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VLSI test principles and architectures [[electronic resource] ] : design for testability / / edited by Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen
| VLSI test principles and architectures [[electronic resource] ] : design for testability / / edited by Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen |
| Edizione | [1st edition] |
| Pubbl/distr/stampa | Amsterdam ; ; Boston, : Elsevier Morgan Kaufmann Publishers, c2006 |
| Descrizione fisica | 1 online resource (809 p.) |
| Disciplina | 621.39/5 |
| Altri autori (Persone) |
WangLaung-Terng
WuCheng-Wen, EE Ph. D. WenXiaoqing |
| Collana | The Morgan Kaufmann series in systems on silicon |
| Soggetto topico |
Integrated circuits - Very large scale integration - Testing
Integrated circuits - Very large scale integration - Design |
| Soggetto genere / forma | Electronic books. |
| ISBN |
1-280-96684-X
9786610966844 0-08-047479-9 |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
Front cover; Title page; Copyright page; Table of contents; Preface; In the Classroom; Acknowledgments; Contributors; About the Editors; 1 Introduction; Importance of Testing; Testing During the VLSI Lifecycle; VLSI Development Process; Design Verification; Yield and Reject Rate; Electronic System Manufacturing Process; System-Level Operation; Challenges in VLSI Testing; Test Generation; Fault Models; Stuck-At Faults; Transistor Faults; Open and Short Faults; Delay Faults and Crosstalk; Pattern Sensitivity and Coupling Faults; Analog Fault Models; Levels of Abstraction in VLSI Testing
Register-Transfer Level and Behavioral Level Gate Level; Switch Level; Physical Level; Historical Review of VLSI Test Technology; Automatic Test Equipment; Automatic Test Pattern Generation; Fault Simulation; Digital Circuit Testing; Analog and Mixed-Signal Circuit Testing; Design for Testability; Board Testing; Boundary Scan Testing; Concluding Remarks; Exercises; Acknowledgments; References; 2 Design for Testability; Introduction; Testability Analysis; SCOAP Testability Analysis; Combinational Controllability and Observability Calculation Sequential Controllability and Observability Calculation Probability-Based Testability Analysis; Simulation-Based Testability Analysis; RTL Testability Analysis; Design for Testability Basics; Ad Hoc Approach; Test Point Insertion; Structured Approach; Scan Cell Designs; Muxed-D Scan Cell; Clocked-Scan Cell; LSSD Scan Cell; Scan Architectures; Full-Scan Design; Muxed-D Full-Scan Design; Clocked Full-Scan Design; LSSD Full-Scan Design; Partial-Scan Design; Random-Access Scan Design; Scan Design Rules; Tristate Buses; Bidirectional I/O Ports; Gated Clocks; Derived Clocks Combinational Feedback Loops Asynchronous Set/Reset Signals; Scan Design Flow; Scan Design Rule Checking and Repair; Scan Synthesis; Scan Configuration; Scan Replacement; Scan Reordering; Scan Stitching; Scan Extraction; Scan Verification; Verifying the Scan Shift Operation; Verifying the Scan Capture Operation; Scan Design Costs; Special-Purpose Scan Designs; Enhanced Scan; Snapshot Scan; Error-Resilient Scan; RTL Design for Testability; RTL Scan Design Rule Checking and Repair; RTL Scan Synthesis; RTL Scan Extraction and Scan Verification; Concluding Remarks; Exercises; Acknowledgments References 3 Logic and Fault Simulation; Introduction; Logic Simulation for Design Verification; Fault Simulation for Test and Diagnosis; Simulation Models; Gate-Level Network; Sequential Circuits; Logic Symbols; Unknown State u; High-Impedance State Z; Intermediate Logic States; Logic Element Evaluation; Truth Tables; Input Scanning; Input Counting; Parallel Gate Evaluation; Timing Models; Transport Delay; Inertial Delay; Wire Delay; Functional Element Delay Model; Logic Simulation; Compiled-Code Simulation; Logic Optimization; Logic Levelization; Code Generation; Event-Driven Simulation Nominal-Delay Event-Driven Simulation |
| Record Nr. | UNINA-9910458608703321 |
