The IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems : proceedings : Chicago, Illinois, 7-9 October 2009 / / edited by Dimitris Gizopoulos, Mohammad Tehranipoor, and Spyros Tragoudas ; sponsored by the IEEE Computer Society Technical Committee on Fault-Tolerant Computing, the IEEE Test Technology Technical Council |
Pubbl/distr/stampa | New York : , : IEEE, , 2009 |
Descrizione fisica | 1 online resource (xxxi, 455 pages) |
Soggetto topico |
Fault-tolerant computing
Integrated circuits - Very large scale integration - Design and construction |
ISBN | 1-5090-7533-X |
Formato | Materiale a stampa ![]() |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Record Nr. | UNISA-996203025203316 |
New York : , : IEEE, , 2009 | ||
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Lo trovi qui: Univ. di Salerno | ||
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The IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems : proceedings : Chicago, Illinois, 7-9 October 2009 / / edited by Dimitris Gizopoulos, Mohammad Tehranipoor, and Spyros Tragoudas ; sponsored by the IEEE Computer Society Technical Committee on Fault-Tolerant Computing, the IEEE Test Technology Technical Council |
Pubbl/distr/stampa | New York : , : IEEE, , 2009 |
Descrizione fisica | 1 online resource (xxxi, 455 pages) |
Soggetto topico |
Fault-tolerant computing
Integrated circuits - Very large scale integration - Design and construction |
ISBN | 1-5090-7533-X |
Formato | Materiale a stampa ![]() |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Record Nr. | UNINA-9910138783103321 |
New York : , : IEEE, , 2009 | ||
![]() | ||
Lo trovi qui: Univ. Federico II | ||
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