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Advanced engineering environments for small manufacturing enterprises : volume II / / Steven J. Fenves; Ram D. Sriram; Young Choi; Joseph P. Elm; John E. Robert
| Advanced engineering environments for small manufacturing enterprises : volume II / / Steven J. Fenves; Ram D. Sriram; Young Choi; Joseph P. Elm; John E. Robert |
| Autore | Fenves Steven J (Steven Joseph) |
| Pubbl/distr/stampa | Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 2004 |
| Descrizione fisica | 1 online resource |
| Altri autori (Persone) |
ChoiYoung
ElmJoseph P FenvesSteven J (Steven Joseph) RobertJohn E SriramRam D |
| Collana | NISTIR |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti | Advanced engineering environments for small manufacturing enterprises |
| Record Nr. | UNINA-9910710774603321 |
Fenves Steven J (Steven Joseph)
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| Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 2004 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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The architecture development facilitator (ADF) first year report / / Steven J. Fenves; Eswaran (Sub) Subrahmanian; Puja Goyal; Jean-Cyrus Angbo; Faouzi Daoud; Ram D. Sriram
| The architecture development facilitator (ADF) first year report / / Steven J. Fenves; Eswaran (Sub) Subrahmanian; Puja Goyal; Jean-Cyrus Angbo; Faouzi Daoud; Ram D. Sriram |
| Autore | Fenves Steven J (Steven Joseph) |
| Pubbl/distr/stampa | Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 2007 |
| Descrizione fisica | 1 online resource |
| Altri autori (Persone) |
AngboJean-Cyrus
DaoudFaouzi FenvesSteven J (Steven Joseph) GoyalPuja SriramRam D SubrahmanianEswaran |
| Collana | NISTIR |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti | Architecture development facilitator |
| Record Nr. | UNINA-9910710757803321 |
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Fenves Steven J (Steven Joseph)
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| Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 2007 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Carbon weight analysis for machining operation and allocation for redesign / / Gaurav Ameta; Mahesh Mani; Sudarsan Rachuri; Shaw C. Feng; Ram D. Sriram; Kevin W. Lyons
| Carbon weight analysis for machining operation and allocation for redesign / / Gaurav Ameta; Mahesh Mani; Sudarsan Rachuri; Shaw C. Feng; Ram D. Sriram; Kevin W. Lyons |
| Autore | Ameta Gaurav |
| Pubbl/distr/stampa | Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 2009 |
| Descrizione fisica | 1 online resource |
| Altri autori (Persone) |
AmetaGaurav
FengShaw C LyonsKevin W ManiMahesh RachuriSudarsan SriramRam D |
| Collana | NISTIR |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910710751503321 |
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Ameta Gaurav
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| Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 2009 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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CPM 2 : a revised core product model for representing design information / / Steven J. Fenves; Sebti Foufou; Conrad Bock; Rachuri Sudarsan; Nicolas Bouillon; Ram D. Sriram
| CPM 2 : a revised core product model for representing design information / / Steven J. Fenves; Sebti Foufou; Conrad Bock; Rachuri Sudarsan; Nicolas Bouillon; Ram D. Sriram |
| Autore | Fenves Steven J (Steven Joseph) |
| Pubbl/distr/stampa | Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 2004 |
| Descrizione fisica | 1 online resource |
| Altri autori (Persone) |
BockC (Conrad)
BouillonNicolas FenvesSteven J (Steven Joseph) FoufouSebti SriramRam D RachuriSudarsan |
| Collana | NISTIR |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti | CPM 2 |
| Record Nr. | UNINA-9910710768003321 |
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Fenves Steven J (Steven Joseph)
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| Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 2004 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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An Evaluation of description logic for the development of product models / / Xenia Fiorentini; Sudarsan Rachuri; Mahesh Mani; Steven J. Fenves; Ram D. Sriram
| An Evaluation of description logic for the development of product models / / Xenia Fiorentini; Sudarsan Rachuri; Mahesh Mani; Steven J. Fenves; Ram D. Sriram |
| Autore | Fiorentini Xenia |
| Pubbl/distr/stampa | Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 2008 |
| Descrizione fisica | 1 online resource |
| Altri autori (Persone) |
FenvesSteven J (Steven Joseph)
FiorentiniXenia ManiMahesh RachuriSudarsan SriramRam D |
| Collana | NISTIR |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910710755003321 |
