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The 23rd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems : proceedings : Boston, Massachusetts, 1-3 October 2008 / / edited by Cristiana Bolchini, Yong-Bin Kim, Dimitris Gizopoulos, and Mohammad Tehranipoor ; sponsored by The IEEE Computer Society Test Technology Technical Council, The IEEE Computer Society Technical Committee on Fault Tolerant Computing
| The 23rd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems : proceedings : Boston, Massachusetts, 1-3 October 2008 / / edited by Cristiana Bolchini, Yong-Bin Kim, Dimitris Gizopoulos, and Mohammad Tehranipoor ; sponsored by The IEEE Computer Society Test Technology Technical Council, The IEEE Computer Society Technical Committee on Fault Tolerant Computing |
| Pubbl/distr/stampa | New York : , : IEEE, , 2008 |
| Descrizione fisica | 1 online resource (xxxi, 545 pages) |
| Soggetto topico |
Integrated circuits - Very large scale integration - Design and construction
Fault-tolerant computing |
| ISBN | 1-5090-8441-X |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996216505403316 |
| New York : , : IEEE, , 2008 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
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The 23rd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems : proceedings : Boston, Massachusetts, 1-3 October 2008 / / edited by Cristiana Bolchini, Yong-Bin Kim, Dimitris Gizopoulos, and Mohammad Tehranipoor ; sponsored by The IEEE Computer Society Test Technology Technical Council, The IEEE Computer Society Technical Committee on Fault Tolerant Computing
| The 23rd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems : proceedings : Boston, Massachusetts, 1-3 October 2008 / / edited by Cristiana Bolchini, Yong-Bin Kim, Dimitris Gizopoulos, and Mohammad Tehranipoor ; sponsored by The IEEE Computer Society Test Technology Technical Council, The IEEE Computer Society Technical Committee on Fault Tolerant Computing |
| Pubbl/distr/stampa | New York : , : IEEE, , 2008 |
| Descrizione fisica | 1 online resource (xxxi, 545 pages) |
| Soggetto topico |
Integrated circuits - Very large scale integration - Design and construction
Fault-tolerant computing |
| ISBN | 1-5090-8441-X |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910145668103321 |
| New York : , : IEEE, , 2008 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Emerging topics in hardware security / / Mark Tehranipoor, editor
| Emerging topics in hardware security / / Mark Tehranipoor, editor |
| Pubbl/distr/stampa | Cham, Switzerland : , : Springer, , [2021] |
| Descrizione fisica | 1 online resource (614 pages) |
| Disciplina | 621.3815 |
| Soggetto topico |
Electronic circuits
Computer engineering Internet of things |
| ISBN | 3-030-64448-0 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910483545503321 |
| Cham, Switzerland : , : Springer, , [2021] | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Hardware security : a hands-on learning approach / / Swarup Bhunia, Mark Tehranipoor
| Hardware security : a hands-on learning approach / / Swarup Bhunia, Mark Tehranipoor |
| Autore | Bhunia Swarup |
| Pubbl/distr/stampa | Cambridge, Massachusetts : , : Morgan Kaufmann Publishers, , [2019] |
| Descrizione fisica | 1 online resource (528 pages) |
| Disciplina | 005.8 |
| Soggetto topico | Computer security |
| ISBN |
0-12-812478-4
0-12-812477-6 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | Part 1: Background on Electronic Hardware -- Part 2: Hardware Attacks: Analysis, Examples, and Threat Models -- Part 3: Countermeasures Against Hardware Attacks -- Part 4: Emerging Trends in Hardware Attacks and Protections. |
| Record Nr. | UNINA-9910583063503321 |
Bhunia Swarup
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| Cambridge, Massachusetts : , : Morgan Kaufmann Publishers, , [2019] | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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The IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems : proceedings : Chicago, Illinois, 7-9 October 2009 / / edited by Dimitris Gizopoulos, Mohammad Tehranipoor, and Spyros Tragoudas ; sponsored by the IEEE Computer Society Technical Committee on Fault-Tolerant Computing, the IEEE Test Technology Technical Council
| The IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems : proceedings : Chicago, Illinois, 7-9 October 2009 / / edited by Dimitris Gizopoulos, Mohammad Tehranipoor, and Spyros Tragoudas ; sponsored by the IEEE Computer Society Technical Committee on Fault-Tolerant Computing, the IEEE Test Technology Technical Council |
| Pubbl/distr/stampa | New York : , : IEEE, , 2009 |
| Descrizione fisica | 1 online resource (xxxi, 455 pages) |
| Soggetto topico |
Fault-tolerant computing
Integrated circuits - Very large scale integration - Design and construction |
| ISBN | 1-5090-7533-X |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996203025203316 |
| New York : , : IEEE, , 2009 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
The IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems : proceedings : Chicago, Illinois, 7-9 October 2009 / / edited by Dimitris Gizopoulos, Mohammad Tehranipoor, and Spyros Tragoudas ; sponsored by the IEEE Computer Society Technical Committee on Fault-Tolerant Computing, the IEEE Test Technology Technical Council
| The IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems : proceedings : Chicago, Illinois, 7-9 October 2009 / / edited by Dimitris Gizopoulos, Mohammad Tehranipoor, and Spyros Tragoudas ; sponsored by the IEEE Computer Society Technical Committee on Fault-Tolerant Computing, the IEEE Test Technology Technical Council |
| Pubbl/distr/stampa | New York : , : IEEE, , 2009 |
| Descrizione fisica | 1 online resource (xxxi, 455 pages) |
| Soggetto topico |
Fault-tolerant computing
Integrated circuits - Very large scale integration - Design and construction |
| ISBN | 1-5090-7533-X |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910138783103321 |
| New York : , : IEEE, , 2009 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Physical assurance : for electronic devices and systems / / Navid Asadizanjani, Mir Tanjidur Rahman, Mark Tehranipoor
| Physical assurance : for electronic devices and systems / / Navid Asadizanjani, Mir Tanjidur Rahman, Mark Tehranipoor |
| Autore | Asadizanjani Navid |
| Edizione | [1st ed. 2021.] |
| Pubbl/distr/stampa | Cham, Switzerland : , : Springer, , [2021] |
| Descrizione fisica | 1 online resource (XIV, 193 p. 123 illus., 118 illus. in color.) |
| Disciplina | 621.38173 |
| Soggetto topico | Integrated circuits |
| ISBN | 3-030-62609-1 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | Introduction -- Sample Preparation and Characterization Tools -- Counterfeiting Detection and Avoidance with Physical Inspection -- Hardware assurance for IC with Physical Inspection -- Hardware assurance for PCB with Physical Inspection -- Electrical Probing -- Optical Inspection and Attack. |
| Record Nr. | UNINA-9910484293903321 |
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Asadizanjani Navid
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| Cham, Switzerland : , : Springer, , [2021] | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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