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Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy [[electronic resource] ] : A Laboratory Workbook / / by Charles E. Lyman, Dale E. Newbury, Joseph Goldstein, David B. Williams, Alton D. Romig Jr., John Armstrong, Patrick Echlin, Charles Fiori, David C. Joy, Eric Lifshin, Klaus-Rüdiger Peters
| Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy [[electronic resource] ] : A Laboratory Workbook / / by Charles E. Lyman, Dale E. Newbury, Joseph Goldstein, David B. Williams, Alton D. Romig Jr., John Armstrong, Patrick Echlin, Charles Fiori, David C. Joy, Eric Lifshin, Klaus-Rüdiger Peters |
| Autore | Lyman Charles E |
| Edizione | [1st ed. 1990.] |
| Pubbl/distr/stampa | New York, NY : , : Springer US : , : Imprint : Springer, , 1990 |
| Descrizione fisica | 1 online resource (XI, 407 p.) |
| Disciplina | 571.8 |
| Soggetto topico |
Developmental biology
Materials science Developmental Biology Characterization and Evaluation of Materials |
| ISBN | 1-4613-0635-3 |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | I: Scanning Electron Microscopy and X-Ray Microanalysis -- Laboratory 1 Basic SEM Imaging -- Laboratory 2 Electron Beam Parameters -- Laboratory 3 Image Contrast and Quality -- Laboratory 4 Stereo Microscopy -- Laboratory 5 Energy-Dispersive X-Ray Spectrometry -- Laboratory 6 Energy-Dispersive X-Ray Microanalysis -- Laboratory 7 Wavelength-Dispersive X-Ray Spectrometry and Microanalysis -- II: Advanced Scanning Electron Microscopy -- Laboratory 8 Backscattered Electron Imaging -- Laboratory 9 Scanning Transmission Imaging in the SEM -- Laboratory 10 Low-Voltage SEM -- Laboratory 11 High-Resolution SEM Imaging -- Laboratory 12 SE Signal Components -- Laboratory 13 Electron Channeling Contrast -- Laboratory 14 Magnetic Contrast -- Laboratory 15 Voltage Contrast and EBIC -- Laboratory 16 Environmental SEM -- Laboratory 17 Computer-Aided Imaging -- III: Advanced X-Ray Microanalysis -- Laboratory 18 Quantitative Wavelength-Dispersive X-Ray Microanalysis -- Laboratory 19 Quantitative Energy-Dispersive X-Ray Microanalysis -- Laboratory 20 Light Element Microanalysis -- Laboratory 21 Trace Element Microanalysis -- Laboratory 22 Particle and Rough Surface Microanalysis -- Laboratory 23 X-Ray Images -- IV: Analytical Electron Microscopy -- Laboratory 24 Scanning Transmission Imaging in the AEM -- Laboratory 25 X-Ray Microanalysis in the AEM -- Laboratory 26 Electron Energy Loss Spectrometry -- Laboratory 27 Convergent Beam Electron Diffraction -- V: Guide to Specimen Preparation -- Laboratory 28 Bulk Specimens for SEM and X-Ray Microanalysis -- Laboratory 29 Thin Specimens for TEM and AEM -- Laboratory 30 Coating Methods -- Solutions to Laboratory Exercises -- Laboratory 2 Electron Beam Parameters -- Laboratory 3 Image Contrast and Quality -- Laboratory 4 Stereo Microscopy -- Laboratory 5 Energy-Dispersive X-Ray Spectrometry -- Laboratory 6 Energy-Dispersive X-Ray Microanalysis -- Laboratory 7 Wavelength-Dispersive X-Ray Spectrometry and Microanalysis -- Laboratory 8 Backscattered Electron Imaging -- Laboratory 9 Scanning Transmission Imaging in the SEM -- Laboratory10 Low-Voltage SEM -- Laboratory 11 High-Resolution SEM Imaging -- Laboratory 12 SE Signal Components -- Laboratory 13 Electron Channeling Contrast -- Laboratory 14 Magnetic Contrast -- Laboratory 15 Voltage Contrast and EBIC -- Laboratory 16 Environmental SEM -- Laboratory 17 Computer-Aided Imaging -- Laboratory 18 Quantitative Wavelength-Dispersive X-Ray Microanalysis -- Laboratory 19 Quantitative Energy-Dispersive X-Ray Microanalysis -- Laboratory 20 Light Element Microanalysis -- Laboratory 21 Trace Element Microanalysis -- Laboratory 22 Particle and Rough Surface Microanalysis -- Laboratory 23 X-Ray Images -- Laboratory 24 Scanning Transmission Imaging in the AEM -- Laboratory 25 X-Ray Microanalysis in the AEM -- Laboratory 26 Electron Energy Loss Spectrometry -- Laboratory 27 Convergent Beam Electron Diffraction. |