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Fiorentini Xenia
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| Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 2008 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Extending the notion of quality from physical metrology to information and sustainability / / Gaurav Ameta; Sudarsan Rachuri; Xenia Fiorentini; Mahesh Mani; Steven J. Fenves; Kevin W. Lyons; Ram D. Sriram
| Extending the notion of quality from physical metrology to information and sustainability / / Gaurav Ameta; Sudarsan Rachuri; Xenia Fiorentini; Mahesh Mani; Steven J. Fenves; Kevin W. Lyons; Ram D. Sriram |
| Autore | Ameta Gaurav |
| Pubbl/distr/stampa | Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 2008 |
| Descrizione fisica | 1 online resource |
| Altri autori (Persone) |
AmetaGaurav
FenvesSteven J (Steven Joseph) FiorentiniXenia LyonsKevin W ManiMahesh RachuriSudarsan SriramRam D |
| Collana | NISTIR |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910710753503321 |
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Ameta Gaurav
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| Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 2008 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Formal representation of product design specifications for validating product designs / / Alex Weissman; Satyandra K. Gupta; Xenia Fiorentini; Rachuri Sudarsan; Ram D. Sriram
| Formal representation of product design specifications for validating product designs / / Alex Weissman; Satyandra K. Gupta; Xenia Fiorentini; Rachuri Sudarsan; Ram D. Sriram |
| Autore | Weissman Alex |
| Pubbl/distr/stampa | Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 2009 |
| Descrizione fisica | 1 online resource |
| Altri autori (Persone) |
FiorentiniXenia
GuptaSatyandra K SriramRam D RachuriSudarsan WeissmanAlex |
| Collana | NISTIR |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910710749303321 |
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Weissman Alex
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| Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 2009 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Information model for disassembly for reuse, recycle, and remanufacturing / / Shaw C. Feng; Hanmin Lee; Che B. Joung; Thomas Kramer; Parisa Ghodous; Ram D. Sriram
| Information model for disassembly for reuse, recycle, and remanufacturing / / Shaw C. Feng; Hanmin Lee; Che B. Joung; Thomas Kramer; Parisa Ghodous; Ram D. Sriram |
| Autore | Feng Shaw C |
| Pubbl/distr/stampa | Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 2011 |
| Descrizione fisica | 1 online resource |
| Altri autori (Persone) |
FengShaw C
GhodousP (Parisa) JoungChe B KramerThomas LeeHanmin SriramRam D |
| Collana | NISTIR |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910709598003321 |
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Feng Shaw C
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| Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 2011 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Manufacturing metrology and standards for the health care enterprise program summary / / Ram D. Sriram; Steven J. Fenves
| Manufacturing metrology and standards for the health care enterprise program summary / / Ram D. Sriram; Steven J. Fenves |
| Autore | Sriram Ram D |
| Pubbl/distr/stampa | Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 2008 |
| Descrizione fisica | 1 online resource |
| Altri autori (Persone) |
FenvesSteven J (Steven Joseph)
SriramRam D |
| Collana | NISTIR |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910710754603321 |
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Sriram Ram D
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| Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 2008 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Master product model for the support of tighter integration of spatial and functional design / / Steven J. Fenves; Young Choi; Balan Gurumoorthy; Greg Mocko; Ram D. Sriram
| Master product model for the support of tighter integration of spatial and functional design / / Steven J. Fenves; Young Choi; Balan Gurumoorthy; Greg Mocko; Ram D. Sriram |
| Autore | Fenves Steven J (Steven Joseph) |
| Pubbl/distr/stampa | Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 2003 |
| Descrizione fisica | 1 online resource |
| Altri autori (Persone) |
ChoiYoung
FenvesSteven J (Steven Joseph) GurumoorthyBalan MockoGreg SriramRam D |
| Collana | NISTIR |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910710778403321 |
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Fenves Steven J (Steven Joseph)
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| Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 2003 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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