| Amsterdam ; ; Boston, : Elsevier Morgan Kaufmann Publishers, c2006 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
VLSI test principles and architectures [[electronic resource] ] : design for testability / / edited by Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen
| VLSI test principles and architectures [[electronic resource] ] : design for testability / / edited by Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen |
| Edizione | [1st edition] |
| Pubbl/distr/stampa | Amsterdam ; ; Boston, : Elsevier Morgan Kaufmann Publishers, c2006 |
| Descrizione fisica | 1 online resource (809 p.) |
| Disciplina | 621.39/5 |
| Altri autori (Persone) |
WangLaung-Terng
WuCheng-Wen, EE Ph. D. WenXiaoqing |
| Collana | The Morgan Kaufmann series in systems on silicon |
| Soggetto topico |
Integrated circuits - Very large scale integration - Testing
Integrated circuits - Very large scale integration - Design |
| ISBN |
1-280-96684-X
9786610966844 0-08-047479-9 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
Front cover; Title page; Copyright page; Table of contents; Preface; In the Classroom; Acknowledgments; Contributors; About the Editors; 1 Introduction; Importance of Testing; Testing During the VLSI Lifecycle; VLSI Development Process; Design Verification; Yield and Reject Rate; Electronic System Manufacturing Process; System-Level Operation; Challenges in VLSI Testing; Test Generation; Fault Models; Stuck-At Faults; Transistor Faults; Open and Short Faults; Delay Faults and Crosstalk; Pattern Sensitivity and Coupling Faults; Analog Fault Models; Levels of Abstraction in VLSI Testing
Register-Transfer Level and Behavioral Level Gate Level; Switch Level; Physical Level; Historical Review of VLSI Test Technology; Automatic Test Equipment; Automatic Test Pattern Generation; Fault Simulation; Digital Circuit Testing; Analog and Mixed-Signal Circuit Testing; Design for Testability; Board Testing; Boundary Scan Testing; Concluding Remarks; Exercises; Acknowledgments; References; 2 Design for Testability; Introduction; Testability Analysis; SCOAP Testability Analysis; Combinational Controllability and Observability Calculation Sequential Controllability and Observability Calculation Probability-Based Testability Analysis; Simulation-Based Testability Analysis; RTL Testability Analysis; Design for Testability Basics; Ad Hoc Approach; Test Point Insertion; Structured Approach; Scan Cell Designs; Muxed-D Scan Cell; Clocked-Scan Cell; LSSD Scan Cell; Scan Architectures; Full-Scan Design; Muxed-D Full-Scan Design; Clocked Full-Scan Design; LSSD Full-Scan Design; Partial-Scan Design; Random-Access Scan Design; Scan Design Rules; Tristate Buses; Bidirectional I/O Ports; Gated Clocks; Derived Clocks Combinational Feedback Loops Asynchronous Set/Reset Signals; Scan Design Flow; Scan Design Rule Checking and Repair; Scan Synthesis; Scan Configuration; Scan Replacement; Scan Reordering; Scan Stitching; Scan Extraction; Scan Verification; Verifying the Scan Shift Operation; Verifying the Scan Capture Operation; Scan Design Costs; Special-Purpose Scan Designs; Enhanced Scan; Snapshot Scan; Error-Resilient Scan; RTL Design for Testability; RTL Scan Design Rule Checking and Repair; RTL Scan Synthesis; RTL Scan Extraction and Scan Verification; Concluding Remarks; Exercises; Acknowledgments References 3 Logic and Fault Simulation; Introduction; Logic Simulation for Design Verification; Fault Simulation for Test and Diagnosis; Simulation Models; Gate-Level Network; Sequential Circuits; Logic Symbols; Unknown State u; High-Impedance State Z; Intermediate Logic States; Logic Element Evaluation; Truth Tables; Input Scanning; Input Counting; Parallel Gate Evaluation; Timing Models; Transport Delay; Inertial Delay; Wire Delay; Functional Element Delay Model; Logic Simulation; Compiled-Code Simulation; Logic Optimization; Logic Levelization; Code Generation; Event-Driven Simulation Nominal-Delay Event-Driven Simulation |
| Record Nr. | UNINA-9910784654603321 |
| Amsterdam ; ; Boston, : Elsevier Morgan Kaufmann Publishers, c2006 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