| Record Nr. | UNINA-9910480498803321 |
Lyman Charles E
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| New York, NY : , : Springer US : , : Imprint : Springer, , 1990 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy [[electronic resource] ] : A Laboratory Workbook / / by Charles E. Lyman, Dale E. Newbury, Joseph Goldstein, David B. Williams, Alton D. Romig Jr., John Armstrong, Patrick Echlin, Charles Fiori, David C. Joy, Eric Lifshin, Klaus-Rüdiger Peters
| Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy [[electronic resource] ] : A Laboratory Workbook / / by Charles E. Lyman, Dale E. Newbury, Joseph Goldstein, David B. Williams, Alton D. Romig Jr., John Armstrong, Patrick Echlin, Charles Fiori, David C. Joy, Eric Lifshin, Klaus-Rüdiger Peters |
| Autore | Lyman Charles E |
| Edizione | [1st ed. 1990.] |
| Pubbl/distr/stampa | New York, NY : , : Springer US : , : Imprint : Springer, , 1990 |
| Descrizione fisica | 1 online resource (XI, 407 p.) |
| Disciplina | 571.8 |
| Soggetto topico |
Developmental biology
Materials science Developmental Biology Characterization and Evaluation of Materials |
| ISBN | 1-4613-0635-3 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | I: Scanning Electron Microscopy and X-Ray Microanalysis -- Laboratory 1 Basic SEM Imaging -- Laboratory 2 Electron Beam Parameters -- Laboratory 3 Image Contrast and Quality -- Laboratory 4 Stereo Microscopy -- Laboratory 5 Energy-Dispersive X-Ray Spectrometry -- Laboratory 6 Energy-Dispersive X-Ray Microanalysis -- Laboratory 7 Wavelength-Dispersive X-Ray Spectrometry and Microanalysis -- II: Advanced Scanning Electron Microscopy -- Laboratory 8 Backscattered Electron Imaging -- Laboratory 9 Scanning Transmission Imaging in the SEM -- Laboratory 10 Low-Voltage SEM -- Laboratory 11 High-Resolution SEM Imaging -- Laboratory 12 SE Signal Components -- Laboratory 13 Electron Channeling Contrast -- Laboratory 14 Magnetic Contrast -- Laboratory 15 Voltage Contrast and EBIC -- Laboratory 16 Environmental SEM -- Laboratory 17 Computer-Aided Imaging -- III: Advanced X-Ray Microanalysis -- Laboratory 18 Quantitative Wavelength-Dispersive X-Ray Microanalysis -- Laboratory 19 Quantitative Energy-Dispersive X-Ray Microanalysis -- Laboratory 20 Light Element Microanalysis -- Laboratory 21 Trace Element Microanalysis -- Laboratory 22 Particle and Rough Surface Microanalysis -- Laboratory 23 X-Ray Images -- IV: Analytical Electron Microscopy -- Laboratory 24 Scanning Transmission Imaging in the AEM -- Laboratory 25 X-Ray Microanalysis in the AEM -- Laboratory 26 Electron Energy Loss Spectrometry -- Laboratory 27 Convergent Beam Electron Diffraction -- V: Guide to Specimen Preparation -- Laboratory 28 Bulk Specimens for SEM and X-Ray Microanalysis -- Laboratory 29 Thin Specimens for TEM and AEM -- Laboratory 30 Coating Methods -- Solutions to Laboratory Exercises -- Laboratory 2 Electron Beam Parameters -- Laboratory 3 Image Contrast and Quality -- Laboratory 4 Stereo Microscopy -- Laboratory 5 Energy-Dispersive X-Ray Spectrometry -- Laboratory 6 Energy-Dispersive X-Ray Microanalysis -- Laboratory 7 Wavelength-Dispersive