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The IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems : proceedings : Chicago, Illinois, 7-9 October 2009 / / edited by Dimitris Gizopoulos, Mohammad Tehranipoor, and Spyros Tragoudas ; sponsored by the IEEE Computer Society Technical Committee on Fault-Tolerant Computing, the IEEE Test Technology Technical Council
The IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems : proceedings : Chicago, Illinois, 7-9 October 2009 / / edited by Dimitris Gizopoulos, Mohammad Tehranipoor, and Spyros Tragoudas ; sponsored by the IEEE Computer Society Technical Committee on Fault-Tolerant Computing, the IEEE Test Technology Technical Council
Pubbl/distr/stampa New York : , : IEEE, , 2009
Descrizione fisica 1 online resource (xxxi, 455 pages)
Soggetto topico Fault-tolerant computing
Integrated circuits - Very large scale integration - Design and construction
ISBN 1-5090-7533-X
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNISA-996203025203316
New York : , : IEEE, , 2009
Materiale a stampa
Lo trovi qui: Univ. di Salerno
Opac: Controlla la disponibilità qui
The IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems : proceedings : Chicago, Illinois, 7-9 October 2009 / / edited by Dimitris Gizopoulos, Mohammad Tehranipoor, and Spyros Tragoudas ; sponsored by the IEEE Computer Society Technical Committee on Fault-Tolerant Computing, the IEEE Test Technology Technical Council
The IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems : proceedings : Chicago, Illinois, 7-9 October 2009 / / edited by Dimitris Gizopoulos, Mohammad Tehranipoor, and Spyros Tragoudas ; sponsored by the IEEE Computer Society Technical Committee on Fault-Tolerant Computing, the IEEE Test Technology Technical Council
Pubbl/distr/stampa New York : , : IEEE, , 2009
Descrizione fisica 1 online resource (xxxi, 455 pages)
Soggetto topico Fault-tolerant computing
Integrated circuits - Very large scale integration - Design and construction
ISBN 1-5090-7533-X
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNINA-9910138783103321
New York : , : IEEE, , 2009
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui