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Polar Oxides [[electronic resource] ] : Properties, Characterization, and Imaging
| Polar Oxides [[electronic resource] ] : Properties, Characterization, and Imaging |
| Autore | Waser Rainer |
| Pubbl/distr/stampa | Hoboken, : Wiley, 2006 |
| Descrizione fisica | 1 online resource (391 p.) |
| Disciplina | 620.14 |
| Altri autori (Persone) |
BöttgerUlrich
TiedkeStephan |
| Soggetto topico |
Ceramic materials -- Congresses
Ceramic materials -- Defects -- Congresses Ceramic materials -- Effect of radiation on -- Congresses Heat-engines -- Materials -- Congresses Polar oxides Chemical & Materials Engineering Engineering & Applied Sciences Materials Science |
| Soggetto genere / forma | Electronic books. |
| ISBN |
1-280-52005-1
9786610520053 3-527-60465-0 3-527-60489-8 |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
Polar Oxides Properties, Characterization, and Imaging; Contents; Preface; 1 Dielectric Properties of Polar Oxides; 1.1 Introduction; 1.2 Dielectric polarization; 1.2.1 Macroscopic and microscopic view; 1.2.2 Mechanisms of polarization; 1.3 Ferroelectric polarization; 1.4 Theory of Ferroelectric Phase Transition; 1.4.1 Ginzburg-Landau Theory; 1.4.2 Soft Mode Concept; 1.5 Ferroelectric Materials; 1.5.1 Basic Compositions; 1.5.2 Grain Size effects; 1.5.3 Influence of Substitutes and Dopants; 1.6 Ferroelectric Domains; 1.6.1 Reversible and Irreversible Polarization Contributions
1.6.2 Ferroelectric SwitchingBibliography; 2 Piezoelectric Characterization; 2.1 Important piezoelectric constants; 2.2 Measurements in bulk materials; 2.3 Measurements in thin films; 2.4 Conclusions; Bibliography; 3 Electrical Characterization of Ferroelectrics; 3.1 Introduction; 3.2 Measurement methods; 3.2.1 Sawyer Tower method; 3.2.2 Shunt method; 3.2.3 Virtual ground method; 3.2.4 Current step method; 3.3 Measurement types; 3.3.1 Hysteresis loop and characteristic values; 3.3.2 Dynamic hysteresis measurement; 3.3.3 Pulse measurement; 3.3.4 Static hysteresis measurement 3.3.5 Leakage measurement3.3.6 Fatigue measurement; 3.3.7 Imprint measurement; 3.3.8 Retention measurement; 3.3.9 Small signal measurements; Bibliography; 4 Optical Characterization of Ferroelectric Materials; 4.1 Introduction: Light propagation within anisotropic crystals; 4.1.1 Huyghens's construction for uniaxial crystals; 4.1.2 The uniaxial indicatrix; 4.1.3 The biaxial indicatrix; 4.2 The electro-optic effect; 4.2.1 Ferroelectrics have anisotropic electronic bonds: Birefringence; 4.2.2 Applied fields change the optical pathlength: Phase modulators 4.2.3 Optical waveguides improve the device efficiency4.3 Non-linear optics; 4.3.1 Nonlinear optical media; 4.3.2 The nonlinear wave equation; 4.3.3 Second order nonlinear optics; Bibliography; 5 Microwave Properties and Measurement Techniques; 5.1 Introduction; 5.2 Basic relations defining microwave properties of dielectrics and normal/superconducting metals; 5.3 Surface impedance of normal metals; 5.4 Surface impedance of high-temperature superconductor films; 5.5 Microwave properties of dielectric single crystals, ceramics and thin films 5.6 General remarks about microwave material measurements5.7 Non resonant microwave measurement techniques; 5.8 Resonator measurement techniques; 5.9 Conclusions; Bibliography; 6 Advanced X-ray Analysis of Ferroelectrics; 6.1 Introduction; 6.2 Experimental; 6.2.1 X-ray diffractometer; 6.2.2 Method of X-ray diffraction; 6.2.3 Sample preparation; 6.3 Results and discussion; 6.3.1 Structural characterization of PZT 52/48 thin film; 6.3.2 Distinguishing SBTN phase from fluorite-SBTN phase; 6.3.3 Grazing incidence X-ray diffraction study on PZT 52/48 thin films; 6.4 Conclusions; Bibliography 7 Characterization of PZT-Ceramics by High-Resolution X-Ray Analysis |
| Record Nr. | UNINA-9910144593803321 |
Waser Rainer
|
||
| Hoboken, : Wiley, 2006 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Polar Oxides [[electronic resource] ] : Properties, Characterization, and Imaging
| Polar Oxides [[electronic resource] ] : Properties, Characterization, and Imaging |
| Autore | Waser Rainer |
| Pubbl/distr/stampa | Hoboken, : Wiley, 2006 |
| Descrizione fisica | 1 online resource (391 p.) |
| Disciplina | 620.14 |
| Altri autori (Persone) |
BöttgerUlrich
TiedkeStephan |
| Soggetto topico |
Ceramic materials -- Congresses
Ceramic materials -- Defects -- Congresses Ceramic materials -- Effect of radiation on -- Congresses Heat-engines -- Materials -- Congresses Polar oxides Chemical & Materials Engineering Engineering & Applied Sciences Materials Science |
| ISBN |
1-280-52005-1
9786610520053 3-527-60465-0 3-527-60489-8 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
Polar Oxides Properties, Characterization, and Imaging; Contents; Preface; 1 Dielectric Properties of Polar Oxides; 1.1 Introduction; 1.2 Dielectric polarization; 1.2.1 Macroscopic and microscopic view; 1.2.2 Mechanisms of polarization; 1.3 Ferroelectric polarization; 1.4 Theory of Ferroelectric Phase Transition; 1.4.1 Ginzburg-Landau Theory; 1.4.2 Soft Mode Concept; 1.5 Ferroelectric Materials; 1.5.1 Basic Compositions; 1.5.2 Grain Size effects; 1.5.3 Influence of Substitutes and Dopants; 1.6 Ferroelectric Domains; 1.6.1 Reversible and Irreversible Polarization Contributions
1.6.2 Ferroelectric SwitchingBibliography; 2 Piezoelectric Characterization; 2.1 Important piezoelectric constants; 2.2 Measurements in bulk materials; 2.3 Measurements in thin films; 2.4 Conclusions; Bibliography; 3 Electrical Characterization of Ferroelectrics; 3.1 Introduction; 3.2 Measurement methods; 3.2.1 Sawyer Tower method; 3.2.2 Shunt method; 3.2.3 Virtual ground method; 3.2.4 Current step method; 3.3 Measurement types; 3.3.1 Hysteresis loop and characteristic values; 3.3.2 Dynamic hysteresis measurement; 3.3.3 Pulse measurement; 3.3.4 Static hysteresis measurement 3.3.5 Leakage measurement3.3.6 Fatigue measurement; 3.3.7 Imprint measurement; 3.3.8 Retention measurement; 3.3.9 Small signal measurements; Bibliography; 4 Optical Characterization of Ferroelectric Materials; 4.1 Introduction: Light propagation within anisotropic crystals; 4.1.1 Huyghens's construction for uniaxial crystals; 4.1.2 The uniaxial indicatrix; 4.1.3 The biaxial indicatrix; 4.2 The electro-optic effect; 4.2.1 Ferroelectrics have anisotropic electronic bonds: Birefringence; 4.2.2 Applied fields change the optical pathlength: Phase modulators 4.2.3 Optical waveguides improve the device efficiency4.3 Non-linear optics; 4.3.1 Nonlinear optical media; 4.3.2 The nonlinear wave equation; 4.3.3 Second order nonlinear optics; Bibliography; 5 Microwave Properties and Measurement Techniques; 5.1 Introduction; 5.2 Basic relations defining microwave properties of dielectrics and normal/superconducting metals; 5.3 Surface impedance of normal metals; 5.4 Surface impedance of high-temperature superconductor films; 5.5 Microwave properties of dielectric single crystals, ceramics and thin films 5.6 General remarks about microwave material measurements5.7 Non resonant microwave measurement techniques; 5.8 Resonator measurement techniques; 5.9 Conclusions; Bibliography; 6 Advanced X-ray Analysis of Ferroelectrics; 6.1 Introduction; 6.2 Experimental; 6.2.1 X-ray diffractometer; 6.2.2 Method of X-ray diffraction; 6.2.3 Sample preparation; 6.3 Results and discussion; 6.3.1 Structural characterization of PZT 52/48 thin film; 6.3.2 Distinguishing SBTN phase from fluorite-SBTN phase; 6.3.3 Grazing incidence X-ray diffraction study on PZT 52/48 thin films; 6.4 Conclusions; Bibliography 7 Characterization of PZT-Ceramics by High-Resolution X-Ray Analysis |
| Record Nr. | UNINA-9910830364003321 |
|
Waser Rainer
|
||
| Hoboken, : Wiley, 2006 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||