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Transmission Electron Microscopy [[electronic resource] ] : A Textbook for Materials Science / / by David B. Williams, C. Barry Carter
| Transmission Electron Microscopy [[electronic resource] ] : A Textbook for Materials Science / / by David B. Williams, C. Barry Carter |
| Autore | Williams David B |
| Edizione | [1st ed. 1996.] |
| Pubbl/distr/stampa | New York, NY : , : Springer US : , : Imprint : Springer, , 1996 |
| Descrizione fisica | 1 online resource (XXIX, 729 p. 1722 illus.) |
| Disciplina | 621.36 |
| Soggetto topico |
Spectroscopy
Microscopy Surfaces (Physics) Interfaces (Physical sciences) Thin films Solid state physics Materials science Spectroscopy and Microscopy Surface and Interface Science, Thin Films Solid State Physics Characterization and Evaluation of Materials Biological Microscopy |
| ISBN | 1-4757-2519-1 |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | 1 The Transmission Electron Microscope -- 2 Scattering and Diffraction -- 3 Elastic Scattering -- 4 Inelastic Scattering and Beam Damage -- 5 Electron Sources -- 6 Lenses, Apertures, and Resolution -- 7 How to “See” Electrons -- 8 Pumps and Holders -- 9 The Instrument -- 10 Specimen Preparation -- 11 Diffraction Patterns -- 12 Thinking in Reciprocal Space -- 13 Diffracted Beams -- 14 Bloch Waves -- 15 Dispersion Surfaces -- 16 Diffraction from Crystals -- 17 Diffraction from Small Volumes -- 18 Indexing Diffraction Patterns -- 19 Kikuchi Diffraction -- 20 Obtaining CBED Patterns -- 21 Using Convergent-Beam Techniques -- 22 Imaging in the TEM -- 23 Thickness and Bending Effects -- 24 Planar Defects -- 25 Strain Fields -- 26 Weak-Beam Dark-Field Microscopy -- 27 Phase-Contrast Images -- 28 High-Resolution TEM -- 29 Image Simulation -- 30 Quantifying and Processing HRTEM Images -- 31 Other Imaging Techniques -- 32 X-ray Spectrometry -- 33 The XEDS-TEM Interface -- 34 Qualitative X-ray Analysis -- 35 Quantitative X-ray Microanalysis -- 36 Spatial Resolution and Minimum Detectability -- 37 Electron Energy-Loss Spectrometers -- 38 The Energy-Loss Spectrum -- 39 Microanalysis with Ionization-Loss Electrons -- 40 Everything Else in the Spectrum -- Acknowledgements for Figures. |
| Record Nr. | UNINA-9910480823503321 |
Williams David B
|
||
| New York, NY : , : Springer US : , : Imprint : Springer, , 1996 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Transmission Electron Microscopy [[electronic resource] ] : A Textbook for Materials Science / / by David B. Williams, C. Barry Carter
| Transmission Electron Microscopy [[electronic resource] ] : A Textbook for Materials Science / / by David B. Williams, C. Barry Carter |
| Autore | Williams David B |
| Edizione | [1st ed. 1996.] |
| Pubbl/distr/stampa | New York, NY : , : Springer US : , : Imprint : Springer, , 1996 |
| Descrizione fisica | 1 online resource (XXIX, 729 p. 1722 illus.) |
| Disciplina | 621.36 |
| Soggetto topico |
Spectroscopy
Microscopy Surfaces (Physics) Interfaces (Physical sciences) Thin films Solid state physics Materials science Spectroscopy and Microscopy Surface and Interface Science, Thin Films Solid State Physics Characterization and Evaluation of Materials Biological Microscopy |