X-Ray Spectrometry and Microanalysis -- Laboratory 8 Backscattered Electron Imaging -- Laboratory 9 Scanning Transmission Imaging in the SEM -- Laboratory10 Low-Voltage SEM -- Laboratory 11 High-Resolution SEM Imaging -- Laboratory 12 SE Signal Components -- Laboratory 13 Electron Channeling Contrast -- Laboratory 14 Magnetic Contrast -- Laboratory 15 Voltage Contrast and EBIC -- Laboratory 16 Environmental SEM -- Laboratory 17 Computer-Aided Imaging -- Laboratory 18 Quantitative Wavelength-Dispersive X-Ray Microanalysis -- Laboratory 19 Quantitative Energy-Dispersive X-Ray Microanalysis -- Laboratory 20 Light Element Microanalysis -- Laboratory 21 Trace Element Microanalysis -- Laboratory 22 Particle and Rough Surface Microanalysis -- Laboratory 23 X-Ray Images -- Laboratory 24 Scanning Transmission Imaging in the AEM -- Laboratory 25 X-Ray Microanalysis in the AEM -- Laboratory 26 Electron Energy Loss Spectrometry -- Laboratory 27 Convergent Beam Electron Diffraction. |
| Record Nr. | UNINA-9910789220703321 |
|
Lyman Charles E
|
||
| New York, NY : , : Springer US : , : Imprint : Springer, , 1990 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy : A Laboratory Workbook / / by Charles E. Lyman, Dale E. Newbury, Joseph Goldstein, David B. Williams, Alton D. Romig Jr., John Armstrong, Patrick Echlin, Charles Fiori, David C. Joy, Eric Lifshin, Klaus-Rüdiger Peters
| Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy : A Laboratory Workbook / / by Charles E. Lyman, Dale E. Newbury, Joseph Goldstein, David B. Williams, Alton D. Romig Jr., John Armstrong, Patrick Echlin, Charles Fiori, David C. Joy, Eric Lifshin, Klaus-Rüdiger Peters |
| Autore | Lyman Charles E |
| Edizione | [1st ed. 1990.] |
| Pubbl/distr/stampa | New York, NY : , : Springer US : , : Imprint : Springer, , 1990 |
| Descrizione fisica | 1 online resource (XI, 407 p.) |
| Disciplina | 571.8 |
| Soggetto topico |
Developmental biology
Materials science Developmental Biology Characterization and Evaluation of Materials |
| ISBN | 1-4613-0635-3 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | I: Scanning Electron Microscopy and X-Ray Microanalysis -- Laboratory 1 Basic SEM Imaging -- Laboratory 2 Electron Beam Parameters -- Laboratory 3 Image Contrast and Quality -- Laboratory 4 Stereo Microscopy -- Laboratory 5 Energy-Dispersive X-Ray Spectrometry -- Laboratory 6 Energy-Dispersive X-Ray Microanalysis -- Laboratory 7 Wavelength-Dispersive X-Ray Spectrometry and Microanalysis -- II: Advanced Scanning Electron Microscopy -- Laboratory 8 Backscattered Electron Imaging -- Laboratory 9 Scanning Transmission Imaging in the SEM -- Laboratory 10 Low-Voltage SEM -- Laboratory 11 High-Resolution SEM Imaging -- Laboratory 12 SE Signal Components -- Laboratory 13 Electron Channeling Contrast -- Laboratory 14 Magnetic Contrast -- Laboratory 15 Voltage Contrast and EBIC -- Laboratory 16 Environmental SEM -- Laboratory 17 Computer-Aided Imaging -- III: Advanced X-Ray Microanalysis -- Laboratory 18 Quantitative Wavelength-Dispersive X-Ray Microanalysis -- Laboratory 19 Quantitative Energy-Dispersive X-Ray Microanalysis -- Laboratory 20 Light Element Microanalysis -- Laboratory 21 Trace Element Microanalysis -- Laboratory 22 Particle and Rough Surface Microanalysis -- Laboratory 23 X-Ray Images -- IV: Analytical Electron Microscopy -- Laboratory 24 Scanning Transmission Imaging in the AEM -- Laboratory 25 X-Ray Microanalysis in the AEM -- Laboratory 26 Electron Energy Loss Spectrometry -- Laboratory 27 Convergent Beam Electron Diffraction -- V: Guide