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Handbook of surface and nanometrology / / David J. Whitehouse
| Handbook of surface and nanometrology / / David J. Whitehouse |
| Autore | Whitehouse D. J (David J.) |
| Edizione | [2nd ed.] |
| Pubbl/distr/stampa | Boca Raton : , : CRC Press, , 2011 |
| Descrizione fisica | 1 online resource (982 p.) |
| Disciplina | 620/.440287 |
| Altri autori (Persone) | WhitehouseD. J (David J.). |
| Soggetto topico |
Surfaces (Technology) - Measurement
Nanostructured materials Metrology |
| Soggetto genere / forma | Electronic books. |
| ISBN |
0-429-14069-X
1-4200-8202-7 |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | Front cover; Dedication; Contents; Preface; Acknowledgments; Chapter 1. Introduction-Surface and Nanometrology; Chapter 2. Characterization; Chapter 3. Processing, Operations, and Simulations; Chapter 4. Measurement Techniques; Chapter 5. Standardization-Traceability-Uncertainty; Chapter 6. Surfaces and Manufacture; Chapter 7. Surface Geometry and Its Importance in Function; Chapter 8. Surface Geometry, Scale of Size Effects, Nanometrology; Chapter 9. General Comments; Glossary; Back cover |
| Record Nr. | UNINA-9910464434903321 |
Whitehouse D. J (David J.)
|
||
| Boca Raton : , : CRC Press, , 2011 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Handbook of surface and nanometrology / / David J. Whitehouse
| Handbook of surface and nanometrology / / David J. Whitehouse |
| Autore | Whitehouse D. J (David J.) |
| Edizione | [2nd ed.] |
| Pubbl/distr/stampa | Boca Raton : , : CRC Press, , 2011 |
| Descrizione fisica | 1 online resource (982 p.) |
| Disciplina | 620/.440287 |
| Altri autori (Persone) | WhitehouseD. J (David J.). |
| Soggetto topico |
Surfaces (Technology) - Measurement
Nanostructured materials Metrology |
| ISBN |
0-429-14069-X
1-4200-8202-7 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | Front cover; Dedication; Contents; Preface; Acknowledgments; Chapter 1. Introduction-Surface and Nanometrology; Chapter 2. Characterization; Chapter 3. Processing, Operations, and Simulations; Chapter 4. Measurement Techniques; Chapter 5. Standardization-Traceability-Uncertainty; Chapter 6. Surfaces and Manufacture; Chapter 7. Surface Geometry and Its Importance in Function; Chapter 8. Surface Geometry, Scale of Size Effects, Nanometrology; Chapter 9. General Comments; Glossary; Back cover |
| Record Nr. | UNINA-9910788729203321 |
|
Whitehouse D. J (David J.)
|
||
| Boca Raton : , : CRC Press, , 2011 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Handbook of surface and nanometrology / / David J. Whitehouse
| Handbook of surface and nanometrology / / David J. Whitehouse |
| Autore | Whitehouse D. J (David J.) |
| Edizione | [2nd ed.] |
| Pubbl/distr/stampa | Boca Raton, FL, : CRC Press, c2011 |
| Descrizione fisica | 1 online resource (982 p.) |
| Disciplina | 620/.440287 |
| Altri autori (Persone) | WhitehouseD. J (David J.). |
| Soggetto topico |
Surfaces (Technology) - Measurement
Nanostructured materials Metrology |
| ISBN |
9781040068687
1040068685 9780429140693 042914069X 9781420082029 1420082027 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | Front cover; Dedication; Contents; Preface; Acknowledgments; Chapter 1. Introduction-Surface and Nanometrology; Chapter 2. Characterization; Chapter 3. Processing, Operations, and Simulations; Chapter 4. Measurement Techniques; Chapter 5. Standardization-Traceability-Uncertainty; Chapter 6. Surfaces and Manufacture; Chapter 7. Surface Geometry and Its Importance in Function; Chapter 8. Surface Geometry, Scale of Size Effects, Nanometrology; Chapter 9. General Comments; Glossary; Back cover |
| Record Nr. | UNINA-9910818308603321 |
|
Whitehouse D. J (David J.)
|
||
| Boca Raton, FL, : CRC Press, c2011 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Surfaces and their measurement [[electronic resource] /] / David Whitehouse
| Surfaces and their measurement [[electronic resource] /] / David Whitehouse |
| Autore | Whitehouse D. J (David J.) |
| Pubbl/distr/stampa | London, : HPS, 2002 |
| Descrizione fisica | 1 online resource (425 p.) |
| Disciplina |
620.110287
620.44 |
| Soggetto topico |
Surfaces (Technology) - Measurement
Civil engineering |
| Soggetto genere / forma | Electronic books. |
| ISBN |
1-281-07307-5
9786611073077 0-08-051823-0 1-4175-2668-8 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
Front Cover; Surfaces and their Measurement; Copyright Page; Contents; Foreword; Chapter 1. Introduction; 1.1 General; 1.2 What is surface metrology?; 1.3 Usefulness of surfaces; 1.4 Nature of surfaces; Chapter 2. Identification and separation of surface features; 2.1 Visualization; 2.2 Profiles and roughness - understanding the measurement routine; 2.3 Waviness; 2.4 Implementing the concept of sampling length; 2.5 The shape of the reference line; 2.6 Other methods; 2.7 Filtering and M system; 2.8 Conclusions; Chapter 3. Profile and areal (3D) parameter characterization; 3.1 Specification
3.2 Classification of parameters for the profile 3.3 Random process analysis; 3.4 Areal (3D) assessment; 3.5 Space frequency functions; 3.6 Comments on digital areal analysis; 3.7 Two-dimensional filtering (areal filtering); 3.8 Fractal surfaces; 3.9 Summary of characterization; Chapter 4. Surface metrology and manufacture; 4.1 Where and when to measure; 4.2 The process and surface finish; 4.3 Process control; 4.4 Relationship between surface metrology and manufacture; 4.5 Force and metrology loops; 4.6 Unit events and auto correlation; 4.7 Use of the power spectrum 4.8 Application of space frequency functions 4.9 Conclusions; Chapter 5. Function and surface texture; 5.1 Generic approach; 5.2 Some specific examples in tribology; 5.3 Surface models; 5.4 Summary of function; Chapter 6. Surface finish measurement - general; 6.1 Some quick ways of examining the surface; 6.2 Surface finish instrumentation; 6.3 Comments; Chapter 7. Stylus instruments; 7.1 The stylus; 7.2 Reference; 7.3 Use of skids; 7.4 Pick-up systems; 7.5 Stylus damage; 7.6 Stylus instrument usage; Chapter 8. Optical methods; 8.1 Optical path length; 8.2 Optical penetration 8.3 Resolution and depth of focus 8.4 Comparison between optical and stylus methods; 8.5 Gloss meters; 8.6 Total integrating sphere; 8.7 Diffractometer; 8.8 Interferometry; 8.9 Optical followers; 8.10 Heterodyne method; 8.11 Other optical methods; 8.12 Conclusions from the comparison of tactile and optical methods; Chapter 9. Scanning microscopes; 9.1 General; 9.2 Scanning microscopes; 9.3 Operation of the STM; 9.4 The atomic force microscope; 9.5 Scanning microscopes: conclusions; 9.6 Instruments 'horns of metrology' : conclusions; Chapter 10. Errors of form (excluding axes of rotation) 10.1 General statement 10.2 Straightness and related topics; 10.3 Measurement; 10.4 Assessment and classification of straightness; 10.5 Flatness; 10.6 Conclusions; Chapter 11. Roundness and related subjects; 11.1 General; 11.2 Direction of measurement; 11.3 Display of roundness; 11.4 Lobing; 11.5 Methods of measuring roundness; 11.6 Nature of the roundness signal; 11.7 Assessment of roundness; 11.8 Partial arc determination; 11.9 Other parameters; 11.10 Filtering for roundness; 11.11 Harmonic problems; 11.12 Alternatives to harmonic analysis; 11.13 Non-roundness parameters; 11.14 Conclusions Chapter 12. Cylindricity, sphericity |
| Record Nr. | UNINA-9910458247303321 |
|
Whitehouse D. J (David J.)
