The AMIS approach to systems integration : an overview / / Don Libes; Edward J. Barkmeyer; Peter Denno; David Flater; Michelle Potts Steves; Evan Wallace; Allison Barnard Feeney
| The AMIS approach to systems integration : an overview / / Don Libes; Edward J. Barkmeyer; Peter Denno; David Flater; Michelle Potts Steves; Evan Wallace; Allison Barnard Feeney |
| Autore | Libes Don |
| Pubbl/distr/stampa | Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 2004 |
| Descrizione fisica | 1 online resource |
| Altri autori (Persone) |
BarkmeyerEdward
DennoPeter Barnard FeeneyAllison FlaterDavid LibesDon StevesMichelle Potts WallaceEvan |
| Collana | NISTIR |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti | AMIS approach to systems integration |
| Record Nr. | UNINA-9910710774103321 |
Libes Don
|
||
| Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 2004 | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Concepts for automating systems integration / / Edward J. Barkmeyer; Allison Barnard Feeney; Peter Denno; David W. Flater; Donald E. Libes; Michelle Potts Steves; Evan K. Wallace
| Concepts for automating systems integration / / Edward J. Barkmeyer; Allison Barnard Feeney; Peter Denno; David W. Flater; Donald E. Libes; Michelle Potts Steves; Evan K. Wallace |
| Autore | Barkmeyer Edward |
| Pubbl/distr/stampa | Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 2003 |
| Descrizione fisica | 1 online resource |
| Altri autori (Persone) |
BarkmeyerEdward
DennoPeter Barnard FeeneyAllison FlaterDavid LibesDonald E StevesMichelle Potts WallaceEvan K |
| Collana | NISTIR |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910710527703321 |
Barkmeyer Edward
|
||
| Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 2003 | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Metric mapping concepts for TIA / / Michelle Potts Steves; Jean Scholtz
| Metric mapping concepts for TIA / / Michelle Potts Steves; Jean Scholtz |
| Autore | Steves Michelle Potts |
| Pubbl/distr/stampa | Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 2004 |
| Descrizione fisica | 1 online resource |
| Altri autori (Persone) |
ScholtzJean
StevesMichelle Potts |
| Collana | NISTIR |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910710775403321 |
Steves Michelle Potts
|
||
| Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 2004 | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Viewing technologies for CAD models / / Michelle Potts Steves; Simon Frechette
| Viewing technologies for CAD models / / Michelle Potts Steves; Simon Frechette |
| Autore | Steves Michelle Potts |
| Pubbl/distr/stampa | Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 2003 |
| Descrizione fisica | 1 online resource |
| Altri autori (Persone) |
FrechetteSimon
StevesMichelle Potts |
| Collana | NISTIR |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910710524803321 |
Steves Michelle Potts
|
||
| Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 2003 | ||
| Lo trovi qui: Univ. Federico II | ||
| ||