Attosecond and XUV physics : ultrafast dynamics and spectroscopy / / edited by Thomas Schultz, Marc Vrakking |
Pubbl/distr/stampa | Weinheim an der Bergstrasse, Germany : , : Wiley-VCH, , 2014 |
Descrizione fisica | 1 online resource (625 p.) |
Disciplina | 535.844 |
Altri autori (Persone) |
VrakkingMarc
SchultzThomas |
Soggetto topico |
Ultraviolet spectroscopy
Ultraviolet spectra Laser spectroscopy |
ISBN |
3-527-67768-2
3-527-67765-8 3-527-67767-4 |
Formato | Materiale a stampa |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Nota di contenuto |
Cover; Titlepage; Copyright; Contents; List of Contributors; 1 Attosecond and XUV Physics: Ultrafast Dynamics and Spectroscopy; 1.1 Introduction; 1.2 The Emergence of Attosecond Science; 1.2.1 Attosecond Pulse Trains and Isolated Attosecond Pulses; 1.2.2 Characterization of Attosecond Laser Pulses; 1.2.3 Experimental Challenges in Attosecond Science; 1.2.4 Attosecond Science as a Driver for Technological Developments; 1.3 Applications of Attosecond Laser Pulses; 1.4 Ultrafast Science Using XUV/X-ray Free Electron Lasers; 1.5 The Interplay between Experiment and Theory
1.6 Conclusion and OutlookReferences; Part One Laser Techniques; 2 Ultrafast Laser Oscillators and Amplifiers; 2.1 Introduction; 2.2 Mode-Locking and Few-Cycle Pulse Generation; 2.3 High-Energy Oscillators; 2.4 Laser Amplifiers; References; 3 Ultrashort Pulse Characterization; 3.1 Motivation: Why Ultrafast Metrology?; 3.1.1 Ultrafast Science: High-Speed Photography in the Extreme; 3.2 Formal Description of Ultrashort Pulses; 3.2.1 Sampling Theorem; 3.2.2 Chronocyclic Representation of Ultrafast Pulses; 3.2.3 Space-Time Coupling; 3.2.4 Accuracy, Precision and Consistency 3.3 Linear Filter Analysis3.4 Ultrafast Metrology in the Visible to Infrared; 3.4.1 Temporal Correlations; 3.4.2 Spectrography; 3.4.3 Sonography; 3.4.4 Tomography; 3.4.5 Interferometry; 3.5 Ultrafast Metrology in the Extreme Ultraviolet; 3.5.1 Complete Characterization of Ultrashort XUV Pulses via Photoionization Spectroscopy; 3.5.2 XUV Interferometry; 3.6 Summary; References; 4 Carrier Envelope Phase Stabilization; 4.1 Introduction; 4.2 CEP Fundamentals; 4.2.1 Time Domain Representation; 4.2.2 Frequency Domain Representation; 4.3 Stabilization Loop Fundamentals; 4.3.1 The Noisy Source 4.3.2 Noise Detection4.3.3 Open-Loop Noise Analysis; 4.3.4 Feedback; 4.3.5 Closed-Loop Noise Analysis; 4.4 CEP in Oscillators; 4.4.1 Oscillators Peculiarities; 4.4.2 CEP Detection; 4.4.3 Actuation; 4.5 CEP in Amplifiers; 4.5.1 Amplifier Peculiarities; 4.5.2 CEP Detection; 4.5.3 Actuation; 4.5.4 Feedback Results; 4.5.5 Parametric Amplification; 4.6 Conclusion; References; 5 Towards Tabletop X-Ray Lasers; 5.1 Context and Objectives; 5.2 Choice of Plasma-Based Soft X-Ray Amplifier; 5.2.1 Basic Aspects of High Harmonic Amplification; 5.2.2 Basic Aspects of Plasma Amplifiers 5.3 2D Fluid Modeling and 3D Ray Trace5.3.1 ARWEN Code; 5.3.2 Model to Obtain 2D Maps of Atomic Data; 5.4 The Bloch-Maxwell Treatment; 5.5 Stretched Seed Amplification; 5.6 Conclusion; References; Part Two Theoretical Methods; 6 Ionization in Strong Low-Frequency Fields; 6.1 Preliminaries; 6.2 Speculative Thoughts; 6.3 Basic Formalism; 6.3.1 Hamiltonians and Gauges; 6.3.2 Formal Solutions; 6.4 The Strong-Field Approximation; 6.4.1 The Volkov Propagator and the Classical Connection; 6.4.2 Transition Amplitudes in the SFA; 6.5 Strong-Field Ionization: Exponential vs. Power Law 6.5.1 The Saddle Point Approximation and the Classical Connection |
Record Nr. | UNINA-9910139018703321 |
Weinheim an der Bergstrasse, Germany : , : Wiley-VCH, , 2014 | ||
Materiale a stampa | ||
Lo trovi qui: Univ. Federico II | ||
|