VLSI test principles and architectures [[electronic resource] ] : design for testability / / edited by Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen
| VLSI test principles and architectures [[electronic resource] ] : design for testability / / edited by Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen |
| Edizione | [1st edition] |
| Pubbl/distr/stampa | Amsterdam ; ; Boston, : Elsevier Morgan Kaufmann Publishers, c2006 |
| Descrizione fisica | 1 online resource (809 p.) |
| Disciplina | 621.39/5 |
| Altri autori (Persone) |
WangLaung-Terng
WuCheng-Wen, EE Ph. D. WenXiaoqing |
| Collana | The Morgan Kaufmann series in systems on silicon |
| Soggetto topico |
Integrated circuits - Very large scale integration - Testing
Integrated circuits - Very large scale integration - Design |
| ISBN |
1-280-96684-X
9786610966844 0-08-047479-9 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
Front cover; Title page; Copyright page; Table of contents; Preface; In the Classroom; Acknowledgments; Contributors; About the Editors; 1 Introduction; Importance of Testing; Testing During the VLSI Lifecycle; VLSI Development Process; Design Verification; Yield and Reject Rate; Electronic System Manufacturing Process; System-Level Operation; Challenges in VLSI Testing; Test Generation; Fault Models; Stuck-At Faults; Transistor Faults; Open and Short Faults; Delay Faults and Crosstalk; Pattern Sensitivity and Coupling Faults; Analog Fault Models; Levels of Abstraction in VLSI Testing
Register-Transfer Level and Behavioral Level Gate Level; Switch Level; Physical Level; Historical Review of VLSI Test Technology; Automatic Test Equipment; Automatic Test Pattern Generation; Fault Simulation; Digital Circuit Testing; Analog and Mixed-Signal Circuit Testing; Design for Testability; Board Testing; Boundary Scan Testing; Concluding Remarks; Exercises; Acknowledgments; References; 2 Design for Testability; Introduction; Testability Analysis; SCOAP Testability Analysis; Combinational Controllability and Observability Calculation Sequential Controllability and Observability Calculation Probability-Based Testability Analysis; Simulation-Based Testability Analysis; RTL Testability Analysis; Design for Testability Basics; Ad Hoc Approach; Test Point Insertion; Structured Approach; Scan Cell Designs; Muxed-D Scan Cell; Clocked-Scan Cell; LSSD Scan Cell; Scan Architectures; Full-Scan Design; Muxed-D Full-Scan Design; Clocked Full-Scan Design; LSSD Full-Scan Design; Partial-Scan Design; Random-Access Scan Design; Scan Design Rules; Tristate Buses; Bidirectional I/O Ports; Gated Clocks; Derived Clocks Combinational Feedback Loops Asynchronous Set/Reset Signals; Scan Design Flow; Scan Design Rule Checking and Repair; Scan Synthesis; Scan Configuration; Scan Replacement; Scan Reordering; Scan Stitching; Scan Extraction; Scan Verification; Verifying the Scan Shift Operation; Verifying the Scan Capture Operation; Scan Design Costs; Special-Purpose Scan Designs; Enhanced Scan; Snapshot Scan; Error-Resilient Scan; RTL Design for Testability; RTL Scan Design Rule Checking and Repair; RTL Scan Synthesis; RTL Scan Extraction and Scan Verification; Concluding Remarks; Exercises; Acknowledgments References 3 Logic and Fault Simulation; Introduction; Logic Simulation for Design Verification; Fault Simulation for Test and Diagnosis; Simulation Models; Gate-Level Network; Sequential Circuits; Logic Symbols; Unknown State u; High-Impedance State Z; Intermediate Logic States; Logic Element Evaluation; Truth Tables; Input Scanning; Input Counting; Parallel Gate Evaluation; Timing Models; Transport Delay; Inertial Delay; Wire Delay; Functional Element Delay Model; Logic Simulation; Compiled-Code Simulation; Logic Optimization; Logic Levelization; Code Generation; Event-Driven Simulation Nominal-Delay Event-Driven Simulation |
| Record Nr. | UNINA-9910822798703321 |
| Amsterdam ; ; Boston, : Elsevier Morgan Kaufmann Publishers, c2006 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||