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Advanced Transmission Electron Microscopy : Imaging and Diffraction in Nanoscience / / by Jian Min Zuo, John C.H. Spence
| Advanced Transmission Electron Microscopy : Imaging and Diffraction in Nanoscience / / by Jian Min Zuo, John C.H. Spence |
| Autore | Zuo Jian Min |
| Edizione | [1st ed. 2017.] |
| Pubbl/distr/stampa | New York, NY : , : Springer New York : , : Imprint : Springer, , 2017 |
| Descrizione fisica | 1 online resource (XXVI, 729 p. 310 illus., 218 illus. in color.) |
| Disciplina | 502.825 |
| Soggetto topico |
Materials science
Lasers Photonics Nanochemistry Nanoscale science Nanoscience Nanostructures Nanotechnology Solid state physics Characterization and Evaluation of Materials Optics, Lasers, Photonics, Optical Devices Nanoscale Science and Technology Solid State Physics |
| ISBN | 1-4939-6607-3 |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | Introduction and historical background -- Electron Waves and Wave Propagation -- The geometry of electron diffraction patterns -- Kinematical Theory of Electron Diffraction -- Dynamical Theory of Electron Diffraction for Perfect Crystals -- Electron optics -- Lens aberrations and Aberration Correction -- Electron Sources -- Electron Detectors -- Instrumentation and experimental techniques -- Crystal symmetry -- Crystal structure and bonding -- Diffuse Scattering -- Atomic resolution electron imaging -- Imaging and characterization of crystal defects -- Strain Measurements and Mapping -- Structure of Nanocrystals, Nanoparticles and Nanotubes. |
| Record Nr. | UNINA-9910254141103321 |
Zuo Jian Min
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| New York, NY : , : Springer New York : , : Imprint : Springer, , 2017 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Springer Handbook of Microscopy / / edited by Peter W. Hawkes, John C.H. Spence
| Springer Handbook of Microscopy / / edited by Peter W. Hawkes, John C.H. Spence |
| Edizione | [1st ed. 2019.] |
| Pubbl/distr/stampa | Cham : , : Springer International Publishing : , : Imprint : Springer, , 2019 |
| Descrizione fisica | 1 online resource (XXXII, 1543 p. 1140 illus. in color.) |
| Disciplina | 502.82 |
| Collana | Springer Handbooks |
| Soggetto topico |
Materials - Analysis
Spectrum analysis Biophysics Characterization and Analytical Technique Spectroscopy Bioanalysis and Bioimaging |
| ISBN | 3-030-00069-9 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | Part A: Electron and Ion Microscopy -- Kirkland et al.: Atomic Resolution Transmission Electron Microscopy -- Nellist: Scanning Transmission Electron Microscopy -- Ross & Minor: In situ Transmission Electron Microscopy -- Plitzko & Baumeister: Crytoelectron TEM -- Erdmann et al: Scanning Electron Microscopy -- Thiel: Variable Pressure Scanning Electron Microscopy -- Botton, Pradhudev: Analytical Electron Microscopy -- Campbell et al: High-Speed Electron Microscopy -- Bauer: LEEM, SPLEEM and SPELEEM -- Feng & Scholl: Photoemission Electron Microscopy -- Tromp: Spectroscopy with the Low Energy Electron Microscope -- Van Aert: Model-Based Electron Microscopy -- Hawkes & Krivanek: Aberration Correctors, Monochromators, Spectrometer -- Hlawacek: Ion Microscopy.-Kelly: Atom-Probe Tomography -- Part B: Holography, Ptychography and Diffraction -- Dunin-Borkowski et al.: Electron Holography.-Rodenburg & Maiden: Ptychography -- Zuo: Electron Nanodiffraction -- Musumeci & Li: High-Energy Time-Resolved Electron Diffraction -- Spence: Diffractive Imaging of Single Particles -- Part C: Photon-based Microscopy -- Diaspro et al: Fluorescence Microscopy -- Sahl et al.: Far-Field Fluorescence Microscopy -- Jacobson et al: Zone-Plate X-Ray Microscopy -- Lin et al: Microcomputed Tomography -- Part D: Applied Microscopy -- Huey et al: Scanning Probe Microscopy in Materials Science -- Leary & Midgeley: Electron Tomography in Materials Science -- Sutter: Scanning Tunneling Microscopy in Surface Science -- Hamidian et al: Visualizing electronic quantum matter -- Ma et al (Terasaki): Microscopy of Nanoporous Crystals -- Wen: Biomedical X-Ray Phase-Contrast Imaging and Tomography -- Amrein & Stamov: Atomic Force Microscopy in the Life Sciences -- Jones: Microscopy in Forensic Sciences. |
| Record Nr. | UNINA-9910357828603321 |
| Cham : , : Springer International Publishing : , : Imprint : Springer, , 2019 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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