; 5.6 The Phase Problem and Anomalous Diffraction; 5.6.1 Introduction; 5.6.2 The Patterson Map; 5.6.3 Friedel's Law and Bijvoet Mates; 5.6.4 Anomalous Diffraction; 5.6.5 Direct Methods; 5.7 Types of Crystalline Samples 5.8 Single Crystal Diffraction |
Record Nr. | UNINA-9910791205503321 |
Willmott Philip | ||
Hoboken, : Wiley, 2011 | ||
Materiale a stampa | ||
Lo trovi qui: Univ. Federico II | ||
|