|
||
| London, : HPS, 2002 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Surfaces and their measurement [[electronic resource] /] / David Whitehouse
| Surfaces and their measurement [[electronic resource] /] / David Whitehouse |
| Autore | Whitehouse D. J (David J.) |
| Pubbl/distr/stampa | London, : HPS, 2002 |
| Descrizione fisica | 1 online resource (425 p.) |
| Disciplina |
620.110287
620.44 |
| Soggetto topico |
Surfaces (Technology) - Measurement
Civil engineering |
| ISBN |
1-281-07307-5
9786611073077 0-08-051823-0 1-4175-2668-8 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
Front Cover; Surfaces and their Measurement; Copyright Page; Contents; Foreword; Chapter 1. Introduction; 1.1 General; 1.2 What is surface metrology?; 1.3 Usefulness of surfaces; 1.4 Nature of surfaces; Chapter 2. Identification and separation of surface features; 2.1 Visualization; 2.2 Profiles and roughness - understanding the measurement routine; 2.3 Waviness; 2.4 Implementing the concept of sampling length; 2.5 The shape of the reference line; 2.6 Other methods; 2.7 Filtering and M system; 2.8 Conclusions; Chapter 3. Profile and areal (3D) parameter characterization; 3.1 Specification
3.2 Classification of parameters for the profile 3.3 Random process analysis; 3.4 Areal (3D) assessment; 3.5 Space frequency functions; 3.6 Comments on digital areal analysis; 3.7 Two-dimensional filtering (areal filtering); 3.8 Fractal surfaces; 3.9 Summary of characterization; Chapter 4. Surface metrology and manufacture; 4.1 Where and when to measure; 4.2 The process and surface finish; 4.3 Process control; 4.4 Relationship between surface metrology and manufacture; 4.5 Force and metrology loops; 4.6 Unit events and auto correlation; 4.7 Use of the power spectrum 4.8 Application of space frequency functions 4.9 Conclusions; Chapter 5. Function and surface texture; 5.1 Generic approach; 5.2 Some specific examples in tribology; 5.3 Surface models; 5.4 Summary of function; Chapter 6. Surface finish measurement - general; 6.1 Some quick ways of examining the surface; 6.2 Surface finish instrumentation; 6.3 Comments; Chapter 7. Stylus instruments; 7.1 The stylus; 7.2 Reference; 7.3 Use of skids; 7.4 Pick-up systems; 7.5 Stylus damage; 7.6 Stylus instrument usage; Chapter 8. Optical methods; 8.1 Optical path length; 8.2 Optical penetration 8.3 Resolution and depth of focus 8.4 Comparison between optical and stylus methods; 8.5 Gloss meters; 8.6 Total integrating sphere; 8.7 Diffractometer; 8.8 Interferometry; 8.9 Optical followers; 8.10 Heterodyne method; 8.11 Other optical methods; 8.12 Conclusions from the comparison of tactile and optical methods; Chapter 9. Scanning microscopes; 9.1 General; 9.2 Scanning microscopes; 9.3 Operation of the STM; 9.4 The atomic force microscope; 9.5 Scanning microscopes: conclusions; 9.6 Instruments 'horns of metrology' : conclusions; Chapter 10. Errors of form (excluding axes of rotation) 10.1 General statement 10.2 Straightness and related topics; 10.3 Measurement; 10.4 Assessment and classification of straightness; 10.5 Flatness; 10.6 Conclusions; Chapter 11. Roundness and related subjects; 11.1 General; 11.2 Direction of measurement; 11.3 Display of roundness; 11.4 Lobing; 11.5 Methods of measuring roundness; 11.6 Nature of the roundness signal; 11.7 Assessment of roundness; 11.8 Partial arc determination; 11.9 Other parameters; 11.10 Filtering for roundness; 11.11 Harmonic problems; 11.12 Alternatives to harmonic analysis; 11.13 Non-roundness parameters; 11.14 Conclusions Chapter 12. Cylindricity, sphericity |
| Record Nr. | UNINA-9910784635403321 |
|
Whitehouse D. J (David J.)