| ISBN | 1-4757-2519-1 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | 1 The Transmission Electron Microscope -- 2 Scattering and Diffraction -- 3 Elastic Scattering -- 4 Inelastic Scattering and Beam Damage -- 5 Electron Sources -- 6 Lenses, Apertures, and Resolution -- 7 How to “See” Electrons -- 8 Pumps and Holders -- 9 The Instrument -- 10 Specimen Preparation -- 11 Diffraction Patterns -- 12 Thinking in Reciprocal Space -- 13 Diffracted Beams -- 14 Bloch Waves -- 15 Dispersion Surfaces -- 16 Diffraction from Crystals -- 17 Diffraction from Small Volumes -- 18 Indexing Diffraction Patterns -- 19 Kikuchi Diffraction -- 20 Obtaining CBED Patterns -- 21 Using Convergent-Beam Techniques -- 22 Imaging in the TEM -- 23 Thickness and Bending Effects -- 24 Planar Defects -- 25 Strain Fields -- 26 Weak-Beam Dark-Field Microscopy -- 27 Phase-Contrast Images -- 28 High-Resolution TEM -- 29 Image Simulation -- 30 Quantifying and Processing HRTEM Images -- 31 Other Imaging Techniques -- 32 X-ray Spectrometry -- 33 The XEDS-TEM Interface -- 34 Qualitative X-ray Analysis -- 35 Quantitative X-ray Microanalysis -- 36 Spatial Resolution and Minimum Detectability -- 37 Electron Energy-Loss Spectrometers -- 38 The Energy-Loss Spectrum -- 39 Microanalysis with Ionization-Loss Electrons -- 40 Everything Else in the Spectrum -- Acknowledgements for Figures. |
| Record Nr. | UNINA-9910792480003321 |
|
Williams David B
|
||
| New York, NY : , : Springer US : , : Imprint : Springer, , 1996 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Transmission Electron Microscopy : A Textbook for Materials Science / / by David B. Williams, C. Barry Carter
| Transmission Electron Microscopy : A Textbook for Materials Science / / by David B. Williams, C. Barry Carter |
| Autore | Williams David B |
| Edizione | [1st ed. 1996.] |
| Pubbl/distr/stampa | New York, NY : , : Springer US : , : Imprint : Springer, , 1996 |
| Descrizione fisica | 1 online resource (XXIX, 729 p. 1722 illus.) |
| Disciplina |
621.36
620.11299 |
| Soggetto topico |
Spectrum analysis
Surfaces (Physics) Condensed matter Materials - Analysis Biophysics Spectroscopy Surface and Interface and Thin Film Condensed Matter Physics Characterization and Analytical Technique Bioanalysis and Bioimaging |
| ISBN | 1-4757-2519-1 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | 1 The Transmission Electron Microscope -- 2 Scattering and Diffraction -- 3 Elastic Scattering -- 4 Inelastic Scattering and Beam Damage -- 5 Electron Sources -- 6 Lenses, Apertures, and Resolution -- 7 How to “See” Electrons -- 8 Pumps and Holders -- 9 The Instrument -- 10 Specimen Preparation -- 11 Diffraction Patterns -- 12 Thinking in Reciprocal Space -- 13 Diffracted Beams -- 14 Bloch Waves -- 15 Dispersion Surfaces -- 16 Diffraction from Crystals -- 17 Diffraction from Small Volumes -- 18 Indexing Diffraction Patterns -- 19 Kikuchi Diffraction -- 20 Obtaining CBED Patterns -- 21 Using Convergent-Beam Techniques -- 22 Imaging in the TEM -- 23 Thickness and Bending Effects -- 24 Planar Defects -- 25 Strain Fields -- 26 Weak-Beam Dark-Field Microscopy -- 27 Phase-Contrast Images -- 28 High-Resolution TEM -- 29 Image Simulation -- 30 Quantifying and Processing HRTEM Images -- 31 Other Imaging Techniques -- 32 X-ray Spectrometry -- 33 The XEDS-TEM Interface -- 34 Qualitative X-ray Analysis -- 35 Quantitative X-ray Microanalysis -- 36 Spatial Resolution and Minimum Detectability -- 37 Electron Energy-Loss Spectrometers -- 38 The Energy-Loss Spectrum -- 39 Microanalysis with Ionization-Loss Electrons -- 40 Everything Else in the Spectrum -- Acknowledgements for Figures. |
| Record Nr. | UNINA-9910958987603321 |
|
Williams David B
|
||
| New York, NY : , : Springer US : , : Imprint : Springer, , 1996 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||