Attosecond and XUV physics : ultrafast dynamics and spectroscopy / / edited by Thomas Schultz, Marc Vrakking |
Pubbl/distr/stampa | Weinheim an der Bergstrasse, Germany : , : Wiley-VCH, , 2014 |
Descrizione fisica | 1 online resource (625 p.) |
Disciplina | 535.844 |
Altri autori (Persone) |
VrakkingMarc
SchultzThomas |
Soggetto topico |
Ultraviolet spectroscopy
Ultraviolet spectra Laser spectroscopy |
ISBN |
3-527-67768-2
3-527-67765-8 3-527-67767-4 |
Formato | Materiale a stampa |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Nota di contenuto |
Cover; Titlepage; Copyright; Contents; List of Contributors; 1 Attosecond and XUV Physics: Ultrafast Dynamics and Spectroscopy; 1.1 Introduction; 1.2 The Emergence of Attosecond Science; 1.2.1 Attosecond Pulse Trains and Isolated Attosecond Pulses; 1.2.2 Characterization of Attosecond Laser Pulses; 1.2.3 Experimental Challenges in Attosecond Science; 1.2.4 Attosecond Science as a Driver for Technological Developments; 1.3 Applications of Attosecond Laser Pulses; 1.4 Ultrafast Science Using XUV/X-ray Free Electron Lasers; 1.5 The Interplay between Experiment and Theory
1.6 Conclusion and OutlookReferences; Part One Laser Techniques; 2 Ultrafast Laser Oscillators and Amplifiers; 2.1 Introduction; 2.2 Mode-Locking and Few-Cycle Pulse Generation; 2.3 High-Energy Oscillators; 2.4 Laser Amplifiers; References; 3 Ultrashort Pulse Characterization; 3.1 Motivation: Why Ultrafast Metrology?; 3.1.1 Ultrafast Science: High-Speed Photography in the Extreme; 3.2 Formal Description of Ultrashort Pulses; 3.2.1 Sampling Theorem; 3.2.2 Chronocyclic Representation of Ultrafast Pulses; 3.2.3 Space-Time Coupling; 3.2.4 Accuracy, Precision and Consistency 3.3 Linear Filter Analysis3.4 Ultrafast Metrology in the Visible to Infrared; 3.4.1 Temporal Correlations; 3.4.2 Spectrography; 3.4.3 Sonography; 3.4.4 Tomography; 3.4.5 Interferometry; 3.5 Ultrafast Metrology in the Extreme Ultraviolet; 3.5.1 Complete Characterization of Ultrashort XUV Pulses via Photoionization Spectroscopy; 3.5.2 XUV Interferometry; 3.6 Summary; References; 4 Carrier Envelope Phase Stabilization; 4.1 Introduction; 4.2 CEP Fundamentals; 4.2.1 Time Domain Representation; 4.2.2 Frequency Domain Representation; 4.3 Stabilization Loop Fundamentals; 4.3.1 The Noisy Source 4.3.2 Noise Detection4.3.3 Open-Loop Noise Analysis; 4.3.4 Feedback; 4.3.5 Closed-Loop Noise Analysis; 4.4 CEP in Oscillators; 4.4.1 Oscillators Peculiarities; 4.4.2 CEP Detection; 4.4.3 Actuation; 4.5 CEP in Amplifiers; 4.5.1 Amplifier Peculiarities; 4.5.2 CEP Detection; 4.5.3 Actuation; 4.5.4 Feedback Results; 4.5.5 Parametric Amplification; 4.6 Conclusion; References; 5 Towards Tabletop X-Ray Lasers; 5.1 Context and Objectives; 5.2 Choice of Plasma-Based Soft X-Ray Amplifier; 5.2.1 Basic Aspects of High Harmonic Amplification; 5.2.2 Basic Aspects of Plasma Amplifiers 5.3 2D Fluid Modeling and 3D Ray Trace5.3.1 ARWEN Code; 5.3.2 Model to Obtain 2D Maps of Atomic Data; 5.4 The Bloch-Maxwell Treatment; 5.5 Stretched Seed Amplification; 5.6 Conclusion; References; Part Two Theoretical Methods; 6 Ionization in Strong Low-Frequency Fields; 6.1 Preliminaries; 6.2 Speculative Thoughts; 6.3 Basic Formalism; 6.3.1 Hamiltonians and Gauges; 6.3.2 Formal Solutions; 6.4 The Strong-Field Approximation; 6.4.1 The Volkov Propagator and the Classical Connection; 6.4.2 Transition Amplitudes in the SFA; 6.5 Strong-Field Ionization: Exponential vs. Power Law 6.5.1 The Saddle Point Approximation and the Classical Connection |
Record Nr. | UNINA-9910815516703321 |
Weinheim an der Bergstrasse, Germany : , : Wiley-VCH, , 2014 | ||
Materiale a stampa | ||
Lo trovi qui: Univ. Federico II | ||
|