|
||
| London, : HPS, 2002 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Surfaces and their measurement / / David Whitehouse
| Surfaces and their measurement / / David Whitehouse |
| Autore | Whitehouse D. J (David J.) |
| Edizione | [1st ed.] |
| Pubbl/distr/stampa | London, : HPS, 2002 |
| Descrizione fisica | 1 online resource (425 p.) |
| Disciplina |
620.110287
620.44 |
| Soggetto topico |
Surfaces (Technology) - Measurement
Civil engineering |
| ISBN |
1-281-07307-5
9786611073077 0-08-051823-0 1-4175-2668-8 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
Front Cover; Surfaces and their Measurement; Copyright Page; Contents; Foreword; Chapter 1. Introduction; 1.1 General; 1.2 What is surface metrology?; 1.3 Usefulness of surfaces; 1.4 Nature of surfaces; Chapter 2. Identification and separation of surface features; 2.1 Visualization; 2.2 Profiles and roughness - understanding the measurement routine; 2.3 Waviness; 2.4 Implementing the concept of sampling length; 2.5 The shape of the reference line; 2.6 Other methods; 2.7 Filtering and M system; 2.8 Conclusions; Chapter 3. Profile and areal (3D) parameter characterization; 3.1 Specification
3.2 Classification of parameters for the profile 3.3 Random process analysis; 3.4 Areal (3D) assessment; 3.5 Space frequency functions; 3.6 Comments on digital areal analysis; 3.7 Two-dimensional filtering (areal filtering); 3.8 Fractal surfaces; 3.9 Summary of characterization; Chapter 4. Surface metrology and manufacture; 4.1 Where and when to measure; 4.2 The process and surface finish; 4.3 Process control; 4.4 Relationship between surface metrology and manufacture; 4.5 Force and metrology loops; 4.6 Unit events and auto correlation; 4.7 Use of the power spectrum 4.8 Application of space frequency functions 4.9 Conclusions; Chapter 5. Function and surface texture; 5.1 Generic approach; 5.2 Some specific examples in tribology; 5.3 Surface models; 5.4 Summary of function; Chapter 6. Surface finish measurement - general; 6.1 Some quick ways of examining the surface; 6.2 Surface finish instrumentation; 6.3 Comments; Chapter 7. Stylus instruments; 7.1 The stylus; 7.2 Reference; 7.3 Use of skids; 7.4 Pick-up systems; 7.5 Stylus damage; 7.6 Stylus instrument usage; Chapter 8. Optical methods; 8.1 Optical path length; 8.2 Optical penetration 8.3 Resolution and depth of focus 8.4 Comparison between optical and stylus methods; 8.5 Gloss meters; 8.6 Total integrating sphere; 8.7 Diffractometer; 8.8 Interferometry; 8.9 Optical followers; 8.10 Heterodyne method; 8.11 Other optical methods; 8.12 Conclusions from the comparison of tactile and optical methods; Chapter 9. Scanning microscopes; 9.1 General; 9.2 Scanning microscopes; 9.3 Operation of the STM; 9.4 The atomic force microscope; 9.5 Scanning microscopes: conclusions; 9.6 Instruments 'horns of metrology' : conclusions; Chapter 10. Errors of form (excluding axes of rotation) 10.1 General statement 10.2 Straightness and related topics; 10.3 Measurement; 10.4 Assessment and classification of straightness; 10.5 Flatness; 10.6 Conclusions; Chapter 11. Roundness and related subjects; 11.1 General; 11.2 Direction of measurement; 11.3 Display of roundness; 11.4 Lobing; 11.5 Methods of measuring roundness; 11.6 Nature of the roundness signal; 11.7 Assessment of roundness; 11.8 Partial arc determination; 11.9 Other parameters; 11.10 Filtering for roundness; 11.11 Harmonic problems; 11.12 Alternatives to harmonic analysis; 11.13 Non-roundness parameters; 11.14 Conclusions Chapter 12. Cylindricity, sphericity |
| Record Nr. | UNINA-9910808849103321 |
|
Whitehouse D. J (David J.)
|
||
| London, : HPS, 2002 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||