Lock-in Thermography : Basics and Use for Evaluating Electronic Devices and Materials / / by Otwin Breitenstein, Wilhelm Warta, Martin C. Schubert

• Autore: Breitenstein Otwin
• Pubblicazione: Cham : , : Springer International Publishing : , : Imprint : Springer, , 2018
• Edizione: 3rd ed. 2018.
• Descrizione fisica: 1 online resource (339 pages)
• Disciplina: 621.381
• Soggetto topico: Lasers; Photonics; Materials science; Microwaves; Optical engineering; Structural materials; Optics, Lasers, Photonics, Optical Devices; Characterization and Evaluation of Materials; Microwaves, RF and Optical Engineering; Structural Materials
• Persona (resp. second.): WartaWilhelm; SchubertMartin C
• Nota di contenuto: Introduction -- Physical and Technical Basics -- Experimental Technique -- Theory -- Measurement Strategies -- Typical Applications -- Summary and Outlook. .
• Sommario/riassunto: This book discusses lock-in thermography (LIT) as a dynamic variant of the widely known IR thermography. It focuses on applications to electronic devices and materials, but also includes chapters addressing non-destructive evaluation. Periodically modulating heat sources allows a much-improved signal-to-noise ratio (up to 1000x) and a far better lateral resolution compared to steady-state thermography. Reviewing various experimental approaches to LIT, particularly the commercial LIT systems available, this 3rd edition introduces new LIT applications, such as illuminated LIT applied to solar cells, non-thermal LIT lifetime mapping and LIT application to spin caloritronics problems. Numerous LIT investigation case studies are also included.
• Titolo autorizzato: Lock-in Thermography
• ISBN: 3-319-99825-0
• Formato: Materiale a stampa
• Livello bibliografico: Monografia
• Lingua di pubblicazione: Inglese
• Record Nr.: 9910309664103321
• Lo trovi qui: Univ. Federico II
• Serie: Springer Series in Advanced Microelectronics, . 1437-0387 ; ; 10