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Statistical Modeling for Degradation Data / / edited by Ding-Geng (Din) Chen, Yuhlong Lio, Hon Keung Tony Ng, Tzong-Ru Tsai
| Statistical Modeling for Degradation Data / / edited by Ding-Geng (Din) Chen, Yuhlong Lio, Hon Keung Tony Ng, Tzong-Ru Tsai |
| Edizione | [1st ed. 2017.] |
| Pubbl/distr/stampa | Singapore : , : Springer Singapore : , : Imprint : Springer, , 2017 |
| Descrizione fisica | 1 online resource (XVIII, 376 p. 109 illus., 67 illus. in color.) |
| Disciplina | 519.5 |
| Collana | ICSA Book Series in Statistics |
| Soggetto topico |
Statistics
Statistical Theory and Methods Statistics for Business, Management, Economics, Finance, Insurance |
| ISBN | 981-10-5194-1 |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | I. Review and Theoretical Framework -- Chapter 1: Stochastic Accelerated Degradation Models Based on a Generalized Cumu-lative Damage Approach -- Chapter 2: Hierarchical Bayesian Change-Point Analysis for Nonlinear Degradation Data -- Chapter 3: Degradation Modeling, Analysis, and Applications on Residual Life Predic-tion -- Chapter 4: On Some Shock Models with Poisson and Generalized Poisson Shock Processes -- Chapter 5: Degradation Based Reliability Modeling and Assessment of Complex Systems in Dynamic Environments -- Chapter 6: A Survey of the Modeling and Applications on Non-Destructive and De-structive Degradation Tests -- II. Modeling and Experimental Designs -- Chapter 7: Degradation Test Plan for a Nonlinear Random-Coefficients Model -- Chapter 8: Optimal Designs for LED Degradation Modeling -- Chapter 9: Gamma Degradation Models: Inferences and Optimal Designs -- Chapter 10: Model Misspecification analysis of Inverse Gaussian and Gamma Degrada-tion Processes -- III. Applications -- Chapter 11: Practical Application of Fréchet Shock-Degradation Models for System Failures -- Chapter 12: Statistical Methods for Thermal Index Estimation Based on Accelerated Destructive Degradation Test Data -- Chapter 13: Inference on Remaining Useful Life Under Gamma Degradation Models with Random effects.-- Chapter 14: ADDT: An R Package for Analysis of Accelerated Destructive Degradation Test Data -- Chapter 15: Modeling and Inference of CD4 Data. . |
| Record Nr. | UNINA-9910254306703321 |
| Singapore : , : Springer Singapore : , : Imprint : Springer, , 2017 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Statistical Quality Technologies : Theory and Practice / / edited by Yuhlong Lio, Hon Keung Tony Ng, Tzong-Ru Tsai, Ding-Geng Chen
| Statistical Quality Technologies : Theory and Practice / / edited by Yuhlong Lio, Hon Keung Tony Ng, Tzong-Ru Tsai, Ding-Geng Chen |
| Edizione | [1st ed. 2019.] |
| Pubbl/distr/stampa | Cham : , : Springer International Publishing : , : Imprint : Springer, , 2019 |
| Descrizione fisica | 1 online resource (409 pages) |
| Disciplina | 519.5 |
| Collana | ICSA Book Series in Statistics |
| Soggetto topico |
Statistics
Statistics for Engineering, Physics, Computer Science, Chemistry and Earth Sciences Statistics for Life Sciences, Medicine, Health Sciences Statistics for Business, Management, Economics, Finance, Insurance |
| ISBN | 3-030-20709-9 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | Part I. Statistical Process Control -- Chapter 1. Some Recent Studies in Statistical Process Control -- Chapter 2. Statistical Quality Control And Reliability Analysis Using the Birnbaum-Saunders Distribution with Industrial Applications -- Chapter 3. Statistical System Monitoring (SSM) for Enterprise-Level Quality Control -- Chapter 4. Enhanced Cumulative Sum Charts based on Ranked Set Sampling -- Chapter 5. A Survey of Control Charts for Simple Linear Profile Processes with Authcorrelation -- Chapter 6. Sequential Monitoring of Circular processes related to the von Mises Distribution -- Part II. Acceptance Sampling Plans -- Chapter 7. Time Truncated Life Test Using the Generalized Multiple Dependent State Sampling plans for Various Life Distributions -- Chapter 8. Decision Theoretic Sampling Plan for One-parameter Exponential Distribution under Type-I and Type-I Hybrid Censoring Schemes -- Chapter 9. Economical Sampling Plans with Warranty -- Chapter 10. Design of Reliability Acceptance Sampling Plans under Partially Accelerated Life Test -- Part III. Reliability Testing and Designs. Chapter 11. Bayesian Sequential Design Based on Dual Objectives for Accelerated Life Tests -- Chapter 12. The Stress-strength Models for the Proportional Hazards Family and Proportional Reverse Hazards Family -- Chapter 13. A Degradation Based on the Wiener Process Assuming non-normal Distributed Measurement Errors -- Chapter 14. An Introduction of Generalized Linear Model Approach to Accelerated Life Test Planning with Type-I Censoring -- Chapter 15. Robust Design in the Case of Data Contamination and Model Departure -- Chapter 16. Defects Driven Yield and Reliability Modeling for Semiconductor Manufacturing. |
| Record Nr. | UNINA-9910349322603321 |
| Cham : , : Springer International Publishing : , : Imprint : Springer, , 2019 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||