to Specimen Preparation -- Laboratory 28 Bulk Specimens for SEM and X-Ray Microanalysis -- Laboratory 29 Thin Specimens for TEM and AEM -- Laboratory 30 Coating Methods -- Solutions to Laboratory Exercises -- Laboratory 2 Electron Beam Parameters -- Laboratory 3 Image Contrast and Quality -- Laboratory 4 Stereo Microscopy -- Laboratory 5 Energy-Dispersive X-Ray Spectrometry -- Laboratory 6 Energy-Dispersive X-Ray Microanalysis -- Laboratory 7 Wavelength-Dispersive X-Ray Spectrometry and Microanalysis -- Laboratory 8 Backscattered Electron Imaging -- Laboratory 9 Scanning Transmission Imaging in the SEM -- Laboratory10 Low-Voltage SEM -- Laboratory 11 High-Resolution SEM Imaging -- Laboratory 12 SE Signal Components -- Laboratory 13 Electron Channeling Contrast -- Laboratory 14 Magnetic Contrast -- Laboratory 15 Voltage Contrast and EBIC -- Laboratory 16 Environmental SEM -- Laboratory 17 Computer-Aided Imaging -- Laboratory 18 Quantitative Wavelength-Dispersive X-Ray Microanalysis -- Laboratory 19 Quantitative Energy-Dispersive X-Ray Microanalysis -- Laboratory 20 Light Element Microanalysis -- Laboratory 21 Trace Element Microanalysis -- Laboratory 22 Particle and Rough Surface Microanalysis -- Laboratory 23 X-Ray Images -- Laboratory 24 Scanning Transmission Imaging in the AEM -- Laboratory 25 X-Ray Microanalysis in the AEM -- Laboratory 26 Electron Energy Loss Spectrometry -- Laboratory 27 Convergent Beam Electron Diffraction. |
| Record Nr. | UNINA-9910807830303321 |
|
Lyman Charles E
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| New York, NY : , : Springer US : , : Imprint : Springer, , 1990 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Transmission Electron Microscopy : Diffraction, Imaging, and Spectrometry / / edited by C. Barry Carter, David B. Williams
| Transmission Electron Microscopy : Diffraction, Imaging, and Spectrometry / / edited by C. Barry Carter, David B. Williams |
| Edizione | [1st ed. 2016.] |
| Pubbl/distr/stampa | Cham : , : Springer International Publishing : , : Imprint : Springer, , 2016 |
| Descrizione fisica | 1 online resource (XXXIII, 518 p. 300 illus.) |
| Disciplina | 502.825 |
| Soggetto topico |
Materials science
Nanoscale science Nanoscience Nanostructures Spectroscopy Solid state physics Microscopy Mechanics Mechanics, Applied Characterization and Evaluation of Materials Nanoscale Science and Technology Spectroscopy/Spectrometry Solid State Physics Spectroscopy and Microscopy Solid Mechanics |
| ISBN | 3-319-26651-9 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | Foreword by Sir John Meurig Thomas -- 1. Electron Sources -- 2. In Situ and Operando -- 3. Electron Diffraction and Phase Identification -- 4. Convergent-Beam Diffraction: Symmetry and Large-Angle Patterns -- 5. Electron crystallography, charge-density mapping and nanodiffraction -- 6. Digital Micrograph -- 7. Electron waves, interference & coherence -- 8. Electron Holography -- 9. Focal-Series Reconstruction -- 10. Direct Methods For Image Interpretation -- 11. Imaging in the STEM -- 12. Electron Tomography -- 13. Energy-Filtered Transmission Electron Microscopy -- 14. Calculation of Electron Energy-Loss Spectra -- 15. Electron Diffraction & X-Ray Excitation -- 16. X-Ray and Electron Energy-Loss Spectral Imaging -- 17. Practical Aspects and Advanced Applications of XEDS. |
| Record Nr. | UNINA-9910254058703321 |
| Cham : , : Springer International Publishing : , : Imprint : Springer, , 2016 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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