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AFM-Based Observation and Robotic Nano-manipulation / / by Shuai Yuan, Lianqing Liu, Zhidong Wang, Ning Xi
| AFM-Based Observation and Robotic Nano-manipulation / / by Shuai Yuan, Lianqing Liu, Zhidong Wang, Ning Xi |
| Autore | Yuan Shuai |
| Edizione | [1st ed. 2020.] |
| Pubbl/distr/stampa | Singapore : , : Springer Singapore : , : Imprint : Springer, , 2020 |
| Descrizione fisica | 1 online resource (XII, 184 p. 135 illus., 104 illus. in color.) |
| Disciplina | 620.5 |
| Soggetto topico |
Materials science
Nanotechnology Nanoscience Nanostructures Characterization and Evaluation of Materials Nanotechnology and Microengineering Nanoscale Science and Technology |
| ISBN | 981-15-0508-X |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | Introduction -- Robotics based AFM Nano-manipulation -- AFM Image Reconstruction using Thermal-drift Compensation Model -- Tip Model based AFM Image Reconstruction -- Stochastic Approach based Tip Localization -- Path Planning of Nano-robot using Probability Distribution Region -- Nano-manipulation Platform based on AFM. |
| Record Nr. | UNINA-9910380734303321 |
Yuan Shuai
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| Singapore : , : Springer Singapore : , : Imprint : Springer, , 2020 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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NANOFIM 2018 : 2018 Nanotechnology for Instrumentation and Measurement : proceedings : 7-8 November 2018, Mexico City, Mexico / / edited by Hiram Ponce, Ramiro Velázquez, Zhidong Wang ; sponsored by Institute of Electrical and Electronics Engineers
| NANOFIM 2018 : 2018 Nanotechnology for Instrumentation and Measurement : proceedings : 7-8 November 2018, Mexico City, Mexico / / edited by Hiram Ponce, Ramiro Velázquez, Zhidong Wang ; sponsored by Institute of Electrical and Electronics Engineers |
| Pubbl/distr/stampa | Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers, , 2018 |
| Descrizione fisica | 1 online resource (611 pages) |
| Disciplina | 620.5 |
| Soggetto topico |
Nanotechnology
Engineering instruments |
| ISBN | 1-5386-9161-2 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910318348903321 |
| Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers, , 2018 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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NANOFIM 2018 : 2018 Nanotechnology for Instrumentation and Measurement : proceedings : 7-8 November 2018, Mexico City, Mexico / / edited by Hiram Ponce, Ramiro Velázquez, Zhidong Wang ; sponsored by Institute of Electrical and Electronics Engineers
| NANOFIM 2018 : 2018 Nanotechnology for Instrumentation and Measurement : proceedings : 7-8 November 2018, Mexico City, Mexico / / edited by Hiram Ponce, Ramiro Velázquez, Zhidong Wang ; sponsored by Institute of Electrical and Electronics Engineers |
| Pubbl/distr/stampa | Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers, , 2018 |
| Descrizione fisica | 1 online resource (611 pages) |
| Disciplina | 620.5 |
| Soggetto topico |
Nanotechnology
Engineering instruments |
| ISBN | 1-5386-9161-2 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996577918903316 |
| Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers, , 2